TW200608034A - Circuit board inspecting apparatus and circuit board inspecting method - Google Patents

Circuit board inspecting apparatus and circuit board inspecting method

Info

Publication number
TW200608034A
TW200608034A TW094117184A TW94117184A TW200608034A TW 200608034 A TW200608034 A TW 200608034A TW 094117184 A TW094117184 A TW 094117184A TW 94117184 A TW94117184 A TW 94117184A TW 200608034 A TW200608034 A TW 200608034A
Authority
TW
Taiwan
Prior art keywords
circuit board
board
middle holding
inspected
pin
Prior art date
Application number
TW094117184A
Other languages
Chinese (zh)
Inventor
Kiyoshi Kimura
Sugiro Shimoda
Satoshi Suzuki
Original Assignee
Jsr Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jsr Corp filed Critical Jsr Corp
Publication of TW200608034A publication Critical patent/TW200608034A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A circuit board inspecting apparatus and a circuit board inspecting method are provided for performing highly reliable electrical inspection to an object to be inspected, or a circuit board to be inspected, even when the circuit board has a fine pitch microelectrode, and for efficiently aligning an inspection jig and the circuit board to be inspected. In a middle pin unit (31) between a circuit board side connector (21) and a tester side connector (41), a first insulating board (34) and a middle holding board (36) are fixed by a first supporting pin (33), a second insulating board (35) and a middle holding board (36) are fixed by a second supporting pin (37), and a first abutting and supporting position of the first supporting pin (33) to the middle holding board (36) and a second abutting and supporting position of the second supporting pin (37) to the middle holding board (36) are arranged at different positions on a middle holding board projection plane projected in a thickness direction of the middle holding board (36). Then, in the middle pin unit (31), an image pickup device, such as a CCD camera (91), is arranged and the inspection jig (11) and the circuit board (1) to be tested are aligned.
TW094117184A 2004-05-28 2005-05-25 Circuit board inspecting apparatus and circuit board inspecting method TW200608034A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004159686 2004-05-28

Publications (1)

Publication Number Publication Date
TW200608034A true TW200608034A (en) 2006-03-01

Family

ID=35451003

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094117184A TW200608034A (en) 2004-05-28 2005-05-25 Circuit board inspecting apparatus and circuit board inspecting method

Country Status (2)

Country Link
TW (1) TW200608034A (en)
WO (1) WO2005116670A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9703623B2 (en) 2014-11-11 2017-07-11 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Adjusting the use of a chip/socket having a damaged pin
JP2018136195A (en) * 2017-02-22 2018-08-30 日置電機株式会社 Probe device and measurement system
TWI730828B (en) * 2020-06-29 2021-06-11 群翊工業股份有限公司 Plate frame width adjustment equipment and control method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3094779B2 (en) * 1994-03-10 2000-10-03 ジェイエスアール株式会社 Circuit board inspection apparatus and inspection method
JP2000266799A (en) * 1999-03-15 2000-09-29 Taiyo Kogyo Kk Printed circuit board inspection device
JP2002005980A (en) * 2000-06-16 2002-01-09 Toppan Printing Co Ltd Printed wiring board inspection jig, inspection device, and positioning method between printed wiring board and upper/lower inspection jig

Also Published As

Publication number Publication date
WO2005116670A1 (en) 2005-12-08

Similar Documents

Publication Publication Date Title
KR100602450B1 (en) Apparatus for testing of flexible printed circuit board
KR101245148B1 (en) Vision inspect apparatus of improved picture visibility
TW200739104A (en) Method and device for the testing of non-componented circuit boards
SG129347A1 (en) Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards
TW200731440A (en) Flip chip mounting shift inspection method and mounting apparatus
TW200720686A (en) Electronic component testing apparatus
SG126025A1 (en) Method and apparatus for a twisting fixture probe for probing test access point structures
EP1707532A3 (en) Probing card and inspection apparatus for microstructure
TW200608034A (en) Circuit board inspecting apparatus and circuit board inspecting method
ATE298973T1 (en) METHOD AND DEVICE FOR DETECTING THE POSITION OF THE CONNECTION CONTACTS OF ELECTRONIC COMPONENTS
US20110234870A1 (en) Imaging apparatus for fully automatic screen printer
CN107490733B (en) Method and apparatus for aligning probe pin with position of electronic device
CN213181304U (en) Detection device for ultrathin PCB
TW200842346A (en) Detection method of printed circuit boards and the system thereof
KR20070044897A (en) Auto trace tester
KR20130022126A (en) Probe unit and apparatus for testing electrical characteristics of an object including the same
TW200716994A (en) Circuit board inspecting apparatus and circuit board inspecting method
TW200723427A (en) Method for inspecting semiconductor device
JP2012038692A (en) Connector defect inspection device
TW200907356A (en) Pogo probe unit and repair apparatus for flat panel display by the same
JP2003207326A (en) Lead shape inspection device for pc card connector and smt connector
JP2007071537A (en) Device and method for inspecting printed circuit board
JP3817338B2 (en) Printed circuit board inspection equipment
KR0177219B1 (en) High density mounting insert kit inspection device
JP2013092508A (en) Appearance inspection device