AU2003254551A1 - Method and device for detecting surface defects on workpieces or components having a shiny surface - Google Patents
Method and device for detecting surface defects on workpieces or components having a shiny surfaceInfo
- Publication number
- AU2003254551A1 AU2003254551A1 AU2003254551A AU2003254551A AU2003254551A1 AU 2003254551 A1 AU2003254551 A1 AU 2003254551A1 AU 2003254551 A AU2003254551 A AU 2003254551A AU 2003254551 A AU2003254551 A AU 2003254551A AU 2003254551 A1 AU2003254551 A1 AU 2003254551A1
- Authority
- AU
- Australia
- Prior art keywords
- surface defects
- workpieces
- components
- image
- computer system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Abstract
The invention relates to a method for detecting surface defects on workpieces or components having shiny surfaces, whereby a ghost image in the form of a grating image comprising light and dark image strips is produced on a surface (1) to be tested by means of a projection device comprising a light source, the grating image is detected by means of a camera device (10), and the shape of the grating image detected by the camera device is supplied to a computer system as a measuring signal. Surface defects are determined in the computer system on the basis of the measuring signal and can be identified as significant surface defects requiring secondary treatment by comparison with at least one stored reference pattern.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10300482.3 | 2003-01-08 | ||
DE10300482A DE10300482B3 (en) | 2003-01-08 | 2003-01-08 | Method and device for detecting surface defects on workpieces with shiny surfaces |
PCT/EP2003/007920 WO2004063732A1 (en) | 2003-01-08 | 2003-07-21 | Method and device for detecting surface defects on workpieces or components having a shiny surface |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003254551A1 true AU2003254551A1 (en) | 2004-08-10 |
Family
ID=32478177
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003254551A Abandoned AU2003254551A1 (en) | 2003-01-08 | 2003-07-21 | Method and device for detecting surface defects on workpieces or components having a shiny surface |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1581803B1 (en) |
AT (1) | ATE333092T1 (en) |
AU (1) | AU2003254551A1 (en) |
DE (2) | DE10300482B3 (en) |
WO (1) | WO2004063732A1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101334081B1 (en) * | 2005-07-08 | 2013-11-29 | 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 | Achieving convergent light rays emitted by planar array of light sources |
DE102009002569A1 (en) * | 2009-04-22 | 2010-10-28 | Manroland Ag | Method for determining the quality of a printed product |
US8233694B2 (en) | 2009-10-21 | 2012-07-31 | GM Global Technology Operations LLC | Method of appearance deformation indexing |
DE102010032241A1 (en) | 2010-07-26 | 2012-01-26 | Smartvision Gmbh | Method for detecting surface defects e.g. cracks at plastic surface of corrugated pipe, involves testing differential image between two partial region images to determine whether coherent regions are provided with grey values |
EP2600283A1 (en) | 2011-12-02 | 2013-06-05 | Uwe Peter Braun | Method and apparatus for fingerprint detection |
DE102013221334A1 (en) * | 2013-10-21 | 2015-04-23 | Volkswagen Aktiengesellschaft | Method and measuring device for evaluating structural differences of a reflecting surface |
DE102019201193A1 (en) * | 2019-01-30 | 2020-07-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for the detection of topographic defects on surfaces of a component |
DE102022125197A1 (en) | 2022-09-29 | 2024-04-04 | B+M Surface Systems Gmbh | Device for examining a surface of a component |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62239005A (en) * | 1986-04-11 | 1987-10-19 | Fuji Photo Film Co Ltd | Surface shape inspecting instrument |
US4792232A (en) * | 1987-05-18 | 1988-12-20 | Shell Oil Company | Method and apparatus for detection of undesirable surface deformities |
DE4041166C2 (en) * | 1990-12-21 | 1995-09-07 | Licentia Gmbh | Test room for visual quality control of high-gloss surfaces |
DE19730885A1 (en) * | 1997-07-18 | 1999-01-21 | Audi Ag | Process for the automatic detection of surface defects on body-in-white bodies and device for carrying out the process |
DE19815250C2 (en) * | 1998-03-05 | 2000-05-31 | Uwe Peter Braun | Attachment optics for use as reflex image optics, in particular for surface defect detection in the automotive industry |
US6100990A (en) * | 1999-06-14 | 2000-08-08 | Ford Motor Company | Method and apparatus for determining reflective optical quality using gray-scale patterns |
DE19944354C5 (en) * | 1999-09-16 | 2011-07-07 | Häusler, Gerd, Prof. Dr., 91056 | Method and device for measuring specular or transparent specimens |
-
2003
- 2003-01-08 DE DE10300482A patent/DE10300482B3/en not_active Expired - Lifetime
- 2003-07-21 EP EP03815048A patent/EP1581803B1/en not_active Expired - Lifetime
- 2003-07-21 AU AU2003254551A patent/AU2003254551A1/en not_active Abandoned
- 2003-07-21 WO PCT/EP2003/007920 patent/WO2004063732A1/en not_active Application Discontinuation
- 2003-07-21 DE DE50304256T patent/DE50304256D1/en not_active Expired - Lifetime
- 2003-07-21 AT AT03815048T patent/ATE333092T1/en active
Also Published As
Publication number | Publication date |
---|---|
ATE333092T1 (en) | 2006-08-15 |
EP1581803A1 (en) | 2005-10-05 |
WO2004063732A1 (en) | 2004-07-29 |
DE50304256D1 (en) | 2006-08-24 |
EP1581803B1 (en) | 2006-07-12 |
DE10300482B3 (en) | 2004-07-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |