MY165726A - Cleaning liquid composition for electronic device - Google Patents

Cleaning liquid composition for electronic device

Info

Publication number
MY165726A
MY165726A MYPI2012005069A MYPI2012005069A MY165726A MY 165726 A MY165726 A MY 165726A MY PI2012005069 A MYPI2012005069 A MY PI2012005069A MY PI2012005069 A MYPI2012005069 A MY PI2012005069A MY 165726 A MY165726 A MY 165726A
Authority
MY
Malaysia
Prior art keywords
liquid composition
cleaning liquid
electronic device
types
semiconductor substrate
Prior art date
Application number
MYPI2012005069A
Other languages
English (en)
Inventor
Taniguchi Yumiko
Morita Kikue
Horike Chiyoko
Ohwada Takuo
Original Assignee
Kanto Kagaku
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanto Kagaku filed Critical Kanto Kagaku
Publication of MY165726A publication Critical patent/MY165726A/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/38Cationic compounds
    • C11D1/62Quaternary ammonium compounds
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3209Amines or imines with one to four nitrogen atoms; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/66Non-ionic compounds
    • C11D1/79Phosphine oxides
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/26Organic compounds containing nitrogen
    • C11D3/30Amines; Substituted amines ; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/36Organic compounds containing phosphorus
    • C11D3/361Phosphonates, phosphinates or phosphonites
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/36Organic compounds containing phosphorus
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G1/00Cleaning or pickling metallic material with solutions or molten salts
    • C23G1/14Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
    • C23G1/16Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions using inhibitors
    • C23G1/18Organic inhibitors
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G1/00Cleaning or pickling metallic material with solutions or molten salts
    • C23G1/14Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
    • C23G1/20Other heavy metals
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/10Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H10P70/15Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/20Cleaning during device manufacture
    • H10P70/27Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Detergent Compositions (AREA)
MYPI2012005069A 2011-12-06 2012-11-23 Cleaning liquid composition for electronic device MY165726A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011267368A JP6066552B2 (ja) 2011-12-06 2011-12-06 電子デバイス用洗浄液組成物

Publications (1)

Publication Number Publication Date
MY165726A true MY165726A (en) 2018-04-20

Family

ID=47323949

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2012005069A MY165726A (en) 2011-12-06 2012-11-23 Cleaning liquid composition for electronic device

Country Status (8)

Country Link
US (1) US9334470B2 (enExample)
EP (1) EP2602309B1 (enExample)
JP (1) JP6066552B2 (enExample)
KR (1) KR102041624B1 (enExample)
CN (1) CN103146509A (enExample)
MY (1) MY165726A (enExample)
SG (1) SG191504A1 (enExample)
TW (1) TWI565797B (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9329486B2 (en) 2005-10-28 2016-05-03 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and method for its use
US8263539B2 (en) 2005-10-28 2012-09-11 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and methods for its use
US7632796B2 (en) 2005-10-28 2009-12-15 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and method for its use
TWI450052B (zh) * 2008-06-24 2014-08-21 黛納羅伊有限責任公司 用於後段製程操作有效之剝離溶液
CN104508072A (zh) 2012-02-15 2015-04-08 安格斯公司 用于cmp后去除的组合物及使用方法
TWI572711B (zh) * 2012-10-16 2017-03-01 盟智科技股份有限公司 半導體製程用的清洗組成物及清洗方法
US9158202B2 (en) 2012-11-21 2015-10-13 Dynaloy, Llc Process and composition for removing substances from substrates
JP6203525B2 (ja) * 2013-04-19 2017-09-27 関東化學株式会社 洗浄液組成物
CN103757648B (zh) * 2014-01-16 2016-03-30 段云豪 一种手机表面铜锈的去除及防护剂
US11127587B2 (en) 2014-02-05 2021-09-21 Entegris, Inc. Non-amine post-CMP compositions and method of use
TWI636131B (zh) * 2014-05-20 2018-09-21 日商Jsr股份有限公司 清洗用組成物及清洗方法
CN104018170A (zh) * 2014-05-29 2014-09-03 东风汽车紧固件有限公司 一种低温环保无铬除磷化膜剂
JP6350080B2 (ja) * 2014-07-31 2018-07-04 Jsr株式会社 半導体基板洗浄用組成物
CN104818133B (zh) * 2015-03-30 2018-04-27 蓝思科技(长沙)有限公司 一种用于菲林褪镀后脱垢的清洗剂
JP6737436B2 (ja) * 2015-11-10 2020-08-12 株式会社Screenホールディングス 膜処理ユニットおよび基板処理装置
US10319605B2 (en) 2016-05-10 2019-06-11 Jsr Corporation Semiconductor treatment composition and treatment method
CN110234719A (zh) * 2017-01-18 2019-09-13 恩特格里斯公司 用于从表面去除氧化铈粒子的组合物和方法
JP7220142B2 (ja) * 2017-03-31 2023-02-09 関東化学株式会社 チタン層またはチタン含有層のエッチング液組成物およびエッチング方法
KR20220118520A (ko) * 2019-12-20 2022-08-25 버슘머트리얼즈 유에스, 엘엘씨 Co/cu 선택적 습식 에칭제
WO2022073178A1 (en) * 2020-10-09 2022-04-14 Henkel Ag & Co. Kgaa Cleaner for electronic device components

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0641773A (ja) 1992-05-18 1994-02-15 Toshiba Corp 半導体ウェーハ処理液
US5421897A (en) * 1992-07-17 1995-06-06 Grawe; John Abatement process for contaminants
JP3335500B2 (ja) * 1994-08-03 2002-10-15 シャープ株式会社 排水処理装置および排水処理方法
JPH09286999A (ja) * 1996-04-19 1997-11-04 Kanto Chem Co Inc シリコンウェハ洗浄用組成物
JP3219020B2 (ja) 1996-06-05 2001-10-15 和光純薬工業株式会社 洗浄処理剤
TW416987B (en) 1996-06-05 2001-01-01 Wako Pure Chem Ind Ltd A composition for cleaning the semiconductor substrate surface
JP3165801B2 (ja) 1997-08-12 2001-05-14 関東化学株式会社 洗浄液
TW387936B (en) 1997-08-12 2000-04-21 Kanto Kagaku Washing solution
JP3377938B2 (ja) 1997-10-21 2003-02-17 花王株式会社 洗浄剤組成物及び洗浄方法
JP4252130B2 (ja) 1998-07-13 2009-04-08 武藤工業株式会社 インクジェットプリンタにおける細線の階調表現方法
JP2000252250A (ja) * 1999-02-26 2000-09-14 Mitsubishi Gas Chem Co Inc 半導体基板洗浄液およびそれを用いた半導体基板の洗浄方法
JP4516176B2 (ja) 1999-04-20 2010-08-04 関東化学株式会社 電子材料用基板洗浄液
US6395693B1 (en) * 1999-09-27 2002-05-28 Cabot Microelectronics Corporation Cleaning solution for semiconductor surfaces following chemical-mechanical polishing
AU2001241190A1 (en) * 2000-03-21 2001-10-03 Wako Pure Chemical Industries, Ltd. Semiconductor wafer cleaning agent and cleaning method
JP2002069495A (ja) * 2000-06-16 2002-03-08 Kao Corp 洗浄剤組成物
KR100867287B1 (ko) * 2000-06-16 2008-11-06 카오카부시키가이샤 세정제 조성물
US6599370B2 (en) * 2000-10-16 2003-07-29 Mallinckrodt Inc. Stabilized alkaline compositions for cleaning microelectronic substrates
JP2002257809A (ja) * 2001-03-06 2002-09-11 Nec Corp テトラメチルアンモニウムハイドロオキサイドの検出方法および装置
MY131912A (en) * 2001-07-09 2007-09-28 Avantor Performance Mat Inc Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
TWI297102B (en) * 2001-08-03 2008-05-21 Nec Electronics Corp Removing composition
JP2003129089A (ja) * 2001-10-24 2003-05-08 Daikin Ind Ltd 洗浄用組成物
TWI276682B (en) * 2001-11-16 2007-03-21 Mitsubishi Chem Corp Substrate surface cleaning liquid mediums and cleaning method
WO2003104900A2 (en) * 2002-06-07 2003-12-18 Mallinckrodt Baker Inc. Microelectronic cleaning compositions containing oxidizers and organic solvents
JP2004042811A (ja) 2002-07-12 2004-02-12 Denso Corp 車両用空調装置
JP4752270B2 (ja) * 2002-11-08 2011-08-17 和光純薬工業株式会社 洗浄液及びそれを用いた洗浄方法
JP2005101479A (ja) * 2002-11-08 2005-04-14 Sumitomo Chemical Co Ltd 半導体基板用洗浄液
JP4485786B2 (ja) * 2003-01-10 2010-06-23 関東化学株式会社 半導体基板用洗浄液
TWI324362B (en) * 2003-01-10 2010-05-01 Kanto Kagaku Cleaning solution for semiconductor substrate
WO2004094581A1 (en) * 2003-04-18 2004-11-04 Ekc Technology, Inc. Aqueous fluoride compositions for cleaning semiconductor devices
JP2005060660A (ja) * 2003-07-31 2005-03-10 Sumitomo Chemical Co Ltd 半導体基板用洗浄液
US20050205835A1 (en) * 2004-03-19 2005-09-22 Tamboli Dnyanesh C Alkaline post-chemical mechanical planarization cleaning compositions
JP4628209B2 (ja) * 2004-11-18 2011-02-09 花王株式会社 剥離剤組成物
TWI282363B (en) * 2005-05-19 2007-06-11 Epoch Material Co Ltd Aqueous cleaning composition for semiconductor copper processing
SG162725A1 (en) 2005-05-26 2010-07-29 Advanced Tech Materials Copper passivating post-chemical mechanical polishing cleaning composition and method of use
JP5192952B2 (ja) 2007-09-14 2013-05-08 三洋化成工業株式会社 磁気ディスク基板用洗浄剤
JP5192953B2 (ja) 2007-09-14 2013-05-08 三洋化成工業株式会社 磁気ディスク用ガラス基板洗浄剤
JP2009194049A (ja) * 2008-02-13 2009-08-27 Sanyo Chem Ind Ltd 銅配線半導体用洗浄剤
JP5553985B2 (ja) * 2008-12-11 2014-07-23 三洋化成工業株式会社 電子材料用洗浄剤
JP5410943B2 (ja) 2008-12-18 2014-02-05 三洋化成工業株式会社 電子材料用洗浄剤
US8765653B2 (en) 2009-07-07 2014-07-01 Air Products And Chemicals, Inc. Formulations and method for post-CMP cleaning
US8148310B2 (en) * 2009-10-24 2012-04-03 Wai Mun Lee Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid
US8148311B2 (en) * 2009-10-24 2012-04-03 Wai Mun Lee Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid
JP5401359B2 (ja) * 2010-02-16 2014-01-29 花王株式会社 硬質表面用アルカリ洗浄剤組成物

Also Published As

Publication number Publication date
TWI565797B (zh) 2017-01-11
US9334470B2 (en) 2016-05-10
JP6066552B2 (ja) 2017-01-25
JP2013119579A (ja) 2013-06-17
US20130143785A1 (en) 2013-06-06
CN103146509A (zh) 2013-06-12
TW201336985A (zh) 2013-09-16
KR20130063474A (ko) 2013-06-14
EP2602309A1 (en) 2013-06-12
EP2602309B1 (en) 2017-05-03
SG191504A1 (en) 2013-07-31
KR102041624B1 (ko) 2019-11-06

Similar Documents

Publication Publication Date Title
MY165726A (en) Cleaning liquid composition for electronic device
SG194161A1 (en) Water purification unit
MY164940A (en) Treatment of illitic formations using a chelating agent
MX367712B (es) Composiciones y metodos de inhibicion de la corrosion.
MY163493A (en) Aqueous alkaline cleaning compositions and method of their use
EP2592131A3 (en) Aqueous cerium-containing solution having an extended bath lifetime for removing mask material
MY166771A (en) Surface treating composition for copper and copper alloy and utilization thereof
CN103643226A (zh) 一种用于钢铁基体化学镀铜的除油清洗防锈液
PH12016500496A1 (en) Method of selectively treating copper in the presence of further metal
MY199306A (en) Tin plating bath and a method for depositing tin or tin alloy onto a surface of a substrate
TW200714709A (en) Polymer-stripping composition
CN103194337A (zh) 一种清洗剂
MY151123A (en) Solution and process for increasing the solderability and corrosion resistance of metal or metal alloy surface
CO6710900A2 (es) Un método para la eliminación de productos químicos orgánicos y complejos organometálicos a partir de agua de proceso o de otras corrientes de una planta de procesamiento de mineral que utilizan zeolita
CN104593835B (zh) 用于片式元器件端电极电镀的中性镀锡液
TW201129692A (en) Cleaning composition of substrate for manufacturing flat panel display device
CN108352318B (zh) 蚀刻液组合物以及蚀刻方法
MX2009013256A (es) Soluciones de limpieza concentradas estabilizadas y metodos para preparar las mismas.
EP2670887A1 (en) Adhesion promoting composition for metal leadframes
CN103668295B (zh) 轴承水基清洗剂
MY157689A (en) Gluconic acid containing photoresist cleaning composition for multi-metal device processing
WO2011031089A3 (ko) 세정액 조성물
WO2011031092A3 (ko) 평판표시장치 제조용 기판의 세정액 조성물
MY172318A (en) Cleaning fluid for semiconductor, and cleaning method using the same
CN104310508A (zh) 一种废水处理剂