MY165726A - Cleaning liquid composition for electronic device - Google Patents
Cleaning liquid composition for electronic deviceInfo
- Publication number
- MY165726A MY165726A MYPI2012005069A MYPI2012005069A MY165726A MY 165726 A MY165726 A MY 165726A MY PI2012005069 A MYPI2012005069 A MY PI2012005069A MY PI2012005069 A MYPI2012005069 A MY PI2012005069A MY 165726 A MY165726 A MY 165726A
- Authority
- MY
- Malaysia
- Prior art keywords
- liquid composition
- cleaning liquid
- electronic device
- types
- semiconductor substrate
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D1/00—Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
- C11D1/38—Cationic compounds
- C11D1/62—Quaternary ammonium compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3209—Amines or imines with one to four nitrogen atoms; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D1/00—Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
- C11D1/66—Non-ionic compounds
- C11D1/79—Phosphine oxides
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/30—Amines; Substituted amines ; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/36—Organic compounds containing phosphorus
- C11D3/361—Phosphonates, phosphinates or phosphonites
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/36—Organic compounds containing phosphorus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
- C23G1/14—Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
- C23G1/16—Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions using inhibitors
- C23G1/18—Organic inhibitors
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
- C23G1/14—Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
- C23G1/20—Other heavy metals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
- H10P70/27—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011267368A JP6066552B2 (ja) | 2011-12-06 | 2011-12-06 | 電子デバイス用洗浄液組成物 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MY165726A true MY165726A (en) | 2018-04-20 |
Family
ID=47323949
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MYPI2012005069A MY165726A (en) | 2011-12-06 | 2012-11-23 | Cleaning liquid composition for electronic device |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9334470B2 (enExample) |
| EP (1) | EP2602309B1 (enExample) |
| JP (1) | JP6066552B2 (enExample) |
| KR (1) | KR102041624B1 (enExample) |
| CN (1) | CN103146509A (enExample) |
| MY (1) | MY165726A (enExample) |
| SG (1) | SG191504A1 (enExample) |
| TW (1) | TWI565797B (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9329486B2 (en) | 2005-10-28 | 2016-05-03 | Dynaloy, Llc | Dynamic multi-purpose composition for the removal of photoresists and method for its use |
| US8263539B2 (en) | 2005-10-28 | 2012-09-11 | Dynaloy, Llc | Dynamic multi-purpose composition for the removal of photoresists and methods for its use |
| US7632796B2 (en) | 2005-10-28 | 2009-12-15 | Dynaloy, Llc | Dynamic multi-purpose composition for the removal of photoresists and method for its use |
| TWI450052B (zh) * | 2008-06-24 | 2014-08-21 | 黛納羅伊有限責任公司 | 用於後段製程操作有效之剝離溶液 |
| CN104508072A (zh) | 2012-02-15 | 2015-04-08 | 安格斯公司 | 用于cmp后去除的组合物及使用方法 |
| TWI572711B (zh) * | 2012-10-16 | 2017-03-01 | 盟智科技股份有限公司 | 半導體製程用的清洗組成物及清洗方法 |
| US9158202B2 (en) | 2012-11-21 | 2015-10-13 | Dynaloy, Llc | Process and composition for removing substances from substrates |
| JP6203525B2 (ja) * | 2013-04-19 | 2017-09-27 | 関東化學株式会社 | 洗浄液組成物 |
| CN103757648B (zh) * | 2014-01-16 | 2016-03-30 | 段云豪 | 一种手机表面铜锈的去除及防护剂 |
| US11127587B2 (en) | 2014-02-05 | 2021-09-21 | Entegris, Inc. | Non-amine post-CMP compositions and method of use |
| TWI636131B (zh) * | 2014-05-20 | 2018-09-21 | 日商Jsr股份有限公司 | 清洗用組成物及清洗方法 |
| CN104018170A (zh) * | 2014-05-29 | 2014-09-03 | 东风汽车紧固件有限公司 | 一种低温环保无铬除磷化膜剂 |
| JP6350080B2 (ja) * | 2014-07-31 | 2018-07-04 | Jsr株式会社 | 半導体基板洗浄用組成物 |
| CN104818133B (zh) * | 2015-03-30 | 2018-04-27 | 蓝思科技(长沙)有限公司 | 一种用于菲林褪镀后脱垢的清洗剂 |
| JP6737436B2 (ja) * | 2015-11-10 | 2020-08-12 | 株式会社Screenホールディングス | 膜処理ユニットおよび基板処理装置 |
| US10319605B2 (en) | 2016-05-10 | 2019-06-11 | Jsr Corporation | Semiconductor treatment composition and treatment method |
| CN110234719A (zh) * | 2017-01-18 | 2019-09-13 | 恩特格里斯公司 | 用于从表面去除氧化铈粒子的组合物和方法 |
| JP7220142B2 (ja) * | 2017-03-31 | 2023-02-09 | 関東化学株式会社 | チタン層またはチタン含有層のエッチング液組成物およびエッチング方法 |
| KR20220118520A (ko) * | 2019-12-20 | 2022-08-25 | 버슘머트리얼즈 유에스, 엘엘씨 | Co/cu 선택적 습식 에칭제 |
| WO2022073178A1 (en) * | 2020-10-09 | 2022-04-14 | Henkel Ag & Co. Kgaa | Cleaner for electronic device components |
Family Cites Families (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0641773A (ja) | 1992-05-18 | 1994-02-15 | Toshiba Corp | 半導体ウェーハ処理液 |
| US5421897A (en) * | 1992-07-17 | 1995-06-06 | Grawe; John | Abatement process for contaminants |
| JP3335500B2 (ja) * | 1994-08-03 | 2002-10-15 | シャープ株式会社 | 排水処理装置および排水処理方法 |
| JPH09286999A (ja) * | 1996-04-19 | 1997-11-04 | Kanto Chem Co Inc | シリコンウェハ洗浄用組成物 |
| JP3219020B2 (ja) | 1996-06-05 | 2001-10-15 | 和光純薬工業株式会社 | 洗浄処理剤 |
| TW416987B (en) | 1996-06-05 | 2001-01-01 | Wako Pure Chem Ind Ltd | A composition for cleaning the semiconductor substrate surface |
| JP3165801B2 (ja) | 1997-08-12 | 2001-05-14 | 関東化学株式会社 | 洗浄液 |
| TW387936B (en) | 1997-08-12 | 2000-04-21 | Kanto Kagaku | Washing solution |
| JP3377938B2 (ja) | 1997-10-21 | 2003-02-17 | 花王株式会社 | 洗浄剤組成物及び洗浄方法 |
| JP4252130B2 (ja) | 1998-07-13 | 2009-04-08 | 武藤工業株式会社 | インクジェットプリンタにおける細線の階調表現方法 |
| JP2000252250A (ja) * | 1999-02-26 | 2000-09-14 | Mitsubishi Gas Chem Co Inc | 半導体基板洗浄液およびそれを用いた半導体基板の洗浄方法 |
| JP4516176B2 (ja) | 1999-04-20 | 2010-08-04 | 関東化学株式会社 | 電子材料用基板洗浄液 |
| US6395693B1 (en) * | 1999-09-27 | 2002-05-28 | Cabot Microelectronics Corporation | Cleaning solution for semiconductor surfaces following chemical-mechanical polishing |
| AU2001241190A1 (en) * | 2000-03-21 | 2001-10-03 | Wako Pure Chemical Industries, Ltd. | Semiconductor wafer cleaning agent and cleaning method |
| JP2002069495A (ja) * | 2000-06-16 | 2002-03-08 | Kao Corp | 洗浄剤組成物 |
| KR100867287B1 (ko) * | 2000-06-16 | 2008-11-06 | 카오카부시키가이샤 | 세정제 조성물 |
| US6599370B2 (en) * | 2000-10-16 | 2003-07-29 | Mallinckrodt Inc. | Stabilized alkaline compositions for cleaning microelectronic substrates |
| JP2002257809A (ja) * | 2001-03-06 | 2002-09-11 | Nec Corp | テトラメチルアンモニウムハイドロオキサイドの検出方法および装置 |
| MY131912A (en) * | 2001-07-09 | 2007-09-28 | Avantor Performance Mat Inc | Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility |
| TWI297102B (en) * | 2001-08-03 | 2008-05-21 | Nec Electronics Corp | Removing composition |
| JP2003129089A (ja) * | 2001-10-24 | 2003-05-08 | Daikin Ind Ltd | 洗浄用組成物 |
| TWI276682B (en) * | 2001-11-16 | 2007-03-21 | Mitsubishi Chem Corp | Substrate surface cleaning liquid mediums and cleaning method |
| WO2003104900A2 (en) * | 2002-06-07 | 2003-12-18 | Mallinckrodt Baker Inc. | Microelectronic cleaning compositions containing oxidizers and organic solvents |
| JP2004042811A (ja) | 2002-07-12 | 2004-02-12 | Denso Corp | 車両用空調装置 |
| JP4752270B2 (ja) * | 2002-11-08 | 2011-08-17 | 和光純薬工業株式会社 | 洗浄液及びそれを用いた洗浄方法 |
| JP2005101479A (ja) * | 2002-11-08 | 2005-04-14 | Sumitomo Chemical Co Ltd | 半導体基板用洗浄液 |
| JP4485786B2 (ja) * | 2003-01-10 | 2010-06-23 | 関東化学株式会社 | 半導体基板用洗浄液 |
| TWI324362B (en) * | 2003-01-10 | 2010-05-01 | Kanto Kagaku | Cleaning solution for semiconductor substrate |
| WO2004094581A1 (en) * | 2003-04-18 | 2004-11-04 | Ekc Technology, Inc. | Aqueous fluoride compositions for cleaning semiconductor devices |
| JP2005060660A (ja) * | 2003-07-31 | 2005-03-10 | Sumitomo Chemical Co Ltd | 半導体基板用洗浄液 |
| US20050205835A1 (en) * | 2004-03-19 | 2005-09-22 | Tamboli Dnyanesh C | Alkaline post-chemical mechanical planarization cleaning compositions |
| JP4628209B2 (ja) * | 2004-11-18 | 2011-02-09 | 花王株式会社 | 剥離剤組成物 |
| TWI282363B (en) * | 2005-05-19 | 2007-06-11 | Epoch Material Co Ltd | Aqueous cleaning composition for semiconductor copper processing |
| SG162725A1 (en) | 2005-05-26 | 2010-07-29 | Advanced Tech Materials | Copper passivating post-chemical mechanical polishing cleaning composition and method of use |
| JP5192952B2 (ja) | 2007-09-14 | 2013-05-08 | 三洋化成工業株式会社 | 磁気ディスク基板用洗浄剤 |
| JP5192953B2 (ja) | 2007-09-14 | 2013-05-08 | 三洋化成工業株式会社 | 磁気ディスク用ガラス基板洗浄剤 |
| JP2009194049A (ja) * | 2008-02-13 | 2009-08-27 | Sanyo Chem Ind Ltd | 銅配線半導体用洗浄剤 |
| JP5553985B2 (ja) * | 2008-12-11 | 2014-07-23 | 三洋化成工業株式会社 | 電子材料用洗浄剤 |
| JP5410943B2 (ja) | 2008-12-18 | 2014-02-05 | 三洋化成工業株式会社 | 電子材料用洗浄剤 |
| US8765653B2 (en) | 2009-07-07 | 2014-07-01 | Air Products And Chemicals, Inc. | Formulations and method for post-CMP cleaning |
| US8148310B2 (en) * | 2009-10-24 | 2012-04-03 | Wai Mun Lee | Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid |
| US8148311B2 (en) * | 2009-10-24 | 2012-04-03 | Wai Mun Lee | Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid |
| JP5401359B2 (ja) * | 2010-02-16 | 2014-01-29 | 花王株式会社 | 硬質表面用アルカリ洗浄剤組成物 |
-
2011
- 2011-12-06 JP JP2011267368A patent/JP6066552B2/ja active Active
-
2012
- 2012-11-23 MY MYPI2012005069A patent/MY165726A/en unknown
- 2012-12-04 EP EP12195375.6A patent/EP2602309B1/en active Active
- 2012-12-05 CN CN2012105179042A patent/CN103146509A/zh active Pending
- 2012-12-05 KR KR1020120140462A patent/KR102041624B1/ko active Active
- 2012-12-05 US US13/705,575 patent/US9334470B2/en active Active
- 2012-12-06 TW TW101145895A patent/TWI565797B/zh active
- 2012-12-06 SG SG2012089926A patent/SG191504A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWI565797B (zh) | 2017-01-11 |
| US9334470B2 (en) | 2016-05-10 |
| JP6066552B2 (ja) | 2017-01-25 |
| JP2013119579A (ja) | 2013-06-17 |
| US20130143785A1 (en) | 2013-06-06 |
| CN103146509A (zh) | 2013-06-12 |
| TW201336985A (zh) | 2013-09-16 |
| KR20130063474A (ko) | 2013-06-14 |
| EP2602309A1 (en) | 2013-06-12 |
| EP2602309B1 (en) | 2017-05-03 |
| SG191504A1 (en) | 2013-07-31 |
| KR102041624B1 (ko) | 2019-11-06 |
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