KR970059320A - 단결정 인상 장치 - Google Patents
단결정 인상 장치 Download PDFInfo
- Publication number
- KR970059320A KR970059320A KR1019970000591A KR19970000591A KR970059320A KR 970059320 A KR970059320 A KR 970059320A KR 1019970000591 A KR1019970000591 A KR 1019970000591A KR 19970000591 A KR19970000591 A KR 19970000591A KR 970059320 A KR970059320 A KR 970059320A
- Authority
- KR
- South Korea
- Prior art keywords
- crucible
- single crystal
- crystal pulling
- semiconductor melt
- raw material
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
- C30B15/12—Double crucible methods
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1052—Seed pulling including a sectioned crucible [e.g., double crucible, baffle]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1056—Seed pulling including details of precursor replenishment
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
본 발명은, 기체 기밀 용기와, 하부 모서리에 연결되는 외부 도가니 및 내부 도가니를 갖는 상기 기밀 용기 내부에 반도체 용융물을 저장하기 위한 이중 도가니와, 상기 외부 도가니 및 내부 도가니 사이의 위치에서 원재료를 상기 반도체 용융물에 부가하기 위한 원재료 공급 수단을 구비한 단결정 인상 장치에 관한 것으로, 본 장치의 유동 제한 부재는 반도체 용융물의 유동을 제한하기 위해 외부 도가니 및 내부 도가니 사이의 반도체 용융물 영역 내부에 구비되는 것을 특징으로 한다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 제1실시예의 필수 구성 요소의 단면도.
Claims (5)
- 기체 기밀 용기와, 하부 모서리에서 연결되는 외부 도가니 및 내부 도가니를 갖는 상기 기밀 용기 내부에 반도체 용융물을 저장하기 위한 이중 도가니와, 상기 외부 도가니 및 내부 도가니 사이의 위치에서 원재료를 상기 반도체 용융물에 부가하기 위한 원재료 공급 수단을 구비한 단결정 인상 장치에 있어서, 유동 제한 부재는 반도체 용융물의 유동을 제한하기 위해 외부 도가니 및 내부 도가니 사이의 반도체 용융물 영역 내부에 구비되는 것을 특징으로 하는 단결정 인상 장치.
- 제1항에 있어서, 상기 유동 제한 부재는 상기 내부 도가니 및 외부 도가니 사이의 영역에서 상기 반도체 용융물 내의 대류 흐름을 제한하는 대류 흐름 제한 부재인 것을 특징으로 하는 단결정 인상 장치.
- 제2항에 있어서, 상기 유동 제한 부재는 원재료 투입 지점으로부터 하부 모서리 연결부로 이어지는 상기 외부 도가니 및 내부 도가니 사이의 통로를 길게 하도록 배치되는 것을 특징으로 하는 단결정 인상 장치.
- 제1항 또는 제2항에 있어서, 상기 유동 제한 부재는 상기 외부 도가니(11) 및 내부 도가니(12)와 중심이 일치하는 링 형태로 형성되고 상기 반도체 용융물의 표면에 수평 방향으로 배치되는 배츨 판인 것을 특징으로 하는 단결정 인상 장치.
- 제4항에 있어서, 상기 배플 판은 상기 원재료 공급 수단의 하부에 배치되고, 상기 원재료 공급 수단에 의해 지지되는 것을 특징으로 하는 단결정 인상 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP96-004408 | 1996-01-12 | ||
JP00440896A JP3769800B2 (ja) | 1996-01-12 | 1996-01-12 | 単結晶引上装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970059320A true KR970059320A (ko) | 1997-08-12 |
KR100439132B1 KR100439132B1 (ko) | 2004-08-25 |
Family
ID=11583501
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970000591A KR100439132B1 (ko) | 1996-01-12 | 1997-01-11 | 단결정인상장치 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5871581A (ko) |
JP (1) | JP3769800B2 (ko) |
KR (1) | KR100439132B1 (ko) |
CN (1) | CN1134560C (ko) |
DE (1) | DE19700516B4 (ko) |
TW (1) | TW531571B (ko) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE60013451T2 (de) * | 1999-05-22 | 2005-10-13 | Japan Science And Technology Agency, Kawaguchi | Verfahren und vorrichtung zur herstellung von hochqualitativen einkristallen |
WO2003038161A1 (en) * | 2001-11-01 | 2003-05-08 | Midwest Research Institute | Shallow melt apparatus for semicontinuous czochralski crystal growth |
US6984263B2 (en) * | 2001-11-01 | 2006-01-10 | Midwest Research Institute | Shallow melt apparatus for semicontinuous czochralski crystal growth |
DE10204178B4 (de) | 2002-02-01 | 2008-01-03 | Siltronic Ag | Verfahren und Vorrichtung zum Herstellen eines Einkristalls aus Halbleitermaterial |
US8021483B2 (en) * | 2002-02-20 | 2011-09-20 | Hemlock Semiconductor Corporation | Flowable chips and methods for the preparation and use of same, and apparatus for use in the methods |
US6959355B2 (en) * | 2003-02-24 | 2005-10-25 | Standard Microsystems Corporation | Universal serial bus hub with shared high speed handler |
CN1314841C (zh) * | 2004-12-03 | 2007-05-09 | 中国科学院上海硅酸盐研究所 | 坩埚升降法补充熔料生长晶体的装置和方法 |
JP4500186B2 (ja) * | 2005-03-07 | 2010-07-14 | 株式会社リコー | Iii族窒化物結晶成長装置 |
US9464364B2 (en) * | 2011-11-09 | 2016-10-11 | Varian Semiconductor Equipment Associates, Inc. | Thermal load leveling during silicon crystal growth from a melt using anisotropic materials |
US20140144371A1 (en) * | 2012-11-29 | 2014-05-29 | Solaicx, Inc. | Heat Shield For Improved Continuous Czochralski Process |
US9863063B2 (en) * | 2012-12-18 | 2018-01-09 | Corner Star Limited | Weir for inhibiting melt flow in a crucible |
JP2016505503A (ja) * | 2012-12-21 | 2016-02-25 | サンエディソン・インコーポレイテッドSunEdison,Inc. | シリカパーツを接合するための方法 |
CN103225108B (zh) * | 2013-04-07 | 2016-04-06 | 福建福晶科技股份有限公司 | 一种大尺寸bbo晶体快速生长的方法 |
CN104342750A (zh) * | 2013-08-08 | 2015-02-11 | 徐州协鑫太阳能材料有限公司 | 石英坩埚及其制备方法 |
US9822466B2 (en) * | 2013-11-22 | 2017-11-21 | Corner Star Limited | Crystal growing systems and crucibles for enhancing heat transfer to a melt |
US10415151B1 (en) * | 2014-03-27 | 2019-09-17 | Varian Semiconductor Equipment Associates, Inc | Apparatus for controlling heat flow within a silicon melt |
KR101599338B1 (ko) * | 2014-05-13 | 2016-03-03 | 웅진에너지 주식회사 | Ccz용 이중도가니 |
US10221500B2 (en) * | 2017-01-04 | 2019-03-05 | Corner Star Limited | System for forming an ingot including crucible and conditioning members |
CN108301038A (zh) * | 2017-01-12 | 2018-07-20 | 新疆知信科技有限公司 | 一种单晶硅提拉炉和生长单晶硅的拉制方法 |
US10407797B2 (en) * | 2017-05-04 | 2019-09-10 | Corner Start Limited | Crystal pulling system and method including crucible and barrier |
KR20210150510A (ko) | 2019-04-11 | 2021-12-10 | 글로벌웨이퍼스 씨오., 엘티디. | 말기 본체 길이에서 감소된 왜곡을 갖는 잉곳을 준비하기 위한 프로세스 |
CN109972200B (zh) * | 2019-04-18 | 2020-08-14 | 邢台晶龙电子材料有限公司 | 连续提拉单晶硅生长方法 |
SG11202111451WA (en) | 2019-04-18 | 2021-11-29 | Globalwafers Co Ltd | Methods for growing a single crystal silicon ingot using continuous czochralski method |
CN110029395A (zh) * | 2019-04-18 | 2019-07-19 | 邢台晶龙电子材料有限公司 | Ccz连续拉晶坩埚及涂层方法 |
JP7216340B2 (ja) * | 2019-09-06 | 2023-02-01 | 株式会社Sumco | シリコン単結晶の育成方法およびシリコン単結晶の引き上げ装置 |
US11111597B2 (en) | 2019-09-13 | 2021-09-07 | Globalwafers Co., Ltd. | Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method |
US11111596B2 (en) | 2019-09-13 | 2021-09-07 | Globalwafers Co., Ltd. | Single crystal silicon ingot having axial uniformity |
CN112210820A (zh) * | 2020-09-10 | 2021-01-12 | 徐州鑫晶半导体科技有限公司 | 晶体生产工艺 |
CN112981519A (zh) * | 2021-03-16 | 2021-06-18 | 大连连城数控机器股份有限公司 | 用于连续单晶硅生长的石英坩埚及其制造方法和组合坩埚 |
Family Cites Families (15)
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JPS5957985A (ja) * | 1982-09-28 | 1984-04-03 | Fujitsu Ltd | 結晶成長用坩堝 |
JPS62128999A (ja) * | 1985-11-25 | 1987-06-11 | Sumitomo Electric Ind Ltd | 2重るつぼを用いた単結晶引上方法及び2重るつぼ |
USH520H (en) * | 1985-12-06 | 1988-09-06 | Technique for increasing oxygen incorporation during silicon czochralski crystal growth | |
JP2755588B2 (ja) * | 1988-02-22 | 1998-05-20 | 株式会社東芝 | 結晶引上げ方法 |
JPH0255287A (ja) * | 1988-08-18 | 1990-02-23 | Furukawa Electric Co Ltd:The | 単結晶成長装置 |
JPH0676274B2 (ja) * | 1988-11-11 | 1994-09-28 | 東芝セラミックス株式会社 | シリコン単結晶の製造装置 |
JPH0688869B2 (ja) * | 1989-01-05 | 1994-11-09 | 川崎製鉄株式会社 | 単結晶引上装置 |
JPH02243587A (ja) * | 1989-03-17 | 1990-09-27 | Kawasaki Steel Corp | 単結晶の引上方法およびその装置 |
JPH0372778A (ja) * | 1989-08-11 | 1991-03-27 | Fuji Xerox Co Ltd | 画像処理装置の領域識別方式 |
JPH03177393A (ja) * | 1989-12-06 | 1991-08-01 | Nippon Steel Corp | 単結晶の製造装置 |
JPH03199192A (ja) * | 1989-12-27 | 1991-08-30 | Toshiba Corp | シリコン単結晶引上げ用ルツボ |
US5314667A (en) * | 1991-03-04 | 1994-05-24 | Lim John C | Method and apparatus for single crystal silicon production |
JPH05310495A (ja) * | 1992-04-28 | 1993-11-22 | Nkk Corp | シリコン単結晶の製造方法および製造装置 |
JPH06135791A (ja) * | 1992-10-27 | 1994-05-17 | Sumitomo Electric Ind Ltd | 半導体単結晶の育成装置 |
US5650008A (en) * | 1995-12-01 | 1997-07-22 | Advanced Materials Processing, Llc | Method for preparing homogeneous bridgman-type single crystals |
-
1996
- 1996-01-12 JP JP00440896A patent/JP3769800B2/ja not_active Expired - Lifetime
- 1996-12-21 TW TW085115857A patent/TW531571B/zh not_active IP Right Cessation
-
1997
- 1997-01-09 DE DE19700516.0A patent/DE19700516B4/de not_active Expired - Fee Related
- 1997-01-10 US US08/781,841 patent/US5871581A/en not_active Expired - Lifetime
- 1997-01-10 CN CNB97101020XA patent/CN1134560C/zh not_active Expired - Fee Related
- 1997-01-11 KR KR1019970000591A patent/KR100439132B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN1160779A (zh) | 1997-10-01 |
CN1134560C (zh) | 2004-01-14 |
JPH09194288A (ja) | 1997-07-29 |
JP3769800B2 (ja) | 2006-04-26 |
DE19700516B4 (de) | 2014-03-13 |
US5871581A (en) | 1999-02-16 |
DE19700516A1 (de) | 1997-07-17 |
KR100439132B1 (ko) | 2004-08-25 |
TW531571B (en) | 2003-05-11 |
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