KR960019102U - 웨이퍼 세척장치 - Google Patents
웨이퍼 세척장치Info
- Publication number
- KR960019102U KR960019102U KR2019940029209U KR19940029209U KR960019102U KR 960019102 U KR960019102 U KR 960019102U KR 2019940029209 U KR2019940029209 U KR 2019940029209U KR 19940029209 U KR19940029209 U KR 19940029209U KR 960019102 U KR960019102 U KR 960019102U
- Authority
- KR
- South Korea
- Prior art keywords
- cleaning device
- wafer cleaning
- wafer
- cleaning
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Dicing (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940029209U KR0125238Y1 (ko) | 1994-11-04 | 1994-11-04 | 웨이퍼 세척장치 |
JP7217288A JPH08139065A (ja) | 1994-11-04 | 1995-08-25 | ウェーハ洗浄装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940029209U KR0125238Y1 (ko) | 1994-11-04 | 1994-11-04 | 웨이퍼 세척장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960019102U true KR960019102U (ko) | 1996-06-19 |
KR0125238Y1 KR0125238Y1 (ko) | 1999-02-18 |
Family
ID=19397378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019940029209U KR0125238Y1 (ko) | 1994-11-04 | 1994-11-04 | 웨이퍼 세척장치 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH08139065A (ko) |
KR (1) | KR0125238Y1 (ko) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101255048B1 (ko) | 2005-04-01 | 2013-04-16 | 에프에스아이 인터내쇼날 인크. | 하나 이상의 처리 유체를 이용하여 마이크로일렉트로닉 워크피이스를 처리하는데 이용되는 장치용 배리어 구조 및 노즐 장치 |
KR101191337B1 (ko) | 2006-07-07 | 2012-10-16 | 에프에스아이 인터내쇼날 인크. | 하나 이상의 처리 유체로 마이크로일렉트로닉 워크피스를 처리하는데 사용되는 장치용 배리어 구조물 및 노즐장치 |
JP5312923B2 (ja) * | 2008-01-31 | 2013-10-09 | 大日本スクリーン製造株式会社 | 基板処理装置 |
JP5705723B2 (ja) | 2008-05-09 | 2015-04-22 | テル エフエスアイ インコーポレイテッド | 操作において開モードと閉モードとの切り替えを簡単に行う加工チェンバ設計を用いてマイクロ電子加工品を加工するための道具および方法 |
CN107743572B (zh) | 2015-06-08 | 2021-03-30 | 株式会社高迎科技 | 湿空气形成装置、包括其的检查装置及检查方法 |
CN114210631B (zh) * | 2021-12-14 | 2023-04-18 | 中国电建集团贵阳勘测设计研究院有限公司 | 一种水电站裂隙冲洗设备 |
-
1994
- 1994-11-04 KR KR2019940029209U patent/KR0125238Y1/ko not_active IP Right Cessation
-
1995
- 1995-08-25 JP JP7217288A patent/JPH08139065A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
KR0125238Y1 (ko) | 1999-02-18 |
JPH08139065A (ja) | 1996-05-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20080527 Year of fee payment: 11 |
|
LAPS | Lapse due to unpaid annual fee |