KR0151012B1
(ko)
*
|
1994-11-30 |
1998-10-01 |
김광호 |
매몰 비트라인 디램 셀 및 제조방법
|
US5893735A
(en)
*
|
1996-02-22 |
1999-04-13 |
Siemens Aktiengesellschaft |
Three-dimensional device layout with sub-groundrule features
|
US5792685A
(en)
*
|
1996-02-22 |
1998-08-11 |
Siemens Aktiengesellschaft |
Three-dimensional device layout having a trench capacitor
|
KR100239414B1
(ko)
*
|
1996-11-07 |
2000-01-15 |
김영환 |
반도체 소자의 제조방법
|
SE520115C2
(sv)
*
|
1997-03-26 |
2003-05-27 |
Ericsson Telefon Ab L M |
Diken med plan ovansida
|
US5953607A
(en)
*
|
1997-06-06 |
1999-09-14 |
International Business Machines Corporation |
Buried strap for trench storage capacitors in dram trench cells
|
US6100131A
(en)
*
|
1997-06-11 |
2000-08-08 |
Siemens Aktiengesellschaft |
Method of fabricating a random access memory cell
|
US6389063B1
(en)
*
|
1997-10-31 |
2002-05-14 |
Hitachi, Ltd. |
Signal transmission apparatus using an isolator, modem, and information processor
|
US5943581A
(en)
*
|
1997-11-05 |
1999-08-24 |
Vanguard International Semiconductor Corporation |
Method of fabricating a buried reservoir capacitor structure for high-density dynamic random access memory (DRAM) circuits
|
US6124141A
(en)
*
|
1998-01-07 |
2000-09-26 |
International Business Machines Corporation |
Non-destructive method and device for measuring the depth of a buried interface
|
US6190955B1
(en)
|
1998-01-27 |
2001-02-20 |
International Business Machines Corporation |
Fabrication of trench capacitors using disposable hard mask
|
KR100652909B1
(ko)
*
|
1998-03-06 |
2006-12-01 |
에이에스엠 아메리카, 인코포레이티드 |
하이 스텝 커버리지를 갖는 실리콘 증착 방법
|
US6261908B1
(en)
*
|
1998-07-27 |
2001-07-17 |
Advanced Micro Devices, Inc. |
Buried local interconnect
|
US6074909A
(en)
*
|
1998-07-31 |
2000-06-13 |
Siemens Aktiengesellschaft |
Apparatus and method for forming controlled deep trench top isolation layers
|
US6177289B1
(en)
*
|
1998-12-04 |
2001-01-23 |
International Business Machines Corporation |
Lateral trench optical detectors
|
US6190971B1
(en)
*
|
1999-05-13 |
2001-02-20 |
International Business Machines Corporation |
Formation of 5F2 cell with partially vertical transistor and gate conductor aligned buried strap with raised shallow trench isolation region
|
US6232170B1
(en)
|
1999-06-16 |
2001-05-15 |
International Business Machines Corporation |
Method of fabricating trench for SOI merged logic DRAM
|
US6229173B1
(en)
|
1999-06-23 |
2001-05-08 |
International Business Machines Corporation |
Hybrid 5F2 cell layout for buried surface strap aligned to vertical transistor
|
US6096580A
(en)
*
|
1999-09-24 |
2000-08-01 |
International Business Machines Corporation |
Low programming voltage anti-fuse
|
US6566177B1
(en)
*
|
1999-10-25 |
2003-05-20 |
International Business Machines Corporation |
Silicon-on-insulator vertical array device trench capacitor DRAM
|
US6396121B1
(en)
*
|
2000-05-31 |
2002-05-28 |
International Business Machines Corporation |
Structures and methods of anti-fuse formation in SOI
|
US6573137B1
(en)
*
|
2000-06-23 |
2003-06-03 |
International Business Machines Corporation |
Single sided buried strap
|
US6538299B1
(en)
|
2000-10-03 |
2003-03-25 |
International Business Machines Corporation |
Silicon-on-insulator (SOI) trench photodiode
|
US6555891B1
(en)
*
|
2000-10-17 |
2003-04-29 |
International Business Machines Corporation |
SOI hybrid structure with selective epitaxial growth of silicon
|
US7822969B2
(en)
*
|
2001-04-16 |
2010-10-26 |
Digimarc Corporation |
Watermark systems and methods
|
TW540154B
(en)
*
|
2001-06-04 |
2003-07-01 |
Promos Technologies Inc |
Deep trench capacitor structure and its manufacturing method
|
DE10128193C1
(de)
*
|
2001-06-11 |
2003-01-30 |
Infineon Technologies Ag |
Ein-Transistor-Speicherzellenanordnung und Verfahren zu deren Herstellung
|
TWI230392B
(en)
*
|
2001-06-18 |
2005-04-01 |
Innovative Silicon Sa |
Semiconductor device
|
US6610573B2
(en)
*
|
2001-06-22 |
2003-08-26 |
Infineon Technologies Ag |
Method for forming a single wiring level for transistors with planar and vertical gates on the same substrate
|
US6620676B2
(en)
*
|
2001-06-29 |
2003-09-16 |
International Business Machines Corporation |
Structure and methods for process integration in vertical DRAM cell fabrication
|
CN1181559C
(zh)
*
|
2001-11-21 |
2004-12-22 |
同济大学 |
一种半导体器件
|
US6885080B2
(en)
*
|
2002-02-22 |
2005-04-26 |
International Business Machines Corporation |
Deep trench isolation of embedded DRAM for improved latch-up immunity
|
EP1357603A3
(en)
|
2002-04-18 |
2004-01-14 |
Innovative Silicon SA |
Semiconductor device
|
EP1355316B1
(en)
*
|
2002-04-18 |
2007-02-21 |
Innovative Silicon SA |
Data storage device and refreshing method for use with such device
|
KR100473476B1
(ko)
|
2002-07-04 |
2005-03-10 |
삼성전자주식회사 |
반도체 장치 및 그 제조방법
|
DE10232938B4
(de)
*
|
2002-07-19 |
2005-05-04 |
Infineon Technologies Ag |
Verfahren zur Herstellung einer vergrabenen Bitleitung für einen Halbleiterspeicher
|
DE10256973B4
(de)
*
|
2002-12-05 |
2006-09-28 |
Infineon Technologies Ag |
Integrierter Halbleiterspeicher mit einem an einem Steg ausgebildeten Auswahltransistor
|
US7085153B2
(en)
*
|
2003-05-13 |
2006-08-01 |
Innovative Silicon S.A. |
Semiconductor memory cell, array, architecture and device, and method of operating same
|
US6912150B2
(en)
*
|
2003-05-13 |
2005-06-28 |
Lionel Portman |
Reference current generator, and method of programming, adjusting and/or operating same
|
US20040228168A1
(en)
*
|
2003-05-13 |
2004-11-18 |
Richard Ferrant |
Semiconductor memory device and method of operating same
|
US7335934B2
(en)
*
|
2003-07-22 |
2008-02-26 |
Innovative Silicon S.A. |
Integrated circuit device, and method of fabricating same
|
US7184298B2
(en)
*
|
2003-09-24 |
2007-02-27 |
Innovative Silicon S.A. |
Low power programming technique for a floating body memory transistor, memory cell, and memory array
|
WO2005059955A2
(en)
*
|
2003-11-18 |
2005-06-30 |
Halliburton Energy Services |
A high temperature memory device
|
CA2543909C
(en)
*
|
2003-11-18 |
2012-01-31 |
Halliburton Energy Services, Inc. |
High temperature electronic devices
|
US7442932B2
(en)
*
|
2003-11-18 |
2008-10-28 |
Halliburton Energy Services, Inc. |
High temperature imaging device
|
US7476939B2
(en)
*
|
2004-11-04 |
2009-01-13 |
Innovative Silicon Isi Sa |
Memory cell having an electrically floating body transistor and programming technique therefor
|
US7251164B2
(en)
*
|
2004-11-10 |
2007-07-31 |
Innovative Silicon S.A. |
Circuitry for and method of improving statistical distribution of integrated circuits
|
US7301838B2
(en)
*
|
2004-12-13 |
2007-11-27 |
Innovative Silicon S.A. |
Sense amplifier circuitry and architecture to write data into and/or read from memory cells
|
US7301803B2
(en)
*
|
2004-12-22 |
2007-11-27 |
Innovative Silicon S.A. |
Bipolar reading technique for a memory cell having an electrically floating body transistor
|
US7485910B2
(en)
*
|
2005-04-08 |
2009-02-03 |
International Business Machines Corporation |
Simplified vertical array device DRAM/eDRAM integration: method and structure
|
US20070023833A1
(en)
*
|
2005-07-28 |
2007-02-01 |
Serguei Okhonin |
Method for reading a memory cell having an electrically floating body transistor, and memory cell and array implementing same
|
US7606066B2
(en)
*
|
2005-09-07 |
2009-10-20 |
Innovative Silicon Isi Sa |
Memory cell and memory cell array having an electrically floating body transistor, and methods of operating same
|
US7227233B2
(en)
*
|
2005-09-12 |
2007-06-05 |
International Business Machines Corporation |
Silicon-on-insulator (SOI) Read Only Memory (ROM) array and method of making a SOI ROM
|
US7355916B2
(en)
|
2005-09-19 |
2008-04-08 |
Innovative Silicon S.A. |
Method and circuitry to generate a reference current for reading a memory cell, and device implementing same
|
US20070085140A1
(en)
*
|
2005-10-19 |
2007-04-19 |
Cedric Bassin |
One transistor memory cell having strained electrically floating body region, and method of operating same
|
US7683430B2
(en)
*
|
2005-12-19 |
2010-03-23 |
Innovative Silicon Isi Sa |
Electrically floating body memory cell and array, and method of operating or controlling same
|
US7542345B2
(en)
*
|
2006-02-16 |
2009-06-02 |
Innovative Silicon Isi Sa |
Multi-bit memory cell having electrically floating body transistor, and method of programming and reading same
|
US7492632B2
(en)
*
|
2006-04-07 |
2009-02-17 |
Innovative Silicon Isi Sa |
Memory array having a programmable word length, and method of operating same
|
US7606098B2
(en)
|
2006-04-18 |
2009-10-20 |
Innovative Silicon Isi Sa |
Semiconductor memory array architecture with grouped memory cells, and method of controlling same
|
TWI302354B
(en)
*
|
2006-04-19 |
2008-10-21 |
Promos Technologies Inc |
A trench step channel cell transistor and manufacture method thereof
|
WO2007128738A1
(en)
|
2006-05-02 |
2007-11-15 |
Innovative Silicon Sa |
Semiconductor memory cell and array using punch-through to program and read same
|
US8069377B2
(en)
|
2006-06-26 |
2011-11-29 |
Micron Technology, Inc. |
Integrated circuit having memory array including ECC and column redundancy and method of operating the same
|
US7542340B2
(en)
*
|
2006-07-11 |
2009-06-02 |
Innovative Silicon Isi Sa |
Integrated circuit including memory array having a segmented bit line architecture and method of controlling and/or operating same
|
KR101406604B1
(ko)
|
2007-01-26 |
2014-06-11 |
마이크론 테크놀로지, 인코포레이티드 |
게이트형 바디 영역으로부터 격리되는 소스/드레인 영역을 포함하는 플로팅-바디 dram 트랜지스터
|
WO2009031052A2
(en)
|
2007-03-29 |
2009-03-12 |
Innovative Silicon S.A. |
Zero-capacitor (floating body) random access memory circuits with polycide word lines and manufacturing methods therefor
|
US8064274B2
(en)
|
2007-05-30 |
2011-11-22 |
Micron Technology, Inc. |
Integrated circuit having voltage generation circuitry for memory cell array, and method of operating and/or controlling same
|
US8085594B2
(en)
|
2007-06-01 |
2011-12-27 |
Micron Technology, Inc. |
Reading technique for memory cell with electrically floating body transistor
|
WO2009039169A1
(en)
|
2007-09-17 |
2009-03-26 |
Innovative Silicon S.A. |
Refreshing data of memory cells with electrically floating body transistors
|
US8536628B2
(en)
|
2007-11-29 |
2013-09-17 |
Micron Technology, Inc. |
Integrated circuit having memory cell array including barriers, and method of manufacturing same
|
US8349662B2
(en)
*
|
2007-12-11 |
2013-01-08 |
Micron Technology, Inc. |
Integrated circuit having memory cell array, and method of manufacturing same
|
US20090159947A1
(en)
*
|
2007-12-19 |
2009-06-25 |
International Business Machines Corporation |
SIMPLIFIED VERTICAL ARRAY DEVICE DRAM/eDRAM INTEGRATION
|
US8773933B2
(en)
|
2012-03-16 |
2014-07-08 |
Micron Technology, Inc. |
Techniques for accessing memory cells
|
US8014195B2
(en)
|
2008-02-06 |
2011-09-06 |
Micron Technology, Inc. |
Single transistor memory cell
|
US8189376B2
(en)
|
2008-02-08 |
2012-05-29 |
Micron Technology, Inc. |
Integrated circuit having memory cells including gate material having high work function, and method of manufacturing same
|
US7749835B2
(en)
*
|
2008-03-14 |
2010-07-06 |
International Business Machines Corporation |
Trench memory with self-aligned strap formed by self-limiting process
|
US7957206B2
(en)
|
2008-04-04 |
2011-06-07 |
Micron Technology, Inc. |
Read circuitry for an integrated circuit having memory cells and/or a memory cell array, and method of operating same
|
US20090251960A1
(en)
*
|
2008-04-07 |
2009-10-08 |
Halliburton Energy Services, Inc. |
High temperature memory device
|
US7947543B2
(en)
*
|
2008-09-25 |
2011-05-24 |
Micron Technology, Inc. |
Recessed gate silicon-on-insulator floating body device with self-aligned lateral isolation
|
US7933140B2
(en)
|
2008-10-02 |
2011-04-26 |
Micron Technology, Inc. |
Techniques for reducing a voltage swing
|
US7924630B2
(en)
*
|
2008-10-15 |
2011-04-12 |
Micron Technology, Inc. |
Techniques for simultaneously driving a plurality of source lines
|
US8223574B2
(en)
|
2008-11-05 |
2012-07-17 |
Micron Technology, Inc. |
Techniques for block refreshing a semiconductor memory device
|
US8213226B2
(en)
*
|
2008-12-05 |
2012-07-03 |
Micron Technology, Inc. |
Vertical transistor memory cell and array
|
US8319294B2
(en)
*
|
2009-02-18 |
2012-11-27 |
Micron Technology, Inc. |
Techniques for providing a source line plane
|
US8710566B2
(en)
|
2009-03-04 |
2014-04-29 |
Micron Technology, Inc. |
Techniques for forming a contact to a buried diffusion layer in a semiconductor memory device
|
US8748959B2
(en)
*
|
2009-03-31 |
2014-06-10 |
Micron Technology, Inc. |
Semiconductor memory device
|
US8139418B2
(en)
|
2009-04-27 |
2012-03-20 |
Micron Technology, Inc. |
Techniques for controlling a direct injection semiconductor memory device
|
US8508994B2
(en)
|
2009-04-30 |
2013-08-13 |
Micron Technology, Inc. |
Semiconductor device with floating gate and electrically floating body
|
US8498157B2
(en)
|
2009-05-22 |
2013-07-30 |
Micron Technology, Inc. |
Techniques for providing a direct injection semiconductor memory device
|
US8537610B2
(en)
|
2009-07-10 |
2013-09-17 |
Micron Technology, Inc. |
Techniques for providing a semiconductor memory device
|
US9076543B2
(en)
|
2009-07-27 |
2015-07-07 |
Micron Technology, Inc. |
Techniques for providing a direct injection semiconductor memory device
|
US8199595B2
(en)
|
2009-09-04 |
2012-06-12 |
Micron Technology, Inc. |
Techniques for sensing a semiconductor memory device
|
US8174881B2
(en)
*
|
2009-11-24 |
2012-05-08 |
Micron Technology, Inc. |
Techniques for reducing disturbance in a semiconductor device
|
US8310893B2
(en)
|
2009-12-16 |
2012-11-13 |
Micron Technology, Inc. |
Techniques for reducing impact of array disturbs in a semiconductor memory device
|
US9059319B2
(en)
*
|
2010-01-25 |
2015-06-16 |
International Business Machines Corporation |
Embedded dynamic random access memory device and method
|
US8416636B2
(en)
*
|
2010-02-12 |
2013-04-09 |
Micron Technology, Inc. |
Techniques for controlling a semiconductor memory device
|
US8576631B2
(en)
|
2010-03-04 |
2013-11-05 |
Micron Technology, Inc. |
Techniques for sensing a semiconductor memory device
|
US8411513B2
(en)
|
2010-03-04 |
2013-04-02 |
Micron Technology, Inc. |
Techniques for providing a semiconductor memory device having hierarchical bit lines
|
US8369177B2
(en)
|
2010-03-05 |
2013-02-05 |
Micron Technology, Inc. |
Techniques for reading from and/or writing to a semiconductor memory device
|
CN102812552B
(zh)
|
2010-03-15 |
2015-11-25 |
美光科技公司 |
半导体存储器装置及用于对半导体存储器装置进行偏置的方法
|
US8411524B2
(en)
|
2010-05-06 |
2013-04-02 |
Micron Technology, Inc. |
Techniques for refreshing a semiconductor memory device
|
US8455875B2
(en)
|
2010-05-10 |
2013-06-04 |
International Business Machines Corporation |
Embedded DRAM for extremely thin semiconductor-on-insulator
|
CN102110716B
(zh)
*
|
2010-12-29 |
2014-03-05 |
电子科技大学 |
槽型半导体功率器件
|
US8531878B2
(en)
|
2011-05-17 |
2013-09-10 |
Micron Technology, Inc. |
Techniques for providing a semiconductor memory device
|
US9559216B2
(en)
|
2011-06-06 |
2017-01-31 |
Micron Technology, Inc. |
Semiconductor memory device and method for biasing same
|
US9837271B2
(en)
|
2014-07-18 |
2017-12-05 |
Asm Ip Holding B.V. |
Process for forming silicon-filled openings with a reduced occurrence of voids
|
US9443730B2
(en)
|
2014-07-18 |
2016-09-13 |
Asm Ip Holding B.V. |
Process for forming silicon-filled openings with a reduced occurrence of voids
|
US10460932B2
(en)
|
2017-03-31 |
2019-10-29 |
Asm Ip Holding B.V. |
Semiconductor device with amorphous silicon filled gaps and methods for forming
|