KR960005771A - 마그네트론스퍼터링장치 - Google Patents
마그네트론스퍼터링장치 Download PDFInfo
- Publication number
- KR960005771A KR960005771A KR1019950020093A KR19950020093A KR960005771A KR 960005771 A KR960005771 A KR 960005771A KR 1019950020093 A KR1019950020093 A KR 1019950020093A KR 19950020093 A KR19950020093 A KR 19950020093A KR 960005771 A KR960005771 A KR 960005771A
- Authority
- KR
- South Korea
- Prior art keywords
- target
- magnetron sputtering
- sputtering apparatus
- magnet
- ring
- Prior art date
Links
- 238000001755 magnetron sputter deposition Methods 0.000 title claims abstract 8
- 230000003628 erosive effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
본 발명은, 링형상의 평판타깃을 가진 마그네트론스퍼터링장치에 관한 것으로서, 타깃의 이용효율이 높고, 막두께분포의 경시변화가 적은 링형상타깃을 이용한 마그네트론스퍼터링장치를 제공하는 것을 특징으로 한 것이며, 그 구성에 있어서, 링형상의 평판의 타깃(2)을 가진 마그네트론스퍼터링장치에 있어서, 상기 타깃(2)의 내주연부를 따른 위치의 상기 타깃(2)의 표면쪽과 이면쪽에 각각 동일극성을 가진 자석(33),(31)을 배치하고, 상기 타깃의 외주연부를 따른 위치의 상기 타깃(2)의 표면쪽과 이면쪽에 각각 동일극성을 가진 자석(34),(32)을 배치하고, 상기 타깃(2)의 내주를 따라서 배치된 상기 자석과, 상기 타깃의 외주를 따라서 배치된 상기 자석과의 극성이 타깃(2)을 사이에 두고 반대의 관계가 되도록 정한 것을 특징으로 한 것이다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 실시예를 표시한 도면.
제2도는 동실시예에 있어서의 자장의 모양을 표시한 도면.
제3도는 동실시예의 타깃의 이용한계에 있어서의 침식면을 표시한 도면.
제4도는 동실시예의 타깃의 침식면의 경시변화를 표시한 도면.
제5도는 동실시예의 타깃의 침식면의 깊이의 경시변화를 표시한 도면.
제6도는 동실시예의 기판의 성막속도의 경시변화를 표시한 도면.
제7도는 동실시예의 기판의 막두께의 분포모양의 경시변화를 표시한 도면.
Claims (2)
- 링형상의 평판의 타깃을 가진 마그네트론스퍼터링장치에 있어서, 상기 타깃의 내주연부를 따른 위치의 상기 타깃의 표면쪽과 이면쪽에 각각 동일 극성을 가진 자석을 배치하고, 상기 타깃의 외주연부를 따른 위치의 상기 타깃의 표면쪽과 이면쪽에 각각 동일 극성을 가진 자석을 배치하고, 상기 타깃의 내주를 따라서 배치된 상기 자석과, 상기 타깃의 외주를 따라서 배치된 상기 자석과의 극성이 타깃을 사이에 두고 반대의 관계가 되도록 정한 것을 특징으로 하는 마그네트론스퍼터링장치.
- 제1항에 있어서, 타깃의 표면에서 자장의 방향이 타깃면에 평행으로 되는 점이 타깃의 반경방향에 2이상 존재하도록 각각의 자석의 강도를 조정한 것을 특징으로 하는 마그네트론스퍼터링장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP94-157531 | 1994-07-08 | ||
JP15753194 | 1994-07-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960005771A true KR960005771A (ko) | 1996-02-23 |
KR0165860B1 KR0165860B1 (ko) | 1999-01-15 |
Family
ID=15651714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950020093A KR0165860B1 (ko) | 1994-07-08 | 1995-07-08 | 마그네트론스퍼터링장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5558749A (ko) |
KR (1) | KR0165860B1 (ko) |
CN (1) | CN1067118C (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9631271B2 (en) | 2013-07-25 | 2017-04-25 | Samsung Display Co., Ltd. | Sputtering system and method of fabricating display device using the same |
Families Citing this family (28)
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DE19643841A1 (de) * | 1996-10-30 | 1998-05-07 | Balzers Prozess Systeme Gmbh | Vorrichtung zum Beschichten von Substraten, insbesondere mit magnetisierbaren Werkstoffen |
US6569294B1 (en) * | 1999-07-15 | 2003-05-27 | Seagate Technology Llc | Sputtering target assembly and method for depositing a thickness gradient layer with narrow transition zone |
US6468405B1 (en) * | 1999-07-15 | 2002-10-22 | Seagate Technology Llc | Sputtering target assembly and method for depositing a thickness gradient layer with narrow transition zone |
US6402903B1 (en) | 2000-02-04 | 2002-06-11 | Steag Hamatech Ag | Magnetic array for sputtering system |
TWI229138B (en) * | 2001-06-12 | 2005-03-11 | Unaxis Balzers Ag | Magnetron-sputtering source |
US6783638B2 (en) | 2001-09-07 | 2004-08-31 | Sputtered Films, Inc. | Flat magnetron |
US6824654B2 (en) * | 2002-10-01 | 2004-11-30 | Asml Holding N.V. | Method of making a cube |
US7485210B2 (en) * | 2004-10-07 | 2009-02-03 | International Business Machines Corporation | Sputtering target fixture |
WO2007046244A1 (ja) * | 2005-10-18 | 2007-04-26 | Ulvac, Inc. | スパッタリング装置 |
US20080083611A1 (en) * | 2006-10-06 | 2008-04-10 | Tegal Corporation | High-adhesive backside metallization |
TWI410511B (zh) * | 2007-03-16 | 2013-10-01 | Univ Tohoku Nat Univ Corp | 磁控管濺鍍裝置 |
JP5147083B2 (ja) * | 2007-03-30 | 2013-02-20 | 国立大学法人東北大学 | 回転マグネットスパッタ装置 |
CN101652499B (zh) * | 2007-04-06 | 2013-09-25 | 国立大学法人东北大学 | 磁控溅射装置 |
WO2008136130A1 (ja) * | 2007-04-24 | 2008-11-13 | Canon Anelva Corporation | プラズマ発生装置およびこれを用いた成膜方法並びに成膜装置 |
KR100978494B1 (ko) | 2007-10-01 | 2010-08-30 | 주식회사 서흥플라즈마 | 핫 캐소드를 이용하는 마그네트론 스퍼터링 장치 |
US8808513B2 (en) * | 2008-03-25 | 2014-08-19 | Oem Group, Inc | Stress adjustment in reactive sputtering |
US20090246385A1 (en) * | 2008-03-25 | 2009-10-01 | Tegal Corporation | Control of crystal orientation and stress in sputter deposited thin films |
US20100018857A1 (en) * | 2008-07-23 | 2010-01-28 | Seagate Technology Llc | Sputter cathode apparatus allowing thick magnetic targets |
JP5496223B2 (ja) * | 2008-12-26 | 2014-05-21 | フンダシオン テクニケル | アーク・エバポレーターおよびアーク・エバポレーターの操作方法 |
US8482375B2 (en) * | 2009-05-24 | 2013-07-09 | Oem Group, Inc. | Sputter deposition of cermet resistor films with low temperature coefficient of resistance |
KR101097329B1 (ko) * | 2010-01-11 | 2011-12-23 | 삼성모바일디스플레이주식회사 | 스퍼터링 장치 |
TW201137149A (en) * | 2010-04-21 | 2011-11-01 | Hon Hai Prec Ind Co Ltd | Magnetron sputtering device |
KR20120000317A (ko) * | 2010-06-25 | 2012-01-02 | 고려대학교 산학협력단 | 전자 물질막 형성 장치 |
US9605341B2 (en) * | 2013-03-06 | 2017-03-28 | Applied Materials, Inc. | Physical vapor deposition RF plasma shield deposit control |
US10283334B2 (en) * | 2014-08-22 | 2019-05-07 | Applied Materials, Inc. | Methods and apparatus for maintaining low non-uniformity over target life |
KR102018542B1 (ko) | 2017-03-02 | 2019-09-05 | 조연수 | 신발창과 일체화된 기능부를 가지는 신발 및 그 제조방법 |
CN108396299A (zh) * | 2018-06-06 | 2018-08-14 | 北京铂阳顶荣光伏科技有限公司 | 一种磁控溅射平面阴极 |
CN111996505B (zh) * | 2020-07-10 | 2023-07-14 | 包头稀土研究院 | 磁控溅射铁磁性靶材的装置 |
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US4378217A (en) * | 1979-07-30 | 1983-03-29 | Training Associates, Inc. | Terminal trainer keyboard and display apparatus for teaching keyboard operations and knowledge items |
JPS5952957B2 (ja) * | 1980-06-16 | 1984-12-22 | 日電アネルバ株式会社 | マグネトロン型スパッタ装置のカソ−ド部 |
US4385979A (en) * | 1982-07-09 | 1983-05-31 | Varian Associates, Inc. | Target assemblies of special materials for use in sputter coating apparatus |
JPS61187336A (ja) * | 1985-02-15 | 1986-08-21 | Mitsubishi Electric Corp | プラズマエッチング装置とエッチング方法 |
US5133858A (en) * | 1989-11-30 | 1992-07-28 | Layton Manufacturing Corporation | Reverse osmosis water purification apparatus |
CN1021062C (zh) * | 1990-02-27 | 1993-06-02 | 北京联合大学机械工程学院 | 新型电磁控阴极电弧源 |
DE4018914C1 (ko) * | 1990-06-13 | 1991-06-06 | Leybold Ag, 6450 Hanau, De | |
US5069722A (en) * | 1990-07-05 | 1991-12-03 | Murphy Patrick M | Cleaning zebramussels from water pipes |
US5106478A (en) * | 1990-12-06 | 1992-04-21 | Wolf Musow | Electrode wiper cleaning system |
DE4042286C1 (ko) * | 1990-12-31 | 1992-02-06 | Leybold Ag, 6450 Hanau, De | |
DE4135939A1 (de) * | 1991-10-31 | 1993-05-06 | Leybold Ag, 6450 Hanau, De | Zerstaeubungskathode |
-
1995
- 1995-06-29 CN CN95108052A patent/CN1067118C/zh not_active Expired - Fee Related
- 1995-07-07 US US08/499,194 patent/US5558749A/en not_active Expired - Fee Related
- 1995-07-08 KR KR1019950020093A patent/KR0165860B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9631271B2 (en) | 2013-07-25 | 2017-04-25 | Samsung Display Co., Ltd. | Sputtering system and method of fabricating display device using the same |
Also Published As
Publication number | Publication date |
---|---|
US5558749A (en) | 1996-09-24 |
KR0165860B1 (ko) | 1999-01-15 |
CN1120601A (zh) | 1996-04-17 |
CN1067118C (zh) | 2001-06-13 |
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