KR950021480A - 스위칭 소자 및 메모리 소자 - Google Patents

스위칭 소자 및 메모리 소자 Download PDF

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Publication number
KR950021480A
KR950021480A KR1019940035249A KR19940035249A KR950021480A KR 950021480 A KR950021480 A KR 950021480A KR 1019940035249 A KR1019940035249 A KR 1019940035249A KR 19940035249 A KR19940035249 A KR 19940035249A KR 950021480 A KR950021480 A KR 950021480A
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South Korea
Prior art keywords
dielectric
switching
switching element
switching device
ferroelectric
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KR1019940035249A
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English (en)
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마틴 울프 로날드
빌헬무스 마리아 브롬 파우루스
페트루스 카로루스 미카엘 크리즌 마셀리누스
Original Assignee
에프. 제이. 스미트
필립스 일렉트로닉스 엔.브이.
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Application filed by 에프. 제이. 스미트, 필립스 일렉트로닉스 엔.브이. filed Critical 에프. 제이. 스미트
Publication of KR950021480A publication Critical patent/KR950021480A/ko

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B53/00Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/36Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using diodes, e.g. as threshold elements, i.e. diodes assuming a stable ON-stage when driven above their threshold (S- or N-characteristic)
    • G11C11/38Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using diodes, e.g. as threshold elements, i.e. diodes assuming a stable ON-stage when driven above their threshold (S- or N-characteristic) using tunnel diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/872Schottky diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/88Tunnel-effect diodes

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Memories (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Non-Volatile Memory (AREA)

Abstract

본 발명은 그사이에 반도전성 유전체(3)를 가진 2개의 전극(1, 2)을 포함하되, 한 전극(2)은 반도전성 유전체 (3)와 소트키 접점을 형성하는 물질을 포함하고 있고, 쇼트키 접점의 공간 전하 영역(3')은 동작중인 전자에 대한 터널링 장벽을 형성하는 그런 스위칭 소자에 관한 것이다. 많은 응용기기에 있어서 보다 긴 주기동안 개방/폐쇄와 같은 일정한 스위칭 상태를 유지하는 것이 바람직하다. 스위칭 소자는 예를 들어 메모리 소자로서 사용될 수도 있다. 본 발명에 따른 스위칭 소자는 유전체(3)가 터널링 장벽의 규격에 영향을 주는 잔류분극을 가진 강유전성 물질을 포함하는 것을 특징으로 한다. 따라서 스위칭 소자가 유전체 (3)의 장류 분극에 따라 다양한 스위칭 상태를 갖게 된다. 이들 스위칭 상태는 유전체(3)의 분극이 변화될 때까지 유지된다.

Description

스위칭 소자 및 메모리 소자
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본 발명에 따른 스위칭 소자의 전류-전압 특성을 도시하는 도면,
제3a도 및 제3b도는 본 발명에 따른 메모리 소자의 기록-판독 사이클을 도시하는 도면.

Claims (9)

  1. 2개의 전극과 그들 사이에 반도전성 유전체를 가지되, 상기 두 전극중 한 전극은 반도전성 유전체와 쇼트키 접점을 형성하는 물질을 포함하고, 쇼트키 접점의 공간 전하 영역은 동작중 전하에 대한 터널링 장벽을 형성하는 스위칭 소자에 있어서, 상기 유전체는 터널링 장벽의 규격에 영향을 주는 잔류분극을 지닌 강유전성 물질을 포함하는 것을 특징으로 하는 스위칭 소자.
  2. 제1항에 있어서, 상기 유전체는 공간 전하 영역에서 파괴현상이 발생하지 않고 전극을 통해 인가되는 전압에 의해 공간 전하 영역외부의 한 유전체 영역에서 강유전성 물질의 스위칭 전계를 실현할 수 있도록 하는 그런 작은 두께률 갖는 특징으로 하는 스위칭 소자.
  3. 제2항에 있어서, 상기 유전체의 두께는 5000Å 이하인 것을 특징으로 하는 스위칭 소자.
  4. 실질직으로 평행한 판의 형태로 이루어진 전극을 포함하는 선행항중 어느 한 항에 있어서, 잔류 분극의 최대 성분의 방향이 상기 판에 실질적으로 직각이 되는 것을 특징으로 하는 스위칭 소자.
  5. 선행항중 어느 한 항에 있어서. 상기 강유전성 유전체가 금속적 도전성 산화막으로된 전극상에 에피택셜 방식으로 제공되는 것을 특징으로 하는 스위칭 소자.
  6. 제5항에 있어서, 상기 금속적 전도성 전극은 단결정 기판상에 제공되는 것을 특징으로 하는 스위칭 소자,
  7. 선행항중 어느 한 항에 있어서, 상기 유전체는 상이한 스위칭 전계에서 그 잔류 분극의 방향이 변화하는 2개 또는 그 이상의 강유전성 물질을 포함하는 것을 특징으로 하는 스위칭 소자.
  8. 제7항에 있어서, 상기 스위칭 소자가 직렬로 접속된 다수의 소자를 포함하게 되도록 상기 상이한 강유전성 물질 사이에 도전층이 제공되는 것을 특징으로 하는 스위칭 소자.
  9. 메모리 소자에 있어서, 상기 메모리 소자는 선행항중 어느 한 항에서 청구된 바와 같은 스위칭 소자를 포함하는 것을 특징으로 하는 메모리 소자.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940035249A 1993-12-23 1994-12-20 스위칭 소자 및 메모리 소자 KR950021480A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
BE9301444A BE1007902A3 (nl) 1993-12-23 1993-12-23 Schakelelement met geheugen voorzien van schottky tunnelbarriere.
BE09301444 1993-12-23

Publications (1)

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KR950021480A true KR950021480A (ko) 1995-07-26

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US (1) US5512773A (ko)
EP (1) EP0660412A1 (ko)
JP (1) JPH07202139A (ko)
KR (1) KR950021480A (ko)
CN (1) CN1108816A (ko)
BE (1) BE1007902A3 (ko)

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