KR940008206B1 - 고전압 스위치 회로 - Google Patents
고전압 스위치 회로 Download PDFInfo
- Publication number
- KR940008206B1 KR940008206B1 KR1019910024801A KR910024801A KR940008206B1 KR 940008206 B1 KR940008206 B1 KR 940008206B1 KR 1019910024801 A KR1019910024801 A KR 1019910024801A KR 910024801 A KR910024801 A KR 910024801A KR 940008206 B1 KR940008206 B1 KR 940008206B1
- Authority
- KR
- South Korea
- Prior art keywords
- high voltage
- transistor
- switch circuit
- gate
- power supply
- Prior art date
Links
- 230000003139 buffering effect Effects 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 abstract description 5
- 230000015556 catabolic process Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000005684 electric field Effects 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 229920005591 polysilicon Polymers 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/0883—Combination of depletion and enhancement field effect transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/06—Modifications for ensuring a fully conducting state
- H03K17/063—Modifications for ensuring a fully conducting state in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/10—Modifications for increasing the maximum permissible switched voltage
- H03K17/102—Modifications for increasing the maximum permissible switched voltage in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Read Only Memory (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
- Electronic Switches (AREA)
- Non-Volatile Memory (AREA)
- Dc-Dc Converters (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910024801A KR940008206B1 (ko) | 1991-12-28 | 1991-12-28 | 고전압 스위치 회로 |
TW081108372A TW209926B (ja) | 1991-12-28 | 1992-10-21 | |
FR9213607A FR2685807B1 (fr) | 1991-12-28 | 1992-11-12 | Circuit de commutation haute tension. |
DE4242801A DE4242801C2 (de) | 1991-12-28 | 1992-12-17 | Hochspannungsschaltkreis |
ITMI922927A IT1256217B (it) | 1991-12-28 | 1992-12-22 | Circuito di commutazione di alta tensione in particolare per dispositivi di memoria a semiconduttori. |
GB9518262A GB2291296B (en) | 1991-12-28 | 1992-12-23 | Switching circuit |
GB9226862A GB2262850B (en) | 1991-12-28 | 1992-12-23 | Switching circuit |
JP34656292A JP2677747B2 (ja) | 1991-12-28 | 1992-12-25 | 高電圧スイッチ回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910024801A KR940008206B1 (ko) | 1991-12-28 | 1991-12-28 | 고전압 스위치 회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930014615A KR930014615A (ko) | 1993-07-23 |
KR940008206B1 true KR940008206B1 (ko) | 1994-09-08 |
Family
ID=19326362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910024801A KR940008206B1 (ko) | 1991-12-28 | 1991-12-28 | 고전압 스위치 회로 |
Country Status (7)
Country | Link |
---|---|
JP (1) | JP2677747B2 (ja) |
KR (1) | KR940008206B1 (ja) |
DE (1) | DE4242801C2 (ja) |
FR (1) | FR2685807B1 (ja) |
GB (1) | GB2262850B (ja) |
IT (1) | IT1256217B (ja) |
TW (1) | TW209926B (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4128763B2 (ja) | 2000-10-30 | 2008-07-30 | 株式会社東芝 | 電圧切り替え回路 |
KR100725993B1 (ko) * | 2005-12-28 | 2007-06-08 | 삼성전자주식회사 | 누설 전류를 방지하는 로우 디코더 회로 및 이를 구비하는반도체 메모리 장치 |
JP4909647B2 (ja) | 2006-06-02 | 2012-04-04 | 株式会社東芝 | 不揮発性半導体記憶装置 |
KR20150121288A (ko) * | 2014-04-17 | 2015-10-29 | 에스케이하이닉스 주식회사 | 고전압 스위치 회로 및 이를 포함하는 비휘발성 메모리 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5541030B2 (ja) * | 1972-02-09 | 1980-10-21 | ||
US4511811A (en) * | 1982-02-08 | 1985-04-16 | Seeq Technology, Inc. | Charge pump for providing programming voltage to the word lines in a semiconductor memory array |
JPS58151124A (ja) * | 1982-03-04 | 1983-09-08 | Ricoh Co Ltd | レベル変換回路 |
US4672241A (en) * | 1985-05-29 | 1987-06-09 | Advanced Micro Devices, Inc. | High voltage isolation circuit for CMOS networks |
US4689495A (en) * | 1985-06-17 | 1987-08-25 | Advanced Micro Devices, Inc. | CMOS high voltage switch |
JPH0748310B2 (ja) * | 1987-04-24 | 1995-05-24 | 株式会社東芝 | 半導体集積回路 |
US4888738A (en) * | 1988-06-29 | 1989-12-19 | Seeq Technology | Current-regulated, voltage-regulated erase circuit for EEPROM memory |
DE3934303C2 (de) * | 1988-10-15 | 2001-01-25 | Sony Corp | Adreßdecoder für nichtflüchtige Speicher |
-
1991
- 1991-12-28 KR KR1019910024801A patent/KR940008206B1/ko not_active IP Right Cessation
-
1992
- 1992-10-21 TW TW081108372A patent/TW209926B/zh not_active IP Right Cessation
- 1992-11-12 FR FR9213607A patent/FR2685807B1/fr not_active Expired - Fee Related
- 1992-12-17 DE DE4242801A patent/DE4242801C2/de not_active Expired - Fee Related
- 1992-12-22 IT ITMI922927A patent/IT1256217B/it active IP Right Grant
- 1992-12-23 GB GB9226862A patent/GB2262850B/en not_active Expired - Fee Related
- 1992-12-25 JP JP34656292A patent/JP2677747B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ITMI922927A0 (it) | 1992-12-22 |
IT1256217B (it) | 1995-11-29 |
FR2685807A1 (fr) | 1993-07-02 |
KR930014615A (ko) | 1993-07-23 |
TW209926B (ja) | 1993-07-21 |
FR2685807B1 (fr) | 1995-11-03 |
JPH05259473A (ja) | 1993-10-08 |
ITMI922927A1 (it) | 1994-06-22 |
GB9226862D0 (en) | 1993-02-17 |
GB2262850A (en) | 1993-06-30 |
GB2262850B (en) | 1996-04-17 |
DE4242801A1 (ja) | 1993-07-01 |
JP2677747B2 (ja) | 1997-11-17 |
DE4242801C2 (de) | 2000-02-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5276646A (en) | High voltage generating circuit for a semiconductor memory circuit | |
JP2860308B2 (ja) | Mos集積回路の閾値を調整する方法 | |
US5109187A (en) | CMOS voltage reference | |
KR900003261B1 (ko) | 차지업(charge-up)회로 | |
US4866307A (en) | Integrated programmable bit circuit using single-level poly construction | |
KR100279568B1 (ko) | 병합된 트랜지스터 및 최적의 면적을 갖는 전기적으로 재프로그램 가능한 전기적으로 프로그램가능한 판독전용 메모리 셀 | |
US4628487A (en) | Dual slope, feedback controlled, EEPROM programming | |
US5847993A (en) | Non-volatile programmable CMOS logic cell and method of operating same | |
US5648930A (en) | Non-volatile memory which is programmable from a power source | |
US6222764B1 (en) | Erasable memory device and an associated method for erasing a memory cell therein | |
EP0522579A2 (en) | Level-shifter circuit for integrated circuits | |
WO1987005760A1 (en) | Cmos voltage translator | |
EP0661716A1 (en) | Voltage regulator for non-volatile semiconductor memory devices | |
US6525962B1 (en) | High current and/or high speed electrically erasable memory cell for programmable logic devices | |
KR100803011B1 (ko) | Eeprom | |
JP3745081B2 (ja) | 不揮発性半導体メモリ装置のローカルチャージポンプ回路 | |
KR940010420B1 (ko) | 프로그래밍 전압 발생회로 | |
KR940008206B1 (ko) | 고전압 스위치 회로 | |
US5315188A (en) | High voltage switching circuit | |
JPH07220484A (ja) | 電圧変換装置 | |
US5239194A (en) | Semiconductor device having increased electrostatic breakdown voltage | |
US7279932B2 (en) | Semiconductor integrated circuit device | |
EP0477896B1 (en) | Nonvolatile semiconductor memory device | |
US6704221B2 (en) | Floating gate programmable cell array for standard CMOS | |
US5530274A (en) | Mos capacitor, Vpp switch circuit, charge pump circuit, eeprom, microcomputer, and IC card |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20100830 Year of fee payment: 17 |
|
LAPS | Lapse due to unpaid annual fee |