KR920013937A - 반도체집적회로 - Google Patents

반도체집적회로 Download PDF

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Publication number
KR920013937A
KR920013937A KR1019910022315A KR910022315A KR920013937A KR 920013937 A KR920013937 A KR 920013937A KR 1019910022315 A KR1019910022315 A KR 1019910022315A KR 910022315 A KR910022315 A KR 910022315A KR 920013937 A KR920013937 A KR 920013937A
Authority
KR
South Korea
Prior art keywords
output
converter
circuit
signal
digital
Prior art date
Application number
KR1019910022315A
Other languages
English (en)
Other versions
KR960003087B1 (ko
Inventor
키요시 이마이
토시아끼 쯔지
타꾸 타카다
세이치 타구치
Original Assignee
다니이 아끼오
마쯔시다덴기산교 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 다니이 아끼오, 마쯔시다덴기산교 가부시기가이샤 filed Critical 다니이 아끼오
Publication of KR920013937A publication Critical patent/KR920013937A/ko
Application granted granted Critical
Publication of KR960003087B1 publication Critical patent/KR960003087B1/ko

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

내용 없음

Description

반도체집적회로
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 일실시예에 있어서의 반도체 집적회로를 탑재한 보오드의 블록도, 제2도는 본 발명의 다른 실시예에 있어서의 반도체 집적회로를 탑재한 보오드의 블록도, 제3도는 본 발명의 또 다른 실시예에 있어서의 반도체 집적회로를 탑재한 보오드의 블록도.

Claims (3)

  1. A/D변환기와, 상기 A/D변환기의 출력에 접속된 디지틀회로와, 상기 A/D변환기의 출력과 상기 디지틀회로의 출력을 입력으로 하는 디지틀신호 절환기와, 상기 디지틀신호절환기의 출력에 접속된 경계·주사출력회로를 구비한 것을 특징으로 하는 반도체 집적회로.
  2. 애널로그신호입력단자와, 상기 애널로그신호입력단자에 접속된 애널로그회로와, 상기 애널로그신호입력단자와 상기 애널로그회로의 출력을 입력으로 하는 애널로그 신호절환기와, 상기 애널로그신호절환기의 출력에 접속된 A/D변환기와 상기 A/D변환기의 출력에 접속된 디지틀회로와, 상기 A/D변환기의 출력과 상기 디지틀 회로의 출력을 입력으로 하는 디지틀신호절환기와, 상기 디지틀 신호절환기의 출력에 접속된 경계·주사출력회로를 구비한 것을 특징으로 하는 반도체 집적회로.
  3. 애널로그신호입력단자와, 상기 애널로그신호입력단자에 접속된 애널로그회로와, 상기 애널로그신호입력단자와 상기 애널로그회로의 출력을 입력으로 하는 애널로그 신호절환기와 상기 애널로그신호절환기의 출력에 접속된 A/D변환기와 상기 A/D변환기의 출력에 접속된 경계·주사출력회로를 구비한 것을 특징으로 하는 반도체 집적회로.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910022315A 1990-12-06 1991-12-06 반도체집적회로 KR960003087B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP90-400584 1990-12-06
JP2400584A JPH04212524A (ja) 1990-12-06 1990-12-06 半導体集積回路

Publications (2)

Publication Number Publication Date
KR920013937A true KR920013937A (ko) 1992-07-30
KR960003087B1 KR960003087B1 (ko) 1996-03-04

Family

ID=18510480

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910022315A KR960003087B1 (ko) 1990-12-06 1991-12-06 반도체집적회로

Country Status (6)

Country Link
US (1) US5225834A (ko)
EP (1) EP0489394B1 (ko)
JP (1) JPH04212524A (ko)
KR (1) KR960003087B1 (ko)
DE (1) DE69126848T2 (ko)
MY (1) MY115272A (ko)

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JP3180421B2 (ja) * 1992-03-30 2001-06-25 日本電気株式会社 テスト回路を内蔵したアナログ・ディジタル混在マスタ
JP3563750B2 (ja) * 1992-10-16 2004-09-08 テキサス インスツルメンツ インコーポレイテツド アナログ回路のための走査に基づく試験
US5404358A (en) * 1993-02-04 1995-04-04 Bull Hn Information Systems Inc. Boundary scan architecture analog extension
GB9303758D0 (en) * 1993-02-25 1993-04-14 Texas Instruments Ltd Improvements in or relating to integrated logic circuits
US5581176A (en) * 1993-05-24 1996-12-03 North American Philips Corporation Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5744949A (en) * 1993-08-17 1998-04-28 Texas Instruments Incorporated Analog test cell circuit
US5659257A (en) * 1994-07-05 1997-08-19 Ford Motor Company Method and circuit structure for measuring and testing discrete components on mixed-signal circuit boards
JPH08154055A (ja) * 1994-11-25 1996-06-11 Oki Electric Ind Co Ltd アナログ／デジタル変換器
US5659312A (en) * 1996-06-14 1997-08-19 Logicvision, Inc. Method and apparatus for testing digital to analog and analog to digital converters
US5974578A (en) * 1996-08-06 1999-10-26 Matsushita Electronics Corporation Integrated circuit and test method therefor
TW356596B (en) * 1996-10-16 1999-04-21 Koninl Philips Electronics Nv Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit
GB9802091D0 (en) * 1998-01-30 1998-03-25 Sgs Thomson Microelectronics Device scan testing
US6333706B1 (en) 1999-08-02 2001-12-25 International Business Machines Corporation Built-in self-test for analog to digital converter
US7032151B2 (en) * 2001-11-13 2006-04-18 Georgia Tech Research Corporation Systems and methods for testing integrated circuits
AU2003223620A1 (en) * 2002-05-01 2003-11-17 Logicvision (Canada), Inc Circuit and method for adding parametric test capability to digital boundary scan
ATE366941T1 (de) * 2003-07-09 2007-08-15 Koninkl Philips Electronics Nv Ic mit eingebauter karakteristikbestimmung
US7599299B2 (en) * 2004-04-30 2009-10-06 Xilinx, Inc. Dynamic reconfiguration of a system monitor (DRPORT)
US7102555B2 (en) * 2004-04-30 2006-09-05 Xilinx, Inc. Boundary-scan circuit used for analog and digital testing of an integrated circuit
JPWO2006022026A1 (ja) * 2004-08-26 2008-05-08 テスト・リサーチ・ラボラトリーズ株式会社 半導体のテストシステム
KR101138200B1 (ko) * 2008-06-02 2012-05-10 가부시키가이샤 어드밴티스트 반도체 웨이퍼, 반도체 회로, 시험용 기판, 및 시험 시스템
US7969171B1 (en) 2010-01-06 2011-06-28 General Electric Company Test circuit and system
US9729163B1 (en) * 2016-08-30 2017-08-08 Qualcomm Incorporated Apparatus and method for in situ analog signal diagnostic and debugging with calibrated analog-to-digital converter
CN111045405A (zh) * 2019-12-16 2020-04-21 上海新华控制技术集团科技有限公司 一种开关量转接输出端子板

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DE3305547A1 (de) * 1983-02-18 1984-08-23 Philips Patentverwaltung Gmbh, 2000 Hamburg Schaltungsanordnung zum digitalen umwandeln eines analogen signals
US4538269A (en) * 1983-04-18 1985-08-27 International Telephone And Telegraph Corporation Programmable coding and decoding arrangement
JPS60147659A (ja) * 1984-01-13 1985-08-03 Hitachi Ltd 論理構造
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JPS63233384A (ja) * 1987-03-20 1988-09-29 Fujitsu Ltd プリント板ユニツトの論理チエツク方法
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JP2627464B2 (ja) * 1990-03-29 1997-07-09 三菱電機株式会社 集積回路装置

Also Published As

Publication number Publication date
EP0489394A2 (en) 1992-06-10
US5225834A (en) 1993-07-06
EP0489394B1 (en) 1997-07-16
DE69126848T2 (de) 1997-11-20
KR960003087B1 (ko) 1996-03-04
EP0489394A3 (en) 1993-06-23
MY115272A (en) 2003-05-31
JPH04212524A (ja) 1992-08-04
DE69126848D1 (de) 1997-08-21

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