DE69126848D1 - Integrierte Halbleiterschaltung - Google Patents

Integrierte Halbleiterschaltung

Info

Publication number
DE69126848D1
DE69126848D1 DE69126848T DE69126848T DE69126848D1 DE 69126848 D1 DE69126848 D1 DE 69126848D1 DE 69126848 T DE69126848 T DE 69126848T DE 69126848 T DE69126848 T DE 69126848T DE 69126848 D1 DE69126848 D1 DE 69126848D1
Authority
DE
Germany
Prior art keywords
semiconductor circuit
integrated semiconductor
integrated
circuit
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69126848T
Other languages
English (en)
Other versions
DE69126848T2 (de
Inventor
Kiyoshi Imai
Toshiaki Tsuji
Taku Takada
Seiichi Taguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69126848D1 publication Critical patent/DE69126848D1/de
Publication of DE69126848T2 publication Critical patent/DE69126848T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
DE69126848T 1990-12-06 1991-12-03 Integrierte Halbleiterschaltung Expired - Fee Related DE69126848T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2400584A JPH04212524A (ja) 1990-12-06 1990-12-06 半導体集積回路

Publications (2)

Publication Number Publication Date
DE69126848D1 true DE69126848D1 (de) 1997-08-21
DE69126848T2 DE69126848T2 (de) 1997-11-20

Family

ID=18510480

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69126848T Expired - Fee Related DE69126848T2 (de) 1990-12-06 1991-12-03 Integrierte Halbleiterschaltung

Country Status (6)

Country Link
US (1) US5225834A (de)
EP (1) EP0489394B1 (de)
JP (1) JPH04212524A (de)
KR (1) KR960003087B1 (de)
DE (1) DE69126848T2 (de)
MY (1) MY115272A (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3180421B2 (ja) * 1992-03-30 2001-06-25 日本電気株式会社 テスト回路を内蔵したアナログ・ディジタル混在マスタ
JP3563750B2 (ja) * 1992-10-16 2004-09-08 テキサス インスツルメンツ インコーポレイテツド アナログ回路のための走査に基づく試験
US5404358A (en) * 1993-02-04 1995-04-04 Bull Hn Information Systems Inc. Boundary scan architecture analog extension
GB9303758D0 (en) * 1993-02-25 1993-04-14 Texas Instruments Ltd Improvements in or relating to integrated logic circuits
US5581176A (en) * 1993-05-24 1996-12-03 North American Philips Corporation Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5744949A (en) * 1993-08-17 1998-04-28 Texas Instruments Incorporated Analog test cell circuit
US5659257A (en) * 1994-07-05 1997-08-19 Ford Motor Company Method and circuit structure for measuring and testing discrete components on mixed-signal circuit boards
JPH08154055A (ja) * 1994-11-25 1996-06-11 Oki Electric Ind Co Ltd アナログ／デジタル変換器
US5659312A (en) * 1996-06-14 1997-08-19 Logicvision, Inc. Method and apparatus for testing digital to analog and analog to digital converters
US5974578A (en) * 1996-08-06 1999-10-26 Matsushita Electronics Corporation Integrated circuit and test method therefor
TW356596B (en) * 1996-10-16 1999-04-21 Koninl Philips Electronics Nv Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit
GB9802091D0 (en) * 1998-01-30 1998-03-25 Sgs Thomson Microelectronics Device scan testing
US6333706B1 (en) 1999-08-02 2001-12-25 International Business Machines Corporation Built-in self-test for analog to digital converter
US7032151B2 (en) * 2001-11-13 2006-04-18 Georgia Tech Research Corporation Systems and methods for testing integrated circuits
WO2003093843A1 (en) * 2002-05-01 2003-11-13 Logicvision(Canada), Inc Circuit and method for adding parametric test capability to digital boundary scan
JP2007527110A (ja) * 2003-07-09 2007-09-20 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ オンボード特徴化ユニットを有するｉｃ
US7599299B2 (en) * 2004-04-30 2009-10-06 Xilinx, Inc. Dynamic reconfiguration of a system monitor (DRPORT)
US7102555B2 (en) * 2004-04-30 2006-09-05 Xilinx, Inc. Boundary-scan circuit used for analog and digital testing of an integrated circuit
WO2006022026A1 (ja) * 2004-08-26 2006-03-02 Test Research Laboratories Inc. 半導体のテストシステム
JPWO2009147720A1 (ja) * 2008-06-02 2011-10-20 株式会社アドバンテスト 半導体ウエハ、半導体回路、試験用基板、および、試験システム
US7969171B1 (en) 2010-01-06 2011-06-28 General Electric Company Test circuit and system
US9729163B1 (en) * 2016-08-30 2017-08-08 Qualcomm Incorporated Apparatus and method for in situ analog signal diagnostic and debugging with calibrated analog-to-digital converter
CN111045405A (zh) * 2019-12-16 2020-04-21 上海新华控制技术集团科技有限公司 一种开关量转接输出端子板

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3305547A1 (de) * 1983-02-18 1984-08-23 Philips Patentverwaltung Gmbh, 2000 Hamburg Schaltungsanordnung zum digitalen umwandeln eines analogen signals
US4538269A (en) * 1983-04-18 1985-08-27 International Telephone And Telegraph Corporation Programmable coding and decoding arrangement
JPS60147659A (ja) * 1984-01-13 1985-08-03 Hitachi Ltd 論理構造
US4872169A (en) * 1987-03-06 1989-10-03 Texas Instruments Incorporated Hierarchical scan selection
JPS63233384A (ja) * 1987-03-20 1988-09-29 Fujitsu Ltd プリント板ユニツトの論理チエツク方法
US4922492A (en) * 1988-05-13 1990-05-01 National Semiconductor Corp. Architecture and device for testable mixed analog and digital VLSI circuits
NL8801362A (nl) * 1988-05-27 1989-12-18 Philips Nv Elektronische module bevattende een eerste substraatelement met een funktioneel deel, alsmede een tweede substraatelement voor het testen van een interkonnektiefunktie, voet bevattende zo een tweede substraatelement, substraatelement te gebruiken als zo een tweede substraatelement en elektronisch apparaat bevattende een plaat met gedrukte bedrading en ten minste twee zulke elektronische modules.
US5132974A (en) * 1989-10-24 1992-07-21 Silc Technologies, Inc. Method and apparatus for designing integrated circuits for testability
DE69124709T2 (de) * 1990-03-15 1997-05-28 At & T Corp Eingebaute Selbstprüfung für Analog-Digitalumsetzer
JP2627464B2 (ja) * 1990-03-29 1997-07-09 三菱電機株式会社 集積回路装置

Also Published As

Publication number Publication date
KR960003087B1 (ko) 1996-03-04
JPH04212524A (ja) 1992-08-04
DE69126848T2 (de) 1997-11-20
EP0489394A2 (de) 1992-06-10
KR920013937A (ko) 1992-07-30
US5225834A (en) 1993-07-06
EP0489394B1 (de) 1997-07-16
MY115272A (en) 2003-05-31
EP0489394A3 (en) 1993-06-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee