KR910015005A - 반도체 디바이스 제조 방법 - Google Patents

반도체 디바이스 제조 방법 Download PDF

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Publication number
KR910015005A
KR910015005A KR1019910001248A KR910001248A KR910015005A KR 910015005 A KR910015005 A KR 910015005A KR 1019910001248 A KR1019910001248 A KR 1019910001248A KR 910001248 A KR910001248 A KR 910001248A KR 910015005 A KR910015005 A KR 910015005A
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KR
South Korea
Prior art keywords
substrate
thin film
temperature
exposed portion
film layer
Prior art date
Application number
KR1019910001248A
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English (en)
Inventor
안쏘니 디핀토 개리
스테인버그 조
지. 프랭카 죤
알. 체니스키 마이클
Original Assignee
빈센트 죠셉 로너
모토로라 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 빈센트 죠셉 로너, 모토로라 인코포레이티드 filed Critical 빈센트 죠셉 로너
Publication of KR910015005A publication Critical patent/KR910015005A/ko

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/20—Resistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • H01L21/28525—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table the conductive layers comprising semiconducting material
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B10/00—Static random access memory [SRAM] devices
    • H10B10/15—Static random access memory [SRAM] devices comprising a resistor load element
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/025—Deposition multi-step
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/122—Polycrystalline
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/124—Polycrystalline emitter

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Drying Of Semiconductors (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

내용 없음

Description

반도체 디바이스 제조 방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본 발명의 양호한 실시예에 따른 연속 처리단에서 제1도의 반도체 디바이스를 나타내는 부분 단면도, 제3도는 본 발명의 양호한 실시예에 따른 연속 처리단에서 제2도의 반도체 디바이스를 나타내는 부분 단면도, 제4도는 본 발명의 양호한 실시예를 실행할때 사용하는 반도체 웨이퍼를 갖는 퍼니스(furnace)의 다이어그램.

Claims (3)

  1. 노출된 부분의 표면을 갖는 반도체 기판을 제공하는 단계와, 다수의 반도체 기판을 수행하는 웨이퍼 영역을 갖는 퍼니스내에 기판을 위치시키는 단계와, 제1온도 범위에서 웨이퍼 영역내의 모든 위치의 온도를 상승시키는 단계와, 기판 표면의 최소한 노출된 부분에서 전도체로 사용하기 위해 박막 물질층을 침전시키는 단계와, 상기 제1온도 범위보다 범위가 좁은 제2온도 범위에서 웨이퍼 영역내로 모든 위치의 온도를 안정화시키는 단계와, 박막층 전도 물질 상에서 전도체로 사용하기 위해 비교적 두꺼운 물질 층을 침전시키는 단계를 구비하는 반도체 디바이스 제조 방법.
  2. 노출된 부분의 표면을 갖는 반도체 기판을 제공하는 단계와, 퍼니스에 기판을 위치시키는 단계와, 제1시간 주기동안 퍼니스를 가열하는 단계와, 기판 표면의 최소한 노출된 부분에서 폴리실리콘 박막층을 침전시키는 단계와, 폴리실리콘 박막층을 침전시킨후 퍼니스로부터 반도체 기판을 제거하는 것없이 제1시간 주기보다 좁은 범위의 제2시간 주기동안 퍼니스를 가열하는 단계와, 제2시간 주기후 폴리실리콘 박막 층 위에 두꺼운 폴리실리콘층을 침전시키는 단계를 구비하는 반도체 디바이스 제조방법.
  3. 노출된 부분의 표면을 갖는 반도체 기판을 제공하는 단계와, 제1온도 범위내에서 기판을 가열시키는 단계와, 기판 표면의 최소한 노출된 부분에서 폴리실리콘박막 층을 침전시키는 단계와, 상기 제1온도 범위보다 더 좁은 버무이인 제2온도 범위내에서 기판 온도를 안정화시키는 단계와, 기판 온도가 제2온도 범위내에서 안정화된 후 폴리실리콘 박막층 위에 두꺼운 폴리실리콘 층을 침전시키는 단계를 구비하는 반도체 디바이스 제조 방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910001248A 1990-01-29 1991-01-25 반도체 디바이스 제조 방법 KR910015005A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/471,451 US5024972A (en) 1990-01-29 1990-01-29 Deposition of a conductive layer for contacts
US471,451 1990-01-29

Publications (1)

Publication Number Publication Date
KR910015005A true KR910015005A (ko) 1991-08-31

Family

ID=23871677

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910001248A KR910015005A (ko) 1990-01-29 1991-01-25 반도체 디바이스 제조 방법

Country Status (4)

Country Link
US (1) US5024972A (ko)
EP (1) EP0440393A3 (ko)
JP (1) JPH0786175A (ko)
KR (1) KR910015005A (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5587696A (en) * 1995-06-28 1996-12-24 Taiwan Semiconductor Manufacturing Company Ltd. High resistance polysilicon resistor for integrated circuits and method of fabrication thereof
JPH09115833A (ja) * 1995-10-07 1997-05-02 Hyundai Electron Ind Co Ltd 半導体素子のポリシリコン膜製造方法
JP3253552B2 (ja) * 1996-05-31 2002-02-04 三洋電機株式会社 半導体装置の製造方法
US5838716A (en) * 1997-06-03 1998-11-17 Taiwan Semiconductor Manufacturing Company, Ltd. Leak check procedure for a dry oxidation furnace tube

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Publication number Priority date Publication date Assignee Title
US3847686A (en) * 1970-05-27 1974-11-12 Gen Electric Method of forming silicon epitaxial layers
US4087571A (en) * 1971-05-28 1978-05-02 Fairchild Camera And Instrument Corporation Controlled temperature polycrystalline silicon nucleation
GB1399163A (en) * 1972-11-08 1975-06-25 Ferranti Ltd Methods of manufacturing semiconductor devices
US3867494A (en) * 1973-03-06 1975-02-18 Owens Corning Fiberglass Corp Method and apparatus for producing fiber reinforced organic foam
US3900597A (en) * 1973-12-19 1975-08-19 Motorola Inc System and process for deposition of polycrystalline silicon with silane in vacuum
JPS5322029B2 (ko) * 1973-12-26 1978-07-06
US4194934A (en) * 1977-05-23 1980-03-25 Varo Semiconductor, Inc. Method of passivating a semiconductor device utilizing dual polycrystalline layers
SU845680A1 (ru) * 1979-10-26 1987-04-15 Организация П/Я А-7124 Способ получени пленок поликристаллического кремни
JPS61134055A (ja) * 1984-12-04 1986-06-21 Sony Corp 半導体装置の製造方法
US4742020A (en) * 1985-02-01 1988-05-03 American Telephone And Telegraph Company, At&T Bell Laboratories Multilayering process for stress accommodation in deposited polysilicon
DE3504199A1 (de) * 1985-02-07 1986-08-07 Siemens AG, 1000 Berlin und 8000 München Verfahren zum herstellen von polykristallinen siliziumschichten mit glatten oberflaechen
JPS62243769A (ja) * 1986-04-16 1987-10-24 Nec Corp 減圧気相ポリシリコン成長方法
US4808555A (en) * 1986-07-10 1989-02-28 Motorola, Inc. Multiple step formation of conductive material layers
US4877753A (en) * 1986-12-04 1989-10-31 Texas Instruments Incorporated In situ doped polysilicon using tertiary butyl phosphine
US4897360A (en) * 1987-12-09 1990-01-30 Wisconsin Alumni Research Foundation Polysilicon thin film process
JPH01161826A (ja) * 1987-12-18 1989-06-26 Toshiba Corp 気相エピタキシャル成長法
JPH01179309A (ja) * 1987-12-30 1989-07-17 Tokyo Electron Ltd 加熱法

Also Published As

Publication number Publication date
US5024972A (en) 1991-06-18
JPH0786175A (ja) 1995-03-31
EP0440393A3 (en) 1992-03-18
EP0440393A2 (en) 1991-08-07

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