KR900002667B1 - The semiconductor memory device having complementary perceiving voltage in memory cell - Google Patents
The semiconductor memory device having complementary perceiving voltage in memory cellInfo
- Publication number
- KR900002667B1 KR900002667B1 KR8607289A KR860007289A KR900002667B1 KR 900002667 B1 KR900002667 B1 KR 900002667B1 KR 8607289 A KR8607289 A KR 8607289A KR 860007289 A KR860007289 A KR 860007289A KR 900002667 B1 KR900002667 B1 KR 900002667B1
- Authority
- KR
- South Korea
- Prior art keywords
- voltage
- memory cell
- precharge
- bit line
- perceiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4099—Dummy cell treatment; Reference voltage generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60222757A JPS6282597A (ja) | 1985-10-08 | 1985-10-08 | 半導体記憶装置 |
| JP222757 | 1985-10-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR870004447A KR870004447A (ko) | 1987-05-09 |
| KR900002667B1 true KR900002667B1 (en) | 1990-04-21 |
Family
ID=16787430
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR8607289A Expired KR900002667B1 (en) | 1985-10-08 | 1986-09-01 | The semiconductor memory device having complementary perceiving voltage in memory cell |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4716549A (https=) |
| EP (1) | EP0223621B1 (https=) |
| JP (1) | JPS6282597A (https=) |
| KR (1) | KR900002667B1 (https=) |
| DE (1) | DE3687037T2 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63308792A (ja) * | 1987-06-10 | 1988-12-16 | Mitsubishi Electric Corp | 半導体記憶装置 |
| JPH01171194A (ja) * | 1987-12-25 | 1989-07-06 | Nec Ic Microcomput Syst Ltd | 半導体記憶装置 |
| US5687109A (en) * | 1988-05-31 | 1997-11-11 | Micron Technology, Inc. | Integrated circuit module having on-chip surge capacitors |
| KR930000899B1 (ko) * | 1990-02-24 | 1993-02-11 | 현대전자산업 주식회사 | 다이나믹 램(dram)의 비트선 센스 증폭기의 균형 실현장치 |
| US5135889A (en) * | 1991-12-09 | 1992-08-04 | Micron Technology, Inc. | Method for forming a shielding structure for decoupling signal traces in a semiconductor |
| EP0663667B1 (de) * | 1994-01-12 | 1999-03-03 | Siemens Aktiengesellschaft | Integrierte Halbleiterspeicherschaltung und Verfahren zu ihrem Betrieb |
| JP2748873B2 (ja) * | 1995-01-04 | 1998-05-13 | 日本電気株式会社 | 強誘電体メモリ装置およびその動作制御方法 |
| US5608668A (en) * | 1995-12-22 | 1997-03-04 | Micron Technology, Inc. | Dram wtih open digit lines and array edge reference sensing |
| US10541031B2 (en) | 2018-06-15 | 2020-01-21 | Sandisk Technologies Llc | Single pulse SLC programming scheme |
| US10825513B2 (en) | 2018-06-26 | 2020-11-03 | Sandisk Technologies Llc | Parasitic noise control during sense operations |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3909631A (en) * | 1973-08-02 | 1975-09-30 | Texas Instruments Inc | Pre-charge voltage generating system |
| US3946368A (en) * | 1974-12-27 | 1976-03-23 | Intel Corporation | System for compensating voltage for a CCD sensing circuit |
| DE2647394C2 (de) * | 1976-10-20 | 1978-11-16 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | MOS-Halbleiterspeicherbaustein |
| JPS5939833B2 (ja) * | 1977-05-24 | 1984-09-26 | 日本電気株式会社 | センス増幅器 |
| JPS6044752B2 (ja) * | 1978-04-24 | 1985-10-05 | 日本電気株式会社 | ダイナミツクメモリ |
| EP0189908B1 (en) * | 1985-01-30 | 1992-10-28 | Nec Corporation | Dynamic memory with improved arrangement for precharging bit lines |
-
1985
- 1985-10-08 JP JP60222757A patent/JPS6282597A/ja active Granted
-
1986
- 1986-08-29 US US06/901,680 patent/US4716549A/en not_active Expired - Fee Related
- 1986-08-29 EP EP86401901A patent/EP0223621B1/en not_active Expired - Lifetime
- 1986-08-29 DE DE8686401901T patent/DE3687037T2/de not_active Expired - Fee Related
- 1986-09-01 KR KR8607289A patent/KR900002667B1/ko not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| EP0223621B1 (en) | 1992-10-28 |
| DE3687037D1 (de) | 1992-12-03 |
| JPH0468716B2 (https=) | 1992-11-04 |
| US4716549A (en) | 1987-12-29 |
| EP0223621A3 (en) | 1990-01-31 |
| KR870004447A (ko) | 1987-05-09 |
| JPS6282597A (ja) | 1987-04-16 |
| EP0223621A2 (en) | 1987-05-27 |
| DE3687037T2 (de) | 1993-03-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0357980A3 (en) | A memory cell with capacitance for single event upset protection | |
| EP0306712A3 (en) | Sense amplifier with improved bitline precharging for dynamic random access memory | |
| KR880006837A (ko) | 고성능 디램을 위한 센스 증폭기 | |
| ES8204210A1 (es) | Disposicion ordenada de memoria de semiconductores | |
| GB1523094A (en) | Semiconductor memory cell circuits | |
| IE802516L (en) | Semiconductor memory device | |
| JPS6410493A (en) | Charge transfer type sense amplifier | |
| JPS6435793A (en) | Semiconductor memory | |
| KR900002667B1 (en) | The semiconductor memory device having complementary perceiving voltage in memory cell | |
| IE830569L (en) | Single transistor, single capacitor mos random access memory | |
| JPS6449195A (en) | Synchronizing type storage device | |
| ES8205074A1 (es) | Perfeccionamientos en aparatos semiconductores que incluyen una red para regenerar el estado de memoria de celulas de memoria de capacitor semiconductor. | |
| KR880006698A (ko) | 씨모오스 반도체 메모리장치의 입출력 회로 | |
| GB1526419A (en) | Static storage elements for electronic data stores | |
| IE811741L (en) | Semiconductor read only memory device | |
| WO1994003900A1 (en) | Six transistor dynamic content addressable memory circuit | |
| EP0049462A3 (en) | Memory device | |
| JPS5712483A (en) | Transistor circuit | |
| JPS5427734A (en) | Dynamic semiconductor memory | |
| IT1249616B (it) | Circuito di precarica di bit line per la lettura di una cella di memoria eprom. | |
| EP0203718A3 (en) | Dynamic mos memory reference voltage generator | |
| KR960008530B1 (en) | Dram cell | |
| KR900008919B1 (ko) | 반도체 메모리 | |
| JPS57195387A (en) | Data lien precharging system of memory integrated circuit | |
| JPS5778695A (en) | Semiconductor storage device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
St.27 status event code: A-2-2-Q10-Q13-nap-PG1605 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| FPAY | Annual fee payment |
Payment date: 19930322 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 19940422 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 19940422 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |