KR20240072095A - 탄화규소 단결정 웨이퍼 및 탄화규소 단결정 잉곳 - Google Patents

탄화규소 단결정 웨이퍼 및 탄화규소 단결정 잉곳 Download PDF

Info

Publication number
KR20240072095A
KR20240072095A KR1020237045445A KR20237045445A KR20240072095A KR 20240072095 A KR20240072095 A KR 20240072095A KR 1020237045445 A KR1020237045445 A KR 1020237045445A KR 20237045445 A KR20237045445 A KR 20237045445A KR 20240072095 A KR20240072095 A KR 20240072095A
Authority
KR
South Korea
Prior art keywords
silicon carbide
single crystal
carbide single
wafer
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020237045445A
Other languages
English (en)
Korean (ko)
Inventor
도모노리 우메자키
가즈토 구마가이
Original Assignee
샌트랄 글래스 컴퍼니 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 샌트랄 글래스 컴퍼니 리미티드 filed Critical 샌트랄 글래스 컴퍼니 리미티드
Publication of KR20240072095A publication Critical patent/KR20240072095A/ko
Pending legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/36Carbides
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/02Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
    • C30B19/04Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux the solvent being a component of the crystal composition
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/10Controlling or regulating
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/60Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/60Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
    • C30B29/64Flat crystals, e.g. plates, strips or discs

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
KR1020237045445A 2021-09-30 2022-09-26 탄화규소 단결정 웨이퍼 및 탄화규소 단결정 잉곳 Pending KR20240072095A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2021-160608 2021-09-30
JP2021160608 2021-09-30
PCT/JP2022/035724 WO2023054264A1 (ja) 2021-09-30 2022-09-26 炭化ケイ素単結晶ウエハ及び炭化ケイ素単結晶インゴット

Publications (1)

Publication Number Publication Date
KR20240072095A true KR20240072095A (ko) 2024-05-23

Family

ID=85782667

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237045445A Pending KR20240072095A (ko) 2021-09-30 2022-09-26 탄화규소 단결정 웨이퍼 및 탄화규소 단결정 잉곳

Country Status (7)

Country Link
US (1) US12325934B2 (https=)
EP (1) EP4411030A4 (https=)
JP (1) JPWO2023054264A1 (https=)
KR (1) KR20240072095A (https=)
CN (1) CN118043505A (https=)
TW (1) TW202331031A (https=)
WO (1) WO2023054264A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12325935B2 (en) * 2021-09-30 2025-06-10 Central Glass Company, Limited Single-crystal silicon carbide wafer, single-crystal silicon carbide ingot, and method for producing single-crystal silicon carbide

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009167047A (ja) 2008-01-15 2009-07-30 Nippon Steel Corp 炭化珪素単結晶インゴット、これから得られる基板及びエピタキシャルウェハ
JP2015030640A (ja) 2013-08-02 2015-02-16 株式会社デンソー 炭化珪素単結晶
JP2016088794A (ja) 2014-10-31 2016-05-23 トヨタ自動車株式会社 SiC単結晶の製造方法
JP2016164120A (ja) 2016-03-15 2016-09-08 新日鉄住金マテリアルズ株式会社 炭化珪素単結晶ウェハ
WO2017047536A1 (ja) 2015-09-14 2017-03-23 新日鐵住金株式会社 SiC単結晶の製造装置、SiC単結晶の製造方法及びSiC単結晶材
JP2018111639A (ja) 2017-01-13 2018-07-19 セントラル硝子株式会社 炭化ケイ素単結晶ウェハ、インゴット及びその製造方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2923260B2 (ja) * 1997-03-19 1999-07-26 東洋炭素株式会社 単結晶引上装置、高純度黒鉛材料及びその製造方法
SE525574C2 (sv) * 2002-08-30 2005-03-15 Okmetic Oyj Lågdopat kiselkarbidsubstrat och användning därav i högspänningskomponenter
JP4853449B2 (ja) 2007-10-11 2012-01-11 住友金属工業株式会社 SiC単結晶の製造方法、SiC単結晶ウエハ及びSiC半導体デバイス
EP2245217A1 (en) * 2007-12-12 2010-11-03 Dow Corning Corporation Method to manufacture large uniform ingots of silicon carbide by sublimation/condensation processes
JP5803519B2 (ja) * 2011-09-29 2015-11-04 トヨタ自動車株式会社 SiC単結晶の製造方法及び製造装置
WO2014034080A1 (ja) 2012-08-26 2014-03-06 国立大学法人名古屋大学 3C-SiC単結晶およびその製造方法
JP6238249B2 (ja) * 2013-05-20 2017-11-29 国立研究開発法人産業技術総合研究所 炭化珪素単結晶及びその製造方法
JP6904774B2 (ja) * 2017-04-28 2021-07-21 富士電機株式会社 炭化珪素エピタキシャルウェハ、炭化珪素絶縁ゲート型バイポーラトランジスタ及びこれらの製造方法
JP2021160608A (ja) 2020-03-31 2021-10-11 株式会社エクォス・リサーチ 移動装置
US12325935B2 (en) * 2021-09-30 2025-06-10 Central Glass Company, Limited Single-crystal silicon carbide wafer, single-crystal silicon carbide ingot, and method for producing single-crystal silicon carbide
EP4421221A4 (en) * 2021-10-22 2025-10-29 Ngk Insulators Ltd SIC SUBSTRATE, SIC COMPOSITE SUBSTRATE
JP2023127894A (ja) * 2022-03-02 2023-09-14 株式会社デンソー 炭化珪素単結晶およびその製造方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009167047A (ja) 2008-01-15 2009-07-30 Nippon Steel Corp 炭化珪素単結晶インゴット、これから得られる基板及びエピタキシャルウェハ
JP2015030640A (ja) 2013-08-02 2015-02-16 株式会社デンソー 炭化珪素単結晶
JP2016088794A (ja) 2014-10-31 2016-05-23 トヨタ自動車株式会社 SiC単結晶の製造方法
WO2017047536A1 (ja) 2015-09-14 2017-03-23 新日鐵住金株式会社 SiC単結晶の製造装置、SiC単結晶の製造方法及びSiC単結晶材
JP2016164120A (ja) 2016-03-15 2016-09-08 新日鉄住金マテリアルズ株式会社 炭化珪素単結晶ウェハ
JP2018111639A (ja) 2017-01-13 2018-07-19 セントラル硝子株式会社 炭化ケイ素単結晶ウェハ、インゴット及びその製造方法

Also Published As

Publication number Publication date
WO2023054264A1 (ja) 2023-04-06
US12325934B2 (en) 2025-06-10
EP4411030A4 (en) 2025-10-08
TW202331031A (zh) 2023-08-01
US20240344237A1 (en) 2024-10-17
EP4411030A1 (en) 2024-08-07
JPWO2023054264A1 (https=) 2023-04-06
CN118043505A (zh) 2024-05-14

Similar Documents

Publication Publication Date Title
TWI410537B (zh) Silicon carbide single crystal wafer and its manufacturing method
JP5304712B2 (ja) 炭化珪素単結晶ウェハ
EP1807557B1 (en) Monocrystalline silicon carbide ingot, monocrystalline silicon carbide wafer and method of manufacturing the same
JP4853449B2 (ja) SiC単結晶の製造方法、SiC単結晶ウエハ及びSiC半導体デバイス
EP2752508A1 (en) Silicon carbide single crystal wafer and manufacturing method for same
JP4388538B2 (ja) 炭化珪素単結晶製造装置
CN107002281A (zh) 碳化硅单晶的制造方法及碳化硅单晶基板
EP2940196B1 (en) Method for producing n-type sic single crystal
WO2016152813A1 (ja) 炭化珪素単結晶の製造方法
US20170067183A1 (en) METHOD OF MANUFACTURING SiC SINGLE CRYSTAL
WO2015001847A1 (ja) 炭化珪素単結晶基板およびその製造方法
JP2004099340A (ja) 炭化珪素単結晶育成用種結晶と炭化珪素単結晶インゴット及びその製造方法
JP2006290635A (ja) 炭化珪素単結晶の製造方法及び炭化珪素単結晶インゴット
JP6869077B2 (ja) 炭化珪素単結晶インゴットの製造方法
KR20240072095A (ko) 탄화규소 단결정 웨이퍼 및 탄화규소 단결정 잉곳
KR20240072094A (ko) 탄화규소 단결정 웨이퍼, 탄화규소 단결정 잉곳 및 탄화규소 단결정의 제조방법
JP5131262B2 (ja) 炭化珪素単結晶及びその製造方法
JP6082111B2 (ja) 炭化珪素の結晶のインゴット、炭化珪素のウェハ、炭化珪素の結晶のインゴットおよび炭化珪素のウェハの製造方法
US10415152B2 (en) SiC single crystal and method for producing same
JP6748613B2 (ja) 炭化珪素単結晶基板
TWI919007B (zh) 碳化矽單晶體晶圓、碳化矽單晶體錠及碳化矽單晶體之製造方法
JP2011201754A (ja) 単結晶炭化珪素の製造方法
EP3243936B1 (en) Method for producing a sic single crystal
WO2025249355A1 (ja) SiC単結晶ウエハ、SiC単結晶インゴット、SiC単結晶ウエハの製造方法、SiC単結晶インゴットの製造方法、SiC単結晶インゴットの製造装置、及びSiCエピタキシャル成長膜の成膜方法
JP2019089664A (ja) p型SiC単結晶の製造方法

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
D21 Rejection of application intended

Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE)

PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902