KR20230153374A - 전자기 간섭 차폐 및 열 소산을 위해 구성된 금속층을 포함하는 패키지 - Google Patents

전자기 간섭 차폐 및 열 소산을 위해 구성된 금속층을 포함하는 패키지 Download PDF

Info

Publication number
KR20230153374A
KR20230153374A KR1020237028883A KR20237028883A KR20230153374A KR 20230153374 A KR20230153374 A KR 20230153374A KR 1020237028883 A KR1020237028883 A KR 1020237028883A KR 20237028883 A KR20237028883 A KR 20237028883A KR 20230153374 A KR20230153374 A KR 20230153374A
Authority
KR
South Korea
Prior art keywords
integrated device
layer
substrate
encapsulation layer
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020237028883A
Other languages
English (en)
Korean (ko)
Inventor
마크 휴스젠
필리프 마이클 예거
Original Assignee
퀄컴 테크놀로지스, 인크.
알에프360 유럽 게엠베하
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 퀄컴 테크놀로지스, 인크., 알에프360 유럽 게엠베하 filed Critical 퀄컴 테크놀로지스, 인크.
Publication of KR20230153374A publication Critical patent/KR20230153374A/ko
Pending legal-status Critical Current

Links

Classifications

    • H01L23/552
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H01L23/36
    • H01L23/4334
    • H01L23/49811
    • H01L24/13
    • H01L24/16
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/01Manufacture or treatment
    • H10W20/021Manufacture or treatment of interconnections within wafers or substrates
    • H10W20/023Manufacture or treatment of interconnections within wafers or substrates the interconnections being through-semiconductor vias
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/20Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/10Arrangements for heating
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/20Arrangements for cooling
    • H10W40/22Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections
    • H10W40/226Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area
    • H10W40/228Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area the projecting parts being wire-shaped or pin-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/20Arrangements for cooling
    • H10W40/25Arrangements for cooling characterised by their materials
    • H10W40/258Metallic materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/70Fillings or auxiliary members in containers or in encapsulations for thermal protection or control
    • H10W40/77Auxiliary members characterised by their shape
    • H10W40/778Auxiliary members characterised by their shape in encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H10W42/261Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their shapes or dispositions
    • H10W42/273Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their shapes or dispositions the arrangements being between laterally adjacent chips, e.g. walls between chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H10W42/261Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their shapes or dispositions
    • H10W42/276Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their shapes or dispositions the arrangements being on an external surface of the package, e.g. on the outer surface of an encapsulation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/016Manufacture or treatment using moulds
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H01L2223/6677
    • H01L2224/131
    • H01L2224/16227
    • H01L2924/10272
    • H01L2924/10329
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W44/00Electrical arrangements for controlling or matching impedance
    • H10W44/20Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]
    • H10W44/241Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for passive devices or passive elements
    • H10W44/248Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for passive devices or passive elements for antennas
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63Vias, e.g. via plugs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/251Materials
    • H10W72/252Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
KR1020237028883A 2021-03-03 2022-02-07 전자기 간섭 차폐 및 열 소산을 위해 구성된 금속층을 포함하는 패키지 Pending KR20230153374A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17/191,550 2021-03-03
US17/191,550 US12142577B2 (en) 2021-03-03 2021-03-03 Package comprising metal layer configured for electromagnetic interference shield and heat dissipation
PCT/US2022/015521 WO2022186953A2 (en) 2021-03-03 2022-02-07 Package comprising metal layer configured for electromagnetic interference shield and heat dissipation

Publications (1)

Publication Number Publication Date
KR20230153374A true KR20230153374A (ko) 2023-11-06

Family

ID=80623490

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237028883A Pending KR20230153374A (ko) 2021-03-03 2022-02-07 전자기 간섭 차폐 및 열 소산을 위해 구성된 금속층을 포함하는 패키지

Country Status (8)

Country Link
US (1) US12142577B2 (enExample)
EP (1) EP4302331A2 (enExample)
JP (1) JP2024508408A (enExample)
KR (1) KR20230153374A (enExample)
CN (1) CN116964729A (enExample)
PH (1) PH12023551687A1 (enExample)
TW (1) TW202236447A (enExample)
WO (1) WO2022186953A2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230245985A1 (en) * 2022-02-01 2023-08-03 Skyworks Solutions, Inc. Shielded wafer level chip scale package with shield connected to ground via redistribution layers
TWI840075B (zh) * 2023-01-05 2024-04-21 矽品精密工業股份有限公司 電子封裝件及其製法
TWI865147B (zh) * 2023-01-05 2024-12-01 矽品精密工業股份有限公司 電子封裝件及其製法
TWI883373B (zh) * 2023-01-17 2025-05-11 華東科技股份有限公司 具散熱功能及電磁防護功能的晶片封裝結構的製造方法
US20240371774A1 (en) * 2023-05-01 2024-11-07 Taiwan Semiconductor Manufacturing Company Limited Package module including a recessed upper surface and methods of forming the package module
CN121694066A (zh) * 2023-07-26 2026-03-17 长江存储科技有限责任公司 芯片封装结构、半导体结构及其制作方法
CN119232106B (zh) * 2024-09-20 2025-12-05 泉州市三安集成电路有限公司 声表面波器件及其制备方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100703090B1 (ko) * 2005-08-30 2007-04-06 삼성전기주식회사 후면 접지형 플립칩 반도체 패키지
JP2009277910A (ja) * 2008-05-15 2009-11-26 Sharp Corp 半導体モジュールおよび半導体モジュールの製造方法
US8373264B2 (en) * 2008-07-31 2013-02-12 Skyworks Solutions, Inc. Semiconductor package with integrated interference shielding and method of manufacture thereof
KR102250612B1 (ko) 2012-06-14 2021-05-10 스카이워크스 솔루션즈, 인코포레이티드 고조파 종단 회로를 포함하는 전력 증폭기 모듈 및 관련된 시스템, 장치, 및 방법
KR20140057979A (ko) * 2012-11-05 2014-05-14 삼성전자주식회사 반도체 패키지 및 반도체 패키지의 제조 방법
JP5767268B2 (ja) * 2013-04-02 2015-08-19 太陽誘電株式会社 回路モジュール及びその製造方法
JP6484019B2 (ja) * 2014-12-11 2019-03-13 アピックヤマダ株式会社 半導体製造装置
CN107535081B (zh) * 2015-05-11 2021-02-02 株式会社村田制作所 高频模块
TWI590392B (zh) * 2015-08-03 2017-07-01 矽品精密工業股份有限公司 電子封裝件及其製法
US10163808B2 (en) * 2015-10-22 2018-12-25 Avago Technologies International Sales Pte. Limited Module with embedded side shield structures and method of fabricating the same
US10872879B2 (en) 2015-11-12 2020-12-22 Amkor Technology Singapore Holding Pte. Ltd. Semiconductor package and manufacturing method thereof
JP2017103282A (ja) * 2015-11-30 2017-06-08 イビデン株式会社 プリント配線板
US10147685B2 (en) * 2016-03-10 2018-12-04 Apple Inc. System-in-package devices with magnetic shielding
JP6500859B2 (ja) * 2016-08-22 2019-04-17 株式会社村田製作所 無線モジュール
TWI603456B (zh) 2016-09-30 2017-10-21 矽品精密工業股份有限公司 電子封裝結構及其製法
US10178757B2 (en) * 2016-09-30 2019-01-08 Avago Technologies International Sales Pte. Limited Systems and methods for providing electromagnetic interference (EMI) compartment shielding for components disposed inside of system electronic packages
US20180374798A1 (en) * 2017-06-24 2018-12-27 Amkor Technology, Inc. Semiconductor device having emi shielding structure and related methods
KR102442623B1 (ko) * 2017-08-08 2022-09-13 삼성전자주식회사 반도체 패키지
JP7130958B2 (ja) * 2017-12-27 2022-09-06 株式会社村田製作所 モジュール
US10790238B2 (en) * 2018-05-10 2020-09-29 Samsung Electro-Mechanics Co., Ltd. Electronic device module and method of manufacturing the same
US20200098698A1 (en) 2018-09-26 2020-03-26 Intel Corporation Novel wafer level chip scale package (wlcsp), flip-chip chip scale package (fccsp), and fan out shielding concepts
KR102586888B1 (ko) * 2018-11-27 2023-10-06 삼성전기주식회사 반도체 패키지
US11310907B2 (en) * 2019-11-27 2022-04-19 Intel Corporation Microelectronic package with substrate-integrated components
US11605571B2 (en) 2020-05-29 2023-03-14 Qualcomm Incorporated Package comprising a substrate, an integrated device, and an encapsulation layer with undercut
US11495531B2 (en) * 2020-07-09 2022-11-08 Advanced Semiconductore Engineering Korea, Inc. Semiconductor device package and method of manufacturing the same

Also Published As

Publication number Publication date
JP2024508408A (ja) 2024-02-27
CN116964729A (zh) 2023-10-27
US20220285286A1 (en) 2022-09-08
EP4302331A2 (en) 2024-01-10
US12142577B2 (en) 2024-11-12
WO2022186953A3 (en) 2022-10-20
WO2022186953A2 (en) 2022-09-09
TW202236447A (zh) 2022-09-16
PH12023551687A1 (en) 2024-04-22

Similar Documents

Publication Publication Date Title
CN115485830B (zh) 包括衬底、集成器件、和具有底切的封装层的封装
KR20230153374A (ko) 전자기 간섭 차폐 및 열 소산을 위해 구성된 금속층을 포함하는 패키지
CN115280494A (zh) 包括封装的触点对触点耦接的器件
JP7823041B2 (ja) 基板と高密度相互接続集積デバイスとを含むパッケージ
KR20240013097A (ko) 브리지를 통해 결합된 통합 디바이스들을 포함한 패키지
KR20240025525A (ko) 집적 디바이스들 및 집적 디바이스들의 최상부 측면들을 커플링시키는 브리지를 포함하는 패키지
CN119768919A (zh) 包括集成器件、芯粒和金属化部分的封装
KR20250009958A (ko) 금속화 부분들 사이에 위치된 상호연결 다이를 포함하는 패키지
KR20250008858A (ko) 기판들 사이에 위치된 상호연결 다이를 포함하는 패키지
JP2024531580A (ja) 背面金属層を有する集積デバイスを備えるパッケージ
KR102615682B1 (ko) 캐비티를 통해 기판에 결합되는 통합 디바이스를 포함하는 패키지 및 이러한 패키지를 제작하기 위한 방법
CN116075931A (zh) 包括被配置为散热器的导线接合件的封装件
US20240038831A1 (en) Package with a substrate comprising embedded stacked trench capacitor devices
CN119654710A (zh) 包括第一基板、第二基板和耦合到第二基板的底表面的电器件的封装
KR20240057411A (ko) 고밀도 상호연결부들을 갖는 기판을 포함하는 패키지
KR20240035464A (ko) 차폐체를 갖는 블록 디바이스를 포함하는 패키지
CN116325144A (zh) 具有包括可变厚度阻焊层的衬底的封装件
KR20250019641A (ko) 후면 전력 분배 네트워크를 위해 구성된 브리지를 갖는 기판을 포함하는 패키지
KR20250046259A (ko) 집적 디바이스 및 제2 금속화 부분에 커플링된 제1 금속화 부분을 포함하는 패키지
JP2024531533A (ja) 高密度相互接続部を有する基板を含むパッケージ
JP2026509412A (ja) 光集積デバイスを備えるパッケージ
KR20240026484A (ko) 오버행을 갖는 스택형 통합 디바이스들을 포함하는 패키지
JP2026508947A (ja) 埋め込み集積デバイスを備えるパッケージ基板
JP2024505488A (ja) 周辺相互接続を備える基板をもつパッケージ

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000