KR20230043924A - 반도체 장치의 구동 방법 - Google Patents

반도체 장치의 구동 방법 Download PDF

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Publication number
KR20230043924A
KR20230043924A KR1020237006224A KR20237006224A KR20230043924A KR 20230043924 A KR20230043924 A KR 20230043924A KR 1020237006224 A KR1020237006224 A KR 1020237006224A KR 20237006224 A KR20237006224 A KR 20237006224A KR 20230043924 A KR20230043924 A KR 20230043924A
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KR
South Korea
Prior art keywords
transistor
wiring
circuit
insulator
potential
Prior art date
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Pending
Application number
KR1020237006224A
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English (en)
Korean (ko)
Inventor
순페이 야마자키
하지메 키무라
히토시 쿠니타케
Original Assignee
가부시키가이샤 한도오따이 에네루기 켄큐쇼
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Publication of KR20230043924A publication Critical patent/KR20230043924A/ko
Pending legal-status Critical Current

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/221Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using ferroelectric capacitors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225Auxiliary circuits
    • G11C11/2273Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225Auxiliary circuits
    • G11C11/2275Writing or programming circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B51/00Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory transistors
    • H10B51/30Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory transistors characterised by the memory core region
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B53/00Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
    • H10B53/30Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225Auxiliary circuits
    • G11C11/2259Cell access

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Thin Film Transistor (AREA)
KR1020237006224A 2020-08-03 2021-07-20 반도체 장치의 구동 방법 Pending KR20230043924A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2020-131964 2020-08-03
JP2020131964 2020-08-03
PCT/IB2021/056525 WO2022029534A1 (ja) 2020-08-03 2021-07-20 半導体装置の駆動方法

Publications (1)

Publication Number Publication Date
KR20230043924A true KR20230043924A (ko) 2023-03-31

Family

ID=80117208

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237006224A Pending KR20230043924A (ko) 2020-08-03 2021-07-20 반도체 장치의 구동 방법

Country Status (6)

Country Link
US (2) US12266392B2 (https=)
JP (2) JP7702411B2 (https=)
KR (1) KR20230043924A (https=)
CN (1) CN115867968A (https=)
DE (1) DE112021004116T5 (https=)
WO (1) WO2022029534A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230039668A (ko) 2020-07-17 2023-03-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
CN116114019A (zh) * 2020-09-22 2023-05-12 株式会社半导体能源研究所 半导体装置及电子设备
WO2024243833A1 (zh) * 2023-05-30 2024-12-05 长江存储科技有限责任公司 半导体器件及其制备方法、存储器系统
KR20250053567A (ko) * 2023-10-13 2025-04-22 삼성전자주식회사 반도체 소자와, 이를 포함하는 메모리 소자 및 전자 장치
KR20250054578A (ko) * 2023-10-16 2025-04-23 삼성전자주식회사 강유전체 전계 효과 트랜지스터, 메모리 장치, 및 뉴럴 네트워크 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110176348A1 (en) 2010-01-15 2011-07-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device

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US5519234A (en) 1991-02-25 1996-05-21 Symetrix Corporation Ferroelectric dielectric memory cell can switch at least giga cycles and has low fatigue - has high dielectric constant and low leakage current
JP2692610B2 (ja) * 1994-09-28 1997-12-17 日本電気株式会社 半導体不揮発性メモリセル及びその動作方法
JP3188179B2 (ja) 1995-09-26 2001-07-16 シャープ株式会社 強誘電体薄膜素子の製造方法及び強誘電体メモリ素子の製造方法
JP2939973B2 (ja) * 1996-06-06 1999-08-25 日本電気株式会社 不揮発性半導体メモリ装置の駆動方法
JP4256670B2 (ja) 2002-12-10 2009-04-22 富士通株式会社 容量素子、半導体装置およびその製造方法
JP4652087B2 (ja) 2004-03-11 2011-03-16 株式会社半導体エネルギー研究所 半導体装置
US7928910B2 (en) 2005-03-31 2011-04-19 Semiconductor Energy Laboratory Co., Ltd. Wireless chip and electronic device having wireless chip
US9324405B2 (en) 2010-11-30 2016-04-26 Radiant Technologies, Inc. CMOS analog memories utilizing ferroelectric capacitors
US9269416B2 (en) 2010-11-30 2016-02-23 Radiant Technologies, Inc. Non-volatile counter utilizing a ferroelectric capacitor
US8760907B2 (en) 2010-11-30 2014-06-24 Radiant Technologies, Inc. Analog memories utilizing ferroelectric capacitors
JP6258672B2 (ja) 2013-11-21 2018-01-10 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
CN106105037B (zh) 2014-01-21 2019-03-29 拉迪安特技术公司 利用铁电电容器的非易失性计数器
CN106716539B (zh) 2014-09-26 2020-11-17 拉迪安特技术公司 利用铁电电容器的cmos模拟存储器
US11171115B2 (en) 2019-03-18 2021-11-09 Kepler Computing Inc. Artificial intelligence processor with three-dimensional stacked memory
US11296708B2 (en) 2019-12-27 2022-04-05 Kepler Computing, Inc. Low power ferroelectric based majority logic gate adder

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110176348A1 (en) 2010-01-15 2011-07-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
K. Kato et al., "Evaluation of Off-State Current Characteristics of Transistor Using Oxide Semiconductor Material, Indium-Gallium-Zinc Oxide," Jpn. J. Appl. Phys., vol. 51, 021201(2012).
S. Amano et al., "Low Power LC Display Using In-Ga-Zn-Oxide TFTs Based on Variable Frame Frequency," SID Symp. Dig. Papers, vol.41, pp.626-629(2010).
S. Yamazaki et al., "Properties of crystalline In-Ga-Zn-oxide semiconductor and its transistor characteristics," Jpn. J. Appl. Phys., vol. 53, 04ED18(2014).
T. Ishizu et al., "Embedded Oxide Semiconductor Memories: A Key Enabler for Low-Power ULSI," ECS Tran., vol. 79, pp. 149-156(2017).

Also Published As

Publication number Publication date
CN115867968A (zh) 2023-03-28
JP2025139598A (ja) 2025-09-26
US20230298650A1 (en) 2023-09-21
US20250157519A1 (en) 2025-05-15
DE112021004116T5 (de) 2023-06-29
US12266392B2 (en) 2025-04-01
WO2022029534A1 (ja) 2022-02-10
JPWO2022029534A1 (https=) 2022-02-10
JP7702411B2 (ja) 2025-07-03

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