KR20220091609A - Composition for forming release layer - Google Patents

Composition for forming release layer Download PDF

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KR20220091609A
KR20220091609A KR1020227020140A KR20227020140A KR20220091609A KR 20220091609 A KR20220091609 A KR 20220091609A KR 1020227020140 A KR1020227020140 A KR 1020227020140A KR 20227020140 A KR20227020140 A KR 20227020140A KR 20220091609 A KR20220091609 A KR 20220091609A
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release layer
composition
polyamic acid
tetracarboxylic dianhydride
forming
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카즈야 에바라
카즈야 신도
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닛산 가가쿠 가부시키가이샤
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Abstract

방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하고, 상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 박리층 형성용 조성물을 제공한다. A polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine contains an aromatic diamine containing at least one of an ester bond and an ether bond, and/or the aromatic Provided is a composition for forming a release layer in which tetracarboxylic dianhydride contains at least one of an ester bond and an ether bond.

Figure pat00028
Figure pat00028

Description

박리층 형성용 조성물{COMPOSITION FOR FORMING RELEASE LAYER}Composition for forming a release layer

본 발명은 박리층 형성용 조성물에 관한 것으로, 상세히 설명하면, 기체 위에 설치하는 박리층을 형성하기 위한 박리층 형성용 조성물에 관한 것이다. The present invention relates to a composition for forming a release layer, and more particularly, to a composition for forming a release layer for forming a release layer installed on a substrate.

최근, 전자 디바이스에는, 구부린다고 하는 기능 부여나 박형화 및 경량화와 같은 성능이 요구되고 있다. 이 점에서, 종래의 무겁고 취약하여 구부릴 수 없는 유리 기판 대신에, 경량의 플랙시블 플라스틱 기판을 사용하는 것이 요구된다. 또한 신세대 디스플레이에서는, 경량의 플랙시블 플라스틱 기판을 사용하는, 액티브 풀컬러(active full-color) TFT 디스플레이 패널의 개발이 요구되고 있다. 그래서, 수지 필름을 기판으로 한 전자 디바이스의 제조 방법이 여러 가지로 검토되기 시작되고 있고, 신세대 디스플레이에서는, 기존의 TFT 설비를 전용 가능한 프로세스로 제조 검토가 진행되고 있다. In recent years, performance, such as provision of a bending function, and thickness reduction and weight reduction, is calculated|required by an electronic device. In this regard, it is required to use a lightweight flexible plastic substrate instead of the conventional heavy, brittle, and unbendable glass substrate. In addition, in the new generation display, the development of an active full-color TFT display panel using a lightweight flexible plastic substrate is required. Then, the manufacturing method of the electronic device which used the resin film as a board|substrate is beginning to be examined in various ways, and in a new-generation display, manufacturing examination is advancing by the process which can divert existing TFT equipment.

특허문헌 1, 2 및 3은 유리 기판 위에 아몰포스 실리콘 박막층을 형성하고, 그 박막층 위에 플라스틱 기판을 형성한 후에, 유리면측에서 레이저를 조사하여, 아몰포스 실리콘의 결정화에 따라 발생하는 수소 가스에 의해 플라스틱 기판을 유리 기판으로부터 박리하는 방법을 개시한다. 또한 특허문헌 4는 특허문헌 1∼3 개시의 기술을 사용하여 피박리층(특허문헌 4에서 「피전사층」으로 기재된다.)을 플라스틱 필름에 첩부하여 액정 표시 장치를 완성시키는 방법을 개시한다. In Patent Documents 1, 2 and 3, an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, a laser is irradiated from the glass surface side, and hydrogen gas generated by crystallization of amorphous silicon is used. A method for peeling a plastic substrate from a glass substrate is disclosed. In addition, Patent Document 4 discloses a method of affixing a layer to be peeled (described as a "transfer target layer" in Patent Document 4) to a plastic film using the technique disclosed in Patent Documents 1 to 3 to complete a liquid crystal display device. .

그러나, 특허문헌 1∼4에 개시된 방법, 특히 특허문헌 4에 개시된 방법은 투광성이 높은 기판을 사용하는 것이 필수이며, 기판을 통과시키고, 또한 비정질 실리콘에 포함되는 수소를 방출시키는데 충분한 에너지를 주기 위해, 비교적 큰 레이저광의 조사가 필요하게 되어, 피박리층에 손상을 주어 버린다고 하는 문제가 있다. 또한 레이저 처리에 장시간을 요하여, 대면적을 갖는 피박리층을 박리하는 것은 곤란하기 때문에, 디바이스 제작의 생산성을 높이는 것이 어렵다고 하는 문제도 있다. However, in the method disclosed in Patent Documents 1 to 4, particularly the method disclosed in Patent Document 4, it is essential to use a substrate with high light transmittance, and in order to give sufficient energy to pass through the substrate and release hydrogen contained in amorphous silicon. , a relatively large laser beam irradiation is required, and there is a problem that the layer to be peeled is damaged. Moreover, since it requires a long time for laser processing and it is difficult to peel the to-be-released layer which has a large area, there also exists a problem that it is difficult to improve the productivity of device manufacture.

일본 특개 평10-125929호 공보Japanese Patent Application Laid-Open No. 10-125929 일본 특개 평10-125931호 공보Japanese Patent Application Laid-Open No. 10-125931 국제공개 제2005/050754호International Publication No. 2005/050754 일본 특개 평10-125930호 공보Japanese Patent Laid-Open No. 10-125930

본 발명은 상기 사정을 감안하여 이루어진 것으로, 플랙시블 전자 디바이스의 수지 기판에 손상을 주지 않고 박리할 수 있는 박리층 형성용 조성물을 제공하는 것을 목적으로 한다. This invention was made in view of the said situation, and an object of this invention is to provide the composition for peeling layer formation which can peel without damaging the resin substrate of a flexible electronic device.

본 발명자들은, 상기 과제를 해결하기 위해 예의 검토를 거듭한 결과, 방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하는 조성물에 있어서, 상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 경우에, 기체와의 우수한 밀착성, 및 플랙시블 전자 디바이스로서 사용되는 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 박리층을 형성할 수 있는 조성물이 얻어지는 것을 발견하고, 본 발명을 완성시켰다. The present inventors, as a result of repeated intensive studies in order to solve the above problems, in a composition comprising a polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine is an ester bond and When it contains an aromatic diamine containing at least one of an ether bond, and/or the aromatic tetracarboxylic dianhydride contains an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond, It discovered that the composition which can form the peeling layer which has the outstanding adhesiveness and moderate adhesiveness with the resin substrate used as a flexible electronic device, and moderate peelability is obtained, and completed this invention.

즉, 본 발명은,That is, the present invention is

1. 방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하고,1. A polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent,

상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 것을 특징으로 하는 박리층 형성용 조성물,The aromatic diamine contains an aromatic diamine containing at least one of an ester bond and an ether bond, and/or the aromatic tetracarboxylic dianhydride contains an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond. A composition for forming a release layer, characterized in that

2. 상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민이 식 (A1)∼(A42)로 이루어지는 군으로부터 선택되는 적어도 1종인 1의 박리층 형성용 조성물,2. The composition for forming a release layer according to 1, wherein the aromatic diamine containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (A1) to (A42);

Figure pat00001
Figure pat00001

Figure pat00002
Figure pat00002

Figure pat00003
Figure pat00003

Figure pat00004
Figure pat00004

Figure pat00005
Figure pat00005

Figure pat00006
Figure pat00006

Figure pat00007
Figure pat00007

3. 상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물이 식 (B1)∼(B14)로 이루어지는 군으로부터 선택되는 적어도 1종인 1 또는 2의 박리층 형성용 조성물,3. The composition for forming a release layer according to 1 or 2, wherein the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (B1) to (B14);

Figure pat00008
Figure pat00008

4. 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물을 더 포함하는 1∼3 중 어느 하나의 박리층 형성용 조성물,4. The composition for forming a release layer according to any one of 1 to 3, wherein the aromatic tetracarboxylic dianhydride further contains an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond;

5. 상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 벤젠 골격, 나프틸 골격 또는 바이페닐 골격을 포함하는 것인 4의 박리층 형성용 조성물,5. The composition for forming a release layer according to 4, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton or a biphenyl skeleton;

6. 상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종인 5의 박리층 형성용 조성물,6. The composition for forming a release layer according to 5, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12);

Figure pat00009
Figure pat00009

7. 상기 유기 용매가 식 (S1)로 표시되는 아마이드류, 식 (S2)로 표시되는 아마이드류 및 식 (S3)으로 표시되는 아마이드류로부터 선택되는 적어도 1개를 포함하는 1∼6 중 어느 하나의 박리층 형성용 조성물,7. Any one of 1 to 6 wherein the organic solvent contains at least one selected from amides represented by formula (S1), amides represented by formula (S2), and amides represented by formula (S3) composition for forming a release layer of

Figure pat00010
Figure pat00010

(식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타낸다.)(Wherein, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number.)

8. 1∼7 중 어느 하나의 박리층 형성용 조성물을 사용하여 형성되는 박리층,8. A release layer formed using the composition for forming a release layer according to any one of 1 to 7;

9. 8의 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 방법,9. A method for manufacturing a flexible electronic device comprising a resin substrate, comprising the use of the release layer of 8;

10. 8의 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 터치패널 센서의 제조 방법,10. A method of manufacturing a touch panel sensor having a resin substrate, characterized in that using the release layer of 8;

11. 상기 수지 기판이 폴리이미드로 이루어지는 기판인 9 또는 10의 제조 방법을 제공한다. 11. It provides the manufacturing method of 9 or 10, wherein the resin substrate is a substrate made of polyimide.

본 발명의 박리층 형성용 조성물을 사용함으로써 기체와의 우수한 밀착성, 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다. 본 발명의 조성물을 사용함으로써 플랙시블 전자 디바이스의 제조 프로세스에 있어서, 기체 위에 형성된 수지 기판이나, 또한 그 위에 설치되는 회로 등에 손상을 주지 않고, 당해 회로 등과 함께 당해 수지 기판을 당해 기체로부터 분리하는 것이 가능하게 된다. 따라서, 본 발명의 박리층 형성용 조성물은 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 프로세스의 간편화와 그 수율의 향상 등에 기여할 수 있다. By using the composition for forming a release layer of the present invention, it is possible to obtain a film having excellent adhesion to a substrate, and moderate adhesion to a resin substrate and appropriate peelability, with good reproducibility. In the manufacturing process of a flexible electronic device by using the composition of the present invention, without damaging the resin substrate formed on the substrate or the circuit installed thereon, separating the resin substrate together with the circuit and the like from the substrate it becomes possible Therefore, the composition for forming a release layer of the present invention can contribute to the simplification of the manufacturing process of the flexible electronic device provided with the resin substrate, the improvement of the yield, etc.

도 1은 실시예 4에서 측정한 투과율을 나타내는 그래프이다. 1 is a graph showing the transmittance measured in Example 4.

이하, 본 발명에 대해, 보다 상세하게 설명한다. EMBODIMENT OF THE INVENTION Hereinafter, this invention is demonstrated in more detail.

본 발명의 박리층 형성용 조성물은 방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하는 것이며, 상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 것이다. 여기에서, 본 발명에서의 박리층이란 소정의 목적으로 유리 기체 바로 위에 설치되는 층이며, 그 전형예로서는 플랙시블 전자 디바이스의 제조 프로세스에 있어서 기체와, 폴리이미드와 같은 수지로 이루어지는 플랙시블 전자 디바이스의 수지 기판과의 사이에, 당해 수지 기판을 소정의 프로세스 중에서 고정하기 위해 설치되고, 또한, 당해 수지 기판 위에 전자 회로 등이 형성된 후에 있어서 당해 수지 기판을 당해 기체로부터 용이하게 박리할 수 있도록 하기 위해 설치되는 것을 들 수 있다. The composition for forming a release layer of the present invention comprises a polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine contains at least one of an ester bond and an ether bond. Min and/or the aromatic tetracarboxylic dianhydride contains an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond. Here, the release layer in the present invention is a layer provided directly on the glass substrate for a predetermined purpose, and a typical example thereof is a flexible electronic device composed of a substrate and a resin such as polyimide in the manufacturing process of the flexible electronic device. It is provided between the resin substrate and the resin substrate to fix the resin substrate in a predetermined process, and is provided so that the resin substrate can be easily peeled from the substrate after an electronic circuit or the like is formed on the resin substrate. can be heard

상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민은 그 분자 내에 에스터 결합 및 에터 결합의 일방을 포함하거나, 또는 이것들의 양방을 포함하는 것이다. The aromatic diamine containing at least one of an ester bond and an ether bond contains either an ester bond or an ether bond in the molecule, or contains both of these.

이러한 방향족 다이아민으로서는 복수의 탄소수 6∼20의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 다이아민을 들 수 있다. 상기 방향족환의 구체예로서는 벤젠환, 나프탈렌환, 안트라센환, 펜안트렌환 등을 들 수 있다. 그 중에서도, 폴리아믹산의 유기 용매에의 용해성을 확보하는 관점에서, 2 또는 3개의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 다이아민이 바람직하다. Examples of such aromatic diamine include diamines having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by an ester bond or an ether bond. Specific examples of the aromatic ring include a benzene ring, a naphthalene ring, an anthracene ring, and a phenanthrene ring. Especially, from a viewpoint of ensuring the solubility to the organic solvent of a polyamic acid, the diamine which has a structure in which 2 or 3 aromatic rings were connected by ester bond or ether bond is preferable.

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민의 바람직한 구체예로서는 이하에 나타내는 것을 들 수 있다. In this invention, what is shown below is mentioned as a preferable specific example of the aromatic diamine containing at least one of an ester bond and an ether bond.

Figure pat00011
Figure pat00011

Figure pat00012
Figure pat00012

Figure pat00013
Figure pat00013

Figure pat00014
Figure pat00014

Figure pat00015
Figure pat00015

Figure pat00016
Figure pat00016

Figure pat00017
Figure pat00017

상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물은 그 분자 내에 에스터 결합과 에터 결합의 일방을 포함하거나, 또는 이것들의 양방 모두를 포함하는 것이다. The aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond contains either an ester bond or an ether bond in its molecule, or contains both of these.

이러한 방향족 테트라카복실산 이무수물로서는 복수의 탄소수 6∼20의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 테트라카복실산 이무수물을 들 수 있다. 상기 방향족환의 구체예로서는 상기와 동일한 것을 들 수 있다. 그 중에서도, 폴리아믹산의 유기 용매에의 용해성을 확보하는 관점에서, 3 또는 4개의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 것이 바람직하다. Examples of such aromatic tetracarboxylic dianhydride include tetracarboxylic dianhydride having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by an ester bond or an ether bond. As a specific example of the said aromatic ring, the thing similar to the above is mentioned. Especially, from a viewpoint of ensuring the solubility to the organic solvent of a polyamic acid, it is preferable to have a structure in which 3 or 4 aromatic rings were connected by the ester bond or an ether bond.

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물의 바람직한 구체예로서는 이하에 나타내는 것을 들 수 있다. In this invention, what is shown below is mentioned as a preferable specific example of the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond.

Figure pat00018
Figure pat00018

본 발명에서는, 전술한 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민과 함께, 그 이외의 다이아민을 사용할 수 있다. In this invention, with the aromatic diamine containing at least one of the above-mentioned ester bond and an ether bond, other diamines can be used.

이러한 다이아민은 지방족 다이아민, 방향족 다이아민의 어떤 것이어도 되지만, 얻어지는 박막의 강도와 내열성을 확보하는 관점에서, 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 다이아민이 바람직하다. The diamine may be either an aliphatic diamine or an aromatic diamine, but an aromatic diamine containing neither an ester bond nor an ether bond is preferable from the viewpoint of ensuring the strength and heat resistance of the resulting thin film.

그 구체예로서는 1,4-다이아미노벤젠(p-페닐렌다이아민), 1,3-다이아미노벤젠(m-페닐렌다이아민), 1,2-다이아미노벤젠(o-페닐렌다이아민), 2,4-다이아미노톨루엔, 2,5-다이아미노톨루엔, 2,6-다이아미노톨루엔, 4,6-다이메틸-m-페닐렌다이아민, 2,5-다이메틸-p-페닐렌다이아민, 2,6-다이메틸-p-페닐렌다이아민, 2,4,6-트라이메틸-1,3-페닐렌다이아민, 2,3,5,6-테트라메틸-p-페닐렌다이아민, m-자일릴렌다이아민, p-자일릴렌다이아민, 5-트라이플루오로메틸벤젠-1,3-다이아민, 5-트라이플루오로메틸 벤젠-1,2-다이아민, 3,5-비스(트라이플루오로메틸)벤젠-1,2-다이아민 등의 벤젠핵을 1개 포함하는 다이아민; 1,2-나프탈렌다이아민, 1,3-나프탈렌다이아민, 1,4-나프탈렌다이아민, 1,5-나프탈렌다이아민, 1,6-나프탈렌다이아민, 1,7-나프탈렌다이아민, 1,8-나프탈렌다이아민, 2,3-나프탈렌다이아민, 2,6-나프탈렌다이아민, 4,4'-바이페닐 다이아민, 2,2'-비스(트라이플루오로메틸)-4,4'-다이아미노바이페닐, 3,3'-다이메틸-4,4'-다이아미노다이페닐메테인, 3,3'-다이카복시-4,4'-다이아미노다이페닐메테인, 3,3',5,5'-테트라메틸-4,4'-다이아미노다이페닐메테인, 4,4'-다이아미노벤즈아닐리드, 3,3'-다이클로로벤지딘, 3,3'-다이메틸벤지딘, 2,2'-다이메틸벤지딘, 3,3'-다이아미노다이페닐메테인, 3,4'-다이아미노다이페닐메테인, 4,4'-다이아미노다이페닐메테인, 2,2-비스(3-아미노페닐)프로페인, 2,2-비스(4-아미노페닐)프로페인, 2,2-비스(3-아미노페닐)-1,1,1,3,3,3-헥사플루오로프로페인, 2,2-비스(4-아미노페닐)-1,1,1,3,3,3-헥사플루오로프로페인, 3,3'-다이아미노다이페닐설폭사이드, 3,4'-다이아미노다이페닐설폭사이드, 4,4'-다이아미노다이페닐설폭사이드, 3,3'-비스(트라이플루오로메틸)바이페닐-4,4'-다이아민, 3,3',5,5'-테트라플루오로바이페닐-4,4'-다이아민, 4,4'-다이아미노옥타플루오로바이페닐 등의 벤젠핵을 2개 포함하는 다이아민; 1,5-다이아미노안트라센, 2,6-다이아미노안트라센, 9,10-다이아미노안트라센, 1,8-다이아미노펜안트렌, 2,7-다이아미노펜안트렌, 3,6-다이아미노펜안트렌, 9,10-다이아미노펜안트렌, 1,3-비스(3-아미노페닐)벤젠, 1,3-비스(4-아미노페닐)벤젠, 1,4-비스(3-아미노페닐)벤젠, 1,4-비스(4-아미노페닐)벤젠, 1,3-비스(3-아미노페닐설파이드)벤젠, 1,3-비스(4-아미노페닐설파이드)벤젠, 1,4-비스(4-아미노페닐설파이드)벤젠, 1,3-비스(3-아미노페닐설폰)벤젠, 1,3-비스(4-아미노페닐설폰)벤젠, 1,4-비스(4-아미노페닐설폰)벤젠, 1,3-비스[2-(4-아미노페닐)아이소프로필]벤젠, 1,4-비스[2-(3-아미노페닐)아이소프로필]벤젠, 1,4-비스[2-(4-아미노페닐)아이소프로필]벤젠 등의 벤젠핵을 3개 포함하는 다이아민 등을 들 수 있지만, 이것들에 한정되지 않는다. 이것들은 1종 단독으로도, 2종 이상을 조합하여 사용할 수도 있다. Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), 1,2-diaminobenzene (o-phenylenediamine) , 2,4-diaminotoluene, 2,5-diaminotoluene, 2,6-diaminotoluene, 4,6-dimethyl-m-phenylenediamine, 2,5-dimethyl-p-phenylene Diamine, 2,6-dimethyl-p-phenylenediamine, 2,4,6-trimethyl-1,3-phenylenediamine, 2,3,5,6-tetramethyl-p-phenylene Diamine, m-xylylenediamine, p-xylylenediamine, 5-trifluoromethylbenzene-1,3-diamine, 5-trifluoromethylbenzene-1,2-diamine, 3,5 -diamine containing one benzene nucleus, such as -bis(trifluoromethyl)benzene-1,2-diamine; 1,2-naphthalenediamine, 1,3-naphthalenediamine, 1,4-naphthalenediamine, 1,5-naphthalenediamine, 1,6-naphthalenediamine, 1,7-naphthalenediamine, 1, 8-naphthalenediamine, 2,3-naphthalenediamine, 2,6-naphthalenediamine, 4,4'-biphenyl diamine, 2,2'-bis(trifluoromethyl)-4,4'- Diaminobiphenyl, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 3,3'-dicarboxy-4,4'-diaminodiphenylmethane, 3,3', 5,5'-tetramethyl-4,4'-diaminodiphenylmethane, 4,4'-diaminobenzanilide, 3,3'-dichlorobenzidine, 3,3'-dimethylbenzidine, 2, 2'-dimethylbenzidine, 3,3'-diaminodiphenylmethane, 3,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylmethane, 2,2-bis(3 -Aminophenyl)propane, 2,2-bis(4-aminophenyl)propane, 2,2-bis(3-aminophenyl)-1,1,1,3,3,3-hexafluoropropane , 2,2-bis(4-aminophenyl)-1,1,1,3,3,3-hexafluoropropane, 3,3'-diaminodiphenylsulfoxide, 3,4'-diamino Diphenylsulfoxide, 4,4'-diaminodiphenylsulfoxide, 3,3'-bis(trifluoromethyl)biphenyl-4,4'-diamine, 3,3',5,5'- diamines containing two benzene nuclei, such as tetrafluorobiphenyl-4,4'-diamine and 4,4'-diaminooctafluorobiphenyl; 1,5-diaminoanthracene, 2,6-diaminoanthracene, 9,10-diaminoanthracene, 1,8-diaminophenanthrene, 2,7-diaminophenanthrene, 3,6-diaminophenanthrene , 9,10-diaminophenanthrene, 1,3-bis(3-aminophenyl)benzene, 1,3-bis(4-aminophenyl)benzene, 1,4-bis(3-aminophenyl)benzene, 1 ,4-bis(4-aminophenyl)benzene, 1,3-bis(3-aminophenylsulfide)benzene, 1,3-bis(4-aminophenylsulfide)benzene, 1,4-bis(4-aminophenyl) Sulfide)benzene, 1,3-bis(3-aminophenylsulfone)benzene, 1,3-bis(4-aminophenylsulfone)benzene, 1,4-bis(4-aminophenylsulfone)benzene, 1,3- Bis[2-(4-aminophenyl)isopropyl]benzene, 1,4-bis[2-(3-aminophenyl)isopropyl]benzene, 1,4-bis[2-(4-aminophenyl)isopropyl ] Although the diamine containing three benzene nuclei, such as benzene, etc. are mentioned, It is not limited to these. These can also be used individually by 1 type or in combination of 2 or more type.

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민과 함께, 그것 이외의 다이아민을 사용하는 경우, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민의 사용량은 전체 다이아민 중, 바람직하게는 70몰% 이상, 보다 바람직하게는 80몰% 이상, 더한층 바람직하게는 90몰% 이상, 더욱 바람직하게는 95몰% 이상이다. 이러한 사용량을 채용함으로써 기체와의 우수한 밀착성, 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다. In the present invention, when a diamine other than that is used together with an aromatic diamine containing at least one of an ester bond and an ether bond, the amount of the aromatic diamine containing at least one of an ester bond and an ether bond is used in the total diamine. It is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more. By employing such an amount, it is possible to obtain a film having excellent adhesion to the substrate and suitable adhesion to the resin substrate and suitable peelability with good reproducibility.

본 발명에서는, 전술한 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물과 함께, 그것 이외의 테트라카복실산 이무수물을 사용할 수 있다. In this invention, together with the aromatic tetracarboxylic dianhydride containing at least one of the above-mentioned ester bond and an ether bond, tetracarboxylic dianhydride other than that can be used.

이러한 테트라카복실산 이무수물은 지방족 테트라카복실산 이무수물, 방향족 테트라카복실산 이무수물의 어떤 것이어도 되지만, 얻어지는 박막의 강도와 내열성을 확보하는 관점에서, 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 바람직하다. The tetracarboxylic dianhydride may be either an aliphatic tetracarboxylic dianhydride or an aromatic tetracarboxylic dianhydride. An aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond, from the viewpoint of ensuring the strength and heat resistance of the resulting thin film. This is preferable.

그 구체예로서는 피로멜리트산 이무수물, 벤젠-1,2,3,4-테트라카복실산 이무수물, 나프탈렌-1,2,3,4-테트라카복실산 이무수물, 나프탈렌-1,2,5,6-테트라카복실산 이무수물, 나프탈렌-1,2,6,7-테트라카복실산 이무수물, 나프탈렌-1,2,7,8-테트라카복실산 이무수물, 나프탈렌-2,3,5,6-테트라카복실산 이무수물, 나프탈렌-2,3,6,7-테트라카복실산 이무수물, 나프탈렌-1,4,5,8-테트라카복실산 이무수물, 바이페닐-2,2',3,3'-테트라카복실산 이무수물, 바이페닐-2,3,3',4'-테트라카복실산 이무수물, 바이페닐-3,3',4,4'-테트라카복실산 이무수물, 안트라센-1,2,3,4-테트라카복실산 이무수물, 안트라센-1,2,5,6-테트라카복실산 이무수물, 안트라센-1,2,6,7-테트라카복실산 이무수물, 안트라센-1,2,7,8-테트라카복실산 이무수물, 안트라센-2,3,6,7-테트라카복실산 이무수물, 펜안트렌-1,2,3,4-테트라카복실산 이무수물, 펜안트렌-1,2,5,6-테트라카복실산 이무수물, 펜안트렌-1,2,6,7-테트라카복실산 이무수물, 펜안트렌-1,2,7,8-테트라카복실산 이무수물, 펜안트렌-1,2,9,10-테트라카복실산 이무수물, 펜안트렌-2,3,5,6-테트라카복실산 이무수물, 펜안트렌-2,3,6,7-테트라카복실산 이무수물, 펜안트렌-2,3,9,10-테트라카복실산 이무수물, 펜안트렌-3,4,5,6-테트라카복실산 이무수물, 펜안트렌-3,4,9,10-테트라카복실산 이무수물 등을 들 수 있지만, 이것들에 한정되지 않는다. 이것들은 1종 단독이어도, 2종 이상을 조합하여 사용할 수도 있다. Specific examples thereof include pyromellitic dianhydride, benzene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1,2,3,4-tetracarboxylic dianhydride, and naphthalene-1,2,5,6-tetra. Carboxylic acid dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene-2,3,5,6-tetracarboxylic dianhydride, naphthalene -2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl-2,2',3,3'-tetracarboxylic dianhydride, biphenyl- 2,3,3',4'-tetracarboxylic dianhydride, biphenyl-3,3',4,4'-tetracarboxylic dianhydride, anthracene-1,2,3,4-tetracarboxylic dianhydride, anthracene- 1,2,5,6-tetracarboxylic dianhydride, anthracene-1,2,6,7-tetracarboxylic dianhydride, anthracene-1,2,7,8-tetracarboxylic dianhydride, anthracene-2,3,6 ,7-tetracarboxylic dianhydride, phenanthrene-1,2,3,4-tetracarboxylic dianhydride, phenanthrene-1,2,5,6-tetracarboxylic dianhydride, phenanthrene-1,2,6,7 -tetracarboxylic dianhydride, phenanthrene-1,2,7,8-tetracarboxylic dianhydride, phenanthrene-1,2,9,10-tetracarboxylic dianhydride, phenanthrene-2,3,5,6-tetra Carboxylic acid dianhydride, phenanthrene-2,3,6,7-tetracarboxylic dianhydride, phenanthrene-2,3,9,10-tetracarboxylic dianhydride, phenanthrene-3,4,5,6-tetracarboxylic dianhydride Although water, phenanthrene-3,4,9,10-tetracarboxylic dianhydride, etc. are mentioned, It is not limited to these. These can also be used individually by 1 type or in combination of 2 or more type.

특히, 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물로서는, 내열성을 확보하는 관점에서, 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종이 바람직하고, 식 (C1) 및 식 (C9)로 이루어지는 군으로부터 선택되는 적어도 1종이 보다 바람직하다. In particular, as the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond, from the viewpoint of ensuring heat resistance, at least one selected from the group consisting of formulas (C1) to (C12) is preferable, and the formula (C1 ) and at least one selected from the group consisting of formula (C9) is more preferable.

Figure pat00019
Figure pat00019

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물과 함께, 그것 이외의 테트라카복실산 이무수물을 사용하는 경우, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물의 사용량은 전체 테트라카복실산 이무수물 중, 바람직하게는 70몰% 이상, 보다 바람직하게는 80몰% 이상, 더한층 바람직하게는 90몰% 이상, 더욱 바람직하게는 95몰% 이상이다. 이러한 사용량을 채용함으로써 기체와의 충분한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다. In the present invention, when a tetracarboxylic dianhydride other than that is used together with an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond, an aromatic tetracarboxylic acid containing at least one of an ester bond and an ether bond The amount of the dianhydride used is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more in the total tetracarboxylic dianhydride. By employing such an amount, it is possible to obtain a film having sufficient adhesion to the substrate, adequate adhesion to the resin substrate, and adequate releasability, with good reproducibility.

이상에서 설명한 다이아민과 테트라카복실산 이무수물을 반응시킴으로써 본 발명에 따른 박리층 형성용 조성물에 포함되는 폴리아믹산을 얻을 수 있다. By reacting the above-described diamine with tetracarboxylic dianhydride, the polyamic acid contained in the composition for forming a release layer according to the present invention can be obtained.

이러한 반응에 사용하는 유기 용매는 반응에 악영향을 미치지 않는 한 특별히 한정되지 않지만, 그 구체예로서는 m-크레졸, 2-파이롤리돈, N-메틸-2-파이롤리돈, N-에틸-2-파이롤리돈, N-바이닐-2-파이롤리돈, N,N-다이메틸아세트아마이드, N,N-다이메틸폼아마이드, 3-메톡시-N,N-다이메틸프로필아마이드, 3-에톡시-N,N-다이메틸프로필아마이드, 3-프로폭시-N,N-다이메틸프로필아마이드, 3-아이소프로폭시-N,N-다이메틸프로필아마이드, 3-뷰톡시-N,N-다이메틸프로필아마이드, 3-sec-뷰톡시-N,N-다이메틸프로필아마이드, 3-tert-뷰톡시-N,N-다이메틸프로필아마이드, γ-뷰티로락톤 등을 들 수 있다. 또한, 유기 용매는 1종 단독으로 또는 2종 이상을 조합하여 사용해도 된다. The organic solvent used for such a reaction is not particularly limited as long as it does not adversely affect the reaction, and specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, and N-ethyl-2-pyr Rollidone, N-vinyl-2-pyrrolidone, N,N-dimethylacetamide, N,N-dimethylformamide, 3-methoxy-N,N-dimethylpropylamide, 3-ethoxy- N,N-dimethylpropylamide, 3-propoxy-N,N-dimethylpropylamide, 3-isopropoxy-N,N-dimethylpropylamide, 3-butoxy-N,N-dimethylpropyl and amide, 3-sec-butoxy-N,N-dimethylpropylamide, 3-tert-butoxy-N,N-dimethylpropylamide, and γ-butyrolactone. In addition, you may use an organic solvent individually by 1 type or in combination of 2 or more type.

특히, 반응에 사용하는 유기 용매는 다이아민 및 테트라카복실산 이무수물 및 폴리아믹산을 잘 용해하므로, 식 (S1)로 표시되는 아마이드류, (S2)로 표시되는 아마이드류 및 식 (S3)으로 표시되는 아마이드류로부터 선택되는 적어도 1종이 바람직하다. In particular, since the organic solvent used for the reaction dissolves diamine and tetracarboxylic dianhydride and polyamic acid well, the amides represented by the formula (S1), the amides represented by the (S2), and the amides represented by the formula (S3) At least one selected from amides is preferable.

Figure pat00020
Figure pat00020

식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타내지만, 바람직하게는 1∼3, 보다 바람직하게는 1 또는 2이다. In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. Although h represents a natural number, Preferably it is 1-3, More preferably, it is 1 or 2.

탄소수 1∼10의 알킬기로서는 메틸기, 에틸기, n-프로필기, 아이소프로필기, n-뷰틸기, 아이소뷰틸기, s-뷰틸기, t-뷰틸기, n-펜틸기, n-헥실기, n-헵틸기, n-옥틸기, n-노닐기, n-데실기 등을 들 수 있다. 이들 중, 탄소수 1∼3의 알킬기가 바람직하고, 탄소수 1 또는 2의 알킬기가 보다 바람직하다. Examples of the alkyl group having 1 to 10 carbon atoms include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n -heptyl group, n-octyl group, n-nonyl group, n-decyl group, etc. are mentioned. Among these, a C1-C3 alkyl group is preferable, and a C1-C2 alkyl group is more preferable.

반응온도는 사용하는 용매의 융점으로부터 비점까지의 범위에서 적당히 설정 하면 되고, 통상 0∼100℃ 정도이지만, 얻어지는 폴리아믹산의 용액 중에서의 이미드화를 막아 폴리아믹산 단위의 고함유량을 유지하기 위해서는, 바람직하게는 0∼70℃ 정도이고, 보다 바람직하게는 0∼60℃ 정도이며, 더한층 바람직하게는 0∼50℃ 정도이다. The reaction temperature may be appropriately set within the range from the melting point to the boiling point of the solvent to be used, and is usually about 0 to 100 ° C. In order to prevent imidization in the solution of the resulting polyamic acid and maintain a high content of the polyamic acid unit, it is preferable Preferably it is about 0-70 degreeC, More preferably, it is about 0-60 degreeC, More preferably, it is about 0-50 degreeC.

반응시간은, 반응온도나 원료 물질의 반응성에 의존하기 때문에 일률적으로 규정할 수 없지만, 통상 1∼100시간 정도이다. The reaction time cannot be defined uniformly because it depends on the reaction temperature and the reactivity of the raw material, but is usually about 1 to 100 hours.

이상에서 설명한 방법에 의해, 목적으로 하는 폴리아믹산을 포함하는 반응 용액을 얻을 수 있다. By the method demonstrated above, the reaction solution containing the target polyamic acid can be obtained.

상기 폴리아믹산의 중량평균 분자량은 5,000∼1,000,000이 바람직하고, 10,000∼500,000이 보다 바람직하고, 핸들링성의 관점에서 15,000∼200,000이 더한층 바람직하다. 또한, 본 발명에서 중량평균 분자량은 겔 퍼미에이션 크로마토그래피(GPC) 분석에 의한 표준 폴리스타이렌 환산으로 얻어지는 평균 분자량이다. 5,000-1,000,000 are preferable, as for the weight average molecular weight of the said polyamic acid, 10,000-500,000 are more preferable, and 15,000-200,000 are still more preferable from a handleability viewpoint. In addition, in the present invention, the weight average molecular weight is an average molecular weight obtained in terms of standard polystyrene by gel permeation chromatography (GPC) analysis.

본 발명에서는, 통상, 상기 반응 용액을 여과한 후, 그 여과액을 그대로, 또는 희석 혹은 농축하여 얻어지는 용액을 본 발명의 박리층 형성용 조성물로서 사용할 수 있다. 이렇게 함으로써 얻어지는 박리층의 밀착성, 박리성 등의 악화의 원인이 될 수 있는 불순물의 혼입을 저감할 수 있을 뿐만 아니라, 효율적으로 박리층 형성용 조성물을 얻을 수 있다. 또한 상기 반응 용액으로부터 폴리아믹산을 단리한 후, 다시 용매에 용해하여 박리층 형성용 조성물로 해도 된다. 이 경우의 용매로서는 전술한 반응에 사용하는 유기 용매 등을 들 수 있다. In the present invention, after filtering the reaction solution, the filtrate as it is or a solution obtained by diluting or concentrating can be used as the composition for forming a release layer of the present invention. By doing in this way, not only can mixing of impurities which may cause deterioration of adhesiveness, peelability, etc. of the peeling layer obtained by doing this be reduced, but the composition for peeling layer formation can be obtained efficiently. Moreover, after isolating a polyamic acid from the said reaction solution, it is good also as a composition for peeling layer formation by melt|dissolving in a solvent again. As a solvent in this case, the organic solvent etc. used for the reaction mentioned above are mentioned.

희석에 사용하는 용매는 특별히 한정되지 않고, 그 구체예로서는 상기 반응의 반응용매의 구체예와 동일한 것을 들 수 있다. 희석에 사용하는 용매는 1종 단독으로 또는 2종 이상을 조합하여 사용해도 된다. 그 중에서도, 폴리아믹산을 잘 용해하므로, N,N-다이메틸폼아마이드, N,N-다이메틸아세트아마이드, N-메틸-2-파이롤리돈, 1,3-다이메틸-2-이미다졸리딘온, N-에틸-2-파이롤리돈, γ-뷰티로락톤이 바람직하고, N-메틸-2-파이롤리돈이 보다 바람직하다. The solvent used for dilution is not specifically limited, The thing similar to the specific example of the reaction solvent of the said reaction is mentioned as the specific example. The solvent used for dilution may be used individually by 1 type or in combination of 2 or more type. Among them, since it dissolves polyamic acid well, N,N-dimethylformamide, N,N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidone Dinone, N-ethyl-2-pyrrolidone and γ-butyrolactone are preferable, and N-methyl-2-pyrrolidone is more preferable.

또한 단독으로는 폴리아믹산을 용해하지 않는 용매이어도, 폴리아믹산이 석출되지 않는 범위이면, 본 발명의 박리층 형성용 조성물에 혼합할 수 있다. 특히, 에틸셀로솔브, 뷰틸셀로솔브, 에틸카비톨, 뷰틸카비톨, 에틸카비톨아세테이트, 에틸렌글라이콜, 1-메톡시-2-프로판올, 1-에톡시-2-프로판올, 1-뷰톡시-2-프로판올, 1-펜옥시-2-프로판올, 프로필렌글라이콜모노아세테이트, 프로필렌글라이콜다이아세테이트, 프로필렌글라이콜-1-모노메틸에터-2-아세테이트, 프로필렌글라이콜-1-모노에틸에터-2-아세테이트, 다이프로필렌글라이콜, 2-(2-에톡시프로폭시)프로판올, 락트산 메틸, 락트산 에틸, 락트산 n-프로필, 락트산 n-뷰틸, 락트산 아이소아밀 등의 저표면장력을 갖는 용매를 적절하게 혼재시킬 수 있다. 이것에 의해, 기판에의 도포시에 도포막 균일성이 향상되는 것이 알려져 있고, 본 발명의 박리층 형성용 조성물에서도 적합하게 사용된다. Moreover, even if it is a solvent which does not melt|dissolve a polyamic acid independently, if it is a range in which a polyamic acid does not precipitate, it can mix with the composition for peeling layer formation of this invention. In particular, ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate, ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1- Butoxy-2-propanol, 1-phenoxy-2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol -1-Monoethyl ether-2-acetate, dipropylene glycol, 2-(2-ethoxypropoxy)propanol, methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate, isoamyl lactate, etc. A solvent having a low surface tension of Thereby, it is known that the uniformity of a coating film improves at the time of application|coating to a board|substrate, and it uses also suitably also with the composition for peeling layer formation of this invention.

본 발명의 박리층 형성용 조성물에 있어서의 폴리아믹산의 농도는 제작하는 박리층의 두께, 조성물의 점도 등을 감안하여 적당히 설정하는 것이지만, 통상 1∼30질량% 정도, 바람직하게는 1∼20질량% 정도이다. 이러한 농도로 함으로써 0.05∼5㎛ 정도의 두께의 박리층을 재현성 좋게 얻을 수 있다. 또한, 폴리아믹산의 농도는 폴리아믹산의 원료인 다이아민과 테트라카복실산 이무수물의 사용량을 조정하거나, 상기 반응 용액을 여과한 후 그 여과액을 희석 또는 농축하거나, 단리한 폴리아믹산을 용매에 용해시킬 때에 그 양을 조정하는 등 하여 조정할 수 있다. The concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30 mass%, preferably 1 to 20 mass % is about By setting it as such a density|concentration, the peeling layer with a thickness of about 0.05-5 micrometers can be obtained with good reproducibility. In addition, the concentration of the polyamic acid is adjusted when the amount of diamine and tetracarboxylic dianhydride, which are raw materials of the polyamic acid, is adjusted, the filtrate is diluted or concentrated after filtering the reaction solution, or the isolated polyamic acid is dissolved in a solvent. It can be adjusted by adjusting the amount, etc.

또한 박리층 형성용 조성물의 점도는 제작하는 박리층의 두께 등을 감안하여 적당히 설정하는 것이지만, 특히 0.05∼5㎛ 정도의 두께의 막을 재현성 좋게 얻는 것을 목적으로 하는 경우, 통상, 25℃에서 10∼10,000mPa·s 정도, 바람직하게는 20∼5,000mPa·s 정도이다. 여기에서, 점도는 시판의 액체의 점도측정용 점도계를 사용하고, 예를 들면, JIS K7117-2에 기재된 수순을 참조하여, 조성물의 온도 25℃의 조건으로 측정할 수 있다. 바람직하게는 점도계로서는 원추 평판형(콘 플레이트형) 회전 점도계를 사용하고, 바람직하게는 동형의 점도계에서 표준 콘 로터로서 1°34'×R24를 사용하여, 조성물의 온도 25℃의 조건으로 측정할 수 있다. 이러한 회전점도계로서는, 예를 들면, 토키산교(주)제 TVE- 25L을 들 수 있다. In addition, although the viscosity of the composition for forming a release layer is appropriately set in consideration of the thickness of the release layer to be produced, in particular, when the purpose of obtaining a film having a thickness of about 0.05 to 5 µm with good reproducibility is usually 10 to at 25°C. It is about 10,000 mPa*s, Preferably it is about 20-5,000 mPa*s. Here, the viscosity can be measured using a commercially available viscometer for measuring the viscosity of a liquid, for example, referring to the procedure described in JIS K7117-2, under the condition of a temperature of 25°C of the composition. Preferably, a cone plate type (cone plate type) rotational viscometer is used as the viscometer, and 1°34'×R24 is used as a standard cone rotor in a viscometer of the same type, and the composition temperature is 25°C. can As such a rotational viscometer, TVE-25L manufactured by Toki Sangyo Co., Ltd. is mentioned, for example.

또한, 본 발명에 따른 박리층 형성용 조성물은 폴리아믹산과 유기 용매 이외에, 예를 들면, 막 강도를 향상시키기 위해, 가교제 등의 성분을 포함해도 된다. In addition to the polyamic acid and the organic solvent, the composition for forming a release layer according to the present invention may contain components such as a crosslinking agent in order to improve film strength, for example.

이상에서 설명한 본 발명의 박리층 형성 조성물을 기체에 도포하고, 얻어진 도포막을 가열하여 폴리아믹산을 열 이미드화 함으로써, 기체와의 우수한 밀착성, 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 폴리이미드막으로 이루어지는 박리층을 얻을 수 있다. A polyimide having excellent adhesion to the substrate and suitable adhesion to the resin substrate and suitable peelability by applying the release layer-forming composition of the present invention described above to a substrate, heating the obtained coating film to thermally imidize the polyamic acid. A release layer made of a film can be obtained.

본 발명의 박리층을 기체 위에 형성하는 경우, 박리층은 기체의 일부 표면에 형성되어 있어도 되고, 전체면에 형성되어 있어도 된다. 기체의 일부 표면에 박리층을 형성하는 태양으로서는 기체 표면 중 소정의 범위에만 박리층을 형성하는 태양, 기체 표면 전체면에 도트 패턴, 라인 앤드 스페이스 패턴 등의 패턴 형상으로 박리층을 형성하는 태양 등이 있다. 또한, 본 발명에 있어서, 기체란 그 표면에 본 발명에 따른 박리층 형성용 조성물이 도포되는 것이며, 플랙시블 전자 디바이스 등의 제조에 사용되는 것을 의미한다. When the release layer of the present invention is formed on a substrate, the release layer may be formed on a part of the surface of the substrate or on the entire surface. As an aspect of forming the release layer on a part of the surface of the substrate, the release layer is formed only in a predetermined range on the surface of the substrate, and the release layer is formed on the entire surface of the substrate in a pattern shape such as a dot pattern, a line and space pattern, etc. There is this. In addition, in the present invention, the substrate means that the composition for forming a release layer according to the present invention is applied to the surface thereof, and is used for manufacturing a flexible electronic device or the like.

기체(기재)로서는, 예를 들면, 유리, 플라스틱(폴리카보네이트, 폴리메타크릴레이트, 폴리스타이렌, 폴리에스터, 폴리올레핀, 에폭시, 멜라민, 트라이아세틸셀룰로오스, ABS, AS, 노보넨계 수지 등), 금속(실리콘 웨이퍼 등), 목재, 종이, 슬레이트 등을 들 수 있지만, 특히, 본 발명에 따른 박리층 형성용 조성물로부터 얻어지는 박리층이 그것에 대한 충분한 밀착성을 갖는 점에서, 유리가 바람직하다. 또한, 기체 표면은 단일의 재료로 구성되어 있어도 되고, 2 이상의 재료로 구성되어 있어도 된다. 2 이상의 재료로 기체 표면이 구성되는 태양으로서는 기체 표면 중, 어떤 범위는 어떤 재료로 구성되고, 그 나머지 표면은 그 밖의 재료로 구성되어 있는 태양, 기체 표면 전체에 도트 패턴, 라인 앤드 스페이스 패턴 등의 패턴 형상으로 어떤 재료가 그 밖의 재료 중에 존재하는 태양 등이 있다. As the substrate (substrate), for example, glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetyl cellulose, ABS, AS, norbornene-based resin, etc.), metal (silicone) wafer, etc.), wood, paper, slate, etc. are mentioned, In particular, the release layer obtained from the composition for forming a release layer according to the present invention has sufficient adhesiveness to it, and glass is preferable. In addition, the base|substrate surface may be comprised from a single material, and may be comprised from two or more materials. As an aspect in which the surface of the base body is composed of two or more materials, an aspect in which a certain range of the base surface is composed of a certain material and the remaining surface is composed of other materials, a dot pattern, a line and space pattern, etc. There are aspects such as a pattern in which a certain material is present among other materials in the shape of a pattern.

도포하는 방법은 특별히 한정되지 않지만, 예를 들면, 캐스트 코팅법, 스핀 코팅법, 블레이드 코팅법, 딥 코팅법, 롤 코팅법, 바 코팅법, 다이 코팅법, 잉크젯법, 인쇄법(철판, 요판, 평판, 스크린 인쇄 등) 등을 들 수 있다. The coating method is not particularly limited, but for example, a cast coating method, a spin coating method, a blade coating method, a dip coating method, a roll coating method, a bar coating method, a die coating method, an inkjet method, a printing method (iron plate, intaglio , flat plate, screen printing, etc.) and the like.

이미드화하기 위한 가열온도는 통상 50∼550℃의 범위 내에서 적당히 결정되지만, 바람직하게는 200℃ 이상, 또한 바람직하게는 500℃ 이하이다. 가열온도를 이와 같이 함으로써 얻어지는 막의 취약화를 막으면서, 이미드화 반응을 충분히 진행시키는 것이 가능하게 된다. 가열시간은 가열온도에 따라 상이하기 때문에 일률적으로 규정할 수 없지만, 통상 5분∼5시간이다. 또한 이미드화율은 50∼100%의 범위이면 된다. The heating temperature for imidization is usually appropriately determined within the range of 50 to 550°C, but is preferably 200°C or higher, and preferably 500°C or lower. By setting the heating temperature in this way, it becomes possible to sufficiently advance the imidization reaction while preventing the resulting film from becoming brittle. Since the heating time varies depending on the heating temperature, it cannot be defined uniformly, but is usually 5 minutes to 5 hours. In addition, the imidation ratio should just be in the range of 50 to 100%.

본 발명에 있어서의 가열 태양의 바람직한 일례로서는 50∼100℃로 5분간∼2시간 가열한 후에, 그대로 단계적으로 가열온도를 상승시키고 최종적으로 375℃ 초과∼450℃로 30분∼4시간 가열하는 수법을 들 수 있다. 특히, 50∼100℃로 5분간∼2시간 가열한 후에, 100℃ 초과∼375℃로 5분간∼2시간, 최후에 375℃ 초과∼450℃로 30분∼4시간 가열하는 것이 바람직하다. As a preferred example of the heating mode in the present invention, after heating at 50 to 100° C. for 5 minutes to 2 hours, the heating temperature is raised stepwise as it is, and finally heating to over 375° C. to 450° C. for 30 minutes to 4 hours. can be heard In particular, after heating at 50 to 100° C. for 5 minutes to 2 hours, heating is preferably performed at over 100° C. to 375° C. for 5 minutes to 2 hours, and finally at over 375° C. to 450° C. for 30 minutes to 4 hours.

가열에 사용하는 기구로서는, 예를 들면, 핫플레이트, 오븐 등을 들 수 있다. 가열 분위기는 공기하이어도 불활성 가스하이어도 되고, 또한 상압하이어도 감압하이어도 된다. As a mechanism used for heating, a hot plate, an oven, etc. are mentioned, for example. The heating atmosphere may be air or inert gas, and may be under normal pressure or under reduced pressure.

박리층의 두께는 통상 0.01∼50㎛ 정도, 생산성의 관점에서, 바람직하게는 0.05∼20㎛ 정도, 보다 바람직하게는 0.05∼5㎛ 정도이며, 가열 전의 도포막의 두께를 조정하여 원하는 두께를 실현한다. The thickness of the release layer is usually about 0.01 to 50 µm, from the viewpoint of productivity, preferably about 0.05 to 20 µm, more preferably about 0.05 to 5 µm, and the desired thickness is achieved by adjusting the thickness of the coating film before heating. .

이상에서 설명한 박리층은 기체, 특히 유리의 기체와의 우수한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는다. 그 때문에, 본 발명에 따른 박리층은, 플랙시블 전자 디바이스의 제조 프로세스에 있어서, 당해 디바이스의 수지 기판에 손상을 주지 않고, 당해 수지 기판을, 그 수지 기판 위에 형성된 회로 등과 함께, 기체로부터 박리시키기 위해 적합하게 사용할 수 있다. The release layer described above has excellent adhesion to the substrate, particularly glass, and moderate adhesion to the resin substrate and moderate peelability. Therefore, in the manufacturing process of a flexible electronic device, the release layer according to the present invention does not damage the resin substrate of the device, and the resin substrate, together with the circuit formed on the resin substrate, is released from the base. can be used appropriately for

이하, 본 발명의 박리층을 사용한 플랙시블 전자 디바이스의 제조 방법의 일례에 대하여 설명한다. Hereinafter, an example of the manufacturing method of the flexible electronic device using the peeling layer of this invention is demonstrated.

본 발명에 따른 박리층 형성용 조성물을 사용하여, 전술의 방법에 의해, 유리 기체 위에 박리층을 형성한다. 이 박리층의 위에, 수지 기판을 형성하기 위한 수지 용액을 도포하고, 이 도포막을 가열함으로써 본 발명에 따른 박리층을 통하여, 유리 기체에 고정된 수지 기판을 형성한다. 이때, 박리층을 모두 덮도록 하여, 박리층의 면적과 비교하여 큰 면적으로, 수지 기판을 형성한다. 상기 수지 기판으로서는 플랙시블 전자 디바이스의 수지 기판으로서 대표적인 폴리이미드로 이루어지는 수지 기판 등을 들 수 있고, 그것을 형성하기 위한 수지 용액으로서는 폴리이미드 용액이나 폴리아믹산 용액을 들 수 있다. 당해 수지 기판의 형성 방법은 상법에 따르면 된다. Using the composition for forming a release layer according to the present invention, a release layer is formed on the glass substrate by the method described above. On this release layer, a resin solution for forming a resin substrate is applied, and the coating film is heated to form a resin substrate fixed to a glass substrate through the release layer according to the present invention. At this time, the resin substrate is formed with an area larger than the area of the release layer so as to cover all of the release layer. As said resin substrate, the resin substrate etc. which consist of a polyimide typical as a resin substrate of a flexible electronic device are mentioned, As a resin solution for forming it, a polyimide solution and a polyamic acid solution are mentioned. What is necessary is just to follow a conventional method for the formation method of the said resin substrate.

다음에 본 발명에 따른 박리층을 통하여 기체에 고정된 당해 수지 기판의 위에, 원하는 회로를 형성하고, 그 후, 예를 들면, 박리층을 따라 수지 기판을 자르고, 이 회로와 함께 수지 기판을 박리층으로부터 박리하여, 수지 기판과 기체를 분리한다. 이때, 기체의 일부를 박리층과 함께 잘라도 된다. Next, a desired circuit is formed on the resin substrate fixed to the base through the release layer according to the present invention, and then, for example, the resin substrate is cut along the release layer, and the resin substrate is peeled off together with the circuit. It peels from a layer, and isolate|separates a resin substrate and a base|substrate. At this time, you may cut off a part of base|substrate together with a peeling layer.

한편, 플랙시블 디스플레이의 제조에 있어서, 지금까지 고휘도 LED나 삼차원 반도체 패키지 등의 제조에서 사용되어 온 레이저 리프크 오프법(LLO법)을 사용하여 유리 캐리어로부터 폴리머 기판을 적합하게 박리할 수 있는 것이 보고되어 있다(일본 특개 2013-147599호 공보). 플랙시블 디스플레이의 제조에서는 유리 캐리어 위에 폴리이미드 등으로 이루어지는 폴리머 기판을 설치하고, 다음에 그 기판 위에 전극 등을 포함하는 회로 등을 형성하고, 최종적으로 이 회로 등과 함께 기판을 유리 캐리어로부터 박리할 필요가 있다. 이 박리 공정에서 LLO법을 채용하고, 즉, 회로 등이 형성된 면과는 반대의 면으로부터, 파장 308nm의 광선을 유리 캐리어에 조사하면, 당해 파장의 광선이 유리 캐리어를 투과하고, 유리 캐리어 근방의 폴리머(폴리이미드)만이 이 광선을 흡수하여 증발(승화)한다. 그 결과, 디스플레이의 성능을 결정짓게 되는, 기판 위에 설치된 회로 등에 영향을 주지 않아, 유리 캐리어로부터의 기판의 박리를 선택적으로 실행 가능하다고 보고되어 있다. On the other hand, in the manufacture of flexible displays, it is possible to appropriately peel a polymer substrate from a glass carrier using the laser lift-off method (LLO method), which has been used in the manufacture of high-brightness LEDs and three-dimensional semiconductor packages, etc. It has been reported (Japanese Patent Laid-Open No. 2013-147599). In the manufacture of a flexible display, it is necessary to install a polymer substrate made of polyimide or the like on a glass carrier, then to form a circuit including electrodes and the like on the substrate, and finally to peel the substrate together with the circuit from the glass carrier. there is In this peeling step, the LLO method is employed, that is, when a light beam having a wavelength of 308 nm is irradiated to a glass carrier from the surface opposite to the surface on which a circuit or the like is formed, the light beam of the wavelength is transmitted through the glass carrier, Only the polymer (polyimide) absorbs this light and evaporates (sublimes) it. As a result, it is reported that the peeling of the substrate from the glass carrier is selectively feasible without affecting the circuitry installed on the substrate, etc., which determines the performance of the display.

본 발명에 따른 박리층을 통하여 기체에 고정된 당해 수지 기판 위에, 원하는 회로를 형성하고, 그 후, LLO법을 채용하면, 이 박리층만이 이 광선을 흡수하여 증발(승화)한다. 즉, 이 박리층이 희생이 되어(희생층으로서 작용함), 유리 캐리어로부터의 기판의 박리를 선택적으로 실행 가능하게 된다. 본 발명의 박리층 형성용 조성물은 LLO법의 적용이 가능하게 되는 특정 파장(예를 들면, 308nm)의 광선을 충분히 흡수한다고 하는 특징을 가지기 때문에, LLO법의 희생층으로서 사용할 수 있다. A desired circuit is formed on the resin substrate fixed to the base through the release layer according to the present invention, and then, if the LLO method is employed, only the release layer absorbs this light and evaporates (sublimes). That is, this release layer becomes sacrificial (acting as a sacrificial layer), making it possible to selectively perform peeling of the substrate from the glass carrier. Since the composition for forming a release layer of the present invention has the characteristic of sufficiently absorbing light of a specific wavelength (eg, 308 nm) to which the LLO method can be applied, it can be used as a sacrificial layer for the LLO method.

실시예Example

이하, 합성예, 비교합성예, 실시예 및 비교예를 들어 본 발명을 더욱 상세하게 설명하지만, 본 발명은 이들 실시예에 한정되지 않는다. 또한, 하기 예에서 사용한 화합물의 약칭 및 수평균 분자량 및 중량평균 분자량의 측정 방법은 이하와 같다. Hereinafter, the present invention will be described in more detail with reference to Synthesis Examples, Comparative Synthesis Examples, Examples and Comparative Examples, but the present invention is not limited to these Examples. In addition, the abbreviation of the compound used in the following example, and the measuring method of a number average molecular weight and weight average molecular weight are as follows.

<화합물의 약칭><Abbreviation of compound>

p-PDA: p-페닐렌다이아민p-PDA: p-phenylenediamine

m-PDA: m-페닐렌다이아민m-PDA: m-phenylenediamine

DATP: 4,4'''-다이아미노-p-터페닐DATP: 4,4'''-diamino-p-terphenyl

DBA: 3,5-다이아미노벤조산DBA: 3,5-diaminobenzoic acid

HAB: 3,3'-다이하이드록시벤지딘HAB: 3,3'-dihydroxybenzidine

DDE: 4,4'-옥시다이아닐린DDE: 4,4'-oxydianiline

BAPB: 4,4'-비스(4-아미노펜옥시)바이페닐BAPB: 4,4'-bis(4-aminophenoxy)biphenyl

FAPB: 4,4'-비스(4-아미노-2-트라이플루오로메틸펜옥시)바이페닐FAPB: 4,4'-bis(4-amino-2-trifluoromethylphenoxy)biphenyl

APAB: 5-아미노-2-(4-아미노페닐)-1H-벤조이미다졸APAB: 5-amino-2-(4-aminophenyl)-1H-benzoimidazole

APAB-E: 4-아미노페닐-4'-아미노벤조에이트APAB-E: 4-Aminophenyl-4'-aminobenzoate

6FAP: 2,2-비스(3-아미노-4-하이드록시페닐)헥사플루오로프로페인6FAP: 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane

TFMB: 2,2'-비스(트라이플루오로메틸)바이페닐-4,4'-다이아민TFMB: 2,2'-bis(trifluoromethyl)biphenyl-4,4'-diamine

BPDA: 3,3',4,4'-바이페닐테트라카복실산 이무수물BPDA: 3,3',4,4'-biphenyltetracarboxylic dianhydride

TAHQ: p-페닐렌비스(트라이멜리트산 모노에스터산 무수물)TAHQ: p-phenylenebis (trimellitic acid monoester anhydride)

PMDA: 피로멜리트산 이무수물PMDA: pyromellitic dianhydride

BPTME: p-바이페닐렌비스(트라이멜리트산 모노에스터산 무수물)BPTME: p-biphenylenebis (trimellitic acid monoester anhydride)

BPODA: 4,4'-(바이페닐-4,4'-바이일비스옥시)비스프탈산 이무수물BPODA: 4,4'-(biphenyl-4,4'-biylbisoxy)bisphthalic dianhydride

CF3-BP-TMA: N,N'-[2,2'-비스(트라이플루오로메틸)바이페닐-4,4'-다이일]비스(1,3-다이옥소-1,3-다이하이드로아이소벤조퓨란-5-카보아마이드)CF3-BP-TMA: N,N'-[2,2'-bis(trifluoromethyl)biphenyl-4,4'-diyl]bis(1,3-dioxo-1,3-dihydro isobenzofuran-5-carbamide)

6FDA: 4,4'-(헥사플루오로아이소프로필리덴)다이프탈산 무수물6FDA: 4,4'-(hexafluoroisopropylidene)diphthalic anhydride

CBDA: 1,2,3,4-사이클로뷰테인테트라카복실산 이무수물CBDA: 1,2,3,4-cyclobutanetetracarboxylic dianhydride

IPBBT: N,N'-아이소프탈비스(벤조옥사졸린-2-싸이온)IPBBT: N,N'-isophthalbis(benzooxazoline-2-thion)

NMP: N-메틸-2-파이롤리돈NMP: N-methyl-2-pyrrolidone

BCS: 뷰틸셀로솔브BCS: Butyl Cellosolve

<중량평균 분자량 및 분자량 분포의 측정><Measurement of weight average molecular weight and molecular weight distribution>

폴리머의 중량평균 분자량(Mw) 및 분자량 분포(Mw/Mn)의 측정은 니혼분코(주)제 GPC 장치(컬럼: 쇼와덴코(주)제 OHpak SB803-HQ 및 OHpak SB804-HQ; 용리액:다이메틸폼아마이드/LiBr·H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1질량%); 유량:1.0mL/분; 컬럼 온도:40℃; Mw:표준 폴리스타이렌 환산값)를 사용하여 행했다(이하의 실시예 및 비교예에 있어서, 동일). The measurement of the weight average molecular weight (Mw) and molecular weight distribution (Mw/Mn) of the polymer was performed using a Nippon Bunko Co., Ltd. GPC apparatus (Column: Showa Denko Co., Ltd. OHpak SB803-HQ and OHpak SB804-HQ; Eluent: Die Methylformamide/LiBr·H 2 O (29.6 mM)/H 3 PO 4 (29.6 mM)/THF (0.1 mass %); Flow rate: 1.0 mL/min; Column temperature: 40° C.; Mw: Standard polystyrene conversion value) was used (in the following Examples and Comparative Examples, the same).

[1] 폴리머의 합성[1] Synthesis of polymers

이하의 방법에 의해, 폴리아믹산 및 폴리벤조옥사졸 전구체를 합성했다. A polyamic acid and a polybenzoxazole precursor were synthesize|combined with the following method.

또한, 얻어진 폴리머 함유 반응액으로부터 폴리머를 단리하지 않고, 후술한 바와 같이, 반응 용액을 희석함으로써 수지 기판 형성용 조성물 또는 박리층 형성용 조성물을 조제했다. In addition, a composition for forming a resin substrate or a composition for forming a release layer was prepared by diluting the reaction solution as described later without isolating the polymer from the obtained polymer-containing reaction solution.

[합성예 S1] 폴리아믹산 S1의 합성[Synthesis Example S1] Synthesis of polyamic acid S1

p-PDA 20.261g(187mmol) 및 DATP 12.206g(47mmol)을 NMP 617.4g에 용해시켰다. 얻어진 용액을 15℃로 냉각하고, 거기에 PMDA 50.112g(230mmol)을 가하고, 질소 분위기하, 50℃까지 승온하고, 48시간 반응시켜, 폴리아믹산 S1을 얻었다. 폴리아믹산 S1의 Mw는 82,100, Mw/Mn은 2.7이었다. 20.261 g (187 mmol) of p-PDA and 12.206 g (47 mmol) of DATP were dissolved in 617.4 g of NMP. The obtained solution was cooled at 15 degreeC, PMDA 50.112g (230 mmol) was added there, it heated up to 50 degreeC in nitrogen atmosphere, it was made to react for 48 hours, and polyamic acid S1 was obtained. Mw of polyamic acid S1 was 82,100, and Mw/Mn was 2.7.

[합성예 S2] 폴리아믹산 S2의 합성[Synthesis Example S2] Synthesis of polyamic acid S2

p-PDA 3.218g(30mmol)을 NMP 88.2g에 용해시켰다. 얻어진 용액에 BPDA 8.581g(29mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 S2를 얻었다. 폴리아믹산 S2의 Mw는 107,300, Mw/Mn은 4.6이었다. 3.218 g (30 mmol) of p-PDA was dissolved in 88.2 g of NMP. 8.581 g (29 mmol) of BPDA was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid S2 was obtained. Mw of polyamic acid S2 was 107,300, and Mw/Mn was 4.6.

[합성예 S3] 폴리아믹산 S3의 합성[Synthesis Example S3] Synthesis of polyamic acid S3

TFMB 17.8g(56mmol), BAPB 0.4g(1mmol) 및 p-PDA 2.5g(23mmol)을 NMP 430g에 용해시켰다. 얻어진 용액에 6FDA 6.3g(14mmol) 및 CF3-BP-TMA 42.8g(64mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 S3을 얻었다. 폴리아믹산 S3의 Mw는 38,700, Mw/Mn은 2.1이었다. 17.8 g (56 mmol) of TFMB, 0.4 g (1 mmol) of BAPB and 2.5 g (23 mmol) of p-PDA were dissolved in 430 g of NMP. 6FDA 6.3g (14mmol) and CF3-BP-TMA 42.8g (64mmol) were added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid S3 was obtained. Mw of polyamic acid S3 was 38,700, and Mw/Mn was 2.1.

[합성예 S4] 폴리아믹산 S4의 합성[Synthesis Example S4] Synthesis of polyamic acid S4

DDE 30.6g(153mmol)을 NMP 440g에 용해시켰다. 얻어진 용액에 CBDA 29.4g(150mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 S4를 얻었다. 폴리아믹산 S4의 Mw는 29,800, Mw/Mn은 2.2이었다. 30.6 g (153 mmol) of DDE was dissolved in 440 g of NMP. 29.4 g (150 mmol) of CBDA was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid S4 was obtained. Mw of polyamic acid S4 was 29,800, and Mw/Mn was 2.2.

[합성예 L1] 폴리아믹산 L1의 합성[Synthesis Example L1] Synthesis of polyamic acid L1

p-PDA 2.054g(19mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 9.946g(19mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L1을 얻었다. 폴리아믹산 L1의 Mw는 57,500, Mw/Mn은 3.0이었다. 2.054 g (19 mmol) of p-PDA was dissolved in 88 g of NMP. 9.946 g (19 mmol) of BPTME was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L1 was obtained. Mw of polyamic acid L1 was 57,500, and Mw/Mn was 3.0.

[합성예 L2] 폴리아믹산 L2의 합성[Synthesis Example L2] Synthesis of polyamic acid L2

p-PDA 1.836g(17mmol) 및 DBA 0.287g(1.9mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 9.878g(18mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L2를 얻었다. 폴리아믹산 L2의 Mw는 65,100, Mw/Mn은 3.0이었다. 1.836 g (17 mmol) of p-PDA and 0.287 g (1.9 mmol) of DBA were dissolved in 88 g of NMP. BPTME 9.878 g (18 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L2 was obtained. Mw of polyamic acid L2 was 65,100, and Mw/Mn was 3.0.

[합성예 L3] 폴리아믹산 L3의 합성[Synthesis Example L3] Synthesis of polyamic acid L3

p-PDA 1.367g(13mmol) 및 HAB 1.172g(5.4mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 9.461g(18mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L3을 얻었다. 폴리아믹산 L3의 Mw는 43,600, Mw/Mn 2.6이었다. 1.367 g (13 mmol) of p-PDA and 1.172 g (5.4 mmol) of HAB were dissolved in 88 g of NMP. BPTME 9.461 g (18 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L3 was obtained. Mw of polyamic acid L3 was 43,600 and Mw/Mn 2.6.

[합성예 L4] 폴리아믹산 L4의 합성[Synthesis Example L4] Synthesis of polyamic acid L4

DATP 3.984g(15mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 8.016g(15mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L4를 얻었다. 폴리아믹산 L4의 Mw는 42,600, Mw/Mn은 3.9이었다. 3.984 g (15 mmol) of DATP was dissolved in 88 g of NMP. BPTME 8.016g (15 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L4 was obtained. Mw of polyamic acid L4 was 42,600, and Mw/Mn was 3.9.

[합성예 L5] 폴리아믹산 L5의 합성[Synthesis Example L5] Synthesis of polyamic acid L5

BAPB 5.17g(14mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 6.83g(13mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L5를 얻었다. 폴리아믹산 L5의 Mw는 52,100, Mw/Mn은 2.7이었다. 5.17 g (14 mmol) of BAPB was dissolved in 88 g of NMP. BPTME 6.83 g (13 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L5 was obtained. Mw of polyamic acid L5 was 52,100, and Mw/Mn was 2.7.

[합성예 L6] 폴리아믹산 L6의 합성[Synthesis Example L6] Synthesis of polyamic acid L6

FAPB 5.89g(12mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 6.11g(11mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L6을 얻었다. 폴리아믹산 L6의 Mw는 87,700, Mw/Mn은 3.3이었다. 5.89 g (12 mmol) of FAPB was dissolved in 88 g of NMP. BPTME 6.11 g (11 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L6 was obtained. Mw of polyamic acid L6 was 87,700, and Mw/Mn was 3.3.

[합성예 L7] 폴리아믹산 L7의 합성[Synthesis Example L7] Synthesis of polyamic acid L7

APAB 3.60g(16mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 8.40g(16mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L7을 얻었다. 폴리아믹산 L7의 Mw는 58,300, Mw/Mn은 2.8이었다. 3.60 g (16 mmol) of APAB was dissolved in 88 g of NMP. BPTME 8.40 g (16 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L7 was obtained. Mw of polyamic acid L7 was 58,300, and Mw/Mn was 2.8.

[합성예 L8] 폴리아믹산 L8의 합성[Synthesis Example L8] Synthesis of polyamic acid L8

DDE 2.322g(12mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 PMDA 2.478g(11mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L8을 얻었다. 폴리아믹산 L8의 Mw는 22,600, Mw/Mn은 2.1이었다. 2.322 g (12 mmol) of DDE was dissolved in 35.2 g of NMP. 2.478 g (11 mmol) of PMDA was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L8 was obtained. Mw of polyamic acid L8 was 22,600, and Mw/Mn was 2.1.

[합성예 L9] 폴리아믹산 L9의 합성[Synthesis Example L9] Synthesis of polyamic acid L9

DATP 1.762g(7mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.038g(7mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L9를 얻었다. 폴리아믹산 L9의 Mw는 61,300, Mw/Mn은 3.3이었다. 1.762 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. 3.038 g (7 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L9 was obtained. Mw of polyamic acid L9 was 61,300, and Mw/Mn was 3.3.

[합성예 L10] 폴리아믹산 L10의 합성[Synthesis Example L10] Synthesis of polyamic acid L10

p-PDA 0.899g(8mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 BPODA 3.900g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L10을 얻었다. 폴리아믹산 L10의 Mw는 17,300, Mw/Mn은 2.4이었다. 0.899 g (8 mmol) of p-PDA was dissolved in 35.2 g of NMP. BPODA 3.900 g (8 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L10 was obtained. Mw of polyamic acid L10 was 17,300, and Mw/Mn was 2.4.

[합성예 L11] 폴리아믹산 L11의 합성[Synthesis Example L11] Synthesis of polyamic acid L11

DATP 1.713g(7mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 BPODA 3.086g(6mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L11을 얻었다. 폴리아믹산 L11의 Mw는 27,000, Mw/Mn은 2.4이었다. 1.713 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. BPODA 3.086g (6 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L11 was obtained. Mw of polyamic acid L11 was 27,000, and Mw/Mn was 2.4.

[합성예 L12] 폴리아믹산 L12의 합성[Synthesis Example L12] Synthesis of polyamic acid L12

p-PDA 0.931g(9mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L12를 얻었다. 폴리아믹산 L12의 Mw는 45,000, Mw/Mn은 2.7이었다. 0.931 g (9 mmol) of p-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L12 was obtained. Mw of polyamic acid L12 was 45,000, and Mw/Mn was 2.7.

[합성예 L13] 폴리아믹산 L13의 합성[Synthesis Example L13] Synthesis of polyamic acid L13

p-PDA 0.839g(8mmol)과 m-PDA 0.093g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L13을 얻었다. 폴리아믹산 L13의 Mw는 39,100, Mw/Mn은 2.6이었다. 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L13 was obtained. Mw of polyamic acid L13 was 39,100, and Mw/Mn was 2.6.

[합성예 L14] 폴리아믹산 L14의 합성[Synthesis Example L14] Synthesis of polyamic acid L14

p-PDA 0.652g(6mmol)과 m-PDA 0.280g(3mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L14를 얻었다. 폴리아믹산 L14의 Mw는 42,700, Mw/Mn은 2.6이었다. 0.652 g (6 mmol) of p-PDA and 0.280 g (3 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L14 was obtained. Mw of polyamic acid L14 was 42,700, and Mw/Mn was 2.6.

[합성예 L15] 폴리아믹산 L15의 합성[Synthesis Example L15] Synthesis of polyamic acid L15

m-PDA 0.931g(9mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L15를 얻었다. 폴리아믹산 L15의 Mw는 36,100, Mw/Mn은 2.5이었다. 0.931 g (9 mmol) of m-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L15 was obtained. Mw of polyamic acid L15 was 36,100, and Mw/Mn was 2.5.

[합성예 L16] 폴리아믹산 L16의 합성[Synthesis Example L16] Synthesis of polyamic acid L16

p-PDA 0.816g(8mmol)과 DATP 0.218g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.765g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L16을 얻었다. 폴리아믹산 L16의 Mw는 43,800, Mw/Mn은 2.5이었다. 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. 3.765 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L16 was obtained. Mw of polyamic acid L16 was 43,800, and Mw/Mn was 2.5.

[합성예 L17] 폴리아믹산 L17의 합성[Synthesis Example L17] Synthesis of polyamic acid L17

p-PDA 0.603g(6mmol) 및 DATP 0.622g(2mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.575g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L17을 얻었다. 폴리아믹산 L17의 Mw는 46,000, Mw/Mn은 2.6이었다. 0.603 g (6 mmol) of p-PDA and 0.622 g (2 mmol) of DATP were dissolved in 35.2 g of NMP. 3.575 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L17 was obtained. Mw of polyamic acid L17 was 46,000, and Mw/Mn was 2.6.

[합성예 L18] 폴리아믹산 L18의 합성[Synthesis Example L18] Synthesis of polyamic acid L18

p-PDA 0.832g(8mmol) 및 DBA 0.130g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.838g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L18을 얻었다. 폴리아믹산 L18의 Mw는 57,000, Mw/Mn은 3.0이었다. 0.832 g (8 mmol) of p-PDA and 0.130 g (1 mmol) of DBA were dissolved in 35.2 g of NMP. TAHQ 3.838g (8 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L18 was obtained. Mw of polyamic acid L18 was 57,000, and Mw/Mn was 3.0.

[합성예 L19] 폴리아믹산 L19의 합성[Synthesis Example L19] Synthesis of polyamic acid L19

p-PDA 0.822g(8mmol) 및 HAB 0.183g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.794g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L19를 얻었다. 폴리아믹산 L19의 Mw는 54,200, Mw/Mn은 2.7이었다. 0.822 g (8 mmol) of p-PDA and 0.183 g (1 mmol) of HAB were dissolved in 35.2 g of NMP. TAHQ 3.794g (8 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L19 was obtained. Mw of polyamic acid L19 was 54,200, and Mw/Mn was 2.7.

[합성예 L20] 폴리아믹산 L20의 합성[Synthesis Example L20] Synthesis of polyamic acid L20

p-PDA 0.616g(6mmol) 및 HAB 0.528g(2mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.655g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L20을 얻었다. 폴리아믹산 L20의 Mw는 55,900, Mw/Mn은 2.6이었다. 0.616 g (6 mmol) of p-PDA and 0.528 g (2 mmol) of HAB were dissolved in 35.2 g of NMP. 3.655 g (8 mmol) of TAHQ was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L20 was obtained. Mw of polyamic acid L20 was 55,900, and Mw/Mn was 2.6.

[합성예 L21] 폴리아믹산 L21의 합성[Synthesis Example L21] Synthesis of polyamic acid L21

APAB-E 1.239g(5mmol)을 NMP 17.6g에 용해시켰다. 얻어진 용액에 PMDA 1.160g(5mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L21을 얻었다. 폴리아믹산 L21의 Mw는 20,900, Mw/Mn은 2.1이었다. 1.239 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. 1.160 g (5 mmol) of PMDA was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L21 was obtained. Mw of polyamic acid L21 was 20,900, and Mw/Mn was 2.1.

[합성예 L22] 폴리아믹산 L22의 합성[Synthesis Example L22] Synthesis of polyamic acid L22

APAB-E 1.060g(5mmol)을 NMP 17.6g에 용해시켰다. 얻어진 용액에 BPDA 1.339g(5mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L22를 얻었다. 폴리아믹산 L22의 Mw는 26,600, Mw/Mn은 2.3이었다. 1.060 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. BPDA 1.339 g (5 mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L22 was obtained. Mw of polyamic acid L22 was 26,600, and Mw/Mn was 2.3.

[비교합성예 1] 폴리벤조옥사졸 전구체 B1의 합성[Comparative Synthesis Example 1] Synthesis of polybenzoxazole precursor B1

6FAP 5.49g(0.015mol)을 NMP 27g에 용해시켰다. 얻어진 용액에 IPBBT 6.48g(0.015mol)을 가하고, 질소 분위기하, 23℃에서 3시간 반응시켰다. 그 후, 이 용액을 순수 300g에 투입하고, 24시간 교반 후, 석출물을 여과했다. 그 후, 감압 건조하여, 폴리벤조옥사졸 전구체 B1을 얻었다. 폴리벤조옥사졸 전구체 B1의 Mw는 2,1000, Mw/Mn은 3.9이었다. 5.49 g (0.015 mol) of 6FAP was dissolved in 27 g of NMP. 6.48 g (0.015 mol) of IPBBT was added to the obtained solution, and it was made to react at 23 degreeC in nitrogen atmosphere for 3 hours. Then, this solution was thrown into 300 g of pure water, and the precipitate was filtered after stirring for 24 hours. Then, it dried under reduced pressure and obtained polybenzoxazole precursor B1. Mw of polybenzoxazole precursor B1 was 2,1000, and Mw/Mn was 3.9.

[2] 수지 기판 형성용 조성물의 조제[2] Preparation of a composition for forming a resin substrate

합성예 S1∼S4에서 얻어진 반응액을, 각각, 그대로 수지 기판 형성용 조성물 W, X, Y 및 Z로서 사용했다. The reaction liquids obtained in Synthesis Examples S1 to S4 were used as compositions W, X, Y and Z for resin substrate formation as they were, respectively.

[3] 박리층 형성용 조성물의 조제[3] Preparation of a composition for forming a release layer

[실시예 1-1][Example 1-1]

합성예 L1에서 얻어진 반응액에 BCS를 가하고, 폴리머 농도가 5질량%, BCS가 20질량%가 되도록 NMP로 희석하여, 박리층 형성용 조성물을 얻었다. BCS was added to the reaction solution obtained in Synthesis Example L1, and the mixture was diluted with NMP so that the polymer concentration was 5% by mass and BCS was 20% by mass to obtain a composition for forming a release layer.

[실시예 1-2∼1-22][Examples 1-2 to 1-22]

합성예 L1에서 얻어진 반응액 대신에, 각각 합성예 L2∼L22에서 얻어진 반응액을 사용한 이외는 실시예 1-1과 동일한 방법으로, 박리층 형성용 조성물을 얻었다. A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solution obtained in Synthesis Examples L2 to L22 was used instead of the reaction solution obtained in Synthesis Example L1.

[비교예 1][Comparative Example 1]

비교합성예 1에서 얻어진 반응액을 폴리머 농도가 5질량%가 되도록 NMP로 희석하여, 조성물을 얻었다. The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP so that the polymer concentration was 5% by mass to obtain a composition.

[4] 박리층의 형성 및 그 평가[4] Formation of release layer and evaluation thereof

[실시예 2-1][Example 2-1]

스핀 코터(조건: 회전수 3000rpm으로 약 30초)를 사용하여, 실시예 1-1에서 얻어진 박리층 형성용 조성물을, 유리 기체로서 100mm×100mm 유리 기판(이하 동일) 위에 도포했다. Using a spin coater (condition: rotation speed of about 30 seconds at 3000 rpm), the composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate onto a 100 mm×100 mm glass substrate (the same hereinafter).

그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후, 오븐을 사용하여, 300℃로 30분간 가열하고, 가열온도를 400℃까지 승온(10℃/분)하고, 400℃로 30분간 더 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Then, the obtained coating film was heated at 80° C. for 10 minutes using a hot plate, and then heated at 300° C. for 30 minutes using an oven, and the heating temperature was raised to 400° C. (10° C./min), 400 It was further heated at 占폚 for 30 minutes to form a release layer having a thickness of about 0.1 占퐉 on the glass substrate. In addition, during the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.

[실시예 2-2∼2-22][Examples 2-2-2 to 2-22]

실시예 1-1에서 얻어진 박리층 형성용 조성물 대신에, 각각 실시예 1-2∼1-22에서 얻어진 박리층 형성용 조성물을 사용한 이외는, 실시예 2-1과 동일한 방법으로, 박리층을 형성했다. The release layer was prepared in the same manner as in Example 2-1 except that the composition for forming a release layer obtained in Examples 1-2 to 1-22 was used instead of the composition for forming a release layer obtained in Example 1-1. formed

[실시예 2-23][Example 2-23]

스핀 코터(조건: 회전수 3000rpm으로 약 30초)를 사용하여, 실시예 1-12에서 얻어진 박리층 형성용 조성물을 100mm×100mm 유리 기판 위에 도포했다. Using a spin coater (condition: about 30 seconds at 3000 rpm of rotation), the composition for forming a release layer obtained in Examples 1-12 was applied onto a 100 mm×100 mm glass substrate.

그리고, 얻어진 도포막을, 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여, 140℃로 30분간 가열하고, 가열온도를 250℃까지 승온(2℃/분)하고, 250℃로 60분간 더 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Then, the obtained coating film was heated at 80° C. for 10 minutes using a hot plate, then heated to 140° C. for 30 minutes using an oven, and the heating temperature was raised to 250° C. (2° C./min), 250 It further heated at ℃ for 60 minutes to form a release layer with a thickness of about 0.1 μm on the glass substrate. In addition, during the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.

[실시예 2-24][Example 2-24]

스핀 코터(조건: 회전수 3000rpm으로 약 30초)를 사용하여, 실시예 1-8에서 얻어진 박리층 형성용 조성물을, 유리 기체로서의 100mm×100mm 유리 기판 위에 도포했다. Using a spin coater (condition: rotation speed of about 30 seconds at 3000 rpm), the composition for forming a release layer obtained in Example 1-8 was applied onto a 100 mm x 100 mm glass substrate as a glass substrate.

그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여 질소 분위기하, 300℃로 30분간 가열하고, 가열온도를 400℃까지 승온(10℃/분)하고, 400℃로 60분간 더 가열하고, 최종적으로 500℃로 10분간 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Then, the obtained coating film was heated at 80° C. for 10 minutes using a hot plate, and then heated at 300° C. for 30 minutes using an oven in a nitrogen atmosphere, and the heating temperature was raised to 400° C. (10° C./min). , further heated at 400° C. for 60 minutes, and finally heated at 500° C. for 10 minutes to form a release layer with a thickness of about 0.1 μm on the glass substrate. In addition, during the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.

[실시예 2-25][Example 2-25]

실시예 1-8에서 얻어진 박리층 형성용 조성물 대신에, 실시예 1-12에서 얻어진 조성물을 사용한 이외는, 실시예 2-24와 동일한 방법으로, 수지 박막을 형성했다. A resin thin film was formed in the same manner as in Example 2-24 except that the composition obtained in Example 1-12 was used instead of the composition for forming a release layer obtained in Example 1-8.

[비교예 2][Comparative Example 2]

실시예 1-1에서 얻어진 박리층 형성용 조성물 대신에, 비교예 1에서 얻어진 조성물을 사용한 이외는, 실시예 2-1과 동일한 방법으로, 수지 박막을 형성했다. A resin thin film was formed in the same manner as in Example 2-1 except that the composition obtained in Comparative Example 1 was used instead of the composition for forming a release layer obtained in Example 1-1.

[5] 박리성의 평가[5] Evaluation of peelability

[실시예 3-1∼3-47, 비교예 3][Examples 3-1 to 3-47, Comparative Example 3]

실시예 2-1∼2-25에서 얻어진 박리층과 유리 기판의 박리성 및 당해 박리층(수지 박막)과 수지 기판의 박리성을 확인했다. 또한, 수지 기판으로서는 폴리이미드로 이루어지는 수지 기판을 사용했다. The peelability of the peeling layer and the glass substrate obtained in Examples 2-1 to 2-25, and the peelability of the said peeling layer (resin thin film) and a resin substrate were confirmed. In addition, as a resin substrate, the resin substrate which consists of polyimide was used.

우선, 실시예 2-1∼2-25에서 얻어진 박리층 부착 유리 기판상의 박리층의 크로스 컷(종횡 1mm 간격, 이하 동일), 및 수지 기판·박리층 부착 유리 기판상의 수지 기판·박리층의 크로스 컷을 행함으로써, 100 격자셀 컷을 행했다. 즉, 이 크로스 컷에 의해, 사방 1mm의 격자셀을 100개 형성했다. First, a cross cut of the release layer on a glass substrate with a release layer obtained in Examples 2-1 to 2-25 (1 mm in length and width, the same hereinafter) and a cross between a resin substrate and a release layer on a glass substrate with a release layer and a resin substrate By performing the cut, 100 grid cells were cut. That is, 100 grid cells of 1 mm square were formed by this cross cut.

그리고, 이 100 매스컷 부분에 점착 테이프를 붙이고, 그 테이프를 벗기고, 이하의 기준(5B∼0B, B, A, AA)에 기초하여, 박리의 정도를 평가했다(실시예 3-1∼3-47). 또한 상기 수법에 준하여, 비교예 2에서 얻어진 수지 박막 부착 유리 기판을 사용하여, 동일한 시험을 행했다(비교예 3). 결과를 표 1에 나타낸다. 또한, 표 1 중의 박리성의 평가기준은 이하와 같다. And the adhesive tape was affixed on this 100-mass cut part, the tape was peeled, and the degree of peeling was evaluated based on the following criteria (5B-0B, B, A, AA) (Examples 3-1 - 3) -47). Moreover, according to the said method, the same test was done using the glass substrate with a resin thin film obtained in the comparative example 2 (comparative example 3). A result is shown in Table 1. In addition, the evaluation criteria of peelability in Table 1 are as follows.

5B: 0% 박리(박리 없음)5B: 0% peeling (no peeling)

4B: 5% 미만의 박리4B: less than 5% peeling

3B: 5∼15%의 박리3B: 5-15% peeling

2B: 15∼35% 미만의 박리2B: peeling less than 15-35%

1B: 35∼65% 미만의 박리1B: less than 35-65% peeling

0B: 65%∼80% 미만의 박리0B: 65% to less than 80% peeling

B: 80%∼95% 미만의 박리 B: 80% to less than 95% peeling

A: 95%∼100% 미만의 박리 A: 95% to less than 100% peeling

AA: 100% 박리(모두 박리)AA: 100% peeling (all peeling)

실시예 3-1∼3-41, 3-44∼3-47 및 비교예 3의 수지 기판은 이하의 방법으로 형성했다. The resin substrates of Examples 3-1 to 3-41, 3-44 to 3-47 and Comparative Example 3 were formed by the following method.

바 코터(갭: 250㎛)를 사용하여, 유리 기판상의 박리층(수지 박막) 위에 수지 기판 형성용 조성물 W 또는 X 중 어느 하나를 도포했다. 그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여, 140℃로 30분간 가열하고, 가열온도를 210℃까지 승온(10℃/분, 이하 동일)하고, 210℃로 30분간, 가열온도를 300℃까지 승온하고, 300℃로 30분간, 가열온도를 400℃까지 승온하고, 400℃로 60분간 가열하여, 박리층 위에 두께 약 20㎛의 폴리이미드 기판을 형성했다. 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Either the composition W or X for resin substrate formation was apply|coated on the peeling layer (resin thin film) on a glass substrate using the bar coater (gap: 250 micrometers). Then, the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated to 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 210 ° C. (10 ° C./min, hereinafter the same) , 210 °C for 30 minutes, heating temperature up to 300 °C, 300 °C for 30 minutes, heating temperature up to 400 °C, heating at 400 °C for 60 minutes, polyimide substrate with a thickness of about 20 µm on the release layer has formed During the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.

실시예 3-42∼3-43의 수지 기판은 이하의 방법으로 형성했다. The resin substrates of Examples 3-42 to 3-43 were formed by the following method.

바 코터(갭: 50㎛)를 사용하여, 유리 기판상의 박리층의 위에 수지 기판 형성용 조성물 Y 또는 Z 중 어느 하나를 도포했다. 그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후, 오븐을 사용하여, 140℃로 30분간 가열하고, 가열온도를 250℃까지 승온(2℃/분)하고, 250℃로 60분간 가열하여, 박리층 위에 두께 약 0.8㎛의 폴리이미드 기판을 형성했다. 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Either the composition Y or Z for resin substrate formation was apply|coated on the peeling layer on a glass substrate using the bar coater (gap: 50 micrometers). Then, the obtained coating film was heated at 80° C. for 10 minutes using a hot plate, and then heated to 140° C. for 30 minutes using an oven, and the heating temperature was raised to 250° C. (2° C./min), 250 It was heated at 占폚 for 60 minutes to form a polyimide substrate having a thickness of about 0.8 占퐉 on the release layer. During the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.

Figure pat00021
Figure pat00021

Figure pat00022
Figure pat00022

표 1 및 2에 나타낸 바와 같이, 실시예의 박리층은 유리 기판과의 밀착성이 우수하고, 또한, 수지 기판과의 박리성이 우수한 것을 알았다. 한편, 비교예의 박리층은 수지 기판과 유리 기판으로부터 박리되지 않아, 박리층으로서 기능하지 않았다. As shown in Tables 1 and 2, it turned out that the peeling layer of an Example was excellent in adhesiveness with a glass substrate, and was excellent in peelability with a resin substrate. On the other hand, the peeling layer of the comparative example did not peel from a resin substrate and a glass substrate, but did not function as a peeling layer.

[6] 투과율의 평가[6] Evaluation of transmittance

[실시예 4][Example 4]

스핀 코터(조건: 회전수 800rpm으로 약 30초)를 사용하여, 실시예 2-8에서 얻어진 박리층 형성용 조성물을 유리 기체로서 100mm×100mm 유리 기판(이하 같음)의 위에 도포했다. Using a spin coater (condition: rotation speed of 800 rpm for about 30 seconds), the composition for forming a release layer obtained in Example 2-8 was applied as a glass substrate onto a 100 mm×100 mm glass substrate (the same as below).

그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여, 300℃로 30분간 가열하고, 가열온도를 400℃까지 승온(10℃/분)하고, 400℃로 30분간 더 가열하여, 유리 기판 위에 두께 약 0.4㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. 얻어진 필름을 자외선 가시 분광 광도계((주)시마즈세사쿠쇼제 SIMADSU UV-2550 형번)를 사용하여 투과율을 측정했다. Then, the obtained coating film was heated at 80° C. for 10 minutes using a hot plate, then heated at 300° C. for 30 minutes using an oven, the heating temperature was raised to 400° C. (10° C./min), and 400° C. By further heating with a furnace for 30 minutes, a peeling layer with a thickness of about 0.4 µm was formed on the glass substrate. In addition, during the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven. Transmittance was measured for the obtained film using the ultraviolet-visible spectrophotometer (SIMADSU UV-2550 model number manufactured by Shimadzu Corporation).

결과를 도 1에 나타낸다. 얻어진 필름의 투과율은 파장 308nm에 대하여 1% 이하로, 희생층으로서 사용 가능한 투과율을 나타냈다. The results are shown in FIG. 1 . The transmittance of the obtained film was 1% or less with respect to a wavelength of 308 nm, indicating transmittance usable as a sacrificial layer.

Claims (11)

방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하고,
상기 방향족 다이아민이 에터 결합을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에터 결합을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 것을 특징으로 하는 박리층 형성용 조성물.
A polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent,
The composition for forming a release layer, characterized in that the aromatic diamine comprises an aromatic diamine having an ether linkage, and/or the aromatic tetracarboxylic dianhydride comprises an aromatic tetracarboxylic acid dianhydride comprising an ether linkage.
제 1 항에 있어서,
상기 에터 결합을 포함하는 방향족 다이아민이 식 (A1)∼(A3), (A7)∼(A12), (A25)∼(A33) 및 (A40)∼(A42)로 이루어지는 군으로부터 선택되는 적어도 1종인 것을 특징으로 하는 박리층 형성용 조성물.
Figure pat00023

Figure pat00024
The method of claim 1,
The aromatic diamine containing the ether bond is at least one selected from the group consisting of formulas (A1) to (A3), (A7) to (A12), (A25) to (A33), and (A40) to (A42). A composition for forming a release layer, characterized in that.
Figure pat00023

Figure pat00024
제 1 항에 있어서,
상기 에터 결합을 포함하는 방향족 테트라카복실산 이무수물이 식 (B3), (B4), (B8)∼(B10) 및 (B12)∼(B14)로 이루어지는 군으로부터 선택되는 적어도 1종인 것을 특징으로 하는 박리층 형성용 조성물.
Figure pat00025
The method of claim 1,
Exfoliation characterized in that the aromatic tetracarboxylic dianhydride containing an ether bond is at least one selected from the group consisting of formulas (B3), (B4), (B8) to (B10) and (B12) to (B14). A composition for forming a layer.
Figure pat00025
제 1 항에 있어서,
상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물을 더 포함하는 것을 특징으로 하는 박리층 형성용 조성물.
The method of claim 1,
The composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride further comprises an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond.
제 4 항에 있어서,
상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 벤젠 골격, 나프틸 골격 또는 바이페닐 골격을 포함하는 것인 것을 특징으로 하는 박리층 형성용 조성물.
5. The method of claim 4,
The composition for forming a release layer, characterized in that the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton, or a biphenyl skeleton.
제 5 항에 있어서,
상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종인 것을 특징으로 하는 박리층 형성용 조성물.
Figure pat00026
6. The method of claim 5,
The composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12).
Figure pat00026
제 1 항에 있어서,
상기 유기 용매가 식 (S1)로 표시되는 아마이드류, 식 (S2)로 표시되는 아마이드류 및 식(S3)으로 표시되는 아마이드류로부터 선택되는 적어도 1개를 포함하는 것을 특징으로 하는 박리층 형성용 조성물.
Figure pat00027

(식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타낸다.)
The method of claim 1,
The organic solvent for forming a release layer, characterized in that it contains at least one selected from the amides represented by the formula (S1), the amides represented by the formula (S2), and the amides represented by the formula (S3) composition.
Figure pat00027

(Wherein, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number.)
제 1 항에 기재된 박리층 형성용 조성물을 사용하여 형성되는 박리층.A release layer formed using the composition for forming a release layer according to claim 1 . 제 8 항에 기재된 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 플렉시블 전자 디바이스의 제조 방법.The manufacturing method of the flexible electronic device provided with the resin substrate characterized by using the peeling layer of Claim 8. 제 8 항에 기재된 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 터치패널 센서의 제조 방법.The manufacturing method of the touch panel sensor provided with the resin substrate characterized by using the peeling layer of Claim 8. 제 9 항 또는 제 10 항에 있어서,
상기 수지 기판이 폴리이미드로 이루어지는 기판인 것을 특징으로 하는 제조 방법.
11. The method according to claim 9 or 10,
The manufacturing method characterized in that the said resin substrate is a board|substrate which consists of polyimide.
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