KR102439472B1 - Method for producing a release layer - Google Patents
Method for producing a release layer Download PDFInfo
- Publication number
- KR102439472B1 KR102439472B1 KR1020197019447A KR20197019447A KR102439472B1 KR 102439472 B1 KR102439472 B1 KR 102439472B1 KR 1020197019447 A KR1020197019447 A KR 1020197019447A KR 20197019447 A KR20197019447 A KR 20197019447A KR 102439472 B1 KR102439472 B1 KR 102439472B1
- Authority
- KR
- South Korea
- Prior art keywords
- release layer
- substrate
- resin substrate
- tetracarboxylic dianhydride
- peeling
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 132
- 229920005575 poly(amic acid) Polymers 0.000 claims abstract description 43
- 239000000203 mixture Substances 0.000 claims abstract description 40
- CDAWCLOXVUBKRW-UHFFFAOYSA-N 2-aminophenol Chemical compound NC1=CC=CC=C1O CDAWCLOXVUBKRW-UHFFFAOYSA-N 0.000 claims abstract description 22
- 238000010304 firing Methods 0.000 claims abstract description 13
- 239000003960 organic solvent Substances 0.000 claims abstract description 10
- 150000000000 tetracarboxylic acids Chemical class 0.000 claims abstract description 8
- 239000011347 resin Substances 0.000 claims description 66
- 229920005989 resin Polymers 0.000 claims description 66
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims description 55
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 claims description 48
- 238000000034 method Methods 0.000 claims description 43
- 125000006158 tetracarboxylic acid group Chemical group 0.000 claims description 23
- 125000003118 aryl group Chemical group 0.000 claims description 18
- 150000004985 diamines Chemical class 0.000 claims description 17
- 150000004984 aromatic diamines Chemical class 0.000 claims description 13
- 229920001721 polyimide Polymers 0.000 claims description 11
- 239000002253 acid Substances 0.000 claims description 6
- 239000009719 polyimide resin Substances 0.000 claims description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 3
- 238000001354 calcination Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 description 55
- 239000011521 glass Substances 0.000 description 33
- 230000015572 biosynthetic process Effects 0.000 description 30
- 238000006243 chemical reaction Methods 0.000 description 26
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 23
- 238000003786 synthesis reaction Methods 0.000 description 21
- 229920000642 polymer Polymers 0.000 description 16
- 239000010408 film Substances 0.000 description 15
- 239000000243 solution Substances 0.000 description 15
- 238000000576 coating method Methods 0.000 description 13
- 230000000052 comparative effect Effects 0.000 description 11
- 239000000463 material Substances 0.000 description 10
- 239000012299 nitrogen atmosphere Substances 0.000 description 10
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 9
- 239000011248 coating agent Substances 0.000 description 9
- 239000002904 solvent Substances 0.000 description 9
- VZSRBBMJRBPUNF-UHFFFAOYSA-N 2-(2,3-dihydro-1H-inden-2-ylamino)-N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]pyrimidine-5-carboxamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C(=O)NCCC(N1CC2=C(CC1)NN=N2)=O VZSRBBMJRBPUNF-UHFFFAOYSA-N 0.000 description 8
- 238000009826 distribution Methods 0.000 description 8
- 239000004642 Polyimide Substances 0.000 description 5
- -1 acid dianhydride Chemical class 0.000 description 5
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 5
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- 238000012360 testing method Methods 0.000 description 5
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 4
- 125000000217 alkyl group Chemical group 0.000 description 4
- 150000001408 amides Chemical class 0.000 description 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 4
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- QBSMHWVGUPQNJJ-UHFFFAOYSA-N 4-[4-(4-aminophenyl)phenyl]aniline Chemical compound C1=CC(N)=CC=C1C1=CC=C(C=2C=CC(N)=CC=2)C=C1 QBSMHWVGUPQNJJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 3
- 125000004432 carbon atom Chemical group C* 0.000 description 3
- 238000007865 diluting Methods 0.000 description 3
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- 239000007789 gas Substances 0.000 description 3
- 238000005227 gel permeation chromatography Methods 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 2
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- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 2
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- 125000003277 amino group Chemical group 0.000 description 2
- 150000001555 benzenes Chemical class 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 239000012295 chemical reaction liquid Substances 0.000 description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 2
- 238000010790 dilution Methods 0.000 description 2
- 239000012895 dilution Substances 0.000 description 2
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- 238000001914 filtration Methods 0.000 description 2
- 229920002457 flexible plastic Polymers 0.000 description 2
- RLSSMJSEOOYNOY-UHFFFAOYSA-N m-cresol Chemical compound CC1=CC=CC(O)=C1 RLSSMJSEOOYNOY-UHFFFAOYSA-N 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- BBYQSYQIKWRMOE-UHFFFAOYSA-N naphthalene-1,2,6,7-tetracarboxylic acid Chemical compound C1=C(C(O)=O)C(C(O)=O)=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 BBYQSYQIKWRMOE-UHFFFAOYSA-N 0.000 description 2
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- 229920003023 plastic Polymers 0.000 description 2
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- 230000035484 reaction time Effects 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 125000006273 (C1-C3) alkyl group Chemical group 0.000 description 1
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- YFOOEYJGMMJJLS-UHFFFAOYSA-N 1,8-diaminonaphthalene Chemical compound C1=CC(N)=C2C(N)=CC=CC2=C1 YFOOEYJGMMJJLS-UHFFFAOYSA-N 0.000 description 1
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- QCILMAMLEHOLRX-UHFFFAOYSA-N 2-(3-aminophenyl)-3h-benzimidazol-5-amine Chemical compound NC1=CC=CC(C=2NC3=CC(N)=CC=C3N=2)=C1 QCILMAMLEHOLRX-UHFFFAOYSA-N 0.000 description 1
- GOJUJUVQIVIZAV-UHFFFAOYSA-N 2-amino-4,6-dichloropyrimidine-5-carbaldehyde Chemical group NC1=NC(Cl)=C(C=O)C(Cl)=N1 GOJUJUVQIVIZAV-UHFFFAOYSA-N 0.000 description 1
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- HUWXDEQWWKGHRV-UHFFFAOYSA-N 3,3'-Dichlorobenzidine Chemical compound C1=C(Cl)C(N)=CC=C1C1=CC=C(N)C(Cl)=C1 HUWXDEQWWKGHRV-UHFFFAOYSA-N 0.000 description 1
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- BRLIJPMFMGTIAW-UHFFFAOYSA-N 3,5-bis(trifluoromethyl)benzene-1,2-diamine Chemical compound NC1=CC(C(F)(F)F)=CC(C(F)(F)F)=C1N BRLIJPMFMGTIAW-UHFFFAOYSA-N 0.000 description 1
- GWHLJVMSZRKEAQ-UHFFFAOYSA-N 3-(2,3-dicarboxyphenyl)phthalic acid Chemical compound OC(=O)C1=CC=CC(C=2C(=C(C(O)=O)C=CC=2)C(O)=O)=C1C(O)=O GWHLJVMSZRKEAQ-UHFFFAOYSA-N 0.000 description 1
- YLZOPXRUQYQQID-UHFFFAOYSA-N 3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)-1-[4-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidin-5-yl]piperazin-1-yl]propan-1-one Chemical compound N1N=NC=2CN(CCC=21)CCC(=O)N1CCN(CC1)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F YLZOPXRUQYQQID-UHFFFAOYSA-N 0.000 description 1
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- UVUCUHVQYAPMEU-UHFFFAOYSA-N 3-[2-(3-aminophenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]aniline Chemical compound NC1=CC=CC(C(C=2C=C(N)C=CC=2)(C(F)(F)F)C(F)(F)F)=C1 UVUCUHVQYAPMEU-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
- B05D3/0254—After-treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D5/00—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/24—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials for applying particular liquids or other fluent materials
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
Abstract
테트라카르복실산 유래의 양쪽 말단을 갖고, 이 양쪽 말단의 어느 일방 또는 양방이 2-아미노페놀로 밀봉되어 있는 폴리아믹산과, 유기 용매를 포함하는 박리층 형성용 조성물을 기체 위에 도포하고, 최고 온도 400℃ 이상에서 소성하는 공정을 포함하는 박리층의 제조 방법을 제공한다.A composition for forming a release layer comprising a polyamic acid having both terminals derived from tetracarboxylic acid and sealed with 2-aminophenol at one or both terminals of the two terminals and an organic solvent is applied on a substrate, the highest temperature Provided is a method for producing a release layer comprising a step of firing at 400°C or higher.
Description
본 발명은 박리층의 제조 방법에 관한 것이다.The present invention relates to a method for producing a release layer.
최근, 전자 디바이스에는 박형화 및 경량화라고 하는 특성에 더하여, 구부릴 수 있다고 하는 기능을 부여하는 것이 요구되고 있다. 이 때문에, 종래의 무겁고 취약하여 구부릴 수 없는 유리 기판을 대신하여, 경량의 플랙시블 플라스틱 기판을 사용하는 것이 요구된다.In recent years, in addition to the characteristics of thickness reduction and weight reduction, it is calculated|required to provide the function of being bendable to an electronic device. For this reason, it is required to use a lightweight flexible plastic substrate instead of the conventional heavy and fragile glass substrate that cannot be bent.
특히, 신세대 디스플레이에서는, 경량의 플랙시블 플라스틱 기판(이하, 수지 기판이라 표기함)을 사용한 액티브 매트릭스형 풀컬러 TFT 디스플레이 패널의 개발이 요구되고 있다. 이 신세대 디스플레이에 관한 기술은 플랙시블 디스플레이나, 플렉시블 스마트폰, 미러 디스플레이 등의 여러 분야에의 전용이 기대되고 있다.In particular, in a new generation display, development of an active matrix type full-color TFT display panel using a lightweight flexible plastic substrate (hereinafter referred to as a resin substrate) is required. Diversion of this new-generation display technology to various fields such as flexible displays, flexible smart phones, and mirror displays is expected.
그래서, 수지 필름을 기판으로 한 전자 디바이스의 제조 방법이 각종 검토되기 시작하고 있고, 신세대 디스플레이에서는, 기존의 TFT 디스플레이 패널 제조용의 설비가 전용 가능한 프로세스의 검토가 진행되고 있다.Then, various examinations of the manufacturing method of the electronic device which used the resin film as a board|substrate are beginning, and examination of the process which can divert the existing equipment for TFT display panel manufacture in a new-generation display is advancing.
예를 들면, 특허문헌 1, 2 및 3에서는, 유리 기판 위에 아몰포스 실리콘 박막층을 형성하고, 그 박막층 위에 플라스틱 기판을 형성한 후, 유리 기판측으로부터 레이저를 조사하여 아몰포스 실리콘을 결정화시키고, 그 결정화에 따라 발생하는 수소 가스에 의해 플라스틱 기판을 유리 기판으로부터 박리하는 방법이 개시되어 있다.For example, in Patent Documents 1, 2 and 3, an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, and then a laser is irradiated from the glass substrate side to crystallize the amorphous silicon, A method of peeling a plastic substrate from a glass substrate by hydrogen gas generated by crystallization is disclosed.
또한, 특허문헌 4에서는, 특허문헌 1∼3에서 개시된 기술을 사용하여 피박리층(특허문헌 4에서 「피전사층」으로 기재되어 있음)을 플라스틱 필름에 붙이고 액정 표시 장치를 완성시키는 방법이 개시되어 있다.Further, in Patent Document 4, a method of attaching a layer to be peeled (described as a “transferred layer” in Patent Document 4) to a plastic film using the techniques disclosed in Patent Documents 1 to 3 to complete a liquid crystal display device is disclosed. has been
그러나, 특허문헌 1∼4에서 개시된 방법, 특히 특허문헌 4에서 개시된 방법에서는, 레이저광을 투과시키기 위해 투광성이 높은 기판을 사용하는 것이 필수적인 것, 기판을 통과시키고, 또한 아몰포스 실리콘에 포함되는 수소를 방출시키는데 충분한, 비교적 큰 에너지의 레이저광의 조사가 필요하게 되는 것, 레이저광의 조사에 의해 피박리층에 손상을 주어 버리는 경우가 있는 것과 같은 문제가 있다.However, in the methods disclosed in Patent Documents 1 to 4, particularly in the method disclosed in Patent Document 4, it is essential to use a substrate with high light transmittance in order to transmit laser light, and hydrogen contained in the amorphous silicon to pass through the substrate. There are problems such as that it is necessary to irradiate a laser beam with a relatively large energy sufficient to emit the ray, and the laser beam irradiation may damage the layer to be peeled off.
게다가, 피박리층이 대면적인 경우에는, 레이저 처리에 장시간을 요하기 때문에, 디바이스 제작의 생산성을 높이기 어렵다.Moreover, when a layer to be peeled has a large area, since a long time is required for laser processing, it is difficult to raise the productivity of device manufacture.
본 발명은 상기 사정을 고려하여 이루어진 것으로, 플랙시블 전자 디바이스의 수지 기판에 손상을 주지 않고 박리할 수 있는 박리층의 제조 방법을 제공하는 것을 목적으로 한다.The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a method for manufacturing a release layer that can be peeled off without damaging a resin substrate of a flexible electronic device.
본 발명자는, 상기 과제를 해결하기 위해 예의 검토를 거듭한 결과, 테트라카르복실산 말단의 어느 일방 또는 양방이 2-아미노페놀로 밀봉되어 있는 폴리아믹산과, 유기 용매를 포함하는 조성물을 사용하고, 박리층 형성시의 소성 온도를 소정의 최고 도달 온도 이상으로 함으로써, 기체와의 우수한 밀착성 및 플랙시블 전자 디바이스에 사용되는 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 박리층을 형성할 수 있는 것을 발견하고, 본 발명을 완성시켰다.MEANS TO SOLVE THE PROBLEM As a result of repeating earnest examination in order to solve the said subject, this inventor uses the composition containing the polyamic acid in which either or both of the tetracarboxylic-acid terminal is sealed with 2-aminophenol, and an organic solvent, By setting the firing temperature at the time of forming the release layer to be higher than or equal to the predetermined maximum achieved temperature, it is possible to form a release layer having excellent adhesion to a substrate and suitable adhesion to a resin substrate used for a flexible electronic device and appropriate release property. found and completed the present invention.
즉, 본 발명은,That is, the present invention is
1. 테트라카르복실산 유래의 양쪽 말단을 갖고, 이 양쪽 말단의 어느 일방 또는 양방이 2-아미노페놀로 밀봉되어 있는 폴리아믹산과, 유기 용매를 포함하는 박리층 형성용 조성물을 기체 위에 도포하고, 최고 온도 400℃ 이상에서 소성하는 공정을 포함하는 것을 특징으로 하는 박리층의 제조 방법,1. A composition for forming a release layer comprising a polyamic acid having both terminals derived from tetracarboxylic acid and one or both terminals of which is sealed with 2-aminophenol and an organic solvent is applied on a substrate; A method for producing a release layer comprising the step of firing at a maximum temperature of 400° C. or higher;
2. 상기 폴리아믹산이 방향족 디아민을 포함하는 디아민 성분과 방향족 테트라카르복실산 이무수물을 포함하는 산 이무수물 성분을 반응시켜 얻어진 폴리아믹산인 1의 박리층의 제조 방법,2. The manufacturing method of the release layer of 1, wherein the polyamic acid is a polyamic acid obtained by reacting a diamine component containing an aromatic diamine with an acid dianhydride component containing an aromatic tetracarboxylic dianhydride;
3. 상기 방향족 디아민이 벤젠핵을 1∼5개 포함하는 방향족 디아민인 2의 박리층의 제조 방법,3. The method for producing the release layer of 2, wherein the aromatic diamine is an aromatic diamine containing 1 to 5 benzene nuclei;
4. 상기 방향족 테트라카르복실산 이무수물이 벤젠핵을 1∼5개 포함하는 방향족 테트라카르복실산 이무수물인 2 또는 3의 박리층의 제조 방법,4. A method for producing a release layer of 2 or 3, wherein the aromatic tetracarboxylic dianhydride is an aromatic tetracarboxylic dianhydride containing 1 to 5 benzene nuclei;
5. 1∼4 중 어느 하나의 제조 방법을 사용하여 형성되는 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 방법,5. A method for manufacturing a flexible electronic device comprising a resin substrate, comprising using a release layer formed using the manufacturing method of any one of 1 to 4;
6. 1∼4 중 어느 하나의 제조 방법을 사용하여 형성한 박리층 위에, 수지 기판 형성용 조성물을 도포한 후, 최고 온도 450℃ 이상에서 소성하여 수지 기판을 형성하는 공정을 포함하는 플랙시블 전자 디바이스의 제조 방법,6. A flexible electronic comprising a step of forming a resin substrate by applying a composition for forming a resin substrate on a release layer formed using the manufacturing method of any one of 1 to 4, and then baking at a maximum temperature of 450° C. or higher a method of manufacturing the device;
7. 상기 수지 기판이 폴리이미드 수지 기판인 5 또는 6의 플랙시블 전자 디바이스의 제조 방법7. The manufacturing method of the flexible electronic device of 5 or 6, wherein the resin substrate is a polyimide resin substrate
을 제공한다.provides
본 발명의 박리층의 제조 방법을 채용함으로써 기체와의 우수한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 박리층을 재현성 좋게 얻을 수 있다. 그 때문에, 본 발명의 제조 방법을 실시함으로써 플랙시블 전자 디바이스의 제조 프로세스에 있어서, 기체 위에 형성된 수지 기판이나, 또한 그 위에 설치되는 회로 등에 손상을 주지 않고, 당해 회로 등과 함께 당해 수지 기판을, 당해 기체로부터 분리하는 것이 가능하게 된다. 따라서, 본 발명의 제조 방법은 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 프로세스의 간편화나 그 수율 향상 등에 기여할 수 있다.By employing the method for producing a release layer of the present invention, a release layer having excellent adhesion to a base material, adequate adhesion to a resin substrate, and appropriate release property can be obtained with good reproducibility. Therefore, in the manufacturing process of a flexible electronic device by implementing the manufacturing method of this invention, the said resin substrate together with the said circuit etc., without damage to the resin substrate formed on the base|substrate, and the circuit provided on it, etc. It becomes possible to separate from the gas. Therefore, the manufacturing method of this invention can contribute to the simplification of the manufacturing process of the flexible electronic device provided with a resin substrate, its yield improvement, etc.
(발명을 실시하기 위한 형태)(Form for implementing the invention)
이하, 본 발명에 대하여, 보다 상세하게 설명한다.Hereinafter, the present invention will be described in more detail.
본 발명에 따른 박리층의 제조 방법은 테트라카르복실산 유래의 양쪽 말단을 갖고, 이 양쪽 말단의 어느 일방 또는 양방이 2-아미노페놀로 밀봉되어 있는 폴리아믹산과, 유기 용매를 포함하는 박리층 형성용 조성물을 기체 위에 도포하고, 최고 온도 400℃ 이상에서 소성하는 공정을 포함하는 것을 특징으로 한다.In the method for producing a release layer according to the present invention, a release layer is formed comprising a polyamic acid having both ends derived from tetracarboxylic acid, and either or both ends of which are sealed with 2-aminophenol, and an organic solvent. It is characterized in that it comprises a step of coating the composition on a substrate and firing at a maximum temperature of 400°C or higher.
여기에서, 본 발명에서의 박리층이란 소정의 목적으로 유리 기체 바로 위에 설치되는 층으로, 그 전형예로서는 플랙시블 전자 디바이스의 제조 프로세스에서, 기체와, 폴리이미드와 같은 수지로 이루어지는 플랙시블 전자 디바이스의 수지 기판과의 사이에 당해 수지 기판을 소정의 프로세스 중에서 고정하기 위해 설치되고, 또한, 당해 수지 기판 위에 전자회로 등이 형성된 후에 당해 수지 기판을 당해 기체로부터 용이하게 박리할 수 있도록 하기 위해 설치되는 박리층을 들 수 있다.Here, the release layer in the present invention is a layer provided directly on a glass substrate for a predetermined purpose, and a typical example thereof is a flexible electronic device composed of a substrate and a resin such as polyimide in a manufacturing process of a flexible electronic device. Peeling provided between the resin substrate and the resin substrate to fix the resin substrate in a predetermined process, and provided so that the resin substrate can be easily peeled from the substrate after an electronic circuit or the like is formed on the resin substrate layers can be taken.
본 발명에서 사용하는 폴리아믹산은 테트라카르복실산 유래의 양쪽 말단을 갖는 폴리아믹산의 중합체쇄 말단의 어느 일방 또는 양방을 2-아미노페놀의 아미노기와 반응시켜 밀봉함으로써 얻을 수 있다. 즉 여기에서 얻어지는 폴리아믹산은 히드록시기 함유 페닐기로 분자쇄 말단의 어느 일방 또는 양방이 밀봉되어 있다.The polyamic acid used by this invention can be obtained by making either one or both of the polymer chain terminal of the polyamic acid which has both terminals derived from tetracarboxylic acid react with the amino group of 2-aminophenol, and sealing. That is, as for the polyamic acid obtained here, either or both of the molecular chain terminals are sealed by the phenyl group containing a hydroxyl group.
중합체 말단이 히드록시기를 가짐으로써, 상층에 사용하는 플랙시블 기판과 골격의 차이가 생길 수 있기 때문에, 얻어지는 막의 박리층으로서의 기능의 향상을 도모할 수 있다.When the polymer terminal has a hydroxyl group, a difference in the skeleton and the flexible substrate used for the upper layer may occur, so that the function of the resulting film as a release layer can be improved.
본 발명에서는, 폴리아믹산의 중합체쇄 말단의 어느 일방에 2-아미노페놀에 유래하는 히드록시기가 존재하면 되지만, 중합체쇄 말단의 양쪽에 2-아미노페놀에 유래하는 히드록시기가 존재하는 것이 바람직하다.In this invention, although the hydroxyl group originating in 2-aminophenol should just exist in either one of the polymer chain terminals of a polyamic acid, it is preferable that the hydroxyl group originating in 2-aminophenol exists in both ends of a polymer chain.
또한 폴리아믹산을 제조할 때 사용하는 디아민 성분 및 산 이무수물 성분으로서는, 얻어지는 막의 박리층으로서의 기능을 향상시키는 관점에서, 방향족 디아민을 포함하는 디아민 성분과 방향족 테트라카르복실산 이무수물을 포함하는 산 이무수물 성분을 반응시켜 얻어지는 폴리아믹산이 바람직하다.Moreover, as a diamine component and acid dianhydride component used when manufacturing a polyamic acid, from a viewpoint of improving the function as a peeling layer of the film|membrane obtained, the diamine component containing aromatic diamine, and acid dianhydride containing aromatic tetracarboxylic dianhydride The polyamic acid obtained by making a water component react is preferable.
방향족 디아민으로서는 분자 내에 2개의 아미노기를 갖고, 또한, 방향환을 갖는 한 특별히 한정되는 것은 아니지만, 벤젠핵을 1∼5개 포함하는 방향족 디아민이 바람직하다.Although it does not specifically limit as long as it has two amino groups in a molecule|numerator and has an aromatic ring as aromatic diamine, The aromatic diamine containing 1-5 benzene nuclei is preferable.
그 구체예로서는 1,4-디아미노벤젠(p-페닐렌디아민), 1,3-디아미노벤젠(m-페닐렌디아민), 1,2-디아미노벤젠(o-페닐렌디아민), 2,4-디아미노톨루엔, 2,5-디아미노톨루엔, 2,6-디아미노톨루엔, 4,6-디메틸-m-페닐렌디아민, 2,5-디메틸-p-페닐렌디아민, 2,6-디메틸-p-페닐렌디아민, 2,4,6-트리메틸-1,3-페닐렌디아민, 2,3,5,6-테트라메틸-p-페닐렌디아민, m-크실릴렌디아민, p-크실릴렌디아민, 5-트리플루오로메틸벤젠-1,3-디아민, 5-트리플루오로메틸벤젠-1,2-디아민, 3,5-비스(트리플루오로메틸)벤젠-1,2-디아민 등의 벤젠핵이 1개의 디아민; 1,2-나프탈렌디아민, 1,3-나프탈렌디아민, 1,4-나프탈렌디아민, 1,5-나프탈렌디아민, 1,6-나프탈렌디아민, 1,7-나프탈렌디아민, 1,8-나프탈렌디아민, 2,3-나프탈렌디아민, 2,6-나프탈렌디아민, 4,4'-비페닐디아민, 2,2'-비스(트리플루오로메틸)-4,4'-디아미노비페닐, 3,3'-디메틸-4,4'-디아미노디페닐메탄, 3,3'-디카르복시-4,4'-디아미노디페닐메탄, 3,3',5,5'-테트라메틸-4,4'-디아미노디페닐메탄, 4,4'-디아미노벤즈아닐리드, 3,3'-디클로로벤지딘, 3,3'-디메틸벤지딘, 2,2'-디메틸벤지딘, 3,3'-디아미노디페닐메탄, 3,4'-디아미노디페닐메탄, 4,4'-디아미노디페닐메탄, 2,2-비스(3-아미노페닐)프로판, 2,2-비스(4-아미노페닐)프로판, 2,2-비스(3-아미노페닐)-1,1,1,3,3,3-헥사플루오로프로판, 2,2-비스(4-아미노페닐)-1,1,1,3,3,3-헥사플루오로프로판, 3,3'-디아미노디페닐술폭시드, 3,4'-디아미노디페닐술폭시드, 4,4'-디아미노디페닐술폭시드, 3,3'-비스(트리플루오로메틸)비페닐-4,4'-디아민, 3,3',5,5'-테트라플루오로비페닐-4,4'-디아민, 4,4'-디아미노옥타플루오로비페닐, 2-(3-아미노페닐)-5-아미노벤즈이미다졸, 2-(4-아미노페닐)-5-아미노벤조옥사졸 등의 벤젠핵이 2개의 디아민; 1,5-디아미노안트라센, 2,6-디아미노안트라센, 9,10-디아미노안트라센, 1,8-디아미노페난트렌, 2,7-디아미노페난트렌, 3,6-디아미노페난트렌, 9,10-디아미노페난트렌, 1,3-비스(3-아미노페닐)벤젠, 1,3-비스(4-아미노페닐)벤젠, 1,4-비스(3-아미노페닐)벤젠, 1,4-비스(4-아미노페닐)벤젠, 1,3-비스(3-아미노페닐설파이드)벤젠, 1,3-비스(4-아미노페닐설파이드)벤젠, 1,4-비스(4-아미노페닐설파이드)벤젠, 1,3-비스(3-아미노페닐술폰)벤젠, 1,3-비스(4-아미노페닐술폰)벤젠, 1,4-비스(4-아미노페닐술폰)벤젠, 1,3-비스[2-(4-아미노페닐)이소프로필]벤젠, 1,4-비스[2-(3-아미노페닐)이소프로필]벤젠, 1,4-비스[2-(4-아미노페닐)이소프로필]벤젠, 4,4''-디아미노-p-터페닐, 4,4''-디아미노-m-터페닐 등의 벤젠핵이 3개의 디아민 등을 들 수 있지만, 이것들에 한정되지 않는다. 이것들은 단독이어도, 2종 이상을 조합하여 사용할 수도 있다. 또한, 본 발명에 있어서, 상기 방향족 디아민은 에테르 결합 및 에스테르 결합을 포함하지 않는 것을 사용하는 것이 바람직하다.Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), 1,2-diaminobenzene (o-phenylenediamine), 2, 4-diaminotoluene, 2,5-diaminotoluene, 2,6-diaminotoluene, 4,6-dimethyl-m-phenylenediamine, 2,5-dimethyl-p-phenylenediamine, 2,6- Dimethyl-p-phenylenediamine, 2,4,6-trimethyl-1,3-phenylenediamine, 2,3,5,6-tetramethyl-p-phenylenediamine, m-xylylenediamine, p- Xylylenediamine, 5-trifluoromethylbenzene-1,3-diamine, 5-trifluoromethylbenzene-1,2-diamine, 3,5-bis(trifluoromethyl)benzene-1,2- diamine having one benzene nucleus such as diamine; 1,2-naphthalenediamine, 1,3-naphthalenediamine, 1,4-naphthalenediamine, 1,5-naphthalenediamine, 1,6-naphthalenediamine, 1,7-naphthalenediamine, 1,8-naphthalenediamine, 2 ,3-naphthalenediamine, 2,6-naphthalenediamine, 4,4'-biphenyldiamine, 2,2'-bis(trifluoromethyl)-4,4'-diaminobiphenyl, 3,3'- Dimethyl-4,4'-diaminodiphenylmethane, 3,3'-dicarboxy-4,4'-diaminodiphenylmethane, 3,3',5,5'-tetramethyl-4,4'- Diaminodiphenylmethane, 4,4'-diaminobenzanilide, 3,3'-dichlorobenzidine, 3,3'-dimethylbenzidine, 2,2'-dimethylbenzidine, 3,3'-diaminodiphenylmethane , 3,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylmethane, 2,2-bis(3-aminophenyl)propane, 2,2-bis(4-aminophenyl)propane, 2 ,2-bis(3-aminophenyl)-1,1,1,3,3,3-hexafluoropropane, 2,2-bis(4-aminophenyl)-1,1,1,3,3, 3-hexafluoropropane, 3,3'-diaminodiphenylsulfoxide, 3,4'-diaminodiphenylsulfoxide, 4,4'-diaminodiphenylsulfoxide, 3,3'-bis( Trifluoromethyl) biphenyl-4,4'-diamine, 3,3',5,5'-tetrafluorobiphenyl-4,4'-diamine, 4,4'-diaminooctafluorobiphenyl, 2 diamines having two benzene nuclei, such as -(3-aminophenyl)-5-aminobenzimidazole and 2-(4-aminophenyl)-5-aminobenzoxazole; 1,5-diaminoanthracene, 2,6-diaminoanthracene, 9,10-diaminoanthracene, 1,8-diaminophenanthrene, 2,7-diaminophenanthrene, 3,6-diaminophenanthrene , 9,10-diaminophenanthrene, 1,3-bis(3-aminophenyl)benzene, 1,3-bis(4-aminophenyl)benzene, 1,4-bis(3-aminophenyl)benzene, 1 ,4-bis(4-aminophenyl)benzene, 1,3-bis(3-aminophenylsulfide)benzene, 1,3-bis(4-aminophenylsulfide)benzene, 1,4-bis(4-aminophenyl) Sulfide)benzene, 1,3-bis(3-aminophenylsulfone)benzene, 1,3-bis(4-aminophenylsulfone)benzene, 1,4-bis(4-aminophenylsulfone)benzene, 1,3- Bis[2-(4-aminophenyl)isopropyl]benzene, 1,4-bis[2-(3-aminophenyl)isopropyl]benzene, 1,4-bis[2-(4-aminophenyl)isopropyl ] Benzene, 4,4''-diamino-p-terphenyl, 4,4''-diamino-m-terphenyl, etc. Although three diamines are mentioned, It is not limited to these. These may be used individually or in combination of 2 or more types. Further, in the present invention, it is preferable to use the aromatic diamine that does not contain an ether bond or an ester bond.
그 중에서도, 얻어지는 막의 박리층으로서의 기능을 향상시키는 관점에서, 방향환 및 그것에 축합하는 복소환 위에 메틸기 등의 치환기를 갖지 않는 방향족 환 및 복소 방향족 환만으로 구성되는 방향족 디아민이 바람직하다. 구체적으로는, p-페닐렌디아민, m-페닐렌디아민, 2-(3-아미노페닐)-5-아미노벤즈이미다졸, 2-(4-아미노페닐)-5-아미노벤조옥사졸, 4,4''-디아미노-p-터페닐 등이 바람직하다.Among them, an aromatic diamine composed only of an aromatic ring and a heteroaromatic ring having no substituent such as a methyl group on the aromatic ring and the heterocyclic ring condensed thereon from the viewpoint of improving the function as a release layer of the obtained film is preferable. Specifically, p-phenylenediamine, m-phenylenediamine, 2-(3-aminophenyl)-5-aminobenzimidazole, 2-(4-aminophenyl)-5-aminobenzoxazole, 4, 4''-diamino-p-terphenyl and the like are preferred.
방향족 테트라카르복실산 이무수물로서는 분자 내에 2개의 디카르복실산 무수물 부위를 갖고, 또한, 방향환을 갖는 한 특별히 한정되는 것은 아니지만, 벤젠핵을 1∼5개 포함하는 방향족 테트라카르복실산 이무수물이 바람직하다.The aromatic tetracarboxylic dianhydride is not particularly limited as long as it has two dicarboxylic acid anhydride moieties and an aromatic ring in the molecule, but it is an aromatic tetracarboxylic dianhydride containing 1 to 5 benzene nuclei. This is preferable.
그 구체예로서는 피로멜리트산 이무수물, 벤젠-1,2,3,4-테트라카르복실산 이무수물, 나프탈렌-1,2,3,4-테트라카르복실산 이무수물, 나프탈렌-1,2,5,6-테트라카르복실산 이무수물, 나프탈렌-1,2,6,7-테트라카르복실산 이무수물, 나프탈렌-1,2,7,8-테트라카르복실산 이무수물, 나프탈렌-2,3,5,6-테트라카르복실산 이무수물, 나프탈렌-2,3,6,7-테트라카르복실산 이무수물, 나프탈렌-1,4,5,8-테트라카르복실산 이무수물, 비페닐-2,2',3,3'-테트라카르복실산 이무수물, 비페닐-2,3,3',4'-테트라카르복실산 이무수물, 비페닐-3,3',4,4'-테트라카르복실산 이무수물, 안트라센-1,2,3,4-테트라카르복실산 이무수물, 안트라센-1,2,5,6-테트라카르복실산 이무수물, 안트라센-1,2,6,7-테트라카르복실산 이무수물, 안트라센-1,2,7,8-테트라카르복실산 이무수물, 안트라센-2,3,6,7-테트라카르복실산 이무수물, 페난트렌-1,2,3,4-테트라카르복실산 이무수물, 페난트렌-1,2,5,6-테트라카르복실산 이무수물, 페난트렌-1,2,6,7-테트라카르복실산 이무수물, 페난트렌-1,2,7,8-테트라카르복실산 이무수물, 페난트렌-1,2,9,10-테트라카르복실산 이무수물, 페난트렌-2,3,5,6-테트라카르복실산 이무수물, 페난트렌-2,3,6,7-테트라카르복실산 이무수물, 페난트렌-2,3,9,10-테트라카르복실산 이무수물, 페난트렌-3,4,5,6-테트라카르복실산 이무수물, 페난트렌-3,4,9,10-테트라카르복실산 이무수물 등을 들 수 있지만, 이것들에 한정되지 않는다. 이것들은 단독이어도, 2종 이상을 조합하여 사용할 수도 있다.Specific examples thereof include pyromellitic dianhydride, benzene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1,2,3,4-tetracarboxylic dianhydride, and naphthalene-1,2,5. ,6-tetracarboxylic dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene-2,3, 5,6-tetracarboxylic dianhydride, naphthalene-2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl-2, 2',3,3'-tetracarboxylic dianhydride, biphenyl-2,3,3',4'-tetracarboxylic dianhydride, biphenyl-3,3',4,4'-tetracarboxylic Acid dianhydride, anthracene-1,2,3,4-tetracarboxylic dianhydride, anthracene-1,2,5,6-tetracarboxylic dianhydride, anthracene-1,2,6,7-tetra Carboxylic acid dianhydride, anthracene-1,2,7,8-tetracarboxylic dianhydride, anthracene-2,3,6,7-tetracarboxylic dianhydride, phenanthrene-1,2,3,4 -tetracarboxylic dianhydride, phenanthrene-1,2,5,6-tetracarboxylic dianhydride, phenanthrene-1,2,6,7-tetracarboxylic dianhydride, phenanthrene-1,2 ,7,8-tetracarboxylic dianhydride, phenanthrene-1,2,9,10-tetracarboxylic dianhydride, phenanthrene-2,3,5,6-tetracarboxylic dianhydride, phenanthrene -2,3,6,7-tetracarboxylic dianhydride, phenanthrene-2,3,9,10-tetracarboxylic dianhydride, phenanthrene-3,4,5,6-tetracarboxylic dianhydride Although water, phenanthrene-3,4,9,10-tetracarboxylic dianhydride, etc. are mentioned, It is not limited to these. These may be used individually or in combination of 2 or more types.
그 중에서도, 얻어지는 막의 박리층으로서의 기능을 향상시키는 관점에서, 벤젠핵이 1개 또는 2개의 방향족 카르복실산 이무수물이 바람직하다. 구체적으로는, 식 (C1)∼(C12) 중 어느 하나로 표시되는 방향족 테트라카르복실산 이무수물이 바람직하고, 식 (C1)∼(C7) 및 (C9)∼(C11) 중 어느 하나로 표시되는 방향족 테트라카르복실산 이무수물이 보다 바람직하다.Especially, from a viewpoint of improving the function as a peeling layer of the film|membrane obtained, the aromatic carboxylic dianhydride of 1 or 2 benzene nucleus is preferable. Specifically, the aromatic tetracarboxylic dianhydride represented by any one of formulas (C1) to (C12) is preferable, and the aromatic represented by any one of formulas (C1) to (C7) and (C9) to (C11) is preferable. Tetracarboxylic dianhydride is more preferable.
또한, 얻어지는 박리층의 유연성, 내열성 등을 향상시키는 관점에서, 본 발명에서 사용하는 디아민 성분은 방향족 디아민 이외의 디아민을 포함해도 되고, 본 발명에서 사용하는 테트라카르복실산 이무수물 성분은 방향족 테트라카르복실산 이무수물 이외의 테트라카르복실산 이무수물을 포함해도 된다.In addition, from the viewpoint of improving the flexibility, heat resistance, and the like of the release layer obtained, the diamine component used in the present invention may contain diamines other than aromatic diamine, and the tetracarboxylic dianhydride component used in the present invention is aromatic tetracarboxylic acid. You may also contain tetracarboxylic dianhydride other than an acid dianhydride.
본 발명에 있어서, 디아민 성분 중의 방향족 디아민의 양은 바람직하게는 70몰% 이상, 보다 바람직하게는 80몰% 이상, 더한층 바람직하게는 90몰% 이상, 더욱 바람직하게는 95몰% 이상, 가장 바람직하게는 100몰%이다. 또한, 테트라카르복실산성분 중의 방향족 테트라카르복실산 이무수물의 양은 바람직하게는 70몰% 이상, 보다 바람직하게는 80몰% 이상, 더한층 바람직하게는 90몰% 이상, 더욱 바람직하게는 95몰% 이상, 가장 바람직하게는 100몰%이다. 이러한 사용량을 채용함으로써 기체(基體)와의 우수한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다.In the present invention, the amount of the aromatic diamine in the diamine component is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, still more preferably 95 mol% or more, and most preferably is 100 mol%. The amount of the aromatic tetracarboxylic dianhydride in the tetracarboxylic acid component is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, still more preferably 95 mol% or more. , most preferably 100 mol%. By employing such a usage-amount, a film having excellent adhesion to a substrate, suitable adhesion to a resin substrate, and moderate peelability can be obtained with good reproducibility.
이상에서 설명한 디아민 성분과 테트라카르복실산 이무수물 성분을 반응시킨 후, 얻어진 폴리아믹산과, 2-아미노페놀을 반응시킴으로써, 본 발명의 박리층 형성용 조성물에 포함되는 그 중합체쇄 말단이 2-아미노페놀로 밀봉된 폴리아믹산을 얻을 수 있다.After the diamine component and the tetracarboxylic dianhydride component described above are reacted, the obtained polyamic acid is reacted with 2-aminophenol so that the end of the polymer chain contained in the composition for forming a release layer of the present invention is 2-amino A polyamic acid sealed with phenol can be obtained.
디아민 성분과 테트라카르복실산 이무수물 성분의 장입비는 목적으로 하는 분자량이나 분자량 분포, 디아민의 종류나 테트라카르복실산 이무수물의 종류 등을 고려하여 적당히 결정되기 때문에 일률적으로 규정할 수 없지만, 테트라카르복실산 유래의 분자쇄 양쪽 말단으로 하기 위해, 디아민 성분의 몰수에 대하여 테트라카르복실산 이무수물 성분의 몰수를 조금 많게 하는 것이 바람직하다. 구체적인 몰비로서는, 디아민 성분 1몰에 대하여, 테트라카르복실산 이무수물 성분 1.02∼3.0몰이 바람직하고, 1.07∼2.5몰이 보다 바람직하고, 1.1∼2.0몰이 더한층 바람직하다.Since the charging ratio of the diamine component and the tetracarboxylic dianhydride component is appropriately determined in consideration of the target molecular weight and molecular weight distribution, the type of diamine and the type of tetracarboxylic dianhydride, etc., it cannot be defined uniformly. In order to set it as the both terminal of molecular chain derived from an acid, it is preferable to slightly increase the number of moles of a tetracarboxylic dianhydride component with respect to the number of moles of a diamine component. As a specific molar ratio, 1.02-3.0 mol of a tetracarboxylic dianhydride component is preferable with respect to 1 mol of a diamine component, 1.07-2.5 mol is more preferable, 1.1-2.0 mol is further more preferable.
폴리아믹산의 합성 및 합성한 폴리아믹산의 분자쇄 말단의 밀봉에서 사용하는 유기 용매는 반응에 악영향을 미치지 않는 한 특별히 한정되지 않지만, 그 구체적인 예로서는 m-크레졸, 2-피롤리돈, N-메틸-2-피롤리돈, N-에틸-2-피롤리돈, N-비닐-2-피롤리돈, N,N-디메틸아세트아미드, N,N-디메틸포름아미드, 3-메톡시-N,N-디메틸프로필아미드, 3-에톡시-N,N-디메틸프로필아미드, 3-프로폭시-N,N-디메틸프로필아미드, 3-이소프로폭시-N,N-디메틸프로필아미드, 3-부톡시-N,N-디메틸프로필아미드, 3-sec-부톡시-N,N-디메틸프로필아미드, 3-tert-부톡시-N,N-디메틸프로필아미드, γ-뷰티로락톤 등을 들 수 있다. 또한, 유기 용매는 1종 단독으로 또는 2종 이상을 조합하여 사용해도 된다.The organic solvent used in the synthesis of the polyamic acid and the sealing of the molecular chain terminal of the synthesized polyamic acid is not particularly limited as long as it does not adversely affect the reaction, and specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl- 2-pyrrolidone, N-ethyl-2-pyrrolidone, N-vinyl-2-pyrrolidone, N,N-dimethylacetamide, N,N-dimethylformamide, 3-methoxy-N,N -Dimethylpropylamide, 3-ethoxy-N,N-dimethylpropylamide, 3-propoxy-N,N-dimethylpropylamide, 3-isopropoxy-N,N-dimethylpropylamide, 3-butoxy- N,N-dimethylpropylamide, 3-sec-butoxy-N,N-dimethylpropylamide, 3-tert-butoxy-N,N-dimethylpropylamide, γ-butyrolactone, and the like can be mentioned. In addition, you may use an organic solvent individually by 1 type or in combination of 2 or more type.
특히, 반응에 사용하는 유기 용매는 디아민 및 테트라카르복실산 이무수물 및 폴리아믹산을 잘 용해하므로, 식 (S1)로 표시되는 아미드류, (S2)로 표시되는 아미드류 및 식 (S3)으로 표시되는 아미드류로부터 선택되는 적어도 1종이 바람직하다.In particular, since the organic solvent used for the reaction dissolves diamine, tetracarboxylic dianhydride and polyamic acid well, amides represented by formula (S1), amides represented by (S2), and amides represented by formula (S3) At least one selected from the amides used is preferable.
식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타내지만, 바람직하게는 1∼3, 보다 바람직하게는 1 또는 2이다.In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. Although h represents a natural number, Preferably it is 1-3, More preferably, it is 1 or 2.
탄소수 1∼10의 알킬기로서는 메틸기, 에틸기, n-프로필기, 이소프로필기, n-부틸기, 이소부틸기, s-부틸기, t-부틸기, n-펜틸기, n-헥실기, n-헵틸기, n-옥틸기, n-노닐기, n-데실기 등을 들 수 있다. 이들 중, 탄소수 1∼3의 알킬기가 바람직하고, 탄소수 1 또는 2의 알킬기가 보다 바람직하다.Examples of the alkyl group having 1 to 10 carbon atoms include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n -heptyl group, n-octyl group, n-nonyl group, n-decyl group, etc. are mentioned. Among these, a C1-C3 alkyl group is preferable, and a C1-C2 alkyl group is more preferable.
폴리아믹산의 합성시의 반응 온도는 사용하는 용매의 융점으로부터 비점까지의 범위에서 적당히 설정하면 되고, 통상 0∼100℃ 정도이지만, 얻어지는 폴리아믹산의 용액 중에서의 이미드화를 막아 폴리아믹산 단위의 고함유량을 유지하는 관점에서, 바람직하게는 0∼70℃ 정도, 보다 바람직하게는 0∼60℃ 정도, 더욱 바람직하게는 0∼50℃ 정도로 할 수 있다. 반응 시간은 반응 온도나 원료물질의 반응성에 의존하기 때문에 일률적으로 규정할 수 없지만, 통상 1∼100시간 정도이다.The reaction temperature at the time of synthesizing the polyamic acid may be appropriately set within the range from the melting point to the boiling point of the solvent to be used, and is usually about 0 to 100 ° C. From the viewpoint of maintaining the The reaction time cannot be defined uniformly because it depends on the reaction temperature or the reactivity of the raw material, but is usually about 1 to 100 hours.
폴리아믹산의 분자쇄 말단을 밀봉할 때의 반응 온도는, 폴리아믹산의 합성시 와 동일하게, 사용하는 용매의 융점으로부터 비점까지의 범위에서 적당히 설정하면 되고, 통상 0∼100℃ 정도이지만, 합성한 폴리아믹산의 분자쇄 말단을 확실하게 밀봉하는 관점에서, 바람직하게는 0∼70℃ 정도, 보다 바람직하게는 0∼60℃ 정도, 더욱 바람직하게는 0∼50℃ 정도로 할 수 있다. 반응 시간은 반응 온도나 원료물질의 반응성에 의존하기 때문에 일률적으로 규정할 수 없지만, 통상 1∼100시간 정도이다.The reaction temperature at the time of sealing the molecular chain terminal of the polyamic acid may be appropriately set within the range from the melting point to the boiling point of the solvent used, as in the synthesis of polyamic acid, and is usually about 0 to 100 ° C. From a viewpoint of sealing the molecular chain terminal of a polyamic acid reliably, Preferably it is about 0-70 degreeC, More preferably, it is about 0-60 degreeC, More preferably, it can be set as about 0-50 degreeC. The reaction time cannot be defined uniformly because it depends on the reaction temperature or the reactivity of the raw material, but is usually about 1 to 100 hours.
이렇게 하여 얻어지는, 분자쇄 말단의 어느 일방 또는 양방이 2-아미노페놀로 밀봉되어 있는 폴리아믹산의 중량평균 분자량은 통상 5,000∼500,000 정도이지만, 얻어지는 막의 박리층으로서의 기능을 향상시키는 관점에서, 바람직하게는 6,000∼200,000 정도, 보다 바람직하게는 7,000∼150,000 정도이다. 또한, 본 발명에서, 중량평균 분자량은 겔 퍼미에이션 크로마토그래피(GPC) 측정에 의한 폴리스티렌 환산값이다.The weight average molecular weight of the polyamic acid obtained in this way, in which one or both ends of the molecular chain are sealed with 2-aminophenol, is usually about 5,000 to 500,000, but from the viewpoint of improving the function as a release layer of the resulting film, it is preferably It is about 6,000-200,000, More preferably, it is about 7,000-150,000. In the present invention, the weight average molecular weight is a polystyrene conversion value measured by gel permeation chromatography (GPC).
본 발명에서는, 통상, 말단 밀봉 후의 반응 용액을 그대로, 또는 희석 혹은 농축하여 얻어지는 용액을 본 발명의 박리층 형성용 조성물로서 사용할 수 있다. 또한, 상기 반응 용액은 필요에 따라 여과해도 된다. 여과함으로써 얻어지는 박리층의 밀착성, 박리성 등의 악화의 원인이 될 수 있는 불순물의 혼입을 저감할 수 있을 뿐만 아니라, 효율적으로 박리층 형성용 조성물을 얻을 수 있다. 또한 상기 반응 용액으로부터 폴리아믹산을 단리한 후, 다시 용매에 용해하여 박리층 형성용 조성물로 해도 된다. 이 경우의 용매로서는 전술한 반응에 사용하는 유기 용매 등을 들 수 있다.In the present invention, usually, the reaction solution after terminal sealing can be used as it is, or a solution obtained by diluting or concentrating can be used as the composition for forming a release layer of the present invention. In addition, you may filter the said reaction solution as needed. In addition to being able to reduce the mixing of impurities which may cause deterioration of adhesiveness, peelability, etc. of the peeling layer obtained by filtration, the composition for peeling layer formation can be obtained efficiently. Moreover, after isolating a polyamic acid from the said reaction solution, it is good also as a composition for peeling layer formation by dissolving in a solvent again. As a solvent in this case, the organic solvent etc. used for the reaction mentioned above are mentioned.
희석에 사용하는 용매는, 특별히 한정되지 않고, 그 구체예로서는 상기 반응의 반응용매의 구체예와 동일한 것을 들 수 있다. 희석에 사용하는 용매는 1종 단독으로 또는 2종 이상을 조합하여 사용해도 된다. 그중에서도 폴리아믹산을 잘 용해하므로, N,N-디메틸포름아미드, N,N-디메틸아세트아미드, N-메틸-2-피롤리돈, 1,3-디메틸-2-이미다졸리디논, N-에틸-2-피롤리돈, γ-뷰티로락톤이 바람직하고, N-메틸-2-피롤리돈이 보다 바람직하다.The solvent used for dilution is not specifically limited, The thing similar to the specific example of the reaction solvent of the said reaction is mentioned as the specific example. The solvent used for dilution may be used individually by 1 type or in combination of 2 or more type. Among them, it dissolves polyamic acid well, so N,N-dimethylformamide, N,N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, N-ethyl -2-pyrrolidone and γ-butyrolactone are preferable, and N-methyl-2-pyrrolidone is more preferable.
또한, 단독으로는 폴리아믹산을 용해하지 않는 용매이어도, 폴리아믹산이 석출하지 않는 범위이면, 본 발명의 박리층 형성용 조성물에 혼합할 수 있다. 특히, 에틸셀로솔브, 부틸셀로솔브, 에틸카르비톨, 부틸카르비톨, 에틸카르비톨아세테이트, 에틸렌글리콜, 1-메톡시-2-프로판올, 1-에톡시-2-프로판올, 1-부톡시-2-프로판올, 1-페녹시-2-프로판올, 프로필렌글리콜모노아세테이트, 프로필렌글리콜디아세테이트, 프로필렌글리콜-1-모노메틸에테르-2-아세테이트, 프로필렌글리콜-1-모노에틸에테르-2-아세테이트, 디프로필렌글리콜, 2-(2-에톡시프로폭시)프로판올, 락트산 메틸, 락트산 에틸, 락트산 n-프로필, 락트산 n-부틸, 락트산 이소아밀 등의 저표면장력을 갖는 용매를 적절하게 혼재시킬 수 있다. 이것에 의해, 기판에의 도포시에 도포막 균일성이 향상되는 것이 알려지고 있고, 본 발명의 박리층 형성용 조성물에서도 적합하게 사용할 수 있다.Moreover, even if it is a solvent which does not melt|dissolve a polyamic acid independently, if it is a range in which a polyamic acid does not precipitate, it can mix with the composition for peeling layer formation of this invention. In particular, ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate, ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy -2-propanol, 1-phenoxy-2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol-1-monoethyl ether-2-acetate, A solvent having a low surface tension, such as dipropylene glycol, 2-(2-ethoxypropoxy)propanol, methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate, isoamyl lactate, etc. can be mixed appropriately. . Thereby, it is known that the uniformity of a coating film improves at the time of application|coating to a board|substrate, and it can use suitably also with the composition for peeling layer formation of this invention.
본 발명의 박리층 형성용 조성물에 있어서의 폴리아믹산의 농도는 제작하는 박리층의 두께, 조성물의 점도 등을 감안하여 적당히 설정하는 것이지만, 통상 1∼30질량% 정도, 바람직하게는 1∼20질량% 정도이다. 이러한 농도로 함으로써 0.05∼5㎛ 정도의 두께의 박리층을 재현성 좋게 얻을 수 있다. 폴리아믹산의 농도는 폴리아믹산의 원료인 디아민과 테트라카르복실산 이무수물의 사용량을 조정하거나, 상기 반응 용액을 여과한 후 그 여과액을 희석 또는 농축하거나, 단리한 폴리아믹산을 용매에 용해시킬 때에 그 양을 조정하는 등하여 조정할 수 있다.The concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, and the like, but is usually about 1 to 30% by mass, preferably 1 to 20% by mass % is about By setting it as such a density|concentration, the peeling layer with a thickness of about 0.05-5 micrometers can be obtained with good reproducibility. The concentration of polyamic acid is determined by adjusting the amount of diamine and tetracarboxylic dianhydride, which are raw materials of polyamic acid, diluting or concentrating the filtrate after filtering the reaction solution, or dissolving the isolated polyamic acid in a solvent. It can be adjusted by adjusting the amount, etc.
본 발명의 박리층 형성용 조성물의 점도는 제작하는 박리층의 두께 등을 감안하여 적당히 설정하는 것이지만, 특히 0.05∼5㎛ 정도의 두께의 막을 재현성 좋게 얻는 것을 목적으로 하는 경우, 통상, 25℃에서 10∼10,000mPa·s 정도, 바람직하게는 20∼5,000mPa·s 정도이다.The viscosity of the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced. It is about 10-10,000 mPa*s, Preferably it is about 20-5,000 mPa*s.
여기에서, 점도는, 시판의 액체의 점도 측정용 점도계를 사용하여, 예를 들면, JIS K7117-2에 기재된 수순을 참조하여, 조성물의 온도 25℃의 조건에서 측정할 수 있다. 바람직하게는, 점도계로서는 원추 평판형(콘 플레이트형) 회전 점도계를 사용하고, 바람직하게는 동형의 점도계로 표준 콘 로터로서 1°34'×R24를 사용하고, 조성물의 온도 25℃의 조건에서 측정할 수 있다. 이러한 회전점도계로서는, 예를 들면, 토키산교(주)제 TVE-25L을 들 수 있다.Here, the viscosity can be measured using a commercially available viscometer for measuring the viscosity of a liquid, for example, referring to the procedure described in JIS K7117-2, and measuring the composition at a temperature of 25°C. Preferably, a conical plate type (cone plate type) rotational viscometer is used as the viscometer, preferably 1°34'×R24 is used as a standard cone rotor as a homogeneous viscometer, and the composition is measured at a temperature of 25°C. can do. As such a rotational viscometer, TVE-25L manufactured by Toki Sangyo Co., Ltd. is mentioned, for example.
또한, 본 발명의 박리층 형성용 조성물은 폴리아믹산과 유기 용매 이외에, 예를 들면, 막 강도를 향상시키기 위해, 가교제 등을 포함하고 있어도 된다.Moreover, the composition for peeling layer formation of this invention may contain the crosslinking agent etc. in order to improve film|membrane strength other than a polyamic acid and an organic solvent, for example.
이상에서 설명한 박리층 형성용 조성물을 기체 위에 도포한 후, 최고 온도 400℃ 이상에서 소성하는 공정을 포함하는 소성법에서, 폴리아믹산을 열 이미드화함으로써, 기체와의 우수한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 폴리이미드막으로 이루어지는 박리층을 얻을 수 있다.In a firing method including a step of applying the above-described composition for forming a release layer on a substrate and then firing at a maximum temperature of 400° C. or higher, thermal imidization of polyamic acid results in excellent adhesion to the substrate and proper adhesion to the resin substrate. A release layer made of a polyimide film having adhesiveness and moderate peelability can be obtained.
본 발명에 있어서, 상기 소성 시의 최고 온도는 400℃ 이상, 또한, 폴리이미드의 내열 온도 이하의 범위이면 특별히 한정되는 것은 아니지만, 상술한 기체와의 밀착성이나, 수지 기판과의 적당한 밀착성 및 박리성을 향상시키는 것을 고려하면, 450℃ 이상이 바람직하고, 500℃ 이상이 보다 바람직하다. 또한, 그 상한은 통상 550℃ 정도이지만, 510℃ 정도가 바람직하다. 가열 온도를 상기 범위로 함으로써 얻어지는 막의 취약화를 막으면서, 이미드화 반응을 충분히 진행시키는 것도 가능하게 된다.In the present invention, the maximum temperature at the time of firing is not particularly limited as long as it is in the range of 400° C. or higher and less than or equal to the heat resistance temperature of the polyimide. In consideration of improving the Moreover, although the upper limit is about 550 degreeC normally, about 510 degreeC is preferable. By setting the heating temperature in the above range, it is also possible to sufficiently advance the imidization reaction while preventing the resulting film from becoming brittle.
가열 시간은 가열 온도에 따라 다르기 때문에 일률적으로 규정할 수 없지만, 통상 1분∼5시간이다. 또한 이미드화율은 50∼100%의 범위이면 된다.Since the heating time varies with the heating temperature, it cannot be defined uniformly, but is usually 1 minute to 5 hours. Moreover, what is necessary is just to be the range of 50 to 100% of imidation ratio.
또한, 상기 소성 시의 온도는 최고 온도가 상기 범위가 되는 한, 그 이하의 온도에서 소성하는 공정을 포함하고 있어도 된다.In addition, the temperature at the time of the said baking may include the process of baking at the temperature below that, as long as the maximum temperature becomes the said range.
본 발명에 있어서의 가열 태양의 바람직한 일례로서는 50∼150℃에서 가열한 후, 그대로 단계적으로 가열 온도를 상승시키고 최종적으로 400℃ 이상에서 가열하는 수법을 들 수 있다. 특히, 가열 태양의 보다 바람직한 일례로서는 50∼100℃에서 가열하고, 100℃ 초과∼400℃ 미만에서 가열하고, 400℃ 이상에서 가열하는 수법을 들 수 있다. 또한, 가열 태양의 보다 바람직한 다른 일례로서는 50∼150℃에서 가열한 후, 150℃ 초과∼350℃에서 가열하고, 이어서 350℃ 초과∼450℃에서 가열하고, 최후에 450℃ 초과∼510℃에서 가열하는 수법을 들 수 있다.As a preferable example of the heating mode in this invention, after heating at 50-150 degreeC, the method of raising a heating temperature in stages as it is and finally heating at 400 degreeC or more is mentioned. In particular, as a more preferable example of a heating mode, the method of heating at 50-100 degreeC, heating at more than 100 degreeC - less than 400 degreeC, and heating at 400 degreeC or more is mentioned. Moreover, as another more preferable example of a heating mode, after heating at 50-150 degreeC, it heats at more than 150 degreeC - 350 degreeC, then, it heats at more than 350 degreeC - 450 degreeC, and finally, it heats at more than 450 degreeC - 510 degreeC. method can be found.
또한, 소성 시간을 고려한 경우의 가열 태양의 바람직한 일례로서는 50∼150℃에서 1분∼2시간 가열한 후, 그대로 단계적으로 가열 온도를 상승시키고 최종적으로 400℃ 이상으로 30분∼4시간 가열하는 수법을 들 수 있다. 특히, 가열 태양의 보다 바람직한 일례로서는 50∼100℃에서 1분∼2시간 가열하고, 100℃ 초과∼400℃ 미만으로 5분∼2시간 가열하고, 400℃ 이상으로 30분∼4시간 가열하는 수법을 들 수 있다. 또한 가열 태양의 보다 바람직한 다른 일례로서는 50∼150℃에서 1분간∼2시간 가열한 후, 150℃ 초과∼350℃에서 5분∼2시간, 이어서 350℃ 초과∼450℃에서 30분∼4시간, 최후에 450℃ 초과∼510℃에서 30분∼4시간 가열하는 수법을 들 수 있다.In addition, as a preferable example of the heating mode when the firing time is considered, the method is heated at 50 to 150°C for 1 minute to 2 hours, then the heating temperature is raised stepwise as it is, and finally heated to 400°C or higher for 30 minutes to 4 hours. can be heard In particular, as a more preferable example of the heating mode, a method of heating at 50 to 100°C for 1 minute to 2 hours, heating at more than 100°C to less than 400°C for 5 minutes to 2 hours, and heating at 400°C or higher for 30 minutes to 4 hours can be heard Moreover, as another more preferable example of a heating mode, after heating at 50-150 degreeC for 1 minute to 2 hours, it is over 150 degreeC - 350 degreeC for 5 minutes to 2 hours, then it is over 350 degreeC - 450 degreeC for 30 minutes - 4 hours; Finally, the method of heating more than 450 degreeC - 510 degreeC for 30 minutes - 4 hours is mentioned.
또한, 본 발명의 박리층을 기체 위에 형성하는 경우, 박리층은 기체의 일부 표면에 형성되어 있어도 되고, 전체면에 형성되어 있어도 된다. 기체의 일부 표면에 박리층을 형성하는 태양으로서는 기체 표면 중 소정의 범위에만 박리층을 형성하는 태양, 기체 표면 전체면에 도트 패턴, 라인 앤드 스페이스 패턴 등의 패턴 형상으로 박리층을 형성하는 태양 등이 있다. 또한, 본 발명에 있어서, 기체란 그 표면에 본 발명의 박리층 형성용 조성물이 도포되는 것으로, 플랙시블 전자 디바이스 등의 제조에 사용되는 것을 의미한다.In addition, when forming the peeling layer of this invention on a base|substrate, the peeling layer may be formed in one part surface of a base|substrate, and may be formed in the whole surface. As an aspect of forming the release layer on a part of the surface of the substrate, the release layer is formed only in a predetermined range of the surface of the substrate, and the release layer is formed on the entire surface of the substrate in a pattern shape such as a dot pattern, a line and space pattern, etc. There is this. In addition, in this invention, the base material means that the composition for peeling layer formation of this invention is apply|coated on the surface, and it is used for manufacture of a flexible electronic device etc.
기체(기재)로서는, 예를 들면, 유리, 금속(실리콘 웨이퍼 등), 슬레이트 등을 들 수 있지만, 특히, 본 발명의 박리층이 그것에 대한 충분한 밀착성을 가지므로, 유리가 바람직하다. 또한, 기체 표면은 단일의 재료로 구성되어 있어도 되고, 2 이상의 재료로 구성되어 있어도 된다. 2 이상의 재료로 기체 표면이 구성되는 태양으로서는, 기체 표면 중의 어떤 범위는 어떤 재료로 구성되고, 그 나머지 표면은 그 밖의 재료로 구성되어 있는 태양, 기체 표면 전체에 도트 패턴, 라인 앤드 스페이스 패턴 등의 패턴 형상으로 어떤 재료가 그 밖의 재료 중에 존재하는 태양 등이 있다.Examples of the substrate (substrate) include glass, metal (silicon wafer and the like), slate, and the like. In particular, since the release layer of the present invention has sufficient adhesion thereto, glass is preferable. In addition, the base|substrate surface may be comprised from a single material, and may be comprised from two or more materials. As an aspect in which the surface of the substrate is composed of two or more materials, a certain range of the surface of the substrate is composed of a certain material, and the other surface is composed of other materials, and a dot pattern, a line and space pattern, etc. There are aspects such as a pattern in which a certain material is present among other materials in the shape of a pattern.
본 발명의 박리층 형성용 조성물을 기체에 도포하는 방법은 특별히 한정되는 것은 아니지만, 예를 들면, 캐스트 코팅법, 스핀 코팅법, 블레이드 코팅법, 딥 코팅법, 롤 코팅법, 바 코팅법, 다이 코팅법, 잉크젯법, 인쇄법(철판, 요판, 평판, 스크린 인쇄 등) 등을 들 수 있다.The method of applying the composition for forming a release layer of the present invention to the substrate is not particularly limited, but for example, a cast coating method, a spin coating method, a blade coating method, a dip coating method, a roll coating method, a bar coating method, and a die The coating method, the inkjet method, the printing method (iron plate, intaglio, flat plate, screen printing, etc.) etc. are mentioned.
가열에 사용하는 기구는, 예를 들면, 핫플레이트, 오븐 등을 들 수 있다. 가열 분위기는 공기하이어도 불활성 가스하이어도 되고, 또한, 상압하이어도 감압하이어도 된다.As an apparatus used for heating, a hot plate, an oven, etc. are mentioned, for example. The heating atmosphere may be air or inert gas, and may be under normal pressure or under reduced pressure.
박리층의 두께는 통상 0.01∼50㎛ 정도, 생산성의 관점에서 바람직하게는 0.05∼20㎛ 정도이다. 또한, 원하는 두께는 가열 전의 도포막의 두께를 조정함으로써 실현한다.The thickness of the release layer is usually about 0.01 to 50 µm, and preferably about 0.05 to 20 µm from the viewpoint of productivity. In addition, a desired thickness is implement|achieved by adjusting the thickness of the coating film before a heating.
이상에서 설명한 박리층은 기체, 특히 유리의 기체와의 우수한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는다. 그 때문에, 본 발명의 박리층은 플랙시블 전자 디바이스의 제조 프로세스에 있어서, 당해 디바이스의 수지 기판에 손상을 주지 않고, 당해 수지 기판을 그 수지 기판 위에 형성된 회로 등과 함께, 기체로부터 박리시키기 위해 적합하게 사용할 수 있다.The release layer described above has excellent adhesion to the substrate, particularly glass, and moderate adhesion to the resin substrate and moderate peelability. Therefore, in the manufacturing process of a flexible electronic device, the peeling layer of this invention is suitable for peeling the said resin substrate from a base|substrate together with the circuit etc. formed on the resin substrate without damaging the resin substrate of the said device. Can be used.
이하, 본 발명의 박리층을 사용한 플랙시블 전자 디바이스의 제조 방법의 일례에 대하여 설명한다.Hereinafter, an example of the manufacturing method of the flexible electronic device using the peeling layer of this invention is demonstrated.
본 발명의 박리층 형성용 조성물을 사용하고, 상술의 방법에 의해, 유리 기체 위에 박리층을 형성한다. 이 박리층 위에, 수지 기판을 형성하기 위한 수지 기판 형성용 용액을 도포하고, 이 도포막을 소성함으로써 본 발명의 박리층을 통하여, 유리 기체에 고정된 수지 기판을 형성한다.Using the composition for forming a release layer of the present invention, a release layer is formed on the glass substrate by the method described above. On this peeling layer, the resin substrate fixed to the glass substrate is formed through the peeling layer of this invention by apply|coating the solution for resin substrate formation for forming a resin substrate, and baking this coating film.
상기 도포막의 소성 온도는 수지의 종류 등에 따라 적당히 설정되는 것이지만, 본 발명에서는, 이 소성 시의 최고 온도를 450℃ 이상으로 하는 것이 바람직하고, 480℃ 이상으로 하는 것이 보다 바람직하고, 490℃ 이상으로 하는 것이 더한층 바람직하고, 500℃ 이상으로 하는 것이 더욱 바람직하다. 수지 기판 제작 시의 소성 시의 최고 온도를 이 범위로 함으로써 하지인 박리층과 기체와의 밀착성이나, 박리층과 수지 기판과의 적당한 밀착성 및 박리성을 보다 향상시킬 수 있다.The firing temperature of the coating film is appropriately set depending on the type of resin, etc., but in the present invention, the maximum temperature at the time of this firing is preferably 450°C or higher, more preferably 480°C or higher, and 490°C or higher. It is further more preferable to set it as 500 degreeC or more. By making the highest temperature at the time of baking at the time of resin substrate preparation into this range, the adhesiveness of the peeling layer which is a base material, and a base|substrate, and moderate adhesiveness and peelability of a peeling layer and a resin substrate can be improved more.
이 경우도, 최고 온도가 상기 범위로 되는 한, 그 이하의 온도에서 소성하는 공정을 포함하고 있어도 된다.Also in this case, as long as the maximum temperature is within the above range, the step of firing at a temperature lower than that may be included.
수지 기판 제작시의 가열 태양의 바람직한 일례로서는 50∼150℃에서 가열한 후, 그대로 단계적으로 가열 온도를 상승시켜 최종적으로 450℃ 이상으로 가열하는 수법을 들 수 있다. 특히, 가열 태양의 보다 바람직한 일례로서는 50∼100℃에서 가열하고, 100℃ 초과∼400℃ 미만에서 가열하고, 450℃ 이상으로 가열하는 수법을 들 수 있다. 또한 가열 태양의 보다 바람직한 다른 일례로서는 50∼100℃에서 가열한 후에, 100℃ 초과∼200℃에서, 이어서 200℃ 초과∼300℃ 미만에서 가열하고, 300℃∼400℃ 미만에서 가열하고, 400℃∼450℃ 미만에서 가열하고, 최후에 450∼510℃에서 가열하는 수법을 들 수 있다.As a preferable example of the heating mode at the time of resin substrate preparation, after heating at 50-150 degreeC, the method of raising the heating temperature stepwise as it is and finally heating to 450 degreeC or more is mentioned. In particular, as a more preferable example of a heating mode, the method of heating at 50-100 degreeC, heating at more than 100 degreeC - less than 400 degreeC, and heating at 450 degreeC or more is mentioned. Moreover, as another more preferable example of a heating mode, after heating at 50-100 degreeC, it heats at more than 100 degreeC - 200 degreeC, then at more than 200 degreeC - less than 300 degreeC, heating at 300 degreeC - less than 400 degreeC, and 400 degreeC The method of heating at less than -450 degreeC and finally heating at 450-510 degreeC is mentioned.
또한, 소성 시간을 고려한 경우의 가열 태양의 바람직한 일례로서는 50∼150℃에서 1분간∼2시간 가열한 후에, 그대로 단계적으로 가열 온도를 상승시켜 최종적으로 450℃ 이상에서 30분∼4시간 가열하는 수법을 들 수 있다. 특히, 가열 태양의 보다 바람직한 일례로서는 50∼100℃에서 1분간∼2시간 가열하고, 100℃ 초과∼400℃ 미만에서 5분간∼2시간 가열하고, 450℃ 이상에서 30분간∼4시간 가열하는 수법을 들 수 있다. 또한, 가열 태양의 보다 바람직한 다른 일례로서는 50∼100℃에서 1분간∼2시간 가열한 후, 100℃ 초과∼200℃에서 5분간∼2시간, 이어서 200℃ 초과∼300℃ 미만에서 30분간∼4시간, 300℃∼400℃ 미만에서 30분간∼4시간, 400℃∼450℃ 미만에서 30분간∼4시간, 최후에 450∼510℃에서 30분간∼4시간 가열하는 수법을 들 수 있다.In addition, as a preferable example of the heating mode when the firing time is taken into consideration, after heating at 50 to 150°C for 1 minute to 2 hours, the heating temperature is raised stepwise as it is, and finally heating at 450°C or higher for 30 minutes to 4 hours. can be heard In particular, as a more preferable example of the heating mode, a method of heating at 50 to 100°C for 1 minute to 2 hours, heating at more than 100°C to less than 400°C for 5 minutes to 2 hours, and heating at 450°C or higher for 30 minutes to 4 hours can be heard Further, as another more preferable example of the heating mode, after heating at 50 to 100°C for 1 minute to 2 hours, then at 100°C to 200°C for 5 minutes to 2 hours, then at more than 200°C to less than 300°C for 30 minutes to 4 time, a method of heating at 300°C to less than 400°C for 30 minutes to 4 hours, at 400°C to less than 450°C for 30 minutes to 4 hours, and finally at 450 to 510°C for 30 minutes to 4 hours.
수지 기판은 박리층을 모두 덮도록 하여, 박리층의 면적과 비교하여 큰 면적으로, 기판을 형성한다. 수지 기판으로서는 플랙시블 전자 디바이스의 수지 기판으로서 대표적인 폴리이미드로 이루어지는 수지 기판을 들 수 있고, 그것을 형성하기 위한 수지 용액으로서는 폴리이미드 용액이나 폴리아믹산 용액을 들 수 있다. 당해 수지 기판의 형성 방법은 상법에 따르면 된다.The resin substrate covers all of the release layer to form a substrate with a large area compared to the area of the release layer. As a resin substrate, the resin substrate which consists of a polyimide typical as a resin substrate of a flexible electronic device is mentioned, As a resin solution for forming it, a polyimide solution and a polyamic-acid solution are mentioned. What is necessary is just to follow a conventional method for the formation method of the said resin substrate.
다음에 본 발명의 박리층을 통하여 기체에 고정된 당해 수지 기판 위에, 원하는 회로를 형성하고, 그 후에, 예를 들면, 박리층을 따라 수지 기판을 자르고, 이 회로와 함께 수지 기판을 박리층으로부터 박리하여, 수지 기판과 기체를 분리한다. 이때, 기체의 일부를 박리층과 함께 잘라도 된다.Next, a desired circuit is formed on the resin substrate fixed to the base through the release layer of the present invention, and then, for example, the resin substrate is cut along the release layer, and the resin substrate together with the circuit is removed from the release layer. It peels, and isolate|separates a resin substrate and a base|substrate. At this time, you may cut off a part of base|substrate together with a peeling layer.
또한, 일본 특개 2013-147599호 공보에서는, 지금까지 고휘도 LED나 삼차원 반도체 패키지 등의 제조에서 사용되어 온 레이저 리프트 오프법(LLO법)을 플랙시블 디스플레이의 제조에 적용하는 것이 보고되어 있다. 상기 LLO법은 회로 등이 형성된 면과는 반대인 면으로부터, 특정한 파장의 광선, 예를 들면, 파장 308nm의 광선을 유리 기체측으로부터 조사하는 것을 특징으로 하는 것이다. 조사된 광선은 유리 기체를 투과하고, 유리 기체 근방의 폴리머(폴리이미드)만이 이 광선을 흡수하여 증발(승화)한다. 그 결과, 디스플레이의 성능을 결정짓게 되는, 수지 기판 위에 설치된 회로 등에 영향을 주지 않고, 유리 기체로부터 수지 기판을 선택적으로 박리하는 것이 가능하게 된다.Further, in Japanese Patent Laid-Open No. 2013-147599, it is reported that the laser lift-off method (LLO method), which has been used in the manufacture of high-brightness LEDs and three-dimensional semiconductor packages, etc., is applied to the manufacture of flexible displays. The LLO method is characterized in that light of a specific wavelength, for example, light of a wavelength of 308 nm, is irradiated from the side opposite to the surface on which the circuit or the like is formed from the side of the glass substrate. The irradiated light beam passes through the glass gas, and only the polymer (polyimide) near the glass gas absorbs the light beam and evaporates (sublimes). As a result, it becomes possible to selectively peel a resin substrate from a glass substrate without affecting the circuit etc. provided on the resin substrate which determine the performance of a display.
본 발명의 박리층은, 상기 LLO법의 적용이 가능하게 되는 특정 파장(예를 들면, 308nm)의 광선을 충분히 흡수한다고 하는 특징을 가지기 때문에, LLO법의 희생층으로서 사용할 수 있다. 그 때문에 본 발명에 조성물을 사용하여 형성한 박리층 을 통하여 유리 기체에 고정된 수지 기판 위에, 원하는 회로를 형성하고, 그 후, LLO법을 실시하여 308nm의 광선을 조사하면, 이 박리층만이 이 광선을 흡수하여 증발(승화)한다. 이것에 의해, 상기 박리층이 희생이 되어(희생층으로서 작용함), 유리 기체로부터 수지 기판을 선택적으로 박리하는 것이 가능하게 된다.Since the release layer of the present invention has the characteristic of sufficiently absorbing light of a specific wavelength (eg, 308 nm) to which the LLO method can be applied, it can be used as a sacrificial layer for the LLO method. Therefore, a desired circuit is formed on a resin substrate fixed to a glass substrate through a release layer formed by using the composition in the present invention, and then LLO method is performed to irradiate a 308 nm light beam, and only this release layer is removed. It absorbs light and evaporates (sublimates). Thereby, the said peeling layer becomes a sacrifice (it acts as a sacrificial layer), and it becomes possible to selectively peel a resin substrate from a glass substrate.
실시예Example
이하, 실시예를 들어 본 발명을 더욱 상세하게 설명하지만, 본 발명은 이들 실시예에 한정되는 것은 아니다.Hereinafter, although an Example demonstrates this invention further in detail, this invention is not limited to these Examples.
[1] 화합물의 약어[1] Abbreviations of compounds
NMP: N-메틸피롤리돈NMP: N-methylpyrrolidone
BCS: 부틸셀로솔브BCS: Butyl Cellosolve
p-PDA: p-페닐렌디아민p-PDA: p-phenylenediamine
2AP: 2-아미노페놀2AP: 2-aminophenol
BPDA: 3,3-4,4-비페닐테트라카르복실산 이무수물BPDA: 3,3-4,4-biphenyltetracarboxylic dianhydride
PMDA: 피로멜리트산 이무수물PMDA: pyromellitic dianhydride
[2] 중량평균 분자량 및 분자량 분포의 측정[2] Measurement of weight average molecular weight and molecular weight distribution
폴리머의 중량평균 분자량(이하 Mw로 약칭함)과 분자량 분포는 니혼분코(주)제 GPC 장치(Shodex(등록상표) 컬럼 KF803L 및 KF805L)를 사용하여 용출 용매로서 디메틸포름아미드를 유량 1ml/분, 컬럼 온도 50℃의 조건으로 측정했다. 또한, Mw는 폴리스티렌 환산값으로 했다.The weight average molecular weight (hereinafter abbreviated as Mw) and molecular weight distribution of the polymer were measured using a GPC apparatus (Shodex (registered trademark) columns KF803L and KF805L) manufactured by Nippon Bunko Co., Ltd., and dimethylformamide as the elution solvent at a flow rate of 1 ml/min, It measured on condition of the column temperature of 50 degreeC. In addition, Mw was made into polystyrene conversion value.
[3] 폴리머의 합성[3] Synthesis of polymers
이하의 방법에 의해, 폴리아믹산을 합성했다.By the following method, the polyamic acid was synthesize|combined.
또한, 얻어진 폴리머 함유 반응액으로부터 폴리머를 단리하지 않고, 후술과 같이, 반응액을 희석함으로써 수지 기판 형성용 조성물 또는 박리층 형성용 조성물을 조제했다.In addition, a composition for forming a resin substrate or a composition for forming a release layer was prepared by diluting the reaction liquid as described later without isolating the polymer from the obtained polymer-containing reaction liquid.
<합성예 S1 폴리아믹산(S1)의 합성)><Synthesis Example S1 Synthesis of polyamic acid (S1)>
p-PDA 3.176g(0.02937몰)을 NMP 88.2g에 용해하고, BPDA 8.624g(0.02931몰)을 첨가한 후, 질소 분위기하, 23℃에서 24시간 반응시켰다. 얻어진 폴리머의 Mw는 107,300, 분자량 분포 4.6이었다.3.176 g (0.02937 mol) of p-PDA was dissolved in 88.2 g of NMP, and 8.624 g (0.02931 mol) of BPDA was added, followed by reaction at 23° C. under a nitrogen atmosphere for 24 hours. The obtained polymer had a Mw of 107,300 and a molecular weight distribution of 4.6.
<합성예 L1 폴리아믹산(L1)의 합성><Synthesis Example L1 Synthesis of polyamic acid (L1)>
p-PDA 1.507g(0.0139몰)을 NMP 43.2g에 용해하고, PMDA 3.166g(0.01452몰)을 첨가한 후, 질소 분위기하, 23℃에서 2시간 반응시켰다. 그 후, 2AP 0.127g(0.0012몰)을 더 첨가하고, 질소 분위기하, 23℃에서 24시간 반응시켰다. 얻어진 폴리머의 Mw는 48,500, 분자량 분포 2.05이었다.1.507 g (0.0139 mol) of p-PDA was dissolved in 43.2 g of NMP, and 3.166 g (0.01452 mol) of PMDA was added thereto, followed by reaction at 23° C. under a nitrogen atmosphere for 2 hours. Then, 0.127 g (0.0012 mol) of 2AP was further added, and it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours. The obtained polymer had a Mw of 48,500 and a molecular weight distribution of 2.05.
<합성예 L2 폴리아믹산(L2)의 합성><Synthesis Example L2 Synthesis of polyamic acid (L2)>
p-PDA 1.119g(0.01103몰)을 NMP 35.2g에 용해하고, PMDA 3.006g(0.01378몰)을 첨가한 후, 질소 분위기하, 23℃에서 2시간 반응시켰다. 그 후, 2AP 0.602g(0.00551몰)을 더 첨가하고, 질소 분위기하, 23℃에서 24시간 반응시켰다. 얻어진 폴리머의 Mw는 11,700, 분자량 분포 1.76이었다.1.119 g (0.01103 mol) of p-PDA was dissolved in 35.2 g of NMP, and 3.006 g (0.01378 mol) of PMDA was added, followed by reaction at 23° C. under a nitrogen atmosphere for 2 hours. Then, 0.602 g (0.00551 mol) of 2AP was further added, and it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours. Mw of the obtained polymer was 11,700, and molecular weight distribution was 1.76.
<합성예 L3 폴리아믹산(L3)의 합성><Synthesis Example L3 Synthesis of polyamic acid (L3)>
p-PDA 0.681g(0.00629몰)을 NMP 35.2g에 용해하고, PMDA 2.746g(0.01259몰)을 첨가한 후, 질소 분위기하, 23℃에서 2시간 반응시켰다. 그 후, 2AP 1.373g(0.012588몰)을 더 첨가하고, 질소 분위기하, 23℃에서 24시간 반응시켰다. 얻어진 폴리머의 Mw는 8,000, 분자량 분포 1.57이었다.0.681 g (0.00629 mol) of p-PDA was dissolved in 35.2 g of NMP, and 2.746 g (0.01259 mol) of PMDA was added, followed by reaction at 23° C. under a nitrogen atmosphere for 2 hours. Then, 1.373 g (0.012588 mol) of 2AP was further added, and it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours. The obtained polymer had Mw of 8,000 and a molecular weight distribution of 1.57.
<비교 합성예 HL1 폴리아믹산(HL1)의 합성><Synthesis of Comparative Synthesis Example HL1 Polyamic Acid (HL1)>
p-PDA 1.29g(0.00107몰)을 NMP 43.2g에 용해하고, BPDA 3.509g(0.00119몰)을 첨가한 후, 질소 분위기하, 23℃에서 24시간 반응시켰다. 얻어진 폴리머의 Mw는 34,000, 분자량 분포 2.03이었다.1.29 g (0.00107 mol) of p-PDA was dissolved in 43.2 g of NMP, and 3.509 g (0.00119 mol) of BPDA was added thereto, followed by reaction at 23° C. under a nitrogen atmosphere for 24 hours. The obtained polymer had Mw of 34,000 and a molecular weight distribution of 2.03.
<비교합성예 HL2 폴리아믹산(HL2)의 합성><Synthesis of Comparative Synthesis Example HL2 Polyamic Acid (HL2)>
p-PDA 1.325g(0.00123몰)을 NMP 36g에 용해하고, PMDA 2.674g(0.00123몰)을 첨가한 후, 질소 분위기하, 23℃에서 2시간 반응시켰다. 아쉽게도, 겔화되었기 때문에, 사용할 수 없었다.After dissolving 1.325 g (0.00123 mol) of p-PDA in 36 g of NMP and adding 2.674 g (0.00123 mol) of PMDA, it was reacted at 23° C. under a nitrogen atmosphere for 2 hours. Unfortunately, since it was gelled, it could not be used.
[4] 수지 기판 형성용 조성물의 조제[4] Preparation of a composition for forming a resin substrate
합성예 S1에서 얻어진 반응액을, 각각, 그대로 수지 기판 형성용 조성물로서 사용했다.The reaction solution obtained in Synthesis Example S1 was used as a composition for forming a resin substrate as it was.
[5] 박리층 형성용 조성물의 조제[5] Preparation of a composition for forming a release layer
[실시예 1-1][Example 1-1]
합성예 L1에서 얻어진 반응액에, BCS와 NMP를 가하고, 폴리머 농도가 5wt%, BCS가 20질량%가 되도록 희석하고, 박리층 형성용 조성물을 얻었다.BCS and NMP were added to the reaction solution obtained in Synthesis Example L1, and the mixture was diluted so that the polymer concentration was 5 wt% and BCS was 20 mass% to obtain a composition for forming a release layer.
[실시예 1-2∼1-3][Examples 1-2 to 1-3]
합성예 L1에서 얻어진 반응액 대신에, 각각 합성예 L2∼L3에서 얻어진 반응액을 사용한 이외는, 실시예 1-1과 동일한 방법으로, 박리층 형성용 조성물을 얻었다.A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solution obtained in Synthesis Examples L2 to L3 was used instead of the reaction solution obtained in Synthesis Example L1.
[비교예 1-1][Comparative Example 1-1]
합성예 L1에서 얻어진 반응액 대신에, 각각 비교합성예 HL1에서 얻어진 반응액을 사용한 이외는, 실시예 1-1과 동일한 방법으로, 박리층 형성용 조성물을 얻었다.A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solution obtained in Comparative Synthesis Example HL1 was used instead of the reaction solution obtained in Synthesis Example L1.
[6] 박리층 및 수지 기판의 제작[6] Preparation of release layer and resin substrate
[실시예 2-1][Example 2-1]
스핀 코터(조건: 회전수 3,000rpm으로 약 30초)를 사용하고, 실시예 1-1에서 얻어진 박리층 형성용 조성물 L1을 유리 기체로서의 100mm×100mm 유리 기판(이하 동일) 위에 도포했다.Using a spin coater (condition: rotation speed of 3,000 rpm for about 30 seconds), the composition L1 for forming a release layer obtained in Example 1-1 was applied onto a 100 mm×100 mm glass substrate (the same hereinafter) as a glass substrate.
그리고, 얻어진 도포막을 핫플레이트를 사용하여 100℃에서 2분간 가열하고, 그 후, 오븐을 사용하여, 300℃에서 30분간 가열하고, 가열 온도를 400℃까지 승온(10℃/분)하고, 400℃에서 30분간 가열하고, 또한, 500℃까지 승온(10℃/분)하고, 500℃에서 10분간 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성하고, 박리층 부착 유리 기판을 얻었다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고 오븐 내에서 가열했다.Then, the obtained coating film was heated at 100° C. for 2 minutes using a hot plate, and then heated at 300° C. for 30 minutes using an oven, and the heating temperature was raised to 400° C. (10° C./min), 400 It was heated at °C for 30 minutes, further heated to 500 °C (10 °C/min), and heated at 500 °C for 10 minutes to form a release layer with a thickness of about 0.1 µm on the glass substrate to obtain a glass substrate with a release layer. . In addition, during the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.
바 코터(갭: 250㎛)를 사용하여, 상기에서 얻어진 유리 기판 위의 박리층(수지 박막) 위에 수지 기판 형성용 조성물 S2를 도포했다. 그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃에서 30분간 가열하고, 그 후, 오븐을 사용하여, 질소 분위기로 한 후, 140℃에서 30분간 가열하고, 가열 온도를 210℃까지 승온(2℃/분, 이하 동일)하고, 210℃에서 30분간, 가열 온도를 300℃까지 승온하고, 300℃에서 30분간, 가열 온도를 400℃까지 승온하고, 400℃에서 30분간, 가열 온도를 500℃까지 승온하고, 500℃에서 60분간 가열하고, 박리층 위에 두께 약 20㎛의 폴리이미드 수지 기판을 형성하고, 수지 기판·박리층 부착 유리 기판을 얻었다. 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다.The composition S2 for resin substrate formation was apply|coated on the peeling layer (resin thin film) on the glass substrate obtained above using the bar coater (gap: 250 micrometers). Then, the obtained coating film was heated at 80° C. for 30 minutes using a hot plate, and then, using an oven, in a nitrogen atmosphere, and then heated at 140° C. for 30 minutes, and the heating temperature was raised to 210° C. (2° C.) /min, hereinafter the same), the heating temperature is increased to 300°C for 30 minutes at 210°C, the heating temperature is raised at 300°C for 30 minutes, the heating temperature is raised to 400°C, and the heating temperature is increased at 400°C for 30 minutes to 500°C. It heated up and heated at 500 degreeC for 60 minutes, the about 20-micrometer-thick polyimide resin substrate was formed on the peeling layer, and the resin substrate and the glass substrate with a peeling layer were obtained. During the temperature increase, the film-attached substrate was heated in the oven without taking it out of the oven.
[실시예 2-2∼2-3][Examples 2-2-2-3]
실시예 1-1에서 얻어진 박리층 형성용 조성물 L1 대신에, 각각 실시예 1-2∼1-3에서 얻어진 박리층 형성용 조성물 L2 및 L3을 사용한 이외는, 실시예 2-1과 동일한 방법으로, 박리층 및 폴리이미드 수지 기판을 형성하고, 박리층 부착 유리 기판 및 수지 기판·박리층 부착 유리 기판을 얻었다.In the same manner as in Example 2-1, except that the compositions L2 and L3 for forming a release layer obtained in Examples 1-2 to 1-3, respectively, were used instead of the composition L1 for forming a release layer obtained in Example 1-1. , a release layer and a polyimide resin substrate were formed, and a glass substrate with a release layer and a glass substrate with a resin substrate and a release layer were obtained.
[비교예 2-1][Comparative Example 2-1]
실시예 1-1에서 얻어진 박리층 형성용 조성물 L1 대신에, 비교예 1-1에서 얻어진 박리층 형성용 조성물 HL1을 사용한 이외는, 실시예 2-1과 동일한 방법으로, 박리층 및 폴리이미드 수지 기판을 형성하고, 박리층 부착 유리 기판 및 수지 기판·박리층 부착 유리 기판을 얻었다.The release layer and the polyimide resin were used in the same manner as in Example 2-1 except that the composition HL1 for forming a release layer obtained in Comparative Example 1-1 was used instead of the composition L1 for forming a release layer obtained in Example 1-1. The board|substrate was formed, and the glass substrate with a peeling layer and the resin substrate and the glass substrate with a peeling layer were obtained.
[7] 박리성의 평가[7] Evaluation of peelability
상기 실시예 2-1∼2-3 및 비교예 2-1에서 얻어진 박리층 부착 유리 기판에 대하여, 박리층과 유리 기판과의 박리성을 하기 수법으로 확인했다. 또한, 하기의 시험은 동일한 유리 기판으로 행했다.About the glass substrate with a peeling layer obtained in said Examples 2-1 to 2-3 and Comparative Example 2-1, the peelability of a peeling layer and a glass substrate was confirmed by the following method. In addition, the following test was done with the same glass substrate.
<수지 박막의 크로스컷 시험 박리성 평가><Evaluation of cross-cut test peelability of resin thin film>
실시예 2-1∼2-3 및 비교예 2-1에서 얻어진 박리층 부착 유리 기판 위의 박리층을 크로스컷(종횡 1mm 간격, 이하 동일)하여, 100 사각형 자르기를 행했다. 즉, 이 크로스컷에 의해, 1mm 사방의 사각조각을 100개 형성했다.The peeling layer on the glass substrate with a peeling layer obtained in Examples 2-1 to 2-3 and Comparative Example 2-1 was cross-cut (vertical and horizontal intervals of 1 mm, hereinafter the same), and 100 square cuts were performed. That is, by this crosscut, 100 square pieces of 1 mm square were formed.
그리고, 이 100 사각형 자르기 부분에 점착테이프를 붙이고, 그 테이프를 벗겨, 이하의 기준(5B∼0B, B,A, AA)에 기초하여, 박리성을 평가했다. 결과를 표 1에 나타낸다.And the adhesive tape was stuck to this 100 square cut-out part, the tape was peeled, and peelability was evaluated based on the following criteria (5B-0B, B,A, AA). A result is shown in Table 1.
<판정 기준><Judgment Criteria>
5B: 0% 박리(박리 없음)5B: 0% peeling (no peeling)
4B: 5% 미만의 박리4B: less than 5% peeling
3B: 5∼15% 미만의 박리3B: peeling less than 5-15%
2B: 15∼35% 미만의 박리2B: peeling less than 15-35%
1B: 35∼65% 미만의 박리1B: peeling less than 35-65%
0B: 65%∼80% 미만의 박리0B: 65% to less than 80% peeling
B: 80%∼95% 미만의 박리B: 80% to less than 95% peeling
A: 95%∼100% 미만의 박리A: 95% to less than 100% peeling
AA: 100% 박리(모두 박리)AA: 100% peeling (all peeling)
<수지 기판의 박리성의 평가><Evaluation of the peelability of the resin substrate>
실시예 2-1∼2-3 및 비교예 2-1에서 얻어진 수지 기판·박리층 부착 유리 기판의 수지 기판을 커터를 사용하여 25mm 폭의 스트립 형상으로 잘랐다. 그리고, 자른 수지 기판의 선단에 셀로판 테이프를 붙이고, 이것을 시험편으로 했다. 이 시험편을 (주)아토닉제 푸시풀 테스터를 사용하여 박리각도가 90°가 되도록 박리 시험을 행하고, 하기의 기준에 기초하여 박리성을 평가했다. 결과를 표 1에 나타낸다.The resin substrate of the glass substrate with a resin substrate and a peeling layer obtained in Examples 2-1 to 2-3 and Comparative Example 2-1 was cut into the strip shape of 25 mm width using the cutter. And the cellophane tape was stuck to the front-end|tip of the cut resin substrate, and this was made into the test piece. This test piece was subjected to a peeling test using a push-pull tester made by Atonic Co., Ltd. so that the peeling angle was set to 90°, and peelability was evaluated based on the following criteria. A result is shown in Table 1.
<판정 기준><Judgment Criteria>
5B: 0% 박리(박리 없음)5B: 0% peeling (no peeling)
4B: 5% 미만의 박리4B: less than 5% peeling
3B: 5∼15% 미만의 박리3B: peeling less than 5-15%
2B: 15∼35% 미만의 박리2B: peeling less than 15-35%
1B: 35∼65% 미만의 박리1B: peeling less than 35-65%
0B: 65%∼80% 미만의 박리0B: 65% to less than 80% peeling
B: 80%∼95% 미만의 박리B: 80% to less than 95% peeling
A: 95%∼100% 미만의 박리A: 95% to less than 100% peeling
AA: 100% 박리(모두 박리)AA: 100% peeling (all peeling)
표 1의 결과로부터, 실시예 2-1∼2-3의 박리층은 유리 기판으로부터 박리층이 벗겨지지 않고 수지 기판만 박리할 수 있었지만, 비교예 2-1에서는 박리할 수 없었던 것이 확인되었다.From the result of Table 1, although the peeling layer of Examples 2-1 to 2-3 could peel only a resin substrate without a peeling layer peeling from a glass substrate, it was confirmed that it was not able to peel in Comparative Example 2-1.
Claims (7)
상기 폴리아믹산이 방향족 디아민을 포함하는 디아민 성분과 방향족 테트라카르복실산 이무수물을 포함하는 산 이무수물 성분을 반응시켜 얻어진 폴리아믹산이고,
상기 테트라카르복실산 이무수물 성분이 하기 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종의 방향족 테트라카르복실산 이무수물을 포함하며, 또한, 그 사용량이 전체 테트라카르복실산 이무수물 중 70몰% 이상인 것을 특징으로 하는 박리층의 제조 방법.
A composition for forming a release layer comprising a polyamic acid having both terminals derived from tetracarboxylic acid and sealed with 2-aminophenol at one or both terminals of the two terminals and an organic solvent is applied on a substrate, the highest temperature A method for producing a release layer comprising a step of firing at 400° C. or higher, the method comprising:
The polyamic acid is a polyamic acid obtained by reacting a diamine component containing an aromatic diamine and an acid dianhydride component containing an aromatic tetracarboxylic acid dianhydride,
The tetracarboxylic dianhydride component contains at least one aromatic tetracarboxylic dianhydride selected from the group consisting of the following formulas (C1) to (C12), and the amount used is all tetracarboxylic dianhydride A method for producing a release layer, characterized in that 70 mol% or more in water.
상기 방향족 디아민이 벤젠핵을 1∼5개 포함하는 방향족 디아민인 것을 특징으로 하는 박리층의 제조 방법.The method of claim 1,
The method for producing a release layer, characterized in that the aromatic diamine is an aromatic diamine containing 1 to 5 benzene nuclei.
상기 방향족 테트라카르복실산 이무수물이 벤젠핵을 1∼5개 포함하는 방향족 테트라카르복실산 이무수물인 것을 특징으로 하는 박리층의 제조 방법.3. The method of claim 1 or 2,
The method for producing a release layer, wherein the aromatic tetracarboxylic dianhydride is an aromatic tetracarboxylic dianhydride containing 1 to 5 benzene nuclei.
상기 수지 기판이 폴리이미드 수지 기판인 것을 특징으로 하는 플랙시블 전자 디바이스의 제조 방법.6. The method of claim 4 or 5,
The method for manufacturing a flexible electronic device, characterized in that the resin substrate is a polyimide resin substrate.
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