KR102528185B1 - Composition for forming release layer - Google Patents

Composition for forming release layer Download PDF

Info

Publication number
KR102528185B1
KR102528185B1 KR1020177024538A KR20177024538A KR102528185B1 KR 102528185 B1 KR102528185 B1 KR 102528185B1 KR 1020177024538 A KR1020177024538 A KR 1020177024538A KR 20177024538 A KR20177024538 A KR 20177024538A KR 102528185 B1 KR102528185 B1 KR 102528185B1
Authority
KR
South Korea
Prior art keywords
release layer
polyamic acid
composition
forming
substrate
Prior art date
Application number
KR1020177024538A
Other languages
Korean (ko)
Other versions
KR20170116065A (en
Inventor
카즈야 에바라
카즈야 신도
Original Assignee
닛산 가가쿠 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 닛산 가가쿠 가부시키가이샤 filed Critical 닛산 가가쿠 가부시키가이샤
Priority to KR1020227020140A priority Critical patent/KR102602473B1/en
Publication of KR20170116065A publication Critical patent/KR20170116065A/en
Application granted granted Critical
Publication of KR102528185B1 publication Critical patent/KR102528185B1/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1067Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
    • C08G73/1071Wholly aromatic polyimides containing oxygen in the form of ether bonds in the main chain
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1003Preparatory processes
    • C08G73/1007Preparatory processes from tetracarboxylic acids or derivatives and diamines
    • C08G73/1028Preparatory processes from tetracarboxylic acids or derivatives and diamines characterised by the process itself, e.g. steps, continuous
    • C08G73/1032Preparatory processes from tetracarboxylic acids or derivatives and diamines characterised by the process itself, e.g. steps, continuous characterised by the solvent(s) used
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1039Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors comprising halogen-containing substituents
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1042Copolyimides derived from at least two different tetracarboxylic compounds or two different diamino compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1046Polyimides containing oxygen in the form of ether bonds in the main chain
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1067Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1085Polyimides with diamino moieties or tetracarboxylic segments containing heterocyclic moieties
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/16Polyester-imides
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • C08L79/08Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133305Flexible substrates, e.g. plastics, organic film
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/13338Input devices, e.g. touch panels
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G09F9/301Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements flexible foldable or roll-able electronic displays, e.g. thin LCD, OLED

Abstract

방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하고, 상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 박리층 형성용 조성물을 제공한다. A polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine contains an aromatic diamine containing at least one of an ester bond and an ether bond, and/or the aromatic A composition for forming a release layer in which tetracarboxylic dianhydride contains at least one of an ester linkage and an ether linkage is provided.

Figure 112017084678511-pct00033
Figure 112017084678511-pct00033

Description

박리층 형성용 조성물Composition for forming release layer

본 발명은 박리층 형성용 조성물에 관한 것으로, 상세히 설명하면, 기체 위에 설치하는 박리층을 형성하기 위한 박리층 형성용 조성물에 관한 것이다. The present invention relates to a composition for forming a release layer, and more specifically, to a composition for forming a release layer for forming a release layer installed on a substrate.

최근, 전자 디바이스에는, 구부린다고 하는 기능 부여나 박형화 및 경량화와 같은 성능이 요구되고 있다. 이 점에서, 종래의 무겁고 취약하여 구부릴 수 없는 유리 기판 대신에, 경량의 플랙시블 플라스틱 기판을 사용하는 것이 요구된다. 또한 신세대 디스플레이에서는, 경량의 플랙시블 플라스틱 기판을 사용하는, 액티브 풀컬러(active full-color) TFT 디스플레이 패널의 개발이 요구되고 있다. 그래서, 수지 필름을 기판으로 한 전자 디바이스의 제조 방법이 여러 가지로 검토되기 시작되고 있고, 신세대 디스플레이에서는, 기존의 TFT 설비를 전용 가능한 프로세스로 제조 검토가 진행되고 있다. BACKGROUND OF THE INVENTION [0002] In recent years, electronic devices have been required to have functions such as bending, and performance such as thinning and lightening. In this regard, it is desired to use a lightweight flexible plastic substrate instead of the conventional glass substrate, which is heavy and brittle and cannot be bent. Also, in a new generation display, development of an active full-color TFT display panel using a lightweight flexible plastic substrate is required. Then, various manufacturing methods of electronic devices using a resin film as a substrate are beginning to be examined, and manufacturing examination is progressing with a process capable of diverting existing TFT facilities in a new generation display.

특허문헌 1, 2 및 3은 유리 기판 위에 아몰포스 실리콘 박막층을 형성하고, 그 박막층 위에 플라스틱 기판을 형성한 후에, 유리면측에서 레이저를 조사하여, 아몰포스 실리콘의 결정화에 따라 발생하는 수소 가스에 의해 플라스틱 기판을 유리 기판으로부터 박리하는 방법을 개시한다. 또한 특허문헌 4는 특허문헌 1∼3 개시의 기술을 사용하여 피박리층(특허문헌 4에서 「피전사층」으로 기재된다.)을 플라스틱 필름에 첩부하여 액정 표시 장치를 완성시키는 방법을 개시한다. Patent Documents 1, 2 and 3 form an amorphous silicon thin film layer on a glass substrate, form a plastic substrate on the thin film layer, then irradiate a laser from the glass surface side, Disclosed is a method of peeling a plastic substrate from a glass substrate. In addition, Patent Document 4 discloses a method of completing a liquid crystal display device by attaching a layer to be peeled (described as "transferred layer" in Patent Document 4) to a plastic film using the techniques disclosed in Patent Documents 1 to 3. .

그러나, 특허문헌 1∼4에 개시된 방법, 특히 특허문헌 4에 개시된 방법은 투광성이 높은 기판을 사용하는 것이 필수이며, 기판을 통과시키고, 또한 비정질 실리콘에 포함되는 수소를 방출시키는데 충분한 에너지를 주기 위해, 비교적 큰 레이저광의 조사가 필요하게 되어, 피박리층에 손상을 주어 버린다고 하는 문제가 있다. 또한 레이저 처리에 장시간을 요하여, 대면적을 갖는 피박리층을 박리하는 것은 곤란하기 때문에, 디바이스 제작의 생산성을 높이는 것이 어렵다고 하는 문제도 있다. However, in the method disclosed in Patent Documents 1 to 4, particularly the method disclosed in Patent Document 4, it is essential to use a substrate having high light transmission properties, and to give enough energy to pass through the substrate and release hydrogen contained in amorphous silicon. , there is a problem that irradiation of a comparatively large laser beam is required, which damages the layer to be separated. In addition, since the laser treatment requires a long time and it is difficult to peel a layer to be separated having a large area, there is also a problem that it is difficult to increase the productivity of device fabrication.

일본 특개 평10-125929호 공보Japanese Unexamined Patent Publication No. 10-125929 일본 특개 평10-125931호 공보Japanese Unexamined Patent Publication No. 10-125931 국제공개 제2005/050754호International Publication No. 2005/050754 일본 특개 평10-125930호 공보Japanese Unexamined Patent Publication No. 10-125930

본 발명은 상기 사정을 감안하여 이루어진 것으로, 플랙시블 전자 디바이스의 수지 기판에 손상을 주지 않고 박리할 수 있는 박리층 형성용 조성물을 제공하는 것을 목적으로 한다. The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a composition for forming a peeling layer capable of peeling without damaging a resin substrate of a flexible electronic device.

본 발명자들은, 상기 과제를 해결하기 위해 예의 검토를 거듭한 결과, 방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하는 조성물에 있어서, 상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 경우에, 기체와의 우수한 밀착성, 및 플랙시블 전자 디바이스로서 사용되는 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 박리층을 형성할 수 있는 조성물이 얻어지는 것을 발견하고, 본 발명을 완성시켰다. As a result of repeated intensive studies to solve the above problems, the inventors of the present invention have found that, in a composition containing a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent, the aromatic diamine has an ester bond and When it contains an aromatic diamine containing at least one of ether bonds, and/or the aromatic tetracarboxylic dianhydride contains an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond, with a gas They discovered that a composition capable of forming a release layer having excellent adhesion and appropriate adhesion to a resin substrate used as a flexible electronic device and appropriate release property was obtained, and the present invention was completed.

즉, 본 발명은,That is, the present invention,

1. 방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하고,1. Contains a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent,

상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 것을 특징으로 하는 박리층 형성용 조성물,The aromatic diamine contains an aromatic diamine containing at least one of an ester bond and an ether bond, and/or the aromatic tetracarboxylic acid dianhydride contains an aromatic tetracarboxylic acid dianhydride containing at least one of an ester bond and an ether bond. A composition for forming a release layer, characterized in that

2. 상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민이 식 (A1)∼(A42)로 이루어지는 군으로부터 선택되는 적어도 1종인 1의 박리층 형성용 조성물,2. The first composition for forming a release layer, wherein the aromatic diamine containing at least one of an ester linkage and an ether linkage is at least one member selected from the group consisting of Formulas (A1) to (A42);

Figure 112017084678511-pct00001
Figure 112017084678511-pct00001

Figure 112017084678511-pct00002
Figure 112017084678511-pct00002

Figure 112017084678511-pct00003
Figure 112017084678511-pct00003

Figure 112017084678511-pct00004
Figure 112017084678511-pct00004

Figure 112017084678511-pct00005
Figure 112017084678511-pct00005

Figure 112017084678511-pct00006
Figure 112017084678511-pct00006

Figure 112017084678511-pct00007
Figure 112017084678511-pct00007

3. 상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물이 식 (B1)∼(B14)로 이루어지는 군으로부터 선택되는 적어도 1종인 1 또는 2의 박리층 형성용 조성물,3. 1 or 2 compositions for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing at least one of an ester linkage and an ether linkage is at least one member selected from the group consisting of formulas (B1) to (B14);

Figure 112017084678511-pct00008
Figure 112017084678511-pct00008

4. 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물을 더 포함하는 1∼3 중 어느 하나의 박리층 형성용 조성물,4. The composition for forming a release layer according to any one of 1 to 3, wherein the aromatic tetracarboxylic dianhydride further comprises an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond;

5. 상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 벤젠 골격, 나프틸 골격 또는 바이페닐 골격을 포함하는 것인 4의 박리층 형성용 조성물,5. The composition for forming a release layer of 4, wherein the aromatic tetracarboxylic acid dianhydride containing neither an ester bond nor an ether bond includes a benzene skeleton, a naphthyl skeleton, or a biphenyl skeleton;

6. 상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종인 5의 박리층 형성용 조성물,6. The composition for forming a release layer according to item 5, wherein the aromatic tetracarboxylic dianhydride containing neither ester linkage nor ether linkage is at least one member selected from the group consisting of formulas (C1) to (C12);

Figure 112017084678511-pct00009
Figure 112017084678511-pct00009

7. 상기 유기 용매가 식 (S1)로 표시되는 아마이드류, 식 (S2)로 표시되는 아마이드류 및 식 (S3)으로 표시되는 아마이드류로부터 선택되는 적어도 1개를 포함하는 1∼6 중 어느 하나의 박리층 형성용 조성물,7. Any one of 1 to 6, wherein the organic solvent contains at least one selected from amides represented by formula (S1), amides represented by formula (S2), and amides represented by formula (S3) A composition for forming a release layer of

Figure 112017084678511-pct00010
Figure 112017084678511-pct00010

(식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타낸다.)(In the formula, R 1 and R 2 independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number.)

8. 1∼7 중 어느 하나의 박리층 형성용 조성물을 사용하여 형성되는 박리층,8. A release layer formed using the composition for forming a release layer of any one of 1 to 7;

9. 8의 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 방법,9. A method for manufacturing a flexible electronic device having a resin substrate, characterized by using the peeling layer of 8 above;

10. 8의 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 터치패널 센서의 제조 방법,10. Method for manufacturing a touch panel sensor having a resin substrate, characterized by using the peeling layer of 8,

11. 상기 수지 기판이 폴리이미드로 이루어지는 기판인 9 또는 10의 제조 방법을 제공한다. 11. A manufacturing method of 9 or 10 in which the resin substrate is a substrate made of polyimide is provided.

본 발명의 박리층 형성용 조성물을 사용함으로써 기체와의 우수한 밀착성, 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다. 본 발명의 조성물을 사용함으로써 플랙시블 전자 디바이스의 제조 프로세스에 있어서, 기체 위에 형성된 수지 기판이나, 또한 그 위에 설치되는 회로 등에 손상을 주지 않고, 당해 회로 등과 함께 당해 수지 기판을 당해 기체로부터 분리하는 것이 가능하게 된다. 따라서, 본 발명의 박리층 형성용 조성물은 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 프로세스의 간편화와 그 수율의 향상 등에 기여할 수 있다. By using the composition for forming a release layer of the present invention, a film having excellent adhesion to a substrate and appropriate adhesion to a resin substrate and appropriate release properties can be obtained with good reproducibility. In the manufacturing process of a flexible electronic device by using the composition of the present invention, it is possible to separate the resin substrate from the substrate together with the circuit without damaging the resin substrate formed on the substrate or the circuit installed thereon. It becomes possible. Therefore, the composition for forming a release layer of the present invention can contribute to simplification of the manufacturing process of a flexible electronic device having a resin substrate and improvement of its yield.

도 1은 실시예 4에서 측정한 투과율을 나타내는 그래프이다. 1 is a graph showing the transmittance measured in Example 4.

이하, 본 발명에 대해, 보다 상세하게 설명한다. Hereinafter, the present invention will be described in more detail.

본 발명의 박리층 형성용 조성물은 방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산, 및 유기 용매를 포함하는 것이며, 상기 방향족 다이아민이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물을 포함하는 것이다. 여기에서, 본 발명에서의 박리층이란 소정의 목적으로 유리 기체 바로 위에 설치되는 층이며, 그 전형예로서는 플랙시블 전자 디바이스의 제조 프로세스에 있어서 기체와, 폴리이미드와 같은 수지로 이루어지는 플랙시블 전자 디바이스의 수지 기판과의 사이에, 당해 수지 기판을 소정의 프로세스 중에서 고정하기 위해 설치되고, 또한, 당해 수지 기판 위에 전자 회로 등이 형성된 후에 있어서 당해 수지 기판을 당해 기체로부터 용이하게 박리할 수 있도록 하기 위해 설치되는 것을 들 수 있다. The composition for forming a release layer of the present invention includes a polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine contains at least one of an ester bond and an ether bond. It contains amine, and/or the aromatic tetracarboxylic dianhydride contains at least one of an ester bond and an ether bond. Here, the release layer in the present invention is a layer provided directly on the glass substrate for a predetermined purpose, and a typical example thereof is a flexible electronic device made of a substrate and a resin such as polyimide in a manufacturing process of a flexible electronic device. It is provided between the resin substrate and the resin substrate in order to fix the resin substrate during a predetermined process, and is provided so that the resin substrate can be easily separated from the base body after an electronic circuit or the like is formed on the resin substrate. can be heard

상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민은 그 분자 내에 에스터 결합 및 에터 결합의 일방을 포함하거나, 또는 이것들의 양방을 포함하는 것이다. The aromatic diamine containing at least one of an ester bond and an ether bond described above contains one of an ester bond and an ether bond in its molecule, or both thereof.

이러한 방향족 다이아민으로서는 복수의 탄소수 6∼20의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 다이아민을 들 수 있다. 상기 방향족환의 구체예로서는 벤젠환, 나프탈렌환, 안트라센환, 펜안트렌환 등을 들 수 있다. 그 중에서도, 폴리아믹산의 유기 용매에의 용해성을 확보하는 관점에서, 2 또는 3개의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 다이아민이 바람직하다. Examples of such aromatic diamines include diamines having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds. A benzene ring, a naphthalene ring, an anthracene ring, a phenanthrene ring etc. are mentioned as a specific example of the said aromatic ring. Especially, from a viewpoint of ensuring the solubility of a polyamic acid to an organic solvent, the diamine which has a structure in which 2 or 3 aromatic rings were connected by the ester bond or the ether bond is preferable.

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민의 바람직한 구체예로서는 이하에 나타내는 것을 들 수 있다. In this invention, what is shown below is mentioned as a preferable specific example of the aromatic diamine containing at least one of an ester bond and an ether bond.

Figure 112017084678511-pct00011
Figure 112017084678511-pct00011

Figure 112017084678511-pct00012
Figure 112017084678511-pct00012

Figure 112017084678511-pct00013
Figure 112017084678511-pct00013

Figure 112017084678511-pct00014
Figure 112017084678511-pct00014

Figure 112017084678511-pct00015
Figure 112017084678511-pct00015

Figure 112017084678511-pct00016
Figure 112017084678511-pct00016

Figure 112017084678511-pct00017
Figure 112017084678511-pct00017

상기 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물은 그 분자 내에 에스터 결합과 에터 결합의 일방을 포함하거나, 또는 이것들의 양방 모두를 포함하는 것이다. The aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond has one of an ester bond and an ether bond in its molecule, or both of these bonds.

이러한 방향족 테트라카복실산 이무수물로서는 복수의 탄소수 6∼20의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 테트라카복실산 이무수물을 들 수 있다. 상기 방향족환의 구체예로서는 상기와 동일한 것을 들 수 있다. 그 중에서도, 폴리아믹산의 유기 용매에의 용해성을 확보하는 관점에서, 3 또는 4개의 방향족환이 에스터 결합 또는 에터 결합으로 연결된 구조를 갖는 것이 바람직하다. Examples of such aromatic tetracarboxylic dianhydride include tetracarboxylic dianhydride having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds. As a specific example of the said aromatic ring, the thing similar to the above is mentioned. Especially, from a viewpoint of ensuring the solubility of a polyamic acid to an organic solvent, what has a structure in which 3 or 4 aromatic rings were connected by the ester bond or the ether bond is preferable.

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물의 바람직한 구체예로서는 이하에 나타내는 것을 들 수 있다. In this invention, what is shown below is mentioned as a preferable specific example of aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond.

Figure 112017084678511-pct00018
Figure 112017084678511-pct00018

본 발명에서는, 전술한 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민과 함께, 그 이외의 다이아민을 사용할 수 있다. In this invention, diamine other than that can be used with the aromatic diamine containing at least one of the above-mentioned ester bond and ether bond.

이러한 다이아민은 지방족 다이아민, 방향족 다이아민의 어떤 것이어도 되지만, 얻어지는 박막의 강도와 내열성을 확보하는 관점에서, 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 다이아민이 바람직하다. Any of an aliphatic diamine and an aromatic diamine may be used as such diamine, but an aromatic diamine containing neither ester bond nor ether bond is preferable from the viewpoint of ensuring strength and heat resistance of the obtained thin film.

그 구체예로서는 1,4-다이아미노벤젠(p-페닐렌다이아민), 1,3-다이아미노벤젠(m-페닐렌다이아민), 1,2-다이아미노벤젠(o-페닐렌다이아민), 2,4-다이아미노톨루엔, 2,5-다이아미노톨루엔, 2,6-다이아미노톨루엔, 4,6-다이메틸-m-페닐렌다이아민, 2,5-다이메틸-p-페닐렌다이아민, 2,6-다이메틸-p-페닐렌다이아민, 2,4,6-트라이메틸-1,3-페닐렌다이아민, 2,3,5,6-테트라메틸-p-페닐렌다이아민, m-자일릴렌다이아민, p-자일릴렌다이아민, 5-트라이플루오로메틸벤젠-1,3-다이아민, 5-트라이플루오로메틸 벤젠-1,2-다이아민, 3,5-비스(트라이플루오로메틸)벤젠-1,2-다이아민 등의 벤젠핵을 1개 포함하는 다이아민; 1,2-나프탈렌다이아민, 1,3-나프탈렌다이아민, 1,4-나프탈렌다이아민, 1,5-나프탈렌다이아민, 1,6-나프탈렌다이아민, 1,7-나프탈렌다이아민, 1,8-나프탈렌다이아민, 2,3-나프탈렌다이아민, 2,6-나프탈렌다이아민, 4,4'-바이페닐 다이아민, 2,2'-비스(트라이플루오로메틸)-4,4'-다이아미노바이페닐, 3,3'-다이메틸-4,4'-다이아미노다이페닐메테인, 3,3'-다이카복시-4,4'-다이아미노다이페닐메테인, 3,3',5,5'-테트라메틸-4,4'-다이아미노다이페닐메테인, 4,4'-다이아미노벤즈아닐리드, 3,3'-다이클로로벤지딘, 3,3'-다이메틸벤지딘, 2,2'-다이메틸벤지딘, 3,3'-다이아미노다이페닐메테인, 3,4'-다이아미노다이페닐메테인, 4,4'-다이아미노다이페닐메테인, 2,2-비스(3-아미노페닐)프로페인, 2,2-비스(4-아미노페닐)프로페인, 2,2-비스(3-아미노페닐)-1,1,1,3,3,3-헥사플루오로프로페인, 2,2-비스(4-아미노페닐)-1,1,1,3,3,3-헥사플루오로프로페인, 3,3'-다이아미노다이페닐설폭사이드, 3,4'-다이아미노다이페닐설폭사이드, 4,4'-다이아미노다이페닐설폭사이드, 3,3'-비스(트라이플루오로메틸)바이페닐-4,4'-다이아민, 3,3',5,5'-테트라플루오로바이페닐-4,4'-다이아민, 4,4'-다이아미노옥타플루오로바이페닐 등의 벤젠핵을 2개 포함하는 다이아민; 1,5-다이아미노안트라센, 2,6-다이아미노안트라센, 9,10-다이아미노안트라센, 1,8-다이아미노펜안트렌, 2,7-다이아미노펜안트렌, 3,6-다이아미노펜안트렌, 9,10-다이아미노펜안트렌, 1,3-비스(3-아미노페닐)벤젠, 1,3-비스(4-아미노페닐)벤젠, 1,4-비스(3-아미노페닐)벤젠, 1,4-비스(4-아미노페닐)벤젠, 1,3-비스(3-아미노페닐설파이드)벤젠, 1,3-비스(4-아미노페닐설파이드)벤젠, 1,4-비스(4-아미노페닐설파이드)벤젠, 1,3-비스(3-아미노페닐설폰)벤젠, 1,3-비스(4-아미노페닐설폰)벤젠, 1,4-비스(4-아미노페닐설폰)벤젠, 1,3-비스[2-(4-아미노페닐)아이소프로필]벤젠, 1,4-비스[2-(3-아미노페닐)아이소프로필]벤젠, 1,4-비스[2-(4-아미노페닐)아이소프로필]벤젠 등의 벤젠핵을 3개 포함하는 다이아민 등을 들 수 있지만, 이것들에 한정되지 않는다. 이것들은 1종 단독으로도, 2종 이상을 조합하여 사용할 수도 있다. Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), and 1,2-diaminobenzene (o-phenylenediamine). , 2,4-diaminotoluene, 2,5-diaminotoluene, 2,6-diaminotoluene, 4,6-dimethyl-m-phenylenediamine, 2,5-dimethyl-p-phenylene Diamine, 2,6-dimethyl-p-phenylenediamine, 2,4,6-trimethyl-1,3-phenylenediamine, 2,3,5,6-tetramethyl-p-phenylene Diamine, m-xylylenediamine, p-xylylenediamine, 5-trifluoromethylbenzene-1,3-diamine, 5-trifluoromethylbenzene-1,2-diamine, 3,5 -Diamine containing one benzene nucleus, such as bis(trifluoromethyl)benzene-1,2-diamine; 1,2-naphthalenediamine, 1,3-naphthalenediamine, 1,4-naphthalenediamine, 1,5-naphthalenediamine, 1,6-naphthalenediamine, 1,7-naphthalenediamine, 1, 8-naphthalenediamine, 2,3-naphthalenediamine, 2,6-naphthalenediamine, 4,4'-biphenyl diamine, 2,2'-bis(trifluoromethyl)-4,4'- Diaminobiphenyl, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 3,3'-dicarboxy-4,4'-diaminodiphenylmethane, 3,3', 5,5'-tetramethyl-4,4'-diaminodiphenylmethane, 4,4'-diaminobenzanilide, 3,3'-dichlorobenzidine, 3,3'-dimethylbenzidine, 2, 2'-dimethylbenzidine, 3,3'-diaminodiphenylmethane, 3,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylmethane, 2,2-bis(3 -Aminophenyl)propane, 2,2-bis(4-aminophenyl)propane, 2,2-bis(3-aminophenyl)-1,1,1,3,3,3-hexafluoropropane , 2,2-bis(4-aminophenyl)-1,1,1,3,3,3-hexafluoropropane, 3,3'-diaminodiphenylsulfoxide, 3,4'-diamino Diphenylsulfoxide, 4,4'-diaminodiphenylsulfoxide, 3,3'-bis(trifluoromethyl)biphenyl-4,4'-diamine, 3,3',5,5'- diamines containing two benzene nuclei, such as tetrafluorobiphenyl-4,4'-diamine and 4,4'-diaminooctafluorobiphenyl; 1,5-diaminoanthracene, 2,6-diaminoanthracene, 9,10-diaminoanthracene, 1,8-diaminophenanthrene, 2,7-diaminophenanthrene, 3,6-diaminophenanthrene , 9,10-diaminophenanthrene, 1,3-bis (3-aminophenyl) benzene, 1,3-bis (4-aminophenyl) benzene, 1,4-bis (3-aminophenyl) benzene, 1 ,4-bis(4-aminophenyl)benzene, 1,3-bis(3-aminophenylsulfide)benzene, 1,3-bis(4-aminophenylsulfide)benzene, 1,4-bis(4-aminophenyl) Sulfide)benzene, 1,3-bis(3-aminophenylsulfone)benzene, 1,3-bis(4-aminophenylsulfone)benzene, 1,4-bis(4-aminophenylsulfone)benzene, 1,3- Bis[2-(4-aminophenyl)isopropyl]benzene, 1,4-bis[2-(3-aminophenyl)isopropyl]benzene, 1,4-bis[2-(4-aminophenyl)isopropyl ] Although diamine containing three benzene nuclei, such as benzene, etc. are mentioned, it is not limited to these. These can also be used individually by 1 type or in combination of 2 or more types.

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민과 함께, 그것 이외의 다이아민을 사용하는 경우, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 다이아민의 사용량은 전체 다이아민 중, 바람직하게는 70몰% 이상, 보다 바람직하게는 80몰% 이상, 더한층 바람직하게는 90몰% 이상, 더욱 바람직하게는 95몰% 이상이다. 이러한 사용량을 채용함으로써 기체와의 우수한 밀착성, 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다. In the present invention, when diamine other than the aromatic diamine containing at least one of an ester bond and an ether bond is used together with an aromatic diamine containing at least one of an ester bond and an ether bond, the amount of aromatic diamine containing at least one of an ester bond and an ether bond is Of the min, it is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, still more preferably 95 mol% or more. By employing such an amount, it is possible to obtain a film having excellent adhesion to a substrate, appropriate adhesion to a resin substrate, and appropriate peelability with good reproducibility.

본 발명에서는, 전술한 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물과 함께, 그것 이외의 테트라카복실산 이무수물을 사용할 수 있다. In the present invention, tetracarboxylic dianhydrides other than those described above can be used together with the aromatic tetracarboxylic dianhydride containing at least one of the ester bond and ether bond.

이러한 테트라카복실산 이무수물은 지방족 테트라카복실산 이무수물, 방향족 테트라카복실산 이무수물의 어떤 것이어도 되지만, 얻어지는 박막의 강도와 내열성을 확보하는 관점에서, 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 바람직하다. Such tetracarboxylic dianhydride may be an aliphatic tetracarboxylic dianhydride or an aromatic tetracarboxylic dianhydride, but from the viewpoint of ensuring the strength and heat resistance of the obtained thin film, an aromatic tetracarboxylic dianhydride containing neither ester bond nor ether bond this is preferable

그 구체예로서는 피로멜리트산 이무수물, 벤젠-1,2,3,4-테트라카복실산 이무수물, 나프탈렌-1,2,3,4-테트라카복실산 이무수물, 나프탈렌-1,2,5,6-테트라카복실산 이무수물, 나프탈렌-1,2,6,7-테트라카복실산 이무수물, 나프탈렌-1,2,7,8-테트라카복실산 이무수물, 나프탈렌-2,3,5,6-테트라카복실산 이무수물, 나프탈렌-2,3,6,7-테트라카복실산 이무수물, 나프탈렌-1,4,5,8-테트라카복실산 이무수물, 바이페닐-2,2',3,3'-테트라카복실산 이무수물, 바이페닐-2,3,3',4'-테트라카복실산 이무수물, 바이페닐-3,3',4,4'-테트라카복실산 이무수물, 안트라센-1,2,3,4-테트라카복실산 이무수물, 안트라센-1,2,5,6-테트라카복실산 이무수물, 안트라센-1,2,6,7-테트라카복실산 이무수물, 안트라센-1,2,7,8-테트라카복실산 이무수물, 안트라센-2,3,6,7-테트라카복실산 이무수물, 펜안트렌-1,2,3,4-테트라카복실산 이무수물, 펜안트렌-1,2,5,6-테트라카복실산 이무수물, 펜안트렌-1,2,6,7-테트라카복실산 이무수물, 펜안트렌-1,2,7,8-테트라카복실산 이무수물, 펜안트렌-1,2,9,10-테트라카복실산 이무수물, 펜안트렌-2,3,5,6-테트라카복실산 이무수물, 펜안트렌-2,3,6,7-테트라카복실산 이무수물, 펜안트렌-2,3,9,10-테트라카복실산 이무수물, 펜안트렌-3,4,5,6-테트라카복실산 이무수물, 펜안트렌-3,4,9,10-테트라카복실산 이무수물 등을 들 수 있지만, 이것들에 한정되지 않는다. 이것들은 1종 단독이어도, 2종 이상을 조합하여 사용할 수도 있다. Specific examples thereof include pyromellitic acid dianhydride, benzene-1,2,3,4-tetracarboxylic acid dianhydride, naphthalene-1,2,3,4-tetracarboxylic acid dianhydride, and naphthalene-1,2,5,6-tetracarboxylic acid dianhydride. Carboxylic dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene-2,3,5,6-tetracarboxylic dianhydride, naphthalene -2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl-2,2',3,3'-tetracarboxylic dianhydride, biphenyl- 2,3,3',4'-tetracarboxylic dianhydride, biphenyl-3,3',4,4'-tetracarboxylic dianhydride, anthracene-1,2,3,4-tetracarboxylic dianhydride, anthracene- 1,2,5,6-tetracarboxylic dianhydride, anthracene-1,2,6,7-tetracarboxylic dianhydride, anthracene-1,2,7,8-tetracarboxylic dianhydride, anthracene-2,3,6 ,7-tetracarboxylic dianhydride, phenanthrene-1,2,3,4-tetracarboxylic dianhydride, phenanthrene-1,2,5,6-tetracarboxylic dianhydride, phenanthrene-1,2,6,7 -Tetracarboxylic dianhydride, phenanthrene-1,2,7,8-tetracarboxylic dianhydride, phenanthrene-1,2,9,10-tetracarboxylic dianhydride, phenanthrene-2,3,5,6-tetra Carboxylic dianhydride, phenanthrene-2,3,6,7-tetracarboxylic dianhydride, phenanthrene-2,3,9,10-tetracarboxylic dianhydride, phenanthrene-3,4,5,6-tetracarboxylic dianhydride Although water, phenanthrene- 3,4,9,10-tetracarboxylic dianhydride, etc. are mentioned, it is not limited to these. These can also be used individually by 1 type or in combination of 2 or more types.

특히, 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물로서는, 내열성을 확보하는 관점에서, 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종이 바람직하고, 식 (C1) 및 식 (C9)로 이루어지는 군으로부터 선택되는 적어도 1종이 보다 바람직하다. In particular, as the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond, at least one selected from the group consisting of formulas (C1) to (C12) is preferable from the viewpoint of ensuring heat resistance, and the formula (C1 ) and at least one selected from the group consisting of formula (C9) is more preferred.

Figure 112017084678511-pct00019
Figure 112017084678511-pct00019

본 발명에 있어서, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물과 함께, 그것 이외의 테트라카복실산 이무수물을 사용하는 경우, 에스터 결합 및 에터 결합의 적어도 일방을 포함하는 방향족 테트라카복실산 이무수물의 사용량은 전체 테트라카복실산 이무수물 중, 바람직하게는 70몰% 이상, 보다 바람직하게는 80몰% 이상, 더한층 바람직하게는 90몰% 이상, 더욱 바람직하게는 95몰% 이상이다. 이러한 사용량을 채용함으로써 기체와의 충분한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 막을 재현성 좋게 얻을 수 있다. In the present invention, when an aromatic tetracarboxylic acid dianhydride containing at least one of an ester bond and an ether bond is used together with a tetracarboxylic acid dianhydride other than that, an aromatic tetracarboxylic acid containing at least one of an ester bond and an ether bond The amount of dianhydride used is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, still more preferably 95 mol% or more, based on the total tetracarboxylic acid dianhydride. By employing such an amount, it is possible to obtain a film having sufficient adhesion to a substrate, appropriate adhesion to a resin substrate, and appropriate peelability with good reproducibility.

이상에서 설명한 다이아민과 테트라카복실산 이무수물을 반응시킴으로써 본 발명에 따른 박리층 형성용 조성물에 포함되는 폴리아믹산을 얻을 수 있다. The polyamic acid included in the composition for forming a release layer according to the present invention can be obtained by reacting the above-described diamine with tetracarboxylic dianhydride.

이러한 반응에 사용하는 유기 용매는 반응에 악영향을 미치지 않는 한 특별히 한정되지 않지만, 그 구체예로서는 m-크레졸, 2-파이롤리돈, N-메틸-2-파이롤리돈, N-에틸-2-파이롤리돈, N-바이닐-2-파이롤리돈, N,N-다이메틸아세트아마이드, N,N-다이메틸폼아마이드, 3-메톡시-N,N-다이메틸프로필아마이드, 3-에톡시-N,N-다이메틸프로필아마이드, 3-프로폭시-N,N-다이메틸프로필아마이드, 3-아이소프로폭시-N,N-다이메틸프로필아마이드, 3-뷰톡시-N,N-다이메틸프로필아마이드, 3-sec-뷰톡시-N,N-다이메틸프로필아마이드, 3-tert-뷰톡시-N,N-다이메틸프로필아마이드, γ-뷰티로락톤 등을 들 수 있다. 또한, 유기 용매는 1종 단독으로 또는 2종 이상을 조합하여 사용해도 된다. The organic solvent used in this reaction is not particularly limited as long as it does not adversely affect the reaction. Specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, and N-ethyl-2-pi. Rolidone, N-vinyl-2-pyrrolidone, N,N-dimethylacetamide, N,N-dimethylformamide, 3-methoxy-N,N-dimethylpropylamide, 3-ethoxy- N,N-dimethylpropylamide, 3-propoxy-N,N-dimethylpropylamide, 3-isopropoxy-N,N-dimethylpropylamide, 3-butoxy-N,N-dimethylpropyl amide, 3-sec-butoxy-N,N-dimethylpropylamide, 3-tert-butoxy-N,N-dimethylpropylamide, γ-butyrolactone, and the like. In addition, you may use an organic solvent individually by 1 type or in combination of 2 or more types.

특히, 반응에 사용하는 유기 용매는 다이아민 및 테트라카복실산 이무수물 및 폴리아믹산을 잘 용해하므로, 식 (S1)로 표시되는 아마이드류, (S2)로 표시되는 아마이드류 및 식 (S3)으로 표시되는 아마이드류로부터 선택되는 적어도 1종이 바람직하다. In particular, since the organic solvent used for the reaction dissolves diamine, tetracarboxylic dianhydride, and polyamic acid well, amides represented by formula (S1), amides represented by (S2), and formula (S3) At least one selected from amides is preferred.

Figure 112017084678511-pct00020
Figure 112017084678511-pct00020

식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타내지만, 바람직하게는 1∼3, 보다 바람직하게는 1 또는 2이다. In formula, R <1> and R <2> represent a C1-C10 alkyl group mutually independently. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number, and is preferably 1 to 3, more preferably 1 or 2.

탄소수 1∼10의 알킬기로서는 메틸기, 에틸기, n-프로필기, 아이소프로필기, n-뷰틸기, 아이소뷰틸기, s-뷰틸기, t-뷰틸기, n-펜틸기, n-헥실기, n-헵틸기, n-옥틸기, n-노닐기, n-데실기 등을 들 수 있다. 이들 중, 탄소수 1∼3의 알킬기가 바람직하고, 탄소수 1 또는 2의 알킬기가 보다 바람직하다. As the C1-C10 alkyl group, methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n - A heptyl group, n-octyl group, n-nonyl group, n-decyl group, etc. are mentioned. Among these, an alkyl group having 1 to 3 carbon atoms is preferable, and an alkyl group having 1 or 2 carbon atoms is more preferable.

반응온도는 사용하는 용매의 융점으로부터 비점까지의 범위에서 적당히 설정 하면 되고, 통상 0∼100℃ 정도이지만, 얻어지는 폴리아믹산의 용액 중에서의 이미드화를 막아 폴리아믹산 단위의 고함유량을 유지하기 위해서는, 바람직하게는 0∼70℃ 정도이고, 보다 바람직하게는 0∼60℃ 정도이며, 더한층 바람직하게는 0∼50℃ 정도이다. The reaction temperature may be appropriately set in the range from the melting point to the boiling point of the solvent to be used, and is usually about 0 to 100 ° C. It is preferably about 0 to 70°C, more preferably about 0 to 60°C, and still more preferably about 0 to 50°C.

반응시간은, 반응온도나 원료 물질의 반응성에 의존하기 때문에 일률적으로 규정할 수 없지만, 통상 1∼100시간 정도이다. Although the reaction time cannot be uniformly defined because it depends on the reaction temperature or the reactivity of the raw materials, it is usually about 1 to 100 hours.

이상에서 설명한 방법에 의해, 목적으로 하는 폴리아믹산을 포함하는 반응 용액을 얻을 수 있다. By the method described above, a reaction solution containing the target polyamic acid can be obtained.

상기 폴리아믹산의 중량평균 분자량은 5,000∼1,000,000이 바람직하고, 10,000∼500,000이 보다 바람직하고, 핸들링성의 관점에서 15,000∼200,000이 더한층 바람직하다. 또한, 본 발명에서 중량평균 분자량은 겔 퍼미에이션 크로마토그래피(GPC) 분석에 의한 표준 폴리스타이렌 환산으로 얻어지는 평균 분자량이다. The weight average molecular weight of the polyamic acid is preferably 5,000 to 1,000,000, more preferably 10,000 to 500,000, and even more preferably 15,000 to 200,000 from the viewpoint of handleability. In the present invention, the weight average molecular weight is the average molecular weight obtained in terms of standard polystyrene by gel permeation chromatography (GPC) analysis.

본 발명에서는, 통상, 상기 반응 용액을 여과한 후, 그 여과액을 그대로, 또는 희석 혹은 농축하여 얻어지는 용액을 본 발명의 박리층 형성용 조성물로서 사용할 수 있다. 이렇게 함으로써 얻어지는 박리층의 밀착성, 박리성 등의 악화의 원인이 될 수 있는 불순물의 혼입을 저감할 수 있을 뿐만 아니라, 효율적으로 박리층 형성용 조성물을 얻을 수 있다. 또한 상기 반응 용액으로부터 폴리아믹산을 단리한 후, 다시 용매에 용해하여 박리층 형성용 조성물로 해도 된다. 이 경우의 용매로서는 전술한 반응에 사용하는 유기 용매 등을 들 수 있다. In the present invention, usually, after filtering the reaction solution, the filtrate as it is or a solution obtained by diluting or concentrating can be used as the composition for forming a release layer of the present invention. In this way, it is possible to reduce contamination of impurities that may cause deterioration of adhesiveness, peelability, etc. of the obtained peeling layer, and also to obtain a composition for forming a peeling layer efficiently. Alternatively, after isolating the polyamic acid from the reaction solution, it may be dissolved in a solvent again to obtain a composition for forming a release layer. As a solvent in this case, the organic solvent used for the reaction mentioned above, etc. are mentioned.

희석에 사용하는 용매는 특별히 한정되지 않고, 그 구체예로서는 상기 반응의 반응용매의 구체예와 동일한 것을 들 수 있다. 희석에 사용하는 용매는 1종 단독으로 또는 2종 이상을 조합하여 사용해도 된다. 그 중에서도, 폴리아믹산을 잘 용해하므로, N,N-다이메틸폼아마이드, N,N-다이메틸아세트아마이드, N-메틸-2-파이롤리돈, 1,3-다이메틸-2-이미다졸리딘온, N-에틸-2-파이롤리돈, γ-뷰티로락톤이 바람직하고, N-메틸-2-파이롤리돈이 보다 바람직하다. The solvent used for dilution is not particularly limited, and specific examples thereof include the same as the specific examples of the reaction solvent in the above reaction. You may use the solvent used for dilution individually by 1 type or in combination of 2 or more types. Among them, since polyamic acid is easily dissolved, N,N-dimethylformamide, N,N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazoli Dinone, N-ethyl-2-pyrrolidone, and γ-butyrolactone are preferred, and N-methyl-2-pyrrolidone is more preferred.

또한 단독으로는 폴리아믹산을 용해하지 않는 용매이어도, 폴리아믹산이 석출되지 않는 범위이면, 본 발명의 박리층 형성용 조성물에 혼합할 수 있다. 특히, 에틸셀로솔브, 뷰틸셀로솔브, 에틸카비톨, 뷰틸카비톨, 에틸카비톨아세테이트, 에틸렌글라이콜, 1-메톡시-2-프로판올, 1-에톡시-2-프로판올, 1-뷰톡시-2-프로판올, 1-펜옥시-2-프로판올, 프로필렌글라이콜모노아세테이트, 프로필렌글라이콜다이아세테이트, 프로필렌글라이콜-1-모노메틸에터-2-아세테이트, 프로필렌글라이콜-1-모노에틸에터-2-아세테이트, 다이프로필렌글라이콜, 2-(2-에톡시프로폭시)프로판올, 락트산 메틸, 락트산 에틸, 락트산 n-프로필, 락트산 n-뷰틸, 락트산 아이소아밀 등의 저표면장력을 갖는 용매를 적절하게 혼재시킬 수 있다. 이것에 의해, 기판에의 도포시에 도포막 균일성이 향상되는 것이 알려져 있고, 본 발명의 박리층 형성용 조성물에서도 적합하게 사용된다. In addition, even if it is a solvent that does not dissolve polyamic acid alone, it can be mixed into the composition for forming a release layer of the present invention as long as the polyamic acid does not precipitate. In particular, ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate, ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1- Butoxy-2-propanol, 1-phenoxy-2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol -1-monoethyl ether-2-acetate, dipropylene glycol, 2-(2-ethoxypropoxy)propanol, methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate, isoamyl lactate, etc. A solvent having a low surface tension of may be appropriately mixed. It is known that this improves the uniformity of the coating film at the time of application to the substrate, and is also suitably used in the composition for forming a release layer of the present invention.

본 발명의 박리층 형성용 조성물에 있어서의 폴리아믹산의 농도는 제작하는 박리층의 두께, 조성물의 점도 등을 감안하여 적당히 설정하는 것이지만, 통상 1∼30질량% 정도, 바람직하게는 1∼20질량% 정도이다. 이러한 농도로 함으로써 0.05∼5㎛ 정도의 두께의 박리층을 재현성 좋게 얻을 수 있다. 또한, 폴리아믹산의 농도는 폴리아믹산의 원료인 다이아민과 테트라카복실산 이무수물의 사용량을 조정하거나, 상기 반응 용액을 여과한 후 그 여과액을 희석 또는 농축하거나, 단리한 폴리아믹산을 용매에 용해시킬 때에 그 양을 조정하는 등 하여 조정할 수 있다. The concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30% by mass, preferably 1 to 20% by mass. is about % With such a concentration, a peeling layer having a thickness of about 0.05 to 5 μm can be obtained with good reproducibility. In addition, the concentration of polyamic acid is adjusted when the amount of diamine and tetracarboxylic dianhydride used as raw materials of polyamic acid is adjusted, the reaction solution is filtered and the filtrate is diluted or concentrated, or the isolated polyamic acid is dissolved in a solvent. It can be adjusted by, for example, adjusting the amount.

또한 박리층 형성용 조성물의 점도는 제작하는 박리층의 두께 등을 감안하여 적당히 설정하는 것이지만, 특히 0.05∼5㎛ 정도의 두께의 막을 재현성 좋게 얻는 것을 목적으로 하는 경우, 통상, 25℃에서 10∼10,000mPa·s 정도, 바람직하게는 20∼5,000mPa·s 정도이다. 여기에서, 점도는 시판의 액체의 점도측정용 점도계를 사용하고, 예를 들면, JIS K7117-2에 기재된 수순을 참조하여, 조성물의 온도 25℃의 조건으로 측정할 수 있다. 바람직하게는 점도계로서는 원추 평판형(콘 플레이트형) 회전 점도계를 사용하고, 바람직하게는 동형의 점도계에서 표준 콘 로터로서 1°34'×R24를 사용하여, 조성물의 온도 25℃의 조건으로 측정할 수 있다. 이러한 회전점도계로서는, 예를 들면, 토키산교(주)제 TVE- 25L을 들 수 있다. In addition, the viscosity of the composition for forming a release layer is appropriately set in consideration of the thickness of the release layer to be manufactured, etc., but in the case of obtaining a film having a thickness of about 0.05 to 5 µm with good reproducibility, it is usually 10 to 10 at 25°C. It is about 10,000 mPa·s, preferably about 20 to 5,000 mPa·s. Here, the viscosity can be measured using a commercially available viscometer for measuring the viscosity of liquids, for example, by referring to the procedure described in JIS K7117-2, under conditions of a composition temperature of 25°C. Preferably, a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and preferably, 1° 34'×R24 is used as a standard cone rotor in the same type of viscometer to measure the composition under the condition of a temperature of 25°C. can An example of such a rotational viscometer is Toki Sangyo Co., Ltd. TVE-25L.

또한, 본 발명에 따른 박리층 형성용 조성물은 폴리아믹산과 유기 용매 이외에, 예를 들면, 막 강도를 향상시키기 위해, 가교제 등의 성분을 포함해도 된다. In addition to the polyamic acid and the organic solvent, the composition for forming a release layer according to the present invention may also contain components such as a crosslinking agent in order to improve film strength, for example.

이상에서 설명한 본 발명의 박리층 형성 조성물을 기체에 도포하고, 얻어진 도포막을 가열하여 폴리아믹산을 열 이미드화 함으로써, 기체와의 우수한 밀착성, 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는 폴리이미드막으로 이루어지는 박리층을 얻을 수 있다. A polyimide having excellent adhesion to a substrate, appropriate adhesion to a resin substrate, and appropriate peelability by applying the release layer-forming composition of the present invention described above to a substrate and heating the obtained coating film to thermally imidize the polyamic acid. A peeling layer made of a film can be obtained.

본 발명의 박리층을 기체 위에 형성하는 경우, 박리층은 기체의 일부 표면에 형성되어 있어도 되고, 전체면에 형성되어 있어도 된다. 기체의 일부 표면에 박리층을 형성하는 태양으로서는 기체 표면 중 소정의 범위에만 박리층을 형성하는 태양, 기체 표면 전체면에 도트 패턴, 라인 앤드 스페이스 패턴 등의 패턴 형상으로 박리층을 형성하는 태양 등이 있다. 또한, 본 발명에 있어서, 기체란 그 표면에 본 발명에 따른 박리층 형성용 조성물이 도포되는 것이며, 플랙시블 전자 디바이스 등의 제조에 사용되는 것을 의미한다. When the release layer of the present invention is formed on the substrate, the release layer may be formed on a part of the surface of the substrate or may be formed on the entire surface of the substrate. As an aspect of forming a release layer on a part of the surface of the substrate, an aspect of forming the release layer only in a predetermined range of the surface of the substrate, an aspect of forming the release layer in a pattern shape such as a dot pattern or a line and space pattern on the entire surface of the substrate, etc. there is Further, in the present invention, the substrate means that the composition for forming a release layer according to the present invention is applied to the surface thereof, and is used for manufacturing flexible electronic devices and the like.

기체(기재)로서는, 예를 들면, 유리, 플라스틱(폴리카보네이트, 폴리메타크릴레이트, 폴리스타이렌, 폴리에스터, 폴리올레핀, 에폭시, 멜라민, 트라이아세틸셀룰로오스, ABS, AS, 노보넨계 수지 등), 금속(실리콘 웨이퍼 등), 목재, 종이, 슬레이트 등을 들 수 있지만, 특히, 본 발명에 따른 박리층 형성용 조성물로부터 얻어지는 박리층이 그것에 대한 충분한 밀착성을 갖는 점에서, 유리가 바람직하다. 또한, 기체 표면은 단일의 재료로 구성되어 있어도 되고, 2 이상의 재료로 구성되어 있어도 된다. 2 이상의 재료로 기체 표면이 구성되는 태양으로서는 기체 표면 중, 어떤 범위는 어떤 재료로 구성되고, 그 나머지 표면은 그 밖의 재료로 구성되어 있는 태양, 기체 표면 전체에 도트 패턴, 라인 앤드 스페이스 패턴 등의 패턴 형상으로 어떤 재료가 그 밖의 재료 중에 존재하는 태양 등이 있다. As the substrate (substrate), for example, glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetyl cellulose, ABS, AS, norbornene-based resin, etc.), metal (silicone) wafers, etc.), wood, paper, slate, etc., but glass is particularly preferable since the release layer obtained from the composition for forming a release layer according to the present invention has sufficient adhesion thereto. In addition, the substrate surface may be composed of a single material or may be composed of two or more materials. As an aspect in which the surface of the aircraft is composed of two or more materials, a certain range of the aircraft surface is composed of a certain material and the remaining surface is composed of other materials, a dot pattern, line and space pattern, etc. There is a mode in which a certain material exists among other materials in the form of a pattern.

도포하는 방법은 특별히 한정되지 않지만, 예를 들면, 캐스트 코팅법, 스핀 코팅법, 블레이드 코팅법, 딥 코팅법, 롤 코팅법, 바 코팅법, 다이 코팅법, 잉크젯법, 인쇄법(철판, 요판, 평판, 스크린 인쇄 등) 등을 들 수 있다. The method of application is not particularly limited, but examples thereof include cast coating, spin coating, blade coating, dip coating, roll coating, bar coating, die coating, inkjet, and printing methods (iron plate, intaglio , flat plate, screen printing, etc.).

이미드화하기 위한 가열온도는 통상 50∼550℃의 범위 내에서 적당히 결정되지만, 바람직하게는 200℃ 이상, 또한 바람직하게는 500℃ 이하이다. 가열온도를 이와 같이 함으로써 얻어지는 막의 취약화를 막으면서, 이미드화 반응을 충분히 진행시키는 것이 가능하게 된다. 가열시간은 가열온도에 따라 상이하기 때문에 일률적으로 규정할 수 없지만, 통상 5분∼5시간이다. 또한 이미드화율은 50∼100%의 범위이면 된다. The heating temperature for imidation is usually appropriately determined within the range of 50 to 550°C, but is preferably 200°C or higher and more preferably 500°C or lower. By setting the heating temperature in this way, it becomes possible to sufficiently advance the imidation reaction while preventing embrittlement of the resulting film. Since the heating time differs depending on the heating temperature, it cannot be uniformly defined, but it is usually 5 minutes to 5 hours. In addition, the imidation ratio may be in the range of 50 to 100%.

본 발명에 있어서의 가열 태양의 바람직한 일례로서는 50∼100℃로 5분간∼2시간 가열한 후에, 그대로 단계적으로 가열온도를 상승시키고 최종적으로 375℃ 초과∼450℃로 30분∼4시간 가열하는 수법을 들 수 있다. 특히, 50∼100℃로 5분간∼2시간 가열한 후에, 100℃ 초과∼375℃로 5분간∼2시간, 최후에 375℃ 초과∼450℃로 30분∼4시간 가열하는 것이 바람직하다. A preferable example of the heating mode in the present invention is a method of heating at 50 to 100°C for 5 minutes to 2 hours, then raising the heating temperature step by step as it is, and finally heating at over 375°C to 450°C for 30 minutes to 4 hours. can be heard In particular, after heating at 50 to 100°C for 5 minutes to 2 hours, it is preferable to heat at more than 100°C to 375°C for 5 minutes to 2 hours, and finally to be heated at more than 375°C to 450°C for 30 minutes to 4 hours.

가열에 사용하는 기구로서는, 예를 들면, 핫플레이트, 오븐 등을 들 수 있다. 가열 분위기는 공기하이어도 불활성 가스하이어도 되고, 또한 상압하이어도 감압하이어도 된다. As a mechanism used for heating, a hot plate, an oven, etc. are mentioned, for example. The heating atmosphere may be air or inert gas, and may be under normal pressure or reduced pressure.

박리층의 두께는 통상 0.01∼50㎛ 정도, 생산성의 관점에서, 바람직하게는 0.05∼20㎛ 정도, 보다 바람직하게는 0.05∼5㎛ 정도이며, 가열 전의 도포막의 두께를 조정하여 원하는 두께를 실현한다. The thickness of the release layer is usually about 0.01 to 50 μm, and from the viewpoint of productivity, it is preferably about 0.05 to 20 μm, more preferably about 0.05 to 5 μm, and the thickness of the coating film before heating is adjusted to achieve a desired thickness. .

이상에서 설명한 박리층은 기체, 특히 유리의 기체와의 우수한 밀착성 및 수지 기판과의 적당한 밀착성과 적당한 박리성을 갖는다. 그 때문에, 본 발명에 따른 박리층은, 플랙시블 전자 디바이스의 제조 프로세스에 있어서, 당해 디바이스의 수지 기판에 손상을 주지 않고, 당해 수지 기판을, 그 수지 기판 위에 형성된 회로 등과 함께, 기체로부터 박리시키기 위해 적합하게 사용할 수 있다. The peeling layer described above has excellent adhesion to a substrate, particularly a substrate of glass, and appropriate adhesion and appropriate peelability to a resin substrate. Therefore, in the manufacturing process of a flexible electronic device, the peeling layer according to the present invention is capable of separating the resin substrate from the substrate together with the circuit or the like formed on the resin substrate without damaging the resin substrate of the device. can be used appropriately for

이하, 본 발명의 박리층을 사용한 플랙시블 전자 디바이스의 제조 방법의 일례에 대하여 설명한다. Hereinafter, an example of a method for manufacturing a flexible electronic device using the release layer of the present invention will be described.

본 발명에 따른 박리층 형성용 조성물을 사용하여, 전술의 방법에 의해, 유리 기체 위에 박리층을 형성한다. 이 박리층의 위에, 수지 기판을 형성하기 위한 수지 용액을 도포하고, 이 도포막을 가열함으로써 본 발명에 따른 박리층을 통하여, 유리 기체에 고정된 수지 기판을 형성한다. 이때, 박리층을 모두 덮도록 하여, 박리층의 면적과 비교하여 큰 면적으로, 수지 기판을 형성한다. 상기 수지 기판으로서는 플랙시블 전자 디바이스의 수지 기판으로서 대표적인 폴리이미드로 이루어지는 수지 기판 등을 들 수 있고, 그것을 형성하기 위한 수지 용액으로서는 폴리이미드 용액이나 폴리아믹산 용액을 들 수 있다. 당해 수지 기판의 형성 방법은 상법에 따르면 된다. Using the composition for forming a release layer according to the present invention, a release layer is formed on a glass substrate by the method described above. On this peeling layer, a resin solution for forming a resin substrate is applied, and the coated film is heated to form a resin substrate fixed to the glass substrate through the peeling layer according to the present invention. At this time, the resin substrate is formed with an area larger than that of the release layer so as to cover the entire release layer. Examples of the resin substrate include a resin substrate made of polyimide, which is representative of a resin substrate for flexible electronic devices, and a polyimide solution and a polyamic acid solution as a resin solution for forming it. The method for forming the resin substrate may be in accordance with a conventional method.

다음에 본 발명에 따른 박리층을 통하여 기체에 고정된 당해 수지 기판의 위에, 원하는 회로를 형성하고, 그 후, 예를 들면, 박리층을 따라 수지 기판을 자르고, 이 회로와 함께 수지 기판을 박리층으로부터 박리하여, 수지 기판과 기체를 분리한다. 이때, 기체의 일부를 박리층과 함께 잘라도 된다. Next, a desired circuit is formed on the resin substrate fixed to the substrate through the release layer according to the present invention, and then, for example, the resin substrate is cut along the release layer, and the resin substrate is separated along with the circuit. By peeling from the layer, the resin substrate and the gas are separated. At this time, a part of the substrate may be cut together with the release layer.

한편, 플랙시블 디스플레이의 제조에 있어서, 지금까지 고휘도 LED나 삼차원 반도체 패키지 등의 제조에서 사용되어 온 레이저 리프크 오프법(LLO법)을 사용하여 유리 캐리어로부터 폴리머 기판을 적합하게 박리할 수 있는 것이 보고되어 있다(일본 특개 2013-147599호 공보). 플랙시블 디스플레이의 제조에서는 유리 캐리어 위에 폴리이미드 등으로 이루어지는 폴리머 기판을 설치하고, 다음에 그 기판 위에 전극 등을 포함하는 회로 등을 형성하고, 최종적으로 이 회로 등과 함께 기판을 유리 캐리어로부터 박리할 필요가 있다. 이 박리 공정에서 LLO법을 채용하고, 즉, 회로 등이 형성된 면과는 반대의 면으로부터, 파장 308nm의 광선을 유리 캐리어에 조사하면, 당해 파장의 광선이 유리 캐리어를 투과하고, 유리 캐리어 근방의 폴리머(폴리이미드)만이 이 광선을 흡수하여 증발(승화)한다. 그 결과, 디스플레이의 성능을 결정짓게 되는, 기판 위에 설치된 회로 등에 영향을 주지 않아, 유리 캐리어로부터의 기판의 박리를 선택적으로 실행 가능하다고 보고되어 있다. On the other hand, in the manufacture of flexible displays, it is possible to suitably peel the polymer substrate from the glass carrier using the laser lift-off method (LLO method), which has been used in the manufacture of high-brightness LEDs, three-dimensional semiconductor packages, etc. so far. It has been reported (Japanese Patent Laid-Open No. 2013-147599). In manufacturing a flexible display, it is necessary to place a polymer substrate made of polyimide or the like on a glass carrier, then form a circuit or the like including electrodes or the like on the substrate, and finally peel the substrate together with the circuit or the like from the glass carrier. there is In this peeling step, the LLO method is employed, that is, when a light ray with a wavelength of 308 nm is irradiated to the glass carrier from the surface opposite to the surface on which the circuit or the like is formed, the light ray of the wavelength permeates the glass carrier, and the light in the vicinity of the glass carrier is irradiated. Only the polymer (polyimide) absorbs this light and evaporates (sublimes). As a result, it is reported that the separation of the substrate from the glass carrier can be performed selectively without affecting the circuit installed on the substrate, which determines the performance of the display.

본 발명에 따른 박리층을 통하여 기체에 고정된 당해 수지 기판 위에, 원하는 회로를 형성하고, 그 후, LLO법을 채용하면, 이 박리층만이 이 광선을 흡수하여 증발(승화)한다. 즉, 이 박리층이 희생이 되어(희생층으로서 작용함), 유리 캐리어로부터의 기판의 박리를 선택적으로 실행 가능하게 된다. 본 발명의 박리층 형성용 조성물은 LLO법의 적용이 가능하게 되는 특정 파장(예를 들면, 308nm)의 광선을 충분히 흡수한다고 하는 특징을 가지기 때문에, LLO법의 희생층으로서 사용할 수 있다. When a desired circuit is formed on the resin substrate fixed to the base body via the release layer according to the present invention, and then the LLO method is employed, only this release layer absorbs this light beam and evaporates (sublimes). That is, this peeling layer is sacrificed (acting as a sacrificial layer), so that the peeling of the substrate from the glass carrier can be selectively performed. Since the composition for forming a release layer of the present invention has a characteristic of sufficiently absorbing light rays of a specific wavelength (for example, 308 nm) to which the LLO method can be applied, it can be used as a sacrificial layer for the LLO method.

실시예Example

이하, 합성예, 비교합성예, 실시예 및 비교예를 들어 본 발명을 더욱 상세하게 설명하지만, 본 발명은 이들 실시예에 한정되지 않는다. 또한, 하기 예에서 사용한 화합물의 약칭 및 수평균 분자량 및 중량평균 분자량의 측정 방법은 이하와 같다. Hereinafter, the present invention will be described in more detail by way of synthesis examples, comparative synthesis examples, examples and comparative examples, but the present invention is not limited to these examples. In addition, the abbreviation of the compound used in the following examples and the method of measuring the number average molecular weight and weight average molecular weight are as follows.

<화합물의 약칭><abbreviation of compound>

p-PDA: p-페닐렌다이아민p-PDA: p-phenylenediamine

m-PDA: m-페닐렌다이아민m-PDA: m-phenylenediamine

DATP: 4,4'''-다이아미노-p-터페닐DATP: 4,4'''-diamino-p-terphenyl

DBA: 3,5-다이아미노벤조산DBA: 3,5-diaminobenzoic acid

HAB: 3,3'-다이하이드록시벤지딘HAB: 3,3'-dihydroxybenzidine

DDE: 4,4'-옥시다이아닐린DDE: 4,4'-oxydianiline

BAPB: 4,4'-비스(4-아미노펜옥시)바이페닐BAPB: 4,4'-bis(4-aminophenoxy)biphenyl

FAPB: 4,4'-비스(4-아미노-2-트라이플루오로메틸펜옥시)바이페닐FAPB: 4,4'-bis(4-amino-2-trifluoromethylphenoxy)biphenyl

APAB: 5-아미노-2-(4-아미노페닐)-1H-벤조이미다졸APAB: 5-amino-2-(4-aminophenyl)-1H-benzoimidazole

APAB-E: 4-아미노페닐-4'-아미노벤조에이트APAB-E: 4-aminophenyl-4'-aminobenzoate

6FAP: 2,2-비스(3-아미노-4-하이드록시페닐)헥사플루오로프로페인6FAP: 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane

TFMB: 2,2'-비스(트라이플루오로메틸)바이페닐-4,4'-다이아민TFMB: 2,2'-bis(trifluoromethyl)biphenyl-4,4'-diamine

BPDA: 3,3',4,4'-바이페닐테트라카복실산 이무수물BPDA: 3,3',4,4'-biphenyltetracarboxylic dianhydride

TAHQ: p-페닐렌비스(트라이멜리트산 모노에스터산 무수물)TAHQ: p-phenylenebis(trimellitic acid monoester acid anhydride)

PMDA: 피로멜리트산 이무수물PMDA: pyromellitic dianhydride

BPTME: p-바이페닐렌비스(트라이멜리트산 모노에스터산 무수물)BPTME: p-biphenylenebis(trimellitic acid monoester acid anhydride)

BPODA: 4,4'-(바이페닐-4,4'-바이일비스옥시)비스프탈산 이무수물BPODA: 4,4'-(biphenyl-4,4'-biylbisoxy)bisphthalic dianhydride

CF3-BP-TMA: N,N'-[2,2'-비스(트라이플루오로메틸)바이페닐-4,4'-다이일]비스(1,3-다이옥소-1,3-다이하이드로아이소벤조퓨란-5-카보아마이드)CF3-BP-TMA: N,N'-[2,2'-bis(trifluoromethyl)biphenyl-4,4'-diyl]bis(1,3-dioxo-1,3-dihydro isobenzofuran-5-carboamide)

6FDA: 4,4'-(헥사플루오로아이소프로필리덴)다이프탈산 무수물6FDA: 4,4'-(hexafluoroisopropylidene)diphthalic anhydride

CBDA: 1,2,3,4-사이클로뷰테인테트라카복실산 이무수물CBDA: 1,2,3,4-Cyclobutanetetracarboxylic dianhydride

IPBBT: N,N'-아이소프탈비스(벤조옥사졸린-2-싸이온)IPBBT: N,N'-isophthalbis (benzooxazoline-2-thione)

NMP: N-메틸-2-파이롤리돈NMP: N-methyl-2-pyrrolidone

BCS: 뷰틸셀로솔브BCS: butyl cellosolve

<중량평균 분자량 및 분자량 분포의 측정><Measurement of weight average molecular weight and molecular weight distribution>

폴리머의 중량평균 분자량(Mw) 및 분자량 분포(Mw/Mn)의 측정은 니혼분코(주)제 GPC 장치(컬럼: 쇼와덴코(주)제 OHpak SB803-HQ 및 OHpak SB804-HQ; 용리액:다이메틸폼아마이드/LiBr·H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1질량%); 유량:1.0mL/분; 컬럼 온도:40℃; Mw:표준 폴리스타이렌 환산값)를 사용하여 행했다(이하의 실시예 및 비교예에 있어서, 동일). Measurement of the weight average molecular weight (Mw) and molecular weight distribution (Mw/Mn) of the polymer was performed using a GPC apparatus manufactured by Nippon Bunko Co., Ltd. (column: OHpak SB803-HQ and OHpak SB804-HQ manufactured by Showa Denko Co., Ltd.; eluent: dye Methylformamide/LiBr·H 2 O (29.6 mM)/H 3 PO 4 (29.6 mM)/THF (0.1% by mass); Flow rate: 1.0 mL/min; Column temperature: 40°C; Mw: Standard polystyrene equivalent value) It was carried out using (in the following examples and comparative examples, the same).

[1] 폴리머의 합성[1] Synthesis of polymers

이하의 방법에 의해, 폴리아믹산 및 폴리벤조옥사졸 전구체를 합성했다. A polyamic acid and a polybenzoxazole precursor were synthesized by the following method.

또한, 얻어진 폴리머 함유 반응액으로부터 폴리머를 단리하지 않고, 후술한 바와 같이, 반응 용액을 희석함으로써 수지 기판 형성용 조성물 또는 박리층 형성용 조성물을 조제했다. In addition, a composition for forming a resin substrate or a composition for forming a release layer was prepared by diluting the reaction solution as described later without isolating the polymer from the resulting polymer-containing reaction liquid.

[합성예 S1] 폴리아믹산 S1의 합성[Synthesis Example S1] Synthesis of polyamic acid S1

p-PDA 20.261g(187mmol) 및 DATP 12.206g(47mmol)을 NMP 617.4g에 용해시켰다. 얻어진 용액을 15℃로 냉각하고, 거기에 PMDA 50.112g(230mmol)을 가하고, 질소 분위기하, 50℃까지 승온하고, 48시간 반응시켜, 폴리아믹산 S1을 얻었다. 폴리아믹산 S1의 Mw는 82,100, Mw/Mn은 2.7이었다. 20.261 g (187 mmol) of p-PDA and 12.206 g (47 mmol) of DATP were dissolved in 617.4 g of NMP. The obtained solution was cooled to 15°C, PMDA 50.112g (230mmol) was added thereto, and the temperature was raised to 50°C under a nitrogen atmosphere, and it was made to react for 48 hours to obtain polyamic acid S1. Mw of polyamic acid S1 was 82,100, and Mw/Mn was 2.7.

[합성예 S2] 폴리아믹산 S2의 합성[Synthesis Example S2] Synthesis of polyamic acid S2

p-PDA 3.218g(30mmol)을 NMP 88.2g에 용해시켰다. 얻어진 용액에 BPDA 8.581g(29mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 S2를 얻었다. 폴리아믹산 S2의 Mw는 107,300, Mw/Mn은 4.6이었다. 3.218 g (30 mmol) of p-PDA was dissolved in 88.2 g of NMP. BPDA 8.581g (29mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid S2 was obtained. Mw of polyamic acid S2 was 107,300, and Mw/Mn was 4.6.

[합성예 S3] 폴리아믹산 S3의 합성[Synthesis Example S3] Synthesis of polyamic acid S3

TFMB 17.8g(56mmol), BAPB 0.4g(1mmol) 및 p-PDA 2.5g(23mmol)을 NMP 430g에 용해시켰다. 얻어진 용액에 6FDA 6.3g(14mmol) 및 CF3-BP-TMA 42.8g(64mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 S3을 얻었다. 폴리아믹산 S3의 Mw는 38,700, Mw/Mn은 2.1이었다. 17.8 g (56 mmol) of TFMB, 0.4 g (1 mmol) of BAPB and 2.5 g (23 mmol) of p-PDA were dissolved in 430 g of NMP. 6FDA 6.3g (14mmol) and CF3-BP-TMA 42.8g (64mmol) were added to the obtained solution, it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and polyamic acid S3 was obtained. Mw of polyamic acid S3 was 38,700, and Mw/Mn was 2.1.

[합성예 S4] 폴리아믹산 S4의 합성[Synthesis Example S4] Synthesis of polyamic acid S4

DDE 30.6g(153mmol)을 NMP 440g에 용해시켰다. 얻어진 용액에 CBDA 29.4g(150mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 S4를 얻었다. 폴리아믹산 S4의 Mw는 29,800, Mw/Mn은 2.2이었다. 30.6 g (153 mmol) of DDE was dissolved in 440 g of NMP. CBDA 29.4g (150mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid S4 was obtained. Mw of polyamic acid S4 was 29,800, and Mw/Mn was 2.2.

[합성예 L1] 폴리아믹산 L1의 합성[Synthesis Example L1] Synthesis of polyamic acid L1

p-PDA 2.054g(19mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 9.946g(19mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L1을 얻었다. 폴리아믹산 L1의 Mw는 57,500, Mw/Mn은 3.0이었다. 2.054 g (19 mmol) of p-PDA was dissolved in 88 g of NMP. BPTME 9.946g (19mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L1 was obtained. Mw of polyamic acid L1 was 57,500, and Mw/Mn was 3.0.

[합성예 L2] 폴리아믹산 L2의 합성[Synthesis Example L2] Synthesis of polyamic acid L2

p-PDA 1.836g(17mmol) 및 DBA 0.287g(1.9mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 9.878g(18mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L2를 얻었다. 폴리아믹산 L2의 Mw는 65,100, Mw/Mn은 3.0이었다. 1.836 g (17 mmol) of p-PDA and 0.287 g (1.9 mmol) of DBA were dissolved in 88 g of NMP. BPTME 9.878g (18mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L2 was obtained. Mw of polyamic acid L2 was 65,100, and Mw/Mn was 3.0.

[합성예 L3] 폴리아믹산 L3의 합성[Synthesis Example L3] Synthesis of polyamic acid L3

p-PDA 1.367g(13mmol) 및 HAB 1.172g(5.4mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 9.461g(18mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L3을 얻었다. 폴리아믹산 L3의 Mw는 43,600, Mw/Mn 2.6이었다. 1.367 g (13 mmol) of p-PDA and 1.172 g (5.4 mmol) of HAB were dissolved in 88 g of NMP. BPTME 9.461g (18mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L3 was obtained. Mw of polyamic acid L3 was 43,600 and Mw/Mn 2.6.

[합성예 L4] 폴리아믹산 L4의 합성[Synthesis Example L4] Synthesis of polyamic acid L4

DATP 3.984g(15mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 8.016g(15mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L4를 얻었다. 폴리아믹산 L4의 Mw는 42,600, Mw/Mn은 3.9이었다. 3.984 g (15 mmol) of DATP was dissolved in 88 g of NMP. BPTME 8.016g (15mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and the polyamic acid L4 was obtained. Mw of polyamic acid L4 was 42,600, and Mw/Mn was 3.9.

[합성예 L5] 폴리아믹산 L5의 합성[Synthesis Example L5] Synthesis of polyamic acid L5

BAPB 5.17g(14mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 6.83g(13mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L5를 얻었다. 폴리아믹산 L5의 Mw는 52,100, Mw/Mn은 2.7이었다. 5.17 g (14 mmol) of BAPB was dissolved in 88 g of NMP. BPTME 6.83g (13mmol) was added to the obtained solution, it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and the polyamic acid L5 was obtained. Mw of polyamic acid L5 was 52,100, and Mw/Mn was 2.7.

[합성예 L6] 폴리아믹산 L6의 합성[Synthesis Example L6] Synthesis of polyamic acid L6

FAPB 5.89g(12mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 6.11g(11mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L6을 얻었다. 폴리아믹산 L6의 Mw는 87,700, Mw/Mn은 3.3이었다. 5.89 g (12 mmol) of FAPB was dissolved in 88 g of NMP. BPTME 6.11g (11mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid L6 was obtained. Mw of polyamic acid L6 was 87,700, and Mw/Mn was 3.3.

[합성예 L7] 폴리아믹산 L7의 합성[Synthesis Example L7] Synthesis of polyamic acid L7

APAB 3.60g(16mmol)을 NMP 88g에 용해시켰다. 얻어진 용액에 BPTME 8.40g(16mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L7을 얻었다. 폴리아믹산 L7의 Mw는 58,300, Mw/Mn은 2.8이었다. 3.60 g (16 mmol) of APAB was dissolved in 88 g of NMP. BPTME 8.40g (16mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid L7 was obtained. Mw of polyamic acid L7 was 58,300, and Mw/Mn was 2.8.

[합성예 L8] 폴리아믹산 L8의 합성[Synthesis Example L8] Synthesis of polyamic acid L8

DDE 2.322g(12mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 PMDA 2.478g(11mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L8을 얻었다. 폴리아믹산 L8의 Mw는 22,600, Mw/Mn은 2.1이었다. 2.322 g (12 mmol) of DDE was dissolved in 35.2 g of NMP. PMDA 2.478g (11mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L8 was obtained. Mw of polyamic acid L8 was 22,600, and Mw/Mn was 2.1.

[합성예 L9] 폴리아믹산 L9의 합성[Synthesis Example L9] Synthesis of polyamic acid L9

DATP 1.762g(7mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.038g(7mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L9를 얻었다. 폴리아믹산 L9의 Mw는 61,300, Mw/Mn은 3.3이었다. 1.762 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. TAHQ 3.038g (7mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid L9 was obtained. Mw of polyamic acid L9 was 61,300, and Mw/Mn was 3.3.

[합성예 L10] 폴리아믹산 L10의 합성[Synthesis Example L10] Synthesis of polyamic acid L10

p-PDA 0.899g(8mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 BPODA 3.900g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L10을 얻었다. 폴리아믹산 L10의 Mw는 17,300, Mw/Mn은 2.4이었다. 0.899 g (8 mmol) of p-PDA was dissolved in 35.2 g of NMP. BPODA 3.900g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid L10 was obtained. Mw of polyamic acid L10 was 17,300, and Mw/Mn was 2.4.

[합성예 L11] 폴리아믹산 L11의 합성[Synthesis Example L11] Synthesis of polyamic acid L11

DATP 1.713g(7mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 BPODA 3.086g(6mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L11을 얻었다. 폴리아믹산 L11의 Mw는 27,000, Mw/Mn은 2.4이었다. 1.713 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. BPODA 3.086g (6mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L11 was obtained. Mw of polyamic acid L11 was 27,000, and Mw/Mn was 2.4.

[합성예 L12] 폴리아믹산 L12의 합성[Synthesis Example L12] Synthesis of polyamic acid L12

p-PDA 0.931g(9mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L12를 얻었다. 폴리아믹산 L12의 Mw는 45,000, Mw/Mn은 2.7이었다. 0.931 g (9 mmol) of p-PDA was dissolved in 35.2 g of NMP. TAHQ 3.868g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L12 was obtained. Mw of polyamic acid L12 was 45,000, and Mw/Mn was 2.7.

[합성예 L13] 폴리아믹산 L13의 합성[Synthesis Example L13] Synthesis of polyamic acid L13

p-PDA 0.839g(8mmol)과 m-PDA 0.093g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L13을 얻었다. 폴리아믹산 L13의 Mw는 39,100, Mw/Mn은 2.6이었다. 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. TAHQ 3.868g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L13 was obtained. Mw of polyamic acid L13 was 39,100, and Mw/Mn was 2.6.

[합성예 L14] 폴리아믹산 L14의 합성[Synthesis Example L14] Synthesis of polyamic acid L14

p-PDA 0.652g(6mmol)과 m-PDA 0.280g(3mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L14를 얻었다. 폴리아믹산 L14의 Mw는 42,700, Mw/Mn은 2.6이었다. 0.652 g (6 mmol) of p-PDA and 0.280 g (3 mmol) of m-PDA were dissolved in 35.2 g of NMP. TAHQ 3.868g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L14 was obtained. Mw of polyamic acid L14 was 42,700, and Mw/Mn was 2.6.

[합성예 L15] 폴리아믹산 L15의 합성[Synthesis Example L15] Synthesis of polyamic acid L15

m-PDA 0.931g(9mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.868g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L15를 얻었다. 폴리아믹산 L15의 Mw는 36,100, Mw/Mn은 2.5이었다. 0.931 g (9 mmol) of m-PDA was dissolved in 35.2 g of NMP. TAHQ 3.868g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L15 was obtained. Mw of polyamic acid L15 was 36,100, and Mw/Mn was 2.5.

[합성예 L16] 폴리아믹산 L16의 합성[Synthesis Example L16] Synthesis of polyamic acid L16

p-PDA 0.816g(8mmol)과 DATP 0.218g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.765g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L16을 얻었다. 폴리아믹산 L16의 Mw는 43,800, Mw/Mn은 2.5이었다. 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. TAHQ 3.765g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L16 was obtained. Mw of polyamic acid L16 was 43,800, and Mw/Mn was 2.5.

[합성예 L17] 폴리아믹산 L17의 합성[Synthesis Example L17] Synthesis of polyamic acid L17

p-PDA 0.603g(6mmol) 및 DATP 0.622g(2mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.575g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L17을 얻었다. 폴리아믹산 L17의 Mw는 46,000, Mw/Mn은 2.6이었다. 0.603 g (6 mmol) of p-PDA and 0.622 g (2 mmol) of DATP were dissolved in 35.2 g of NMP. TAHQ 3.575g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and the polyamic acid L17 was obtained. Mw of polyamic acid L17 was 46,000, and Mw/Mn was 2.6.

[합성예 L18] 폴리아믹산 L18의 합성[Synthesis Example L18] Synthesis of polyamic acid L18

p-PDA 0.832g(8mmol) 및 DBA 0.130g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.838g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L18을 얻었다. 폴리아믹산 L18의 Mw는 57,000, Mw/Mn은 3.0이었다. 0.832 g (8 mmol) of p-PDA and 0.130 g (1 mmol) of DBA were dissolved in 35.2 g of NMP. TAHQ 3.838g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L18 was obtained. Mw of polyamic acid L18 was 57,000, and Mw/Mn was 3.0.

[합성예 L19] 폴리아믹산 L19의 합성[Synthesis Example L19] Synthesis of polyamic acid L19

p-PDA 0.822g(8mmol) 및 HAB 0.183g(1mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.794g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L19를 얻었다. 폴리아믹산 L19의 Mw는 54,200, Mw/Mn은 2.7이었다. 0.822 g (8 mmol) of p-PDA and 0.183 g (1 mmol) of HAB were dissolved in 35.2 g of NMP. TAHQ 3.794g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L19 was obtained. Mw of polyamic acid L19 was 54,200, and Mw/Mn was 2.7.

[합성예 L20] 폴리아믹산 L20의 합성[Synthesis Example L20] Synthesis of polyamic acid L20

p-PDA 0.616g(6mmol) 및 HAB 0.528g(2mmol)을 NMP 35.2g에 용해시켰다. 얻어진 용액에 TAHQ 3.655g(8mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L20을 얻었다. 폴리아믹산 L20의 Mw는 55,900, Mw/Mn은 2.6이었다. 0.616 g (6 mmol) of p-PDA and 0.528 g (2 mmol) of HAB were dissolved in 35.2 g of NMP. TAHQ 3.655g (8mmol) was added to the obtained solution, it was made to react at 23 degreeC in nitrogen atmosphere for 24 hours, and polyamic acid L20 was obtained. Mw of polyamic acid L20 was 55,900, and Mw/Mn was 2.6.

[합성예 L21] 폴리아믹산 L21의 합성[Synthesis Example L21] Synthesis of polyamic acid L21

APAB-E 1.239g(5mmol)을 NMP 17.6g에 용해시켰다. 얻어진 용액에 PMDA 1.160g(5mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L21을 얻었다. 폴리아믹산 L21의 Mw는 20,900, Mw/Mn은 2.1이었다. 1.239 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. PMDA 1.160g (5mmol) was added to the obtained solution, it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and the polyamic acid L21 was obtained. Mw of polyamic acid L21 was 20,900, and Mw/Mn was 2.1.

[합성예 L22] 폴리아믹산 L22의 합성[Synthesis Example L22] Synthesis of polyamic acid L22

APAB-E 1.060g(5mmol)을 NMP 17.6g에 용해시켰다. 얻어진 용액에 BPDA 1.339g(5mmol)을 가하고, 질소 분위기하, 23℃에서 24시간 반응시켜, 폴리아믹산 L22를 얻었다. 폴리아믹산 L22의 Mw는 26,600, Mw/Mn은 2.3이었다. 1.060 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. 1.339 g (5 mmol) of BPDA was added to the obtained solution, and it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and the polyamic acid L22 was obtained. Mw of polyamic acid L22 was 26,600, and Mw/Mn was 2.3.

[비교합성예 1] 폴리벤조옥사졸 전구체 B1의 합성[Comparative Synthesis Example 1] Synthesis of polybenzoxazole precursor B1

6FAP 5.49g(0.015mol)을 NMP 27g에 용해시켰다. 얻어진 용액에 IPBBT 6.48g(0.015mol)을 가하고, 질소 분위기하, 23℃에서 3시간 반응시켰다. 그 후, 이 용액을 순수 300g에 투입하고, 24시간 교반 후, 석출물을 여과했다. 그 후, 감압 건조하여, 폴리벤조옥사졸 전구체 B1을 얻었다. 폴리벤조옥사졸 전구체 B1의 Mw는 2,1000, Mw/Mn은 3.9이었다. 5.49 g (0.015 mol) of 6FAP was dissolved in 27 g of NMP. IPBBT 6.48g (0.015 mol) was added to the obtained solution, and it was made to react at 23 degreeC in nitrogen atmosphere for 3 hours. Then, this solution was injected into 300 g of pure water, and after stirring for 24 hours, the precipitate was filtered. Then, it dried under reduced pressure and obtained the polybenzoxazole precursor B1. Mw of polybenzoxazole precursor B1 was 2,1000, and Mw/Mn was 3.9.

[2] 수지 기판 형성용 조성물의 조제[2] Preparation of a composition for forming a resin substrate

합성예 S1∼S4에서 얻어진 반응액을, 각각, 그대로 수지 기판 형성용 조성물 W, X, Y 및 Z로서 사용했다. The reaction liquids obtained in Synthesis Examples S1 to S4 were used as compositions W, X, Y, and Z for forming a resin substrate as they were, respectively.

[3] 박리층 형성용 조성물의 조제[3] Preparation of a composition for forming a release layer

[실시예 1-1][Example 1-1]

합성예 L1에서 얻어진 반응액에 BCS를 가하고, 폴리머 농도가 5질량%, BCS가 20질량%가 되도록 NMP로 희석하여, 박리층 형성용 조성물을 얻었다. BCS was added to the reaction solution obtained in Synthesis Example L1, and diluted with NMP so that the polymer concentration was 5% by mass and the BCS was 20% by mass, thereby obtaining a composition for forming a release layer.

[실시예 1-2∼1-22][Examples 1-2 to 1-22]

합성예 L1에서 얻어진 반응액 대신에, 각각 합성예 L2∼L22에서 얻어진 반응액을 사용한 이외는 실시예 1-1과 동일한 방법으로, 박리층 형성용 조성물을 얻었다. A composition for forming a release layer was obtained in the same manner as in Example 1-1, except that the reaction solutions obtained in Synthesis Examples L2 to L22 were used instead of the reaction solutions obtained in Synthesis Example L1.

[비교예 1][Comparative Example 1]

비교합성예 1에서 얻어진 반응액을 폴리머 농도가 5질량%가 되도록 NMP로 희석하여, 조성물을 얻었다. The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP to a polymer concentration of 5% by mass to obtain a composition.

[4] 박리층의 형성 및 그 평가[4] Formation of release layer and its evaluation

[실시예 2-1][Example 2-1]

스핀 코터(조건: 회전수 3000rpm으로 약 30초)를 사용하여, 실시예 1-1에서 얻어진 박리층 형성용 조성물을, 유리 기체로서 100mm×100mm 유리 기판(이하 동일) 위에 도포했다. The composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate onto a 100 mm x 100 mm glass substrate (the same below) using a spin coater (condition: rotation speed of 3000 rpm for about 30 seconds).

그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후, 오븐을 사용하여, 300℃로 30분간 가열하고, 가열온도를 400℃까지 승온(10℃/분)하고, 400℃로 30분간 더 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Then, the obtained coated film was heated at 80° C. for 10 minutes using a hot plate, then heated at 300° C. for 30 minutes using an oven, and the heating temperature was raised to 400° C. (10° C./min), followed by heating at 400° C. It was further heated at °C for 30 minutes to form a peeling layer having a thickness of about 0.1 μm on the glass substrate. During the temperature rise, the film-attached substrate was heated in the oven without taking it out of the oven.

[실시예 2-2∼2-22][Examples 2-2 to 2-22]

실시예 1-1에서 얻어진 박리층 형성용 조성물 대신에, 각각 실시예 1-2∼1-22에서 얻어진 박리층 형성용 조성물을 사용한 이외는, 실시예 2-1과 동일한 방법으로, 박리층을 형성했다. A release layer was prepared in the same manner as in Example 2-1, except that the release layer-forming composition obtained in Examples 1-2 to 1-22 was used instead of the release layer-forming composition obtained in Example 1-1. formed

[실시예 2-23][Example 2-23]

스핀 코터(조건: 회전수 3000rpm으로 약 30초)를 사용하여, 실시예 1-12에서 얻어진 박리층 형성용 조성물을 100mm×100mm 유리 기판 위에 도포했다. The composition for forming a release layer obtained in Example 1-12 was applied onto a 100 mm x 100 mm glass substrate using a spin coater (condition: rotation speed of 3000 rpm for about 30 seconds).

그리고, 얻어진 도포막을, 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여, 140℃로 30분간 가열하고, 가열온도를 250℃까지 승온(2℃/분)하고, 250℃로 60분간 더 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Then, the obtained coated film was heated at 80° C. for 10 minutes using a hot plate, then heated at 140° C. for 30 minutes using an oven, and the heating temperature was raised to 250° C. (2° C./min), followed by heating at 250° C. It was further heated at °C for 60 minutes to form a peeling layer having a thickness of about 0.1 μm on the glass substrate. During the temperature rise, the film-attached substrate was heated in the oven without taking it out of the oven.

[실시예 2-24][Example 2-24]

스핀 코터(조건: 회전수 3000rpm으로 약 30초)를 사용하여, 실시예 1-8에서 얻어진 박리층 형성용 조성물을, 유리 기체로서의 100mm×100mm 유리 기판 위에 도포했다. The composition for forming a release layer obtained in Example 1-8 was applied onto a 100 mm x 100 mm glass substrate as a glass base using a spin coater (condition: rotation speed of 3000 rpm for about 30 seconds).

그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여 질소 분위기하, 300℃로 30분간 가열하고, 가열온도를 400℃까지 승온(10℃/분)하고, 400℃로 60분간 더 가열하고, 최종적으로 500℃로 10분간 가열하여, 유리 기판 위에 두께 약 0.1㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Then, the obtained coated film was heated at 80° C. for 10 minutes using a hot plate, then heated at 300° C. for 30 minutes in a nitrogen atmosphere using an oven, and the heating temperature was raised to 400° C. (10° C./min). , and further heated at 400°C for 60 minutes, and finally heated at 500°C for 10 minutes to form a release layer having a thickness of about 0.1 µm on the glass substrate. During the temperature rise, the film-attached substrate was heated in the oven without taking it out of the oven.

[실시예 2-25][Example 2-25]

실시예 1-8에서 얻어진 박리층 형성용 조성물 대신에, 실시예 1-12에서 얻어진 조성물을 사용한 이외는, 실시예 2-24와 동일한 방법으로, 수지 박막을 형성했다. A resin thin film was formed in the same manner as in Example 2-24, except that the composition obtained in Example 1-12 was used instead of the composition for forming a release layer obtained in Example 1-8.

[비교예 2][Comparative Example 2]

실시예 1-1에서 얻어진 박리층 형성용 조성물 대신에, 비교예 1에서 얻어진 조성물을 사용한 이외는, 실시예 2-1과 동일한 방법으로, 수지 박막을 형성했다. A resin thin film was formed in the same manner as in Example 2-1, except that the composition obtained in Comparative Example 1 was used instead of the composition for forming a release layer obtained in Example 1-1.

[5] 박리성의 평가[5] Evaluation of peelability

[실시예 3-1∼3-47, 비교예 3][Examples 3-1 to 3-47, Comparative Example 3]

실시예 2-1∼2-25에서 얻어진 박리층과 유리 기판의 박리성 및 당해 박리층(수지 박막)과 수지 기판의 박리성을 확인했다. 또한, 수지 기판으로서는 폴리이미드로 이루어지는 수지 기판을 사용했다. The peelability of the peeling layer obtained in Examples 2-1 to 2-25 and the glass substrate, and the peelability of the peeling layer (resin thin film) and the resin substrate were confirmed. In addition, as the resin substrate, a resin substrate made of polyimide was used.

우선, 실시예 2-1∼2-25에서 얻어진 박리층 부착 유리 기판상의 박리층의 크로스 컷(종횡 1mm 간격, 이하 동일), 및 수지 기판·박리층 부착 유리 기판상의 수지 기판·박리층의 크로스 컷을 행함으로써, 100 격자셀 컷을 행했다. 즉, 이 크로스 컷에 의해, 사방 1mm의 격자셀을 100개 형성했다. First, cross-cutting of the release layer on the glass substrate with a release layer obtained in Examples 2-1 to 2-25 (1 mm intervals in length and width, the same hereinafter), and cross-cutting of the resin substrate and the release layer on the glass substrate with a resin substrate and release layer By performing the cut, 100 lattice cell cuts were performed. That is, 100 lattice cells of 1 mm square were formed by this cross-cutting.

그리고, 이 100 매스컷 부분에 점착 테이프를 붙이고, 그 테이프를 벗기고, 이하의 기준(5B∼0B, B, A, AA)에 기초하여, 박리의 정도를 평가했다(실시예 3-1∼3-47). 또한 상기 수법에 준하여, 비교예 2에서 얻어진 수지 박막 부착 유리 기판을 사용하여, 동일한 시험을 행했다(비교예 3). 결과를 표 1에 나타낸다. 또한, 표 1 중의 박리성의 평가기준은 이하와 같다. Then, adhesive tape was applied to these 100 mass cut parts, the tape was peeled off, and the degree of peeling was evaluated based on the following criteria (5B to 0B, B, A, AA) (Examples 3-1 to 3 -47). Furthermore, the same test was done according to the said method using the glass substrate with a resin thin film obtained by the comparative example 2 (comparative example 3). The results are shown in Table 1. In addition, the evaluation criteria of peelability in Table 1 are as follows.

5B: 0% 박리(박리 없음)5B: 0% exfoliation (no exfoliation)

4B: 5% 미만의 박리4B: less than 5% peeling

3B: 5∼15%의 박리3B: 5 to 15% peeling

2B: 15∼35% 미만의 박리2B: 15 to less than 35% peeling

1B: 35∼65% 미만의 박리1B: 35 to less than 65% peeling

0B: 65%∼80% 미만의 박리0B: 65% to less than 80% peeling

B: 80%∼95% 미만의 박리 B: 80% to less than 95% peeling

A: 95%∼100% 미만의 박리 A: 95% to less than 100% peeling

AA: 100% 박리(모두 박리)AA: 100% exfoliation (all exfoliation)

실시예 3-1∼3-41, 3-44∼3-47 및 비교예 3의 수지 기판은 이하의 방법으로 형성했다. The resin substrates of Examples 3-1 to 3-41 and 3-44 to 3-47 and Comparative Example 3 were formed by the following method.

바 코터(갭: 250㎛)를 사용하여, 유리 기판상의 박리층(수지 박막) 위에 수지 기판 형성용 조성물 W 또는 X 중 어느 하나를 도포했다. 그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여, 140℃로 30분간 가열하고, 가열온도를 210℃까지 승온(10℃/분, 이하 동일)하고, 210℃로 30분간, 가열온도를 300℃까지 승온하고, 300℃로 30분간, 가열온도를 400℃까지 승온하고, 400℃로 60분간 가열하여, 박리층 위에 두께 약 20㎛의 폴리이미드 기판을 형성했다. 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Using a bar coater (gap: 250 μm), either the composition W or X for forming a resin substrate was applied onto the release layer (resin thin film) on the glass substrate. Then, the obtained coating film was heated at 80° C. for 10 minutes using a hot plate, then heated at 140° C. for 30 minutes using an oven, and the heating temperature was raised to 210° C. (10° C./min, hereinafter the same), , The heating temperature was raised to 300 ° C at 210 ° C for 30 minutes, the heating temperature was raised to 400 ° C for 30 minutes at 300 ° C, and the heating temperature was raised to 400 ° C for 60 minutes, and a polyimide substrate having a thickness of about 20 μm was formed on the release layer. has formed During the temperature rise, the film-attached substrate was heated in the oven without taking it out of the oven.

실시예 3-42∼3-43의 수지 기판은 이하의 방법으로 형성했다. The resin substrates of Examples 3-42 to 3-43 were formed by the following method.

바 코터(갭: 50㎛)를 사용하여, 유리 기판상의 박리층의 위에 수지 기판 형성용 조성물 Y 또는 Z 중 어느 하나를 도포했다. 그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후, 오븐을 사용하여, 140℃로 30분간 가열하고, 가열온도를 250℃까지 승온(2℃/분)하고, 250℃로 60분간 가열하여, 박리층 위에 두께 약 0.8㎛의 폴리이미드 기판을 형성했다. 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. Using a bar coater (gap: 50 μm), either the composition Y or Z for forming a resin substrate was applied on the release layer on the glass substrate. Then, the obtained coated film was heated at 80° C. for 10 minutes using a hot plate, then heated at 140° C. for 30 minutes using an oven, and the heating temperature was raised to 250° C. (2° C./min), followed by heating at 250° C. It was heated at °C for 60 minutes to form a polyimide substrate having a thickness of about 0.8 μm on the release layer. During the temperature rise, the film-attached substrate was heated in the oven without taking it out of the oven.

Figure 112017084678511-pct00021
Figure 112017084678511-pct00021

Figure 112017084678511-pct00022
Figure 112017084678511-pct00022

표 1 및 2에 나타낸 바와 같이, 실시예의 박리층은 유리 기판과의 밀착성이 우수하고, 또한, 수지 기판과의 박리성이 우수한 것을 알았다. 한편, 비교예의 박리층은 수지 기판과 유리 기판으로부터 박리되지 않아, 박리층으로서 기능하지 않았다. As shown in Tables 1 and 2, it was found that the peeling layers of Examples were excellent in adhesiveness to a glass substrate and also excellent in peelability to a resin substrate. On the other hand, the peeling layer of the comparative example did not peel from the resin substrate and the glass substrate and did not function as a peeling layer.

[6] 투과율의 평가[6] Evaluation of transmittance

[실시예 4][Example 4]

스핀 코터(조건: 회전수 800rpm으로 약 30초)를 사용하여, 실시예 2-8에서 얻어진 박리층 형성용 조성물을 유리 기체로서 100mm×100mm 유리 기판(이하 같음)의 위에 도포했다. Using a spin coater (condition: rotation speed of 800 rpm for about 30 seconds), the composition for forming a release layer obtained in Example 2-8 was applied as a glass base onto a 100 mm x 100 mm glass substrate (same as below).

그리고, 얻어진 도포막을 핫플레이트를 사용하여 80℃로 10분간 가열하고, 그 후에 오븐을 사용하여, 300℃로 30분간 가열하고, 가열온도를 400℃까지 승온(10℃/분)하고, 400℃로 30분간 더 가열하여, 유리 기판 위에 두께 약 0.4㎛의 박리층을 형성했다. 또한, 승온 동안, 막 부착 기판을 오븐으로부터 꺼내지 않고, 오븐 내에서 가열했다. 얻어진 필름을 자외선 가시 분광 광도계((주)시마즈세사쿠쇼제 SIMADSU UV-2550 형번)를 사용하여 투과율을 측정했다. Then, the obtained coating film was heated at 80°C for 10 minutes using a hot plate, then heated at 300°C for 30 minutes using an oven, and the heating temperature was raised to 400°C (10°C/min), followed by heating at 400°C. was further heated for 30 minutes to form a peeling layer having a thickness of about 0.4 μm on the glass substrate. During the temperature rise, the film-attached substrate was heated in the oven without taking it out of the oven. The transmittance|permeability of the obtained film was measured using the ultraviolet-visible spectrophotometer (SIMADSU UV-2550 type|model manufactured by Shimadzu Corporation).

결과를 도 1에 나타낸다. 얻어진 필름의 투과율은 파장 308nm에 대하여 1% 이하로, 희생층으로서 사용 가능한 투과율을 나타냈다. Results are shown in FIG. 1 . The transmittance of the obtained film was 1% or less with respect to a wavelength of 308 nm, indicating transmittance usable as a sacrificial layer.

Claims (11)

방향족 다이아민과 방향족 테트라카복실산 이무수물을 반응시켜 얻어지는 폴리아믹산 및 유기 용매를 포함하고,
상기 방향족 다이아민이 에스터 결합을 포함하는 방향족 다이아민을 포함하고, 및/또는 상기 방향족 테트라카복실산 이무수물이 에스터 결합을 포함하는 방향족 테트라카복실산 이무수물을 포함하며,
상기 에스터 결합을 포함하는 방향족 다이아민이 식 (A4)∼(A6), (A13)∼(A24) 및 (A34)∼(A39)로 이루어지는 군으로부터 선택되는 적어도 1종이고,
Figure 112023008625651-pct00035

상기 에스터 결합을 포함하는 방향족 테트라카복실산 이무수물이 식 (B1), (B2), (B5)∼(B7) 및 (B11)로 이루어지는 군으로부터 선택되는 적어도 1종인 것을 특징으로 하는 박리층 형성용 조성물.
Figure 112023008625651-pct00036
A polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride and an organic solvent,
wherein the aromatic diamine comprises an aromatic diamine comprising an ester bond, and/or the aromatic tetracarboxylic acid dianhydride comprises an aromatic tetracarboxylic acid dianhydride comprising an ester bond;
The aromatic diamine containing an ester bond is at least one selected from the group consisting of formulas (A4) to (A6), (A13) to (A24) and (A34) to (A39),
Figure 112023008625651-pct00035

A composition for forming a release layer, characterized in that the aromatic tetracarboxylic dianhydride containing an ester bond is at least one selected from the group consisting of formulas (B1), (B2), (B5) to (B7) and (B11) .
Figure 112023008625651-pct00036
제 1 항에 있어서,
상기 방향족 테트라카복실산 이무수물이 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물을 더 포함하는 것을 특징으로 하는 박리층 형성용 조성물.
According to claim 1,
A composition for forming a release layer, characterized in that the aromatic tetracarboxylic dianhydride further comprises an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond.
제 2 항에 있어서,
상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 벤젠 골격, 나프틸 골격 또는 바이페닐 골격을 포함하는 것인 것을 특징으로 하는 박리층 형성용 조성물.
According to claim 2,
A composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond includes a benzene skeleton, a naphthyl skeleton or a biphenyl skeleton.
제 3 항에 있어서,
상기 에스터 결합 및 에터 결합의 어느 것도 포함하지 않는 방향족 테트라카복실산 이무수물이 식 (C1)∼(C12)로 이루어지는 군으로부터 선택되는 적어도 1종인 것을 특징으로 하는 박리층 형성용 조성물.
Figure 112023008625651-pct00031
According to claim 3,
A composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of Formulas (C1) to (C12).
Figure 112023008625651-pct00031
제 1 항에 있어서,
상기 유기 용매가 식 (S1)로 표시되는 아마이드류, 식 (S2)로 표시되는 아마이드류 및 식 (S3)으로 표시되는 아마이드류로부터 선택되는 적어도 1개를 포함하는 것을 특징으로 하는 박리층 형성용 조성물.
Figure 112023008625651-pct00032

(식 중, R1 및 R2는, 서로 독립하여, 탄소수 1∼10의 알킬기를 나타낸다. R3은 수소 원자, 또는 탄소수 1∼10의 알킬기를 나타낸다. h는 자연수를 나타낸다.)
According to claim 1,
For forming a release layer, characterized in that the organic solvent contains at least one selected from amides represented by formula (S1), amides represented by formula (S2), and amides represented by formula (S3). composition.
Figure 112023008625651-pct00032

(In the formula, R 1 and R 2 independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number.)
제 1 항에 기재된 박리층 형성용 조성물을 사용하여 형성되는 박리층.A release layer formed using the composition for forming a release layer according to claim 1. 제 6 항에 기재된 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 플랙시블 전자 디바이스의 제조 방법.A method for manufacturing a flexible electronic device having a resin substrate, characterized by using the peeling layer according to claim 6. 제 6 항에 기재된 박리층을 사용하는 것을 특징으로 하는, 수지 기판을 구비하는 터치패널 센서의 제조 방법.The manufacturing method of the touchscreen sensor provided with the resin substrate characterized by using the peeling layer of Claim 6. 제 7 항 또는 제 8 항에 있어서,
상기 수지 기판이 폴리이미드로 이루어지는 기판인 것을 특징으로 하는 제조 방법.
According to claim 7 or 8,
A manufacturing method characterized in that the resin substrate is a substrate made of polyimide.
삭제delete 삭제delete
KR1020177024538A 2015-02-10 2016-02-08 Composition for forming release layer KR102528185B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020227020140A KR102602473B1 (en) 2015-02-10 2016-02-08 Composition for forming release layer

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015024753 2015-02-10
JPJP-P-2015-024753 2015-02-10
PCT/JP2016/053624 WO2016129546A1 (en) 2015-02-10 2016-02-08 Composition for forming release layer

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020227020140A Division KR102602473B1 (en) 2015-02-10 2016-02-08 Composition for forming release layer

Publications (2)

Publication Number Publication Date
KR20170116065A KR20170116065A (en) 2017-10-18
KR102528185B1 true KR102528185B1 (en) 2023-05-03

Family

ID=56615290

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020177024538A KR102528185B1 (en) 2015-02-10 2016-02-08 Composition for forming release layer
KR1020227020140A KR102602473B1 (en) 2015-02-10 2016-02-08 Composition for forming release layer

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020227020140A KR102602473B1 (en) 2015-02-10 2016-02-08 Composition for forming release layer

Country Status (5)

Country Link
JP (3) JP6729403B2 (en)
KR (2) KR102528185B1 (en)
CN (3) CN113402882B (en)
TW (2) TWI768234B (en)
WO (1) WO2016129546A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102133559B1 (en) * 2015-09-24 2020-07-13 아사히 가세이 가부시키가이샤 Polyimide precursor, resin composition, and method for producing resin film
TWI817931B (en) * 2016-08-03 2023-10-11 日商日產化學工業股份有限公司 laminated body
JP7063266B2 (en) * 2016-08-03 2022-05-09 日産化学株式会社 A composition for forming a release layer and a release layer
TWI746611B (en) * 2016-08-03 2021-11-21 日商日產化學工業股份有限公司 Composition for forming peeling layer, and laminate containing the same
CN110050013B (en) * 2016-12-08 2022-11-29 日产化学株式会社 Method for producing release layer
WO2018105676A1 (en) * 2016-12-08 2018-06-14 日産化学工業株式会社 Release layer production method
KR102439472B1 (en) * 2016-12-08 2022-09-05 닛산 가가쿠 가부시키가이샤 Method for producing a release layer
KR101971155B1 (en) * 2016-12-15 2019-04-22 연세대학교 산학협력단 Diamine monomer, transparent polyimide comprising the same, and the preparation method thereof
KR102008766B1 (en) 2017-01-31 2019-08-09 주식회사 엘지화학 Laminate for manufacturing flexible substrate and process for manufacturing flexible substrate using same
KR102574758B1 (en) * 2017-03-30 2023-09-06 닛산 가가쿠 가부시키가이샤 Composition for Forming Release Layer and Release Layer
TWI786192B (en) * 2017-09-27 2022-12-11 日商日產化學股份有限公司 Temporary adhesive layer forming composition and temporary adhesive layer
KR102013283B1 (en) * 2017-12-05 2019-08-22 재단법인 오송첨단의료산업진흥재단 Method of detaching a thin film electrode using thermal expansion coefficient
CN109337070B (en) * 2018-07-12 2021-08-20 住井科技(深圳)有限公司 Resin composition
JP7203649B2 (en) * 2019-03-18 2023-01-13 太陽ホールディングス株式会社 Esterdiamine-containing polybenzoxazole precursors, photosensitive resin compositions, dry films, cured products and electronic components
TW202138431A (en) * 2019-12-20 2021-10-16 日商日產化學股份有限公司 Release layer forming composition
JP7435110B2 (en) 2020-03-19 2024-02-21 住友ベークライト株式会社 Polyhydroxyimide, polymer solution, photosensitive resin composition and its uses
CN111675902A (en) * 2020-05-22 2020-09-18 浙江中科玖源新材料有限公司 Transparent polyimide film with high heat resistance and low thermal expansion coefficient and preparation method thereof
CN113292726B (en) * 2021-04-10 2023-03-24 常州市尚科新材料有限公司 Polyimide molding powder and preparation method and application thereof
CN116003794A (en) * 2022-12-29 2023-04-25 中国科学院化学研究所 High-frequency high-heat-resistance heat-sealable poly (aryl ester-imide) resin and preparation method and application thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013100467A (en) * 2011-10-20 2013-05-23 Nitto Denko Corp Thermally-detachable sheet
JP2013153122A (en) * 2011-10-20 2013-08-08 Nitto Denko Corp Method for manufacturing semiconductor device
WO2014050933A1 (en) * 2012-09-27 2014-04-03 新日鉄住金化学株式会社 Display device production method

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04212206A (en) * 1990-03-27 1992-08-03 Hitachi Ltd Insulating paint, solderable insulated wire, manufacture of the insulated wire, and flyback transformer using the insulated wire
JPH0649207A (en) * 1992-07-30 1994-02-22 Hitachi Ltd Production of electronic device using polyamic acid ester
JP4619461B2 (en) 1996-08-27 2011-01-26 セイコーエプソン株式会社 Thin film device transfer method and device manufacturing method
JP3809681B2 (en) 1996-08-27 2006-08-16 セイコーエプソン株式会社 Peeling method
JP4619462B2 (en) 1996-08-27 2011-01-26 セイコーエプソン株式会社 Thin film element transfer method
JP3590902B2 (en) * 1998-02-19 2004-11-17 株式会社カネカ Polyimide film with improved adhesion and method for producing the same
JP2002114848A (en) * 2000-10-06 2002-04-16 Kanegafuchi Chem Ind Co Ltd New thermoplastic polyimide resin and flexible metal foil-clad laminate
JP2004269675A (en) * 2003-03-07 2004-09-30 Kanegafuchi Chem Ind Co Ltd Bonding sheet and flexible metal-clad laminate obtained from the same
GB0327093D0 (en) 2003-11-21 2003-12-24 Koninkl Philips Electronics Nv Active matrix displays and other electronic devices having plastic substrates
JP4627297B2 (en) * 2004-05-21 2011-02-09 マナック株式会社 Polyesterimide and its precursor with low linear thermal expansion coefficient
JP4650066B2 (en) * 2005-04-01 2011-03-16 セイコーエプソン株式会社 Substrate for transfer, method for manufacturing flexible wiring substrate, and method for manufacturing electronic device
JP4901170B2 (en) * 2005-09-30 2012-03-21 株式会社カネカ Heat-sealable polyimide film and metal laminate using the heat-sealable polyimide film
TWI297342B (en) * 2006-01-17 2008-06-01 Ind Tech Res Inst Thermoplastic polyimide composition and double-sided flexible copper clad laminate using the same
KR101075146B1 (en) * 2006-07-27 2011-10-19 우베 고산 가부시키가이샤 Laminate of heat resistant film and metal foil, and method for production thereof
JP2008279698A (en) * 2007-05-11 2008-11-20 Asahi Kasei Corp Laminate and its manufacturing method
WO2009139086A1 (en) * 2008-05-16 2009-11-19 旭化成イーマテリアルズ株式会社 Polyester-imide precursor and polyester-imide
JP2010221523A (en) * 2009-03-24 2010-10-07 Toray Ind Inc Method for manufacturing metallic layer laminated film
JP2011062842A (en) * 2009-09-15 2011-03-31 Asahi Kasei E-Materials Corp Metal foil polyimide laminate
KR101728573B1 (en) * 2009-09-30 2017-04-19 다이니폰 인사츠 가부시키가이샤 Substrate for flexible device, thin film transistor substrate for flexible device, flexible device, substrate for thin film element, thin film element, thin film transistor, method for manufacturing substrate for thin film element, method for manufacturing thin film element, and method for manufacturing thin film transistor
CN103890116A (en) * 2011-10-20 2014-06-25 日东电工株式会社 Thermally-detachable sheet
CN104066768B (en) * 2011-11-25 2018-03-23 日产化学工业株式会社 Display base plate resin combination
KR101749609B1 (en) * 2011-11-25 2017-06-21 닛산 가가쿠 고교 가부시키 가이샤 Resin composition for display substrates
WO2013133168A1 (en) * 2012-03-05 2013-09-12 日産化学工業株式会社 Polyamic acid and polyimide
JP2015155483A (en) * 2012-05-29 2015-08-27 日産化学工業株式会社 resin composition
JP6217631B2 (en) * 2012-06-20 2017-10-25 東洋紡株式会社 LAMINATE MANUFACTURING METHOD, LAMINATE, MANUFACTURING METHOD OF LAMINATE WITH DEVICE, AND LAMINATE WITH DEVICE
JP6146077B2 (en) * 2012-06-29 2017-06-14 Jsr株式会社 Method for producing liquid crystal alignment film
TWI613089B (en) * 2012-09-14 2018-02-01 三井化學股份有限公司 Transparent polyimido laminate, method for producing the same, optical film, method for producing flecible device, touch panel display, liquid crystal display and organic el display
CN107573506B (en) * 2012-09-18 2020-06-30 宇部兴产株式会社 Polyimide precursor, polyimide film, varnish, and substrate
CN103383996B (en) * 2013-06-27 2015-07-22 江苏华东锂电技术研究院有限公司 Preparation method of polyimide micro-pore diaphragm
WO2015152120A1 (en) * 2014-03-31 2015-10-08 日産化学工業株式会社 Composition for forming releasing layer
JP2015199350A (en) * 2014-03-31 2015-11-12 新日鉄住金化学株式会社 Method for manufacturing flexible device, flexible device manufacturing apparatus, flexible device, and liquid composition
KR101992525B1 (en) * 2014-07-17 2019-06-24 아사히 가세이 가부시키가이샤 Resin precursor, resin composition containing same, polyimide resin membrane, resin film, and method for producing same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013100467A (en) * 2011-10-20 2013-05-23 Nitto Denko Corp Thermally-detachable sheet
JP2013153122A (en) * 2011-10-20 2013-08-08 Nitto Denko Corp Method for manufacturing semiconductor device
WO2014050933A1 (en) * 2012-09-27 2014-04-03 新日鉄住金化学株式会社 Display device production method

Also Published As

Publication number Publication date
TW201943767A (en) 2019-11-16
CN111234217A (en) 2020-06-05
TW201700540A (en) 2017-01-01
CN107250277B (en) 2021-07-30
CN113402882A (en) 2021-09-17
JP6729403B2 (en) 2020-07-22
KR102602473B1 (en) 2023-11-16
KR20220091609A (en) 2022-06-30
KR20170116065A (en) 2017-10-18
JPWO2016129546A1 (en) 2017-12-14
CN113402882B (en) 2024-02-06
TWI720965B (en) 2021-03-11
JP2021119243A (en) 2021-08-12
JP7131651B2 (en) 2022-09-06
JP2020019960A (en) 2020-02-06
CN107250277A (en) 2017-10-13
TWI768234B (en) 2022-06-21
WO2016129546A1 (en) 2016-08-18
JP6939862B2 (en) 2021-09-22

Similar Documents

Publication Publication Date Title
KR102528185B1 (en) Composition for forming release layer
TWI758245B (en) Manufacturing method of flexible electronic device
KR102365302B1 (en) Composition for forming a release layer for a transparent resin substrate
WO2018025955A1 (en) Composition for forming releasing layer
KR102439479B1 (en) Method for producing a release layer
KR102500563B1 (en) Composition for Forming a Substrate Protection Layer
KR102410266B1 (en) Composition for forming a release layer
JP6897690B2 (en) Method of manufacturing the release layer

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
AMND Amendment
E601 Decision to refuse application
X091 Application refused [patent]
AMND Amendment
X701 Decision to grant (after re-examination)
GRNT Written decision to grant