JP6939862B2 - Composition for forming a release layer - Google Patents

Composition for forming a release layer Download PDF

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JP6939862B2
JP6939862B2 JP2019183479A JP2019183479A JP6939862B2 JP 6939862 B2 JP6939862 B2 JP 6939862B2 JP 2019183479 A JP2019183479 A JP 2019183479A JP 2019183479 A JP2019183479 A JP 2019183479A JP 6939862 B2 JP6939862 B2 JP 6939862B2
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release layer
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polyamic acid
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JP2020019960A (en
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江原 和也
和也 江原
和也 進藤
和也 進藤
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Nissan Chemical Corp
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    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
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Description

本発明は、剥離層形成用組成物に関し、詳述すると、基体上に設ける剥離層を形成するための剥離層形成用組成物に関する。 The present invention relates to a composition for forming a release layer, and more specifically, to a composition for forming a release layer for forming a release layer provided on a substrate.

近年、電子デバイスには、曲げるという機能付与や薄型化及び軽量化といった性能が求められている。このことから、従来の重く脆弱で曲げることができないガラス基板にかわって、軽量なフレキシブルプラスチック基板を用いることが求められる。また、新世代ディスプレイでは、軽量なフレキシブルプラスチック基板を用いる、アクティブフルカラー(active full-color)TFTディスプレイパネルの開発が求められている。そこで、樹脂フィルムを基板とした電子デバイスの製造方法が各種検討され始めており、新世代ディスプレイでは、既存のTFT設備を転用可能なプロセスで製造検討が進められている。 In recent years, electronic devices are required to have a function of bending, thinning, and weight reduction. For this reason, it is required to use a lightweight flexible plastic substrate instead of the conventional heavy, fragile and inflexible glass substrate. Further, in the new generation display, development of an active full-color TFT display panel using a lightweight flexible plastic substrate is required. Therefore, various methods for manufacturing electronic devices using a resin film as a substrate have begun to be studied, and for new-generation displays, manufacturing studies are being carried out by a process in which existing TFT equipment can be diverted.

特許文献1、2及び3は、ガラス基板上にアモルファスシリコン薄膜層を形成し、その薄膜層上にプラスチック基板を形成した後に、ガラス面側からレーザーを照射して、アモルファスシリコンの結晶化に伴い発生する水素ガスによりプラスチック基板をガラス基板から剥離する方法を開示する。また、特許文献4は、特許文献1〜3開示の技術を用いて被剥離層(特許文献4において「被転写層」と記載される。)をプラスチックフィルムに貼りつけて液晶表示装置を完成させる方法を開示する。 In Patent Documents 1, 2 and 3, an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, and then a laser is irradiated from the glass surface side to accompany the crystallization of amorphous silicon. A method of peeling a plastic substrate from a glass substrate by the generated hydrogen gas is disclosed. Further, in Patent Document 4, a peelable layer (described as “transfer layer” in Patent Document 4) is attached to a plastic film by using the techniques disclosed in Patent Documents 1 to 3 to complete a liquid crystal display device. Disclose the method.

しかし、特許文献1〜4に開示された方法、特に特許文献4に開示された方法は、透光性の高い基板を使用することが必須であり、基板を通過させ、更に非晶質シリコンに含まれる水素を放出させるのに十分なエネルギーを与えるため、比較的大きなレーザー光の照射が必要とされ、被剥離層に損傷を与えてしまうという問題がある。また、レーザー処理に長時間を要し、大面積を有する被剥離層を剥離するのは困難であるため、デバイス作製の生産性を挙げることが難しいという問題もある。 However, in the methods disclosed in Patent Documents 1 to 4, particularly the method disclosed in Patent Document 4, it is essential to use a substrate having high translucency, and the substrate is passed through the substrate to be further subjected to amorphous silicon. In order to give sufficient energy to release the contained hydrogen, it is necessary to irradiate a relatively large laser beam, and there is a problem that the layer to be separated is damaged. Further, since the laser treatment requires a long time and it is difficult to peel off the layer to be peeled off having a large area, there is also a problem that it is difficult to increase the productivity of device fabrication.

特開平10−125929号公報Japanese Unexamined Patent Publication No. 10-125929 特開平10−125931号公報Japanese Unexamined Patent Publication No. 10-125931 国際公開第2005/050754号International Publication No. 2005/050754 特開平10−125930号公報Japanese Unexamined Patent Publication No. 10-125930

本発明は、前記事情に鑑みてなされたものであり、フレキシブル電子デバイスの樹脂基板に損傷を与えることなく剥離することができる剥離層形成用組成物を提供することを目的とする。 The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a composition for forming a release layer that can be peeled off without damaging the resin substrate of a flexible electronic device.

本発明者らは、前記課題を解決すべく鋭意検討を重ねた結果、芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含む組成物において、前記芳香族ジアミンがエステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物がエステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含む場合に、基体との優れた密着性、及びフレキシブル電子デバイスとして用いられる樹脂基板との適度な密着性と適度な剥離性とを有する剥離層を形成できる組成物が得られることを見出し、本発明を完成させた。 As a result of diligent studies to solve the above problems, the present inventors have made a composition containing a polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic acid dianhydride and an organic solvent. The aromatic tetracarboxylic acid dianhydride contains an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic acid dianhydride contains at least one of an ester bond and an ether bond. When an anhydride is contained, a composition capable of forming a release layer having excellent adhesion to a substrate, appropriate adhesion to a resin substrate used as a flexible electronic device, and appropriate peelability can be obtained. Find out and complete the present invention.

すなわち、本発明は、下記剥離層形成用組成物を提供する。
1.芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られる重量平均分子量が15,000〜200,000のポリアミック酸、及び有機溶媒を含み、
前記芳香族ジアミンが、エーテル結合を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エーテル結合を含む芳香族テトラカルボン酸二無水物を含むことを特徴とする剥離層形成用組成物(ただし、前記ポリアミック酸は、2,2'−ジメチルベンジジンと、1,3−ビス(4−アミノフェノキシ)ベンゼンと、ピロメリット酸二無水物と、3,3',4,4'−ビフェニルテトラカルボン酸二無水物とを反応させて得られるものを含まない。)
2.前記エーテル結合を含む芳香族ジアミンが、式(A1)〜(A3)、(A7)〜(A12)、(A25)〜(A33)及び(A40)〜(A42)からなる群から選ばれる少なくとも1種である1の剥離層形成用組成物。

Figure 0006939862
Figure 0006939862
Figure 0006939862
Figure 0006939862
3.前記エーテル結合を含む芳香族ジアミンが、式(A8)、(A9)、(A11)、(A26)〜(A33)及び(A40)〜(A42)からなる群から選ばれる少なくとも1種である2の剥離層形成用組成物。
.前記エーテル結合を含む芳香族テトラカルボン酸二無水物が、式(B3)、(B4)、(B8)〜(B10)及び(B12)〜(B14)からなる群から選ばれる少なくとも1種である1〜3のいずれかの剥離層形成用組成物。
Figure 0006939862
5.前記エーテル結合を含む芳香族テトラカルボン酸二無水物が、式(B3)、(B4)及び(B8)〜(B10)からなる群から選ばれる少なくとも1種である4の剥離層形成用組成物。
.前記芳香族テトラカルボン酸二無水物が、更にエステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物を含む1〜のいずれかの剥離層形成用組成物。
.前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、ベンゼン骨格、ナフチル骨格又はビフェニル骨格を含むものであるの剥離層形成用組成物。
.前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、式(C1)〜(C12)からなる群から選ばれる少なくとも1種であるの剥離層形成用組成物。
Figure 0006939862
.前記有機溶媒が、式(S1)で表されるアミド類、式(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1つを含む1〜のいずれかの剥離層形成用組成物。
Figure 0006939862
(式中、R1及びR2は、互いに独立して、炭素数1〜10のアルキル基を表す。R3は、水素原子、又は炭素数1〜10のアルキル基を表す。hは、自然数を表す。)
10.1〜のいずれかの剥離層形成用組成物を用いて形成される剥離層。
1110の剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法。
10の剥離層を用いることを特徴とする、樹脂基板を備えるタッチパネルセンサーの製造方法。
.前記樹脂基板が、ポリイミドからなる基板である11又は1の製造方法。 That is, the present invention provides the following composition for forming a release layer.
1. 1. It contains a polyamic acid having a weight average molecular weight of 15,000 to 200,000 obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent.
Peeling characterized in that the aromatic diamine comprises an aromatic diamine comprising an ether bond and / or the aromatic tetracarboxylic acid dianhydride comprises an aromatic tetracarboxylic acid dianhydride comprising an ether bond. Layer-forming composition (where the polyamic acid is 2,2'-dimethylbenzidine, 1,3-bis (4-aminophenoxy) benzene, pyromellitic acid dianhydride, 3,3', 4 , 4'-Does not include those obtained by reacting with biphenyltetracarboxylic acid dianhydride.)
2. The aromatic diamine containing the ether bond is at least one selected from the group consisting of the formulas (A1) to (A3), (A7) to (A12), (A25) to (A33) and (A40) to (A42). The composition for forming a release layer of 1 which is a seed.
Figure 0006939862
Figure 0006939862
Figure 0006939862
Figure 0006939862
3. 3. The aromatic diamine containing an ether bond is at least one selected from the group consisting of formulas (A8), (A9), (A11), (A26) to (A33) and (A40) to (A42) 2 Composition for forming a release layer.
4 . The aromatic tetracarboxylic dianhydride containing the ether bond is at least one selected from the group consisting of the formulas (B3), (B4), (B8) to (B10) and (B12) to (B14). The composition for forming a release layer according to any one of 1 to 3.
Figure 0006939862
5. The composition for forming a release layer of 4 in which the aromatic tetracarboxylic dianhydride containing the ether bond is at least one selected from the group consisting of the formulas (B3), (B4) and (B8) to (B10). ..
6 . The composition for forming a release layer according to any one of 1 to 5 , wherein the aromatic tetracarboxylic acid dianhydride further contains an aromatic tetracarboxylic acid dianhydride containing neither an ester bond nor an ether bond.
7 . 6. The composition for forming an exfoliation layer of 6 , wherein the aromatic tetracarboxylic acid dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton or a biphenyl skeleton.
8 . The composition for forming a release layer of 7 , wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of the formulas (C1) to (C12).
Figure 0006939862
9 . Any of 1 to 8 in which the organic solvent contains at least one selected from amides represented by the formula (S1), amides represented by the formula (S2) and amides represented by the formula (S3). Composition for forming a release layer.
Figure 0006939862
(In the formula, R 1 and R 2 represent an alkyl group having 1 to 10 carbon atoms independently of each other. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. H is a natural number. Represents.)
10 . A release layer formed by using the composition for forming a release layer according to any one of 1 to 9.
11 . A method for manufacturing a flexible electronic device including a resin substrate, which comprises using 10 release layers.
1 2 . A method for manufacturing a touch panel sensor including a resin substrate, which comprises using 10 release layers.
1 3 . It said resin substrate, 11 or 1 second manufacturing method is a substrate made of polyimide.

本発明の剥離層形成用組成物を用いることで、基体との優れた密着性、及び樹脂基板との適度な密着性と適度な剥離性とを有する膜を再現性よく得ることができる。本発明の組成物を用いることで、フレキシブル電子デバイスの製造プロセスにおいて、基体上に形成された樹脂基板や、更にその上に設けられる回路等に損傷を与えることなく、当該回路等とともに当該樹脂基板を当該基体から分離することが可能となる。したがって、本発明の剥離層形成用組成物は、樹脂基板を備えるフレキシブル電子デバイスの製造プロセスの簡便化やその歩留り向上等に寄与し得る。 By using the composition for forming a release layer of the present invention, it is possible to obtain a film having excellent adhesion to a substrate, appropriate adhesion to a resin substrate, and appropriate peelability with good reproducibility. By using the composition of the present invention, in the manufacturing process of the flexible electronic device, the resin substrate formed on the substrate and the circuit and the like provided on the substrate are not damaged, and the resin substrate is combined with the circuit and the like. Can be separated from the substrate. Therefore, the composition for forming a release layer of the present invention can contribute to the simplification of the manufacturing process of the flexible electronic device including the resin substrate and the improvement of the yield thereof.

実施例4で測定した透過率を示すグラフである。It is a graph which shows the transmittance measured in Example 4.

以下、本発明について、より詳細に説明する。
本発明の剥離層形成用組成物は、芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含むものであって、前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むものである。ここで、本発明における剥離層とは、所定の目的でガラス基体直上に設けられる層であって、その典型例としては、フレキシブル電子デバイスの製造プロセスにおいて、基体と、ポリイミドといった樹脂からなるフレキシブル電子デバイスの樹脂基板との間に、当該樹脂基板を所定のプロセス中において固定するために設けられ、かつ、当該樹脂基板上に電子回路等の形成した後において当該樹脂基板が当該基体から容易に剥離できるようにするために設けられるものが挙げられる。
Hereinafter, the present invention will be described in more detail.
The composition for forming a release layer of the present invention contains a polyamic acid obtained by reacting an aromatic diamine with an aromatic tetracarboxylic acid dianhydride, and an organic solvent, and the aromatic diamine is an ester. An aromatic tetracarboxylic acid dianhydride comprising at least one of a bond and an ether bond and / or said aromatic tetracarboxylic acid dianhydride comprising at least one of an ester bond and an ether bond. .. Here, the release layer in the present invention is a layer provided directly above the glass substrate for a predetermined purpose, and as a typical example thereof, in the manufacturing process of a flexible electronic device, a flexible electron composed of a substrate and a resin such as polyimide is used. The resin substrate is provided between the device and the resin substrate in order to fix the resin substrate in a predetermined process, and the resin substrate is easily peeled off from the substrate after an electronic circuit or the like is formed on the resin substrate. Some are provided to enable this.

前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンは、その分子内にエステル結合及びエーテル結合の一方を含むか、あるいはこれらの両方を含むものである。 The aromatic diamine containing at least one of the ester bond and the ether bond contains one of the ester bond and the ether bond in the molecule, or contains both of them.

このような芳香族ジアミンとしては、複数の炭素数6〜20の芳香族環がエステル結合又はエーテル結合で連結された構造を有するジアミンが挙げられる。前記芳香族環の具体例としては、ベンゼン環、ナフタレン環、アントラセン環、フェナントレン環等が挙げられる。中でも、ポリアミック酸の有機溶媒への溶解性を確保する観点から、2又は3個の芳香族環が、エステル結合又はエーテル結合で連結された構造を有するジアミンが好ましい。 Examples of such an aromatic diamine include diamines having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are linked by an ester bond or an ether bond. Specific examples of the aromatic ring include a benzene ring, a naphthalene ring, an anthracene ring, a phenanthrene ring, and the like. Among them, a diamine having a structure in which two or three aromatic rings are linked by an ester bond or an ether bond is preferable from the viewpoint of ensuring the solubility of the polyamic acid in an organic solvent.

本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンの好ましい具体例としては、以下に示すものが挙げられる。 In the present invention, preferred specific examples of the aromatic diamine containing at least one of an ester bond and an ether bond include those shown below.

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物は、その分子内にエステル結合とエーテル結合の一方を含むか、あるいはこれらの両方ともを含むものである。 The aromatic tetracarboxylic dianhydride containing at least one of the ester bond and the ether bond contains one or both of the ester bond and the ether bond in the molecule.

このような芳香族テトラカルボン酸二無水物としては、複数の炭素数6〜20の芳香族環がエステル結合又はエーテル結合で連結された構造を有するテトラカルボン酸二無水物が挙げられる。前記芳香族環の具体例としては、前記と同様のものが挙げられる。中でも、ポリアミック酸の有機溶媒への溶解性を確保する観点から、3又は4個の芳香族環がエステル結合又はエーテル結合で連結された構造を有するものが好ましい。 Examples of such aromatic tetracarboxylic acid dianhydride include tetracarboxylic acid dianhydride having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are linked by an ester bond or an ether bond. Specific examples of the aromatic ring include the same as described above. Among them, those having a structure in which 3 or 4 aromatic rings are linked by an ester bond or an ether bond are preferable from the viewpoint of ensuring the solubility of the polyamic acid in an organic solvent.

本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物の好ましい具体例としては、以下に示すものが挙げられる。 In the present invention, preferred specific examples of the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond include those shown below.

Figure 0006939862
Figure 0006939862

本発明においては、前述したエステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンとともに、それ以外のジアミンを用いることができる。 In the present invention, other diamines can be used together with the aromatic diamine containing at least one of the ester bond and the ether bond described above.

このようなジアミンは、脂肪族ジアミン、芳香族ジアミンのいずれでもよいが、得られる薄膜の強度と耐熱性を確保する観点から、エステル結合及びエーテル結合のいずれも含まない芳香族ジアミンが好ましい。 Such a diamine may be either an aliphatic diamine or an aromatic diamine, but from the viewpoint of ensuring the strength and heat resistance of the obtained thin film, an aromatic diamine containing neither an ester bond nor an ether bond is preferable.

その具体例としては、1,4−ジアミノベンゼン(p−フェニレンジアミン)、1,3−ジアミノベンゼン(m−フェニレンジアミン)、1,2−ジアミノベンゼン(o−フェニレンジアミン)、2,4−ジアミノトルエン、2,5−ジアミノトルエン、2,6−ジアミノトルエン、4,6−ジメチル−m−フェニレンジアミン、2,5−ジメチル−p−フェニレンジアミン、2,6−ジメチル−p−フェニレンジアミン、2,4,6−トリメチル−1,3−フェニレンジアミン、2,3,5,6−テトラメチル−p−フェニレンジアミン、m−キシリレンジアミン、p−キシリレンジアミン、5−トリフルオロメチルベンゼン−1,3−ジアミン、5−トリフルオロメチルベンゼン−1,2−ジアミン、3,5−ビス(トリフルオロメチル)ベンゼン−1,2−ジアミン等のベンゼン核を1つ含むジアミン;1,2−ナフタレンジアミン、1,3−ナフタレンジアミン、1,4−ナフタレンジアミン、1,5−ナフタレンジアミン、1,6−ナフタレンジアミン、1,7−ナフタレンジアミン、1,8−ナフタレンジアミン、2,3−ナフタレンジアミン、2,6−ナフタレンジアミン、4,4'−ビフェニルジアミン、2,2'−ビス(トリフルオロメチル)−4,4'−ジアミノビフェニル、3,3'−ジメチル−4,4'−ジアミノジフェニルメタン、3,3'−ジカルボキシ−4,4'−ジアミノジフェニルメタン、3,3',5,5'−テトラメチル−4,4'−ジアミノジフェニルメタン、4,4'−ジアミノベンズアニリド、3,3'−ジクロロベンジジン、3,3'−ジメチルベンジジン、2,2'−ジメチルベンジジン、3,3'−ジアミノジフェニルメタン、3,4'−ジアミノジフェニルメタン、4,4'−ジアミノジフェニルメタン、2,2−ビス(3−アミノフェニル)プロパン、2,2−ビス(4−アミノフェニル)プロパン、2,2−ビス(3−アミノフェニル)−1,1,1,3,3,3−ヘキサフルオロプロパン、2,2−ビス(4−アミノフェニル)−1,1,1,3,3,3−ヘキサフルオロプロパン、3,3'−ジアミノジフェニルスルホキシド、3,4'−ジアミノジフェニルスルホキシド、4,4'−ジアミノジフェニルスルホキシド、3,3'−ビス(トリフルオロメチル)ビフェニル−4,4'−ジアミン、3,3',5,5'−テトラフルオロビフェニル−4,4'−ジアミン、4,4'−ジアミノオクタフルオロビフェニル等のベンゼン核を2つ含むジアミン;1,5−ジアミノアントラセン、2,6−ジアミノアントラセン、9,10−ジアミノアントラセン、1,8−ジアミノフェナントレン、2,7−ジアミノフェナントレン、3,6−ジアミノフェナントレン、9,10−ジアミノフェナントレン、1,3−ビス(3−アミノフェニル)ベンゼン、1,3−ビス(4−アミノフェニル)ベンゼン、1,4−ビス(3−アミノフェニル)ベンゼン、1,4−ビス(4−アミノフェニル)ベンゼン、1,3−ビス(3−アミノフェニルスルフィド)ベンゼン、1,3−ビス(4−アミノフェニルスルフィド)ベンゼン、1,4−ビス(4−アミノフェニルスルフィド)ベンゼン、1,3−ビス(3−アミノフェニルスルホン)ベンゼン、1,3−ビス(4−アミノフェニルスルホン)ベンゼン、1,4−ビス(4−アミノフェニルスルホン)ベンゼン、1,3−ビス[2−(4−アミノフェニル)イソプロピル]ベンゼン、1,4−ビス[2−(3−アミノフェニル)イソプロピル]ベンゼン、1,4−ビス[2−(4−アミノフェニル)イソプロピル]ベンゼン等のベンゼン核を3つ含むジアミン等が挙げられるが、これらに限定されない。これらは、1種単独でも、2種以上を組み合わせて用いることもできる。 Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), 1,2-diaminobenzene (o-phenylenediamine), and 2,4-diamino. Toluene, 2,5-diaminotoluene, 2,6-diaminotoluene, 4,6-dimethyl-m-phenylenediamine, 2,5-dimethyl-p-phenylenediamine, 2,6-dimethyl-p-phenylenediamine, 2, , 4,6-trimethyl-1,3-phenylenediamine, 2,3,5,6-tetramethyl-p-phenylenediamine, m-xylylene diamine, p-xylylene diamine, 5-trifluoromethylbenzene-1 , 3-Diamine, 5-trifluoromethylbenzene-1,2-diamine, 3,5-bis (trifluoromethyl) benzene-1,2-diamine and other diamines containing one benzene nucleus; 1,2-naphthalene Diamine, 1,3-naphthalenediamine, 1,4-naphthalenediamine, 1,5-naphthalenediamine, 1,6-naphthalenediamine, 1,7-naphthalenediamine, 1,8-naphthalenediamine, 2,3-naphthalenediamine 2,6-naphthalenediamine, 4,4'-biphenyldiamine, 2,2'-bis (trifluoromethyl) -4,4'-diaminobiphenyl, 3,3'-dimethyl-4,4'-diaminodiphenylmethane 3,3'-Dicarboxy-4,4'-diaminodiphenylmethane, 3,3', 5,5'-tetramethyl-4,4'-diaminodiphenylmethane, 4,4'-diaminobenzanilide, 3,3 '-Dichlorobenzidine, 3,3'-dimethylbenzidine, 2,2'-dimethylbenzidine, 3,3'-diaminodiphenylmethane, 3,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylmethane, 2,2-bis (3-Aminophenyl) propane, 2,2-bis (4-aminophenyl) propane, 2,2-bis (3-aminophenyl) -1,1,1,1,3,3,3-hexafluoropropane, 2 , 2-Bis (4-aminophenyl) -1,1,1,3,3,3-hexafluoropropane, 3,3'-diaminodiphenyl sulfoxide, 3,4'-diaminodiphenyl sulfoxide, 4,4'- Diaminodiphenyl sulfoxide, 3,3'-bis (trifluoromethyl) biphenyl-4,4'-diamine, 3,3', 5,5'-tetrafluorobiphenyl-4,4' -Diamine, a diamine containing two benzene nuclei such as 4,4'-diaminooctafluorobiphenyl; 1,5-diaminoanthracene, 2,6-diaminoanthracene, 9,10-diaminoanthracene, 1,8-diaminophenanthrene, 2,7-Diaminophenanthrene, 3,6-diaminophenanthrene, 9,10-diaminophenanthrene, 1,3-bis (3-aminophenyl) benzene, 1,3-bis (4-aminophenyl) benzene, 1,4 -Bis (3-aminophenyl) benzene, 1,4-bis (4-aminophenyl) benzene, 1,3-bis (3-aminophenyl sulfide) benzene, 1,3-bis (4-aminophenyl sulfide) benzene 1,4-Bis (4-aminophenylsulfide) benzene, 1,3-bis (3-aminophenylsulfone) benzene, 1,3-bis (4-aminophenylsulfone) benzene, 1,4-bis (4) −Aminophenylsulfone) Benzene, 1,3-bis [2- (4-aminophenyl) isopropyl] benzene, 1,4-bis [2- (3-aminophenyl) isopropyl] benzene, 1,4-bis [2 -(4-Aminophenyl) isopropyl] Diamine containing three benzene nuclei such as benzene can be mentioned, but is not limited thereto. These can be used alone or in combination of two or more.

本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンとともに、それ以外のジアミンを用いる場合、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンの使用量は、全ジアミン中、好ましくは70モル%以上、より好ましくは80モル%以上、より一層好ましくは90モル%以上、更に好ましくは95モル%以上である。このような使用量を採用することで、基体との優れた密着性、及び樹脂基板との適度な密着性と適度な剥離性とを有する膜を再現性よく得ることができる。 In the present invention, when other diamines are used together with the aromatic diamine containing at least one of the ester bond and the ether bond, the amount of the aromatic diamine containing at least one of the ester bond and the ether bond is preferably used in the total diamine. Is 70 mol% or more, more preferably 80 mol% or more, even more preferably 90 mol% or more, still more preferably 95 mol% or more. By adopting such a usage amount, it is possible to obtain a film having excellent adhesion to the substrate, appropriate adhesion to the resin substrate, and appropriate peelability with good reproducibility.

本発明においては、前述したエステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物とともに、それ以外のテトラカルボン酸二無水物を用いることができる。 In the present invention, other tetracarboxylic acid dianhydrides can be used together with the aromatic tetracarboxylic acid dianhydride containing at least one of the ester bond and the ether bond described above.

このようなテトラカルボン酸二無水物は、脂肪族テトラカルボン酸二無水物、芳香族テトラカルボン酸二無水物のいずれでもよいが、得られる薄膜の強度と耐熱性を確保する観点から、エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が好ましい。 Such a tetracarboxylic acid dianhydride may be either an aliphatic tetracarboxylic acid dianhydride or an aromatic tetracarboxylic acid dianhydride, but from the viewpoint of ensuring the strength and heat resistance of the obtained thin film, an ester bond is used. And aromatic tetracarboxylic acid dianhydride containing neither ether bond is preferable.

その具体例としては、ピロメリット酸二無水物、ベンゼン−1,2,3,4−テトラカルボン酸二無水物、ナフタレン−1,2,3,4−テトラカルボン酸二無水物、ナフタレン−1,2,5,6−テトラカルボン酸二無水物、ナフタレン−1,2,6,7−テトラカルボン酸二無水物、ナフタレン−1,2,7,8−テトラカルボン酸二無水物、ナフタレン−2,3,5,6−テトラカルボン酸二無水物、ナフタレン−2,3,6,7−テトラカルボン酸二無水物、ナフタレン−1,4,5,8−テトラカルボン酸二無水物、ビフェニル−2,2',3,3'−テトラカルボン酸二無水物、ビフェニル−2,3,3',4'−テトラカルボン酸二無水物、ビフェニル−3,3',4,4'−テトラカルボン酸二無水物、アントラセン−1,2,3,4−テトラカルボン酸二無水物、アントラセン−1,2,5,6−テトラカルボン酸二無水物、アントラセン−1,2,6,7−テトラカルボン酸二無水物、アントラセン−1,2,7,8−テトラカルボン酸二無水物、アントラセン−2,3,6,7−テトラカルボン酸二無水物、フェナントレン−1,2,3,4−テトラカルボン酸二無水物、フェナントレン−1,2,5,6−テトラカルボン酸二無水物、フェナントレン−1,2,6,7−テトラカルボン酸二無水物、フェナントレン−1,2,7,8−テトラカルボン酸二無水物、フェナントレン−1,2,9,10−テトラカルボン酸二無水物、フェナントレン−2,3,5,6−テトラカルボン酸二無水物、フェナントレン−2,3,6,7−テトラカルボン酸二無水物、フェナントレン−2,3,9,10−テトラカルボン酸二無水物、フェナントレン−3,4,5,6−テトラカルボン酸二無水物、フェナントレン−3,4,9,10−テトラカルボン酸二無水物等が挙げられるが、これらに限定されない。これらは、1種単独でも、2種以上を組み合わせて用いることもできる。 Specific examples thereof include pyromellitic acid dianhydride, benzene-1,2,3,4-tetracarboxylic acid dianhydride, naphthalene-1,2,3,4-tetracarboxylic acid dianhydride, and naphthalene-1. , 2,5,6-Tetracarboxylic acid dianhydride, naphthalene-1,2,6,7-tetracarboxylic acid dianhydride, naphthalene-1,2,7,8-tetracarboxylic acid dianhydride, naphthalene- 2,3,5,6-Tetracarboxylic acid dianhydride, naphthalene-2,3,6,7-tetracarboxylic acid dianhydride, naphthalene-1,4,5,8-tetracarboxylic acid dianhydride, biphenyl -2,2', 3,3'-tetracarboxylic acid dianhydride, biphenyl-2,3,3', 4'-tetracarboxylic acid dianhydride, biphenyl-3,3', 4,4'-tetra Carous acid dianhydride, anthracene-1,2,3,4-tetracarboxylic acid dianhydride, anthracene-1,2,5,6-tetracarboxylic acid dianhydride, anthracene-1,2,6,7- Tetracarboxylic acid dianhydride, anthracene-1,2,7,8-tetracarboxylic acid dianhydride, anthracene-2,3,6,7-tetracarboxylic acid dianhydride, phenanthrene-1,2,3,4 -Tetracarboxylic acid dianhydride, phenanthrene-1,2,5,6-tetracarboxylic acid dianhydride, phenanthrene-1,2,6,7-tetracarboxylic acid dianhydride, phenanthrene-1,2,7, 8-Tetracarboxylic acid dianhydride, phenanthrene-1,2,9,10-tetracarboxylic acid dianhydride, phenanthrene-2,3,5,6-tetracarboxylic acid dianhydride, phenanthrene-2,3,6 , 7-Tetracarboxylic acid dianhydride, phenanthrene-2,3,9,10-tetracarboxylic acid dianhydride, phenanthrene-3,4,5,6-tetracarboxylic acid dianhydride, phenanthrene-3,4, Examples include, but are not limited to, 9,10-tetracarboxylic acid dianhydride. These can be used alone or in combination of two or more.

特に、エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物としては、耐熱性を確保する観点から、式(C1)〜(C12)からなる群から選ばれる少なくとも1種が好ましく、式(C1)及び式(C9)からなる群から選ばれる少なくとも1種がより好ましい。 In particular, as the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond, at least one selected from the group consisting of the formulas (C1) to (C12) is preferable from the viewpoint of ensuring heat resistance. , At least one selected from the group consisting of the formula (C1) and the formula (C9) is more preferable.

Figure 0006939862
Figure 0006939862

本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物とともに、それ以外のテトラカルボン酸二無水物を用いる場合、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物の使用量は、全テトラカルボン酸二無水物中、好ましくは70モル%以上、より好ましくは80モル%以上、より一層好ましくは90モル%以上、更に好ましくは95モル%以上である。このような使用量を採用することで、基体との十分な密着性及び樹脂基板との適度な密着性と適度な剥離性を有する膜を再現性よく得ることができる。 In the present invention, when an aromatic tetracarboxylic acid dianhydride containing at least one of an ester bond and an ether bond is used together with another tetracarboxylic acid dianhydride, an aromatic tetracarbonate containing at least one of an ester bond and an ether bond is used. The amount of the carboxylic acid dianhydride used is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, still more preferably 95 mol% or more, based on the total tetracarboxylic acid dianhydride. Is. By adopting such a usage amount, it is possible to obtain a film having sufficient adhesion to the substrate, appropriate adhesion to the resin substrate, and appropriate peelability with good reproducibility.

以上説明したジアミンとテトラカルボン酸二無水物とを反応させることで、本発明に係る剥離層形成用組成物に含まれるポリアミック酸を得ることができる。 By reacting the diamine described above with the tetracarboxylic dianhydride, the polyamic acid contained in the composition for forming a release layer according to the present invention can be obtained.

このような反応に用いる有機溶媒は、反応に悪影響を及ぼさない限り特に限定されないが、その具体例としては、m−クレゾール、2−ピロリドン、N−メチル−2−ピロリドン、N−エチル−2−ピロリドン、N−ビニル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、3−メトキシ−N,N−ジメチルプロピルアミド、3−エトキシ−N,N−ジメチルプロピルアミド、3−プロポキシ−N,N−ジメチルプロピルアミド、3−イソプロポキシ−N,N−ジメチルプロピルアミド、3−ブトキシ−N,N−ジメチルプロピルアミド、3−sec−ブトキシ−N,N−ジメチルプロピルアミド、3−tert−ブトキシ−N,N−ジメチルプロピルアミド、γ−ブチロラクトン等が挙げられる。なお、有機溶媒は、1種単独で又は2種以上を組み合わせて使用してもよい。 The organic solvent used for such a reaction is not particularly limited as long as it does not adversely affect the reaction, and specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, and N-ethyl-2-. Pyrrolidone, N-vinyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 3-methoxy-N, N-dimethylpropylamide, 3-ethoxy-N, N-dimethylpropylamide, 3- Propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N-dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec-butoxy-N, N-dimethylpropylamide, 3 -Tart-butoxy-N, N-dimethylpropylamide, γ-butyrolactone and the like can be mentioned. The organic solvent may be used alone or in combination of two or more.

特に、反応に用いる有機溶媒は、ジアミン及びテトラカルボン酸二無水物並びにポリアミック酸をよく溶解することから、式(S1)で表されるアミド類、(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1種が好ましい。 In particular, since the organic solvent used in the reaction dissolves diamine, tetracarboxylic dianhydride and polyamic acid well, the amides represented by the formula (S1), the amides represented by the formula (S2) and the formula (S2). At least one selected from the amides represented by S3) is preferable.

Figure 0006939862
Figure 0006939862

式中、R1及びR2は、互いに独立して、炭素数1〜10のアルキル基を表す。R3は、水素原子、又は炭素数1〜10のアルキル基を表す。hは、自然数を表すが、好ましくは1〜3、より好ましくは1又は2である。 In the formula, R 1 and R 2 represent alkyl groups having 1 to 10 carbon atoms independently of each other. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number, preferably 1 to 3, more preferably 1 or 2.

炭素数1〜10のアルキル基としては、メチル基、エチル基、n−プロピル基、イソプロピル基、n−ブチル基、イソブチル基、s−ブチル基、t−ブチル基、n−ペンチル基、n−ヘキシル基、n−ヘプチル基、n−オクチル基、n−ノニル基、n−デシル基等が挙げられる。これらのうち、炭素数1〜3のアルキル基が好ましく、炭素数1又は2のアルキル基がより好ましい。 Alkyl groups having 1 to 10 carbon atoms include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group and n-. Examples thereof include a hexyl group, an n-heptyl group, an n-octyl group, an n-nonyl group and an n-decyl group. Of these, an alkyl group having 1 to 3 carbon atoms is preferable, and an alkyl group having 1 or 2 carbon atoms is more preferable.

反応温度は、用いる溶媒の融点から沸点までの範囲で適宜設定すればよく、通常0〜100℃程度であるが、得られるポリアミック酸の溶液中でのイミド化を防いでポリアミック酸単位の高含有量を維持するためには、好ましくは0〜70℃程度であり、より好ましくは0〜60℃程度であり、より一層好ましくは0〜50℃程度である。 The reaction temperature may be appropriately set in the range from the melting point to the boiling point of the solvent to be used, and is usually about 0 to 100 ° C., but imidization in the obtained polyamic acid solution is prevented and the polyamic acid unit is high. In order to maintain the amount, it is preferably about 0 to 70 ° C, more preferably about 0 to 60 ° C, and even more preferably about 0 to 50 ° C.

反応時間は、反応温度や原料物質の反応性に依存するため一概に規定できないが、通常1〜100時間程度である。 The reaction time cannot be unconditionally defined because it depends on the reaction temperature and the reactivity of the raw material, but it is usually about 1 to 100 hours.

以上説明した方法によって、目的とするポリアミック酸を含む反応溶液を得ることができる。 By the method described above, a reaction solution containing the desired polyamic acid can be obtained.

前記ポリアミック酸の重量平均分子量は、5,000〜1,000,000が好ましく、10,000〜500,000がより好ましく、ハンドリング性の観点から15,000〜200,000がより一層好ましい。なお、本発明において重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)分析による標準ポリスチレン換算で得られる平均分子量である。 The weight average molecular weight of the polyamic acid is preferably 5,000 to 1,000,000, more preferably 10,000 to 500,000, and even more preferably 15,000 to 200,000 from the viewpoint of handleability. In the present invention, the weight average molecular weight is the average molecular weight obtained in terms of standard polystyrene by gel permeation chromatography (GPC) analysis.

本発明においては、通常、前記反応溶液をろ過した後、そのろ液をそのまま、又は希釈若しくは濃縮して得られる溶液を、本発明の剥離層形成用組成物として用いることができる。このようにすることで、得られる剥離層の密着性、剥離性等の悪化の原因となり得る不純物の混入を低減できるだけでなく、効率よく剥離層形成用組成物を得ることができる。また、前記反応溶液からポリアミック酸を単離した後、再度溶媒に溶解して剥離層形成用組成物としてもよい。この場合の溶媒としては、前述した反応に用いる有機溶媒等が挙げられる。 In the present invention, a solution obtained by filtering the reaction solution and then using the filtrate as it is or by diluting or concentrating the reaction solution can be used as the composition for forming a release layer of the present invention. By doing so, not only can the mixing of impurities that can cause deterioration of the adhesiveness and peelability of the obtained release layer be reduced, but also a composition for forming the release layer can be efficiently obtained. Further, after isolating the polyamic acid from the reaction solution, it may be dissolved in a solvent again to obtain a composition for forming a release layer. Examples of the solvent in this case include the organic solvent used in the above-mentioned reaction.

希釈に用いる溶媒は、特に限定されず、その具体例としては、前記反応の反応溶媒の具体例と同様のものが挙げられる。希釈に用いる溶媒は、1種単独で又は2種以上を組み合わせて使用してもよい。中でも、ポリアミック酸をよく溶解することから、N,N−ジメチルホルムアミド、N,N−ジメチルアセトアミド、N−メチル−2−ピロリドン、1,3−ジメチル−2−イミダゾリジノン、N−エチル−2−ピロリドン、γ−ブチロラクトンが好ましく、N−メチル−2−ピロリドンがより好ましい。 The solvent used for dilution is not particularly limited, and specific examples thereof include the same as the specific examples of the reaction solvent for the reaction. The solvent used for dilution may be used alone or in combination of two or more. Among them, N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, N-ethyl-2 because it dissolves polyamic acid well. -Pyrrolidone and γ-butyrolactone are preferable, and N-methyl-2-pyrrolidone is more preferable.

また、単独ではポリアミック酸を溶解しない溶媒であっても、ポリアミック酸が析出しない範囲であれば、本発明の剥離層形成用組成物に混合することができる。特に、エチルセロソルブ、ブチルセロソルブ、エチルカルビトール、ブチルカルビトール、エチルカルビトールアセテート、エチレングリコール、1−メトキシ−2−プロパノール、1−エトキシ−2−プロパノール、1−ブトキシ−2−プロパノール、1−フェノキシ−2−プロパノール、プロピレングリコールモノアセテート、プロピレングリコールジアセテート、プロピレングリコール−1−モノメチルエーテル−2−アセテート、プロピレングリコール−1−モノエチルエーテル−2−アセテート、ジプロピレングリコール、2−(2−エトキシプロポキシ)プロパノール、乳酸メチル、乳酸エチル、乳酸n−プロピル、乳酸n−ブチル、乳酸イソアミル等の低表面張力を有する溶媒を適度に混在させることができる。これにより、基板への塗布時に塗膜均一性が向上することが知られており、本発明の剥離層形成用組成物においても好適に用いられる。 Further, even if the solvent does not dissolve the polyamic acid by itself, it can be mixed with the composition for forming a release layer of the present invention as long as the polyamic acid does not precipitate. In particular, ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate, ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy-2-propanol, 1-phenoxy. -2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol-1-monoethyl ether-2-acetate, dipropylene glycol, 2- (2-ethoxy Propoxy) Solvents having low surface tension such as propanol, methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate, and isoamyl lactate can be appropriately mixed. It is known that this improves the uniformity of the coating film when it is applied to a substrate, and it is also preferably used in the composition for forming a release layer of the present invention.

本発明の剥離層形成用組成物におけるポリアミック酸の濃度は、作製する剥離層の厚み、組成物の粘度等を勘案して適宜設定するものではあるが、通常1〜30質量%程度、好ましくは1〜20質量%程度である。このような濃度とすることで、0.05〜5μm程度の厚さの剥離層を再現性よく得ることができる。なお、ポリアミック酸の濃度は、ポリアミック酸の原料であるジアミンとテトラカルボン酸二無水物の使用量を調整する、前記反応溶液をろ過した後そのろ液を希釈又は濃縮する、単離したポリアミック酸を溶媒に溶解させる際にその量を調整する等して調整することができる。 The concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30% by mass, preferably about 1 to 30% by mass. It is about 1 to 20% by mass. With such a concentration, a peeling layer having a thickness of about 0.05 to 5 μm can be obtained with good reproducibility. The concentration of the polyamic acid is adjusted by adjusting the amount of diamine and tetracarboxylic dianhydride used as raw materials of the polyamic acid, filtering the reaction solution and then diluting or concentrating the filtrate, and the isolated polyamic acid. Can be adjusted by adjusting the amount of the substance when it is dissolved in the solvent.

また、剥離層形成用組成物の粘度は、作製する剥離層の厚み等を勘案して適宜設定するものではあるが、特に0.05〜5μm程度の厚さの膜を再現性よく得ること目的とする場合、通常、25℃で10〜10,000mPa・s程度、好ましくは20〜5,000mPa・s程度である。ここで、粘度は、市販の液体の粘度測定用粘度計を使用して、例えば、JIS K7117−2に記載の手順を参照して、組成物の温度25℃の条件にて測定することができる。好ましくは、粘度計としては、円錐平板型(コーンプレート型)回転粘度計を使用し、好ましくは同型の粘度計で標準コーンロータとして1°34’×R24を使用して、組成物の温度25℃の条件にて測定することができる。このような回転粘度計としては、例えば、東機産業(株)製TVE−25Lが挙げられる。 The viscosity of the composition for forming a release layer is appropriately set in consideration of the thickness of the release layer to be produced, etc., but the purpose is to obtain a film having a thickness of about 0.05 to 5 μm with good reproducibility. In this case, it is usually about 10 to 10,000 mPa · s at 25 ° C., preferably about 20 to 5,000 mPa · s. Here, the viscosity can be measured using a commercially available viscometer for measuring the viscosity of a liquid, for example, with reference to the procedure described in JIS K7117-2, under the condition that the temperature of the composition is 25 ° C. .. Preferably, a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and 1 ° 34'x R24 is preferably used as the standard cone rotor with the same type viscometer, and the temperature of the composition is 25. It can be measured under the condition of ° C. Examples of such a rotational viscometer include TVE-25L manufactured by Toki Sangyo Co., Ltd.

なお、本発明に係る剥離層形成用組成物は、ポリアミック酸と有機溶媒のほかに、例えば膜強度を向上させるために、架橋剤等の成分を含んでもよい。 In addition to the polyamic acid and the organic solvent, the composition for forming a release layer according to the present invention may contain components such as a cross-linking agent in order to improve the film strength, for example.

以上説明した本発明の剥離層形成組成物を基体に塗布し、得られた塗膜を加熱してポリアミック酸を熱イミド化することで、基体との優れた密着性、及び樹脂基板との適度な密着性と適度な剥離性とを有するポリイミド膜からなる剥離層を得ることができる。 By applying the release layer forming composition of the present invention described above to a substrate and heating the obtained coating film to thermally imidize the polyamic acid, excellent adhesion to the substrate and appropriate adhesion to the resin substrate are obtained. It is possible to obtain a peeling layer made of a polyimide film having excellent adhesion and appropriate peeling property.

本発明の剥離層を基体上に形成する場合、剥離層は基体の一部表面に形成されていてもよいし、全面に形成されていてもよい。基体の一部表面に剥離層を形成する態様としては、基体表面のうち所定の範囲にのみ剥離層を形成する態様、基体表面全面にドットパターン、ラインアンドスペースパターン等のパターン状に剥離層を形成する態様等がある。なお、本発明において、基体とは、その表面に本発明に係る剥離層形成用組成物が塗られるものであって、フレキシブル電子デバイス等の製造に用いられるものを意味する。 When the release layer of the present invention is formed on a substrate, the release layer may be formed on a partial surface of the substrate or may be formed on the entire surface of the substrate. Examples of forming the release layer on a part of the surface of the substrate include forming the release layer only in a predetermined range on the surface of the substrate, and forming the release layer in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate. There are modes of formation and the like. In the present invention, the substrate means a substrate on which the composition for forming a release layer according to the present invention is coated, and is used for manufacturing a flexible electronic device or the like.

基体(基材)としては、例えば、ガラス、プラスチック(ポリカーボネート、ポリメタクリレート、ポリスチレン、ポリエステル、ポリオレフィン、エポキシ、メラミン、トリアセチルセルロース、ABS、AS、ノルボルネン系樹脂等)、金属(シリコンウエハ等)、木材、紙、スレート等が挙げられるが、特に、本発明に係る剥離層形成用組成物から得られる剥離層がそれに対する十分な密着性を有することから、ガラスが好ましい。なお、基体表面は、単一の材料で構成されていてもよく、2以上の材料で構成されていてもよい。2以上の材料で基体表面が構成される態様としては、基体表面のうち、ある範囲はある材料で構成され、その余の表面はその他の材料で構成されている態様、基体表面全体にドットパターン、ラインアンドスペースパターン等のパターン状にある材料がその他の材料中に存在する態様等がある。 Examples of the substrate (base material) include glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetyl cellulose, ABS, AS, norbornene resin, etc.), metal (silicon wafer, etc.), and the like. Examples thereof include wood, paper, and slate. In particular, glass is preferable because the release layer obtained from the release layer forming composition according to the present invention has sufficient adhesion to the release layer. The surface of the substrate may be made of a single material or may be made of two or more materials. A mode in which the surface of the substrate is composed of two or more materials is a mode in which a certain range of the surface of the substrate is composed of a certain material and the remaining surface is composed of other materials, and a dot pattern is formed on the entire surface of the substrate. , A pattern in which a patterned material such as a line-and-space pattern is present in other materials, and the like.

塗布する方法は、特に限定されないが、例えば、キャストコート法、スピンコート法、ブレードコート法、ディップコート法、ロールコート法、バーコート法、ダイコート法、インクジェット法、印刷法(凸版、凹版、平版、スクリーン印刷等)等が挙げられる。 The coating method is not particularly limited, but for example, a cast coating method, a spin coating method, a blade coating method, a dip coating method, a roll coating method, a bar coating method, a die coating method, an inkjet method, and a printing method (letter plate, intaglio plate, planographic plate). , Screen printing, etc.).

イミド化するための加熱温度は、通常50〜550℃の範囲内で適宜決定されるが、好ましくは200℃以上、また、好ましくは500℃以下である。加熱温度をこのようにすることで、得られる膜の脆弱化を防ぎつつ、イミド化反応を十分に進行させることが可能となる。加熱時間は、加熱温度によって異なるため一概に規定できないが、通常5分〜5時間である。また、イミド化率は、50〜100%の範囲であればよい。 The heating temperature for imidization is usually appropriately determined in the range of 50 to 550 ° C, but is preferably 200 ° C or higher, and preferably 500 ° C or lower. By setting the heating temperature in this way, it is possible to sufficiently proceed the imidization reaction while preventing the resulting film from becoming fragile. The heating time cannot be unconditionally specified because it varies depending on the heating temperature, but is usually 5 minutes to 5 hours. The imidization rate may be in the range of 50 to 100%.

本発明における加熱態様の好ましい一例としては、50〜100℃で5分間〜2時間加熱した後に、そのまま段階的に加熱温度を上昇させて最終的に375℃超〜450℃で30分〜4時間加熱する手法が挙げられる。特に、50〜100℃で5分間〜2時間加熱した後に、100℃超〜375℃で5分間〜2時間、最後に375℃超〜450℃で30分〜4時間加熱することが好ましい。 As a preferable example of the heating mode in the present invention, after heating at 50 to 100 ° C. for 5 minutes to 2 hours, the heating temperature is gradually increased as it is, and finally, the heating temperature is increased over 375 ° C. to 450 ° C. for 30 minutes to 4 hours. A method of heating can be mentioned. In particular, it is preferable to heat at 50 to 100 ° C. for 5 minutes to 2 hours, then at 100 ° C. to 375 ° C. for 5 minutes to 2 hours, and finally at 375 ° C. to 450 ° C. for 30 minutes to 4 hours.

加熱に用いる器具としては、例えば、ホットプレート、オーブン等が挙げられる。加熱雰囲気は、空気下であっても不活性ガス下であってもよく、また、常圧下であっても減圧下であってもよい。 Examples of the appliance used for heating include a hot plate, an oven, and the like. The heating atmosphere may be under air or under an inert gas, and may be under normal pressure or reduced pressure.

剥離層の厚さは、通常0.01〜50μm程度、生産性の観点から、好ましくは0.05〜20μm程度、より好ましくは0.05〜5μm程度であり、加熱前の塗膜の厚さを調整して所望の厚さを実現する。 The thickness of the release layer is usually about 0.01 to 50 μm, preferably about 0.05 to 20 μm, more preferably about 0.05 to 5 μm from the viewpoint of productivity, and the thickness of the coating film before heating. To achieve the desired thickness.

以上説明した剥離層は、基体、特にガラスの基体との優れた密着性及び樹脂基板との適度な密着性と適度な剥離性を有する。それ故、本発明に係る剥離層は、フレキシブル電子デバイスの製造プロセスにおいて、当該デバイスの樹脂基板に損傷を与えることなく、当該樹脂基板を、その樹脂基板上に形成された回路等とともに、基体から剥離させるために好適に用いることができる。 The release layer described above has excellent adhesion to a substrate, particularly a glass substrate, appropriate adhesion to a resin substrate, and appropriate peelability. Therefore, in the process of manufacturing a flexible electronic device, the release layer according to the present invention can be used to remove the resin substrate from the substrate together with a circuit or the like formed on the resin substrate without damaging the resin substrate of the device. It can be suitably used for peeling.

以下、本発明の剥離層を用いたフレキシブル電子デバイスの製造方法の一例について説明する。
本発明に係る剥離層形成用組成物を用いて、前述の方法によって、ガラス基体上に剥離層を形成する。この剥離層の上に、樹脂基板を形成するための樹脂溶液を塗布し、この塗膜を加熱することで、本発明に係る剥離層を介して、ガラス基体に固定された樹脂基板を形成する。この際、剥離層を全て覆うようにして、剥離層の面積と比較して大きい面積で、樹脂基板を形成する。前記樹脂基板としては、フレキシブル電子デバイスの樹脂基板として代表的なポリイミドからなる樹脂基板等が挙げられ、それを形成するための樹脂溶液としては、ポリイミド溶液やポリアミック酸溶液が挙げられる。当該樹脂基板の形成方法は、常法に従えばよい。
Hereinafter, an example of a method for manufacturing a flexible electronic device using the release layer of the present invention will be described.
Using the release layer forming composition according to the present invention, a release layer is formed on the glass substrate by the above-mentioned method. A resin solution for forming a resin substrate is applied onto the release layer, and the coating film is heated to form a resin substrate fixed to the glass substrate via the release layer according to the present invention. .. At this time, the resin substrate is formed with an area larger than the area of the release layer so as to cover the entire release layer. Examples of the resin substrate include a resin substrate made of polyimide, which is a typical resin substrate for flexible electronic devices, and examples of the resin solution for forming the resin substrate include a polyimide solution and a polyamic acid solution. The method for forming the resin substrate may be a conventional method.

次に、本発明に係る剥離層を介して基体に固定された当該樹脂基板の上に、所望の回路を形成し、その後、例えば剥離層に沿って樹脂基板をカットし、この回路とともに樹脂基板を剥離層から剥離して、樹脂基板と基体とを分離する。この際、基体の一部を剥離層とともにカットしてもよい。 Next, a desired circuit is formed on the resin substrate fixed to the substrate via the release layer according to the present invention, and then, for example, the resin substrate is cut along the release layer, and the resin substrate is cut together with this circuit. Is peeled off from the peeling layer to separate the resin substrate and the substrate. At this time, a part of the substrate may be cut together with the release layer.

一方、フレキシブルディスプレイの製造において、これまで高輝度LEDや三次元半導体パッケージ等の製造において使用されてきたレーザーリフトオフ法(LLO法)を用いてガラスキャリアからポリマー基板を好適に剥離できることが報告されている(特開2013−147599号公報)。フレキシブルディスプレイの製造では、ガラスキャリア上にポリイミド等からなるポリマー基板を設け、次にその基板の上に電極等を含む回路等を形成し、最終的にこの回路等とともに基板をガラスキャリアから剥離する必要がある。この剥離工程においてLLO法を採用し、すなわち、回路等が形成された面とは反対の面から、波長308nmの光線をガラスキャリアに照射すると、当該波長の光線がガラスキャリアを透過し、ガラスキャリア近傍のポリマー(ポリイミド)のみがこの光線を吸収して蒸発(昇華)する。その結果、ディスプレイの性能を決定づけることとなる、基板上に設けられた回路等に影響を与えることなく、ガラスキャリアからの基板の剥離を選択的に実行可能であると報告されている。 On the other hand, in the manufacture of flexible displays, it has been reported that the polymer substrate can be suitably peeled from the glass carrier by using the laser lift-off method (LLO method) which has been used in the manufacture of high-brightness LEDs and three-dimensional semiconductor packages. (Japanese Patent Laid-Open No. 2013-147599). In the manufacture of flexible displays, a polymer substrate made of polyimide or the like is provided on a glass carrier, then a circuit or the like including electrodes or the like is formed on the substrate, and finally the substrate is peeled off from the glass carrier together with this circuit or the like. There is a need. When the LLO method is adopted in this peeling step, that is, when a light beam having a wavelength of 308 nm is applied to the glass carrier from a surface opposite to the surface on which the circuit or the like is formed, the light ray having the wavelength is transmitted through the glass carrier and the glass carrier. Only the nearby polymer (polyimide) absorbs this light beam and evaporates (sublimates). As a result, it has been reported that the substrate can be selectively peeled from the glass carrier without affecting the circuits provided on the substrate, which determines the performance of the display.

本発明に係る剥離層を介して基体に固定された当該樹脂基板の上に、所望の回路を形成し、その後、LLO法を採用すると、該剥離層のみがこの光線を吸収して蒸発(昇華)する。すなわち、該剥離層が犠牲となり(犠牲層として働く)、ガラスキャリアからの基板の剥離を選択的に実行可能となる。本発明の剥離層形成用組成物は、LLO法の適用が可能となる特定波長(例えば308nm)の光線を十分に吸収するという特徴を持つため、LLO法の犠牲層として用いることができる。 When a desired circuit is formed on the resin substrate fixed to the substrate via the release layer according to the present invention and then the LLO method is adopted, only the release layer absorbs this light beam and evaporates (sublimates). )do. That is, the peeling layer is sacrificed (acts as a sacrificial layer), and the substrate can be selectively peeled from the glass carrier. The composition for forming a release layer of the present invention has a feature of sufficiently absorbing light rays having a specific wavelength (for example, 308 nm) to which the LLO method can be applied, and therefore can be used as a sacrificial layer of the LLO method.

以下、合成例、比較合成例、実施例及び比較例を挙げて本発明を更に詳細に説明するが、本発明は、これら実施例に限定されない。なお、下記例で使用した化合物の略称、及び数平均分子量及び重量平均分子量の測定方法は以下のとおりである。 Hereinafter, the present invention will be described in more detail with reference to Synthesis Examples, Comparative Synthesis Examples, Examples and Comparative Examples, but the present invention is not limited to these Examples. The abbreviations of the compounds used in the following examples and the methods for measuring the number average molecular weight and the weight average molecular weight are as follows.

<化合物の略称>
p−PDA:p−フェニレンジアミン
m−PDA:m−フェニレンジアミン
DATP:4,4''−ジアミノ−p−ターフェニル
DBA:3,5−ジアミノ安息香酸
HAB:3,3'−ジヒドロキシベンジジン
DDE:4,4'−オキシジアニリン
BAPB:4,4'−ビス(4−アミノフェノキシ)ビフェニル
FAPB:4,4'−ビス(4−アミノ−2−トリフルオロメチルフェノキシ)ビフェニル
APAB:5−アミノ−2−(4−アミノフェニル)−1H−ベンゾイミダゾール
APAB−E:4−アミノフェニル−4'−アミノベンゾエート
6FAP:2,2−ビス(3−アミノ−4−ヒドロキシフェニル)ヘキサフルオロプロパン
TFMB:2,2'−ビス(トリフルオロメチル)ビフェニル−4,4'−ジアミン
BPDA:3,3',4,4'−ビフェニルテトラカルボン酸二無水物
TAHQ:p−フェニレンビス(トリメリット酸モノエステル酸無水物)
PMDA:ピロメリット酸二無水物
BPTME:p−ビフェニレンビス(トリメリット酸モノエステル酸無水物)
BPODA:4,4'−(ビフェニル−4,4'−ジイルビスオキシ)ビスフタル酸二無水物
CF3−BP−TMA:N,N'−[2,2'−ビス(トリフルオロメチル)ビフェニル−4,4'−ジイル]ビス(1,3−ジオキソ−1,3−ジヒドロイソベンゾフラン−5−カルボアミド)
6FDA:4,4'−(ヘキサフルオロイソプロピリデン)ジフタル酸無水物
CBDA:1,2,3,4−シクロブタンテトラカルボン酸二無水物
IPBBT:N,N'−イソフタルビス(ベンゾオキサゾリン−2−チオン)
NMP:N−メチル−2−ピロリドン
BCS:ブチルセロソルブ
<Abbreviation of compound>
p-PDA: p-phenylenediamine m-PDA: m-phenylenediamine DATP: 4,4 '' -diamino-p-terphenyl DBA: 3,5-diaminobenzoate HAB: 3,3'-dihydroxybenzidine DDE: 4,4'-Oxydianiline BABP: 4,4'-bis (4-aminophenoxy) biphenyl FABP: 4,4'-bis (4-amino-2-trifluoromethylphenoxy) biphenyl APAB: 5-amino- 2- (4-Aminophenyl) -1H-benzoimidazole APAB-E: 4-aminophenyl-4'-aminobenzoate 6FAP: 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane TFMB: 2 , 2'-bis (trifluoromethyl) biphenyl-4,4'-diamine BPDA: 3,3', 4,4'-biphenyltetracarboxylic acid dianhydride TAHQ: p-phenylenebis (trimeritic acid monoesteric acid) (Anhydrous)
PMDA: pyromellitic acid dianhydride BPTME: p-biphenylene bis (trimellitic acid monoesteric anhydride)
BPODA: 4,4'-(biphenyl-4,4'-diylbisoxy) bisphthalic dianhydride CF3-BP-TMA: N, N'-[2,2'-bis (trifluoromethyl) biphenyl-4 , 4'-Diyl] bis (1,3-dioxo-1,3-dihydroisobenzofuran-5-carbamide)
6FDA: 4,4'-(hexafluoroisopropyridene) diphthalic acid anhydride CBDA: 1,2,3,4-cyclobutanetetracarboxylic dianhydride IPBBT: N, N'-isophthalic acid (benzoxazoline-2-thione) )
NMP: N-methyl-2-pyrrolidone BCS: Butyl cellosolve

<重量平均分子量及び分子量分布の測定>
ポリマーの重量平均分子量(Mw)及び分子量分布(Mw/Mn)の測定は、日本分光(株)製GPC装置(カラム:昭和電工(株)製OHpak SB803-HQ、及びOHpak SB804-HQ;溶離液:ジメチルホルムアミド/LiBr・H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1質量%);流量:1.0mL/分;カラム温度:40℃;Mw:標準ポリスチレン換算値)を用いて行った(以下の実施例及び比較例において、同じ)。
<Measurement of weight average molecular weight and molecular weight distribution>
The weight average molecular weight (Mw) and molecular weight distribution (Mw / Mn) of the polymer are measured by GPC equipment manufactured by JASCO Corporation (column: OHpak SB803-HQ and OHpak SB804-HQ manufactured by Showa Denko Corporation; eluent. : Dimethylformamide / LiBr · H 2 O (29.6 mM) / H 3 PO 4 (29.6 mM) / THF (0.1% by mass); Flow rate: 1.0 mL / min; Column temperature: 40 ° C; Mw: (Standard polystyrene conversion value) was used (the same applies to the following examples and comparative examples).

[1]ポリマーの合成
以下の方法によって、ポリアミック酸及びポリベンゾオキサゾール前駆体を合成した。
なお、得られたポリマー含有反応液からポリマーを単離せず、後述のとおり、反応溶液を希釈することで、樹脂基板形成用組成物又は剥離層形成用組成物を調製した。
[1] Polymer synthesis A polyamic acid and a polybenzoxazole precursor were synthesized by the following method.
The polymer was not isolated from the obtained polymer-containing reaction solution, and the reaction solution was diluted to prepare a resin substrate forming composition or a release layer forming composition as described later.

[合成例S1]ポリアミック酸S1の合成
p−PDA20.261g(187mmol)及びDATP12.206g(47mmol)をNMP617.4gに溶解させた。得られた溶液を15℃に冷却し、そこへPMDA50.112g(230mmol)を加え、窒素雰囲気下、50℃まで昇温し、48時間反応させ、ポリアミック酸S1を得た。ポリアミック酸S1のMwは82,100、Mw/Mnは2.7であった。
[Synthesis Example S1] Synthesis of polyamic acid S1 20.261 g (187 mmol) of p-PDA and 12.206 g (47 mmol) of DATP were dissolved in NMP 617.4 g. The obtained solution was cooled to 15 ° C., PMDA 50.112 g (230 mmol) was added thereto, the temperature was raised to 50 ° C. under a nitrogen atmosphere, and the mixture was reacted for 48 hours to obtain polyamic acid S1. The Mw of the polyamic acid S1 was 82,100, and the Mw / Mn was 2.7.

[合成例S2]ポリアミック酸S2の合成
p−PDA3.218g(30mmol)をNMP88.2gに溶解させた。得られた溶液にBPDA8.581g(29mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S2を得た。ポリアミック酸S2のMwは107,300、Mw/Mnは4.6であった。
[Synthesis Example S2] Synthesis of polyamic acid S2 3.218 g (30 mmol) of p-PDA was dissolved in 88.2 g of NMP. 8.581 g (29 mmol) of BPDA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid S2. The Mw of the polyamic acid S2 was 107,300, and the Mw / Mn was 4.6.

[合成例S3]ポリアミック酸S3の合成
TFMB17.8g(56mmol)、BAPB0.4g(1mmol)及びp−PDA2.5g(23mmol)をNMP430gに溶解させた。得られた溶液に、6FDA6.3g(14mmol)及びCF3−BP−TMA42.8g(64mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S3を得た。ポリアミック酸S3のMwは38,700、Mw/Mnは2.1であった。
[Synthesis Example S3] Synthesis of polyamic acid S3 17.8 g (56 mmol) of TFMB, 0.4 g (1 mmol) of BABP and 2.5 g (23 mmol) of p-PDA were dissolved in 430 g of NMP. To the obtained solution, 6.3 g (14 mmol) of 6FDA and 42.8 g (64 mmol) of CF3-BP-TMA were added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid S3. The Mw of the polyamic acid S3 was 38,700, and the Mw / Mn was 2.1.

[合成例S4]ポリアミック酸S4の合成
DDE30.6g(153mmol)をNMP440gに溶解させた。得られた溶液にCBDA29.4g(150mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S4を得た。ポリアミック酸S4のMwは29,800、Mw/Mnは2.2であった。
[Synthesis Example S4] Synthesis of polyamic acid S4 30.6 g (153 mmol) of DDE was dissolved in 440 g of NMP. 29.4 g (150 mmol) of CBDA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid S4. The Mw of the polyamic acid S4 was 29,800, and the Mw / Mn was 2.2.

[合成例L1]ポリアミック酸L1の合成
p−PDA2.054g(19mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.946g(19mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L1を得た。ポリアミック酸L1のMwは57,500、Mw/Mnは3.0であった。
[Synthesis Example L1] Synthesis of polyamic acid L1 2.054 g (19 mmol) of p-PDA was dissolved in 88 g of NMP. 9.946 g (19 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L1. The Mw of the polyamic acid L1 was 57,500, and the Mw / Mn was 3.0.

[合成例L2]ポリアミック酸L2の合成
p−PDA1.836g(17mmol)及びDBA0.287g(1.9mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.878g(18mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L2を得た。ポリアミック酸L2のMwは65,100、Mw/Mnは3.0であった。
[Synthesis Example L2] Synthesis of polyamic acid L2 1.836 g (17 mmol) of p-PDA and 0.287 g (1.9 mmol) of DBA were dissolved in 88 g of NMP. 9.878 g (18 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L2. The Mw of the polyamic acid L2 was 65,100, and the Mw / Mn was 3.0.

[合成例L3]ポリアミック酸L3の合成
p−PDA1.367g(13mmol)及びHAB1.172g(5.4mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.461g(18mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L3を得た。ポリアミック酸L3のMwは43,600、Mw/Mn2.6であった。
[Synthesis Example L3] Synthesis of polyamic acid L3 1.367 g (13 mmol) of p-PDA and 1.172 g (5.4 mmol) of HAB were dissolved in 88 g of NMP. 9.461 g (18 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L3. The Mw of the polyamic acid L3 was 43,600 and Mw / Mn2.6.

[合成例L4]ポリアミック酸L4の合成
DATP3.984g(15mmol)をNMP88gに溶解させた。得られた溶液にBPTME8.016g(15mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L4を得た。ポリアミック酸L4のMwは42,600、Mw/Mnは3.9であった。
[Synthesis Example L4] Synthesis of polyamic acid L4 3.984 g (15 mmol) of DATP was dissolved in 88 g of NMP. 8.016 g (15 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L4. The Mw of the polyamic acid L4 was 42,600, and the Mw / Mn was 3.9.

[合成例L5]ポリアミック酸L5の合成
BAPB5.17g(14mmol)をNMP88gに溶解させた。得られた溶液にBPTME6.83g(13mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L5を得た。ポリアミック酸L5のMwは52,100、Mw/Mnは2.7であった。
[Synthesis Example L5] Synthesis of polyamic acid L5 5.17 g (14 mmol) of BAPB was dissolved in 88 g of NMP. 6.83 g (13 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L5. The Mw of the polyamic acid L5 was 52,100, and the Mw / Mn was 2.7.

[合成例L6]ポリアミック酸L6の合成
FAPB5.89g(12mmol)をNMP88gに溶解させた。得られた溶液にBPTME6.11g(11mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L6を得た。ポリアミック酸L6のMwは87,700、Mw/Mnは3.3であった。
[Synthesis Example L6] Synthesis of polyamic acid L6 5.89 g (12 mmol) of FAPB was dissolved in 88 g of NMP. 6.11 g (11 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L6. The Mw of the polyamic acid L6 was 87,700, and the Mw / Mn was 3.3.

[合成例L7]ポリアミック酸L7の合成
APAB3.60g(16mmol)をNMP88gに溶解させた。得られた溶液にBPTME8.40g(16mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L7を得た。ポリアミック酸L7のMwは58,300、Mw/Mnは2.8であった。
[Synthesis Example L7] Synthesis of polyamic acid L7 3.60 g (16 mmol) of APAB was dissolved in 88 g of NMP. 8.40 g (16 mmol) of BPTME was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L7. The Mw of the polyamic acid L7 was 58,300, and the Mw / Mn was 2.8.

[合成例L8]ポリアミック酸L8の合成
DDE2.322g(12mmol)をNMP35.2gに溶解させた。得られた溶液にPMDA2.478g(11mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L8を得た。ポリアミック酸L8のMwは22,600、Mw/Mnは2.1であった。
[Synthesis Example L8] Synthesis of polyamic acid L8 2.322 g (12 mmol) of DDE was dissolved in 35.2 g of NMP. 2.478 g (11 mmol) of PMDA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L8. The Mw of the polyamic acid L8 was 22,600, and the Mw / Mn was 2.1.

[合成例L9]ポリアミック酸L9の合成
DATP1.762g(7mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.038g(7mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L9を得た。ポリアミック酸L9のMwは61,300、Mw/Mnは3.3であった。
[Synthesis Example L9] Synthesis of polyamic acid L9 1.762 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. 3.038 g (7 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L9. The Mw of the polyamic acid L9 was 61,300, and the Mw / Mn was 3.3.

[合成例L10]ポリアミック酸L10の合成
p−PDA0.899g(8mmol)をNMP35.2gに溶解させた。得られた溶液にBPODA3.900g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L10を得た。ポリアミック酸L10のMwは17,300、Mw/Mnは2.4であった。
[Synthesis Example L10] Synthesis of polyamic acid L10 0.899 g (8 mmol) of p-PDA was dissolved in 35.2 g of NMP. 3.900 g (8 mmol) of BPODA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L10. The Mw of the polyamic acid L10 was 17,300, and the Mw / Mn was 2.4.

[合成例L11]ポリアミック酸L11の合成
DATP1.713g(7mmol)をNMP35.2gに溶解させた。得られた溶液にBPODA3.086g(6mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L11を得た。ポリアミック酸L11のMwは27,000、Mw/Mnは2.4であった。
[Synthesis Example L11] Synthesis of polyamic acid L11 1.713 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. 3.086 g (6 mmol) of BPODA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L11. The Mw of the polyamic acid L11 was 27,000, and the Mw / Mn was 2.4.

[合成例L12]ポリアミック酸L12の合成
p−PDA0.931g(9mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L12を得た。ポリアミック酸L12のMwは45,000、Mw/Mnは2.7であった。
[Synthesis Example L12] Synthesis of polyamic acid L12 0.931 g (9 mmol) of p-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L12. The Mw of the polyamic acid L12 was 45,000, and the Mw / Mn was 2.7.

[合成例L13]ポリアミック酸L13の合成
p−PDA0.839g(8mmol)とm−PDA0.093g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L13を得た。ポリアミック酸L13のMwは39,100、Mw/Mnは2.6であった。
[Synthesis Example L13] Synthesis of polyamic acid L13 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L13. The Mw of the polyamic acid L13 was 39,100, and the Mw / Mn was 2.6.

[合成例L14]ポリアミック酸L14の合成
p−PDA0.652g(6mmol)とm−PDA0.280g(3mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L14を得た。ポリアミック酸L14のMwは42,700、Mw/Mnは2.6であった。
[Synthesis Example L14] Synthesis of polyamic acid L14 0.652 g (6 mmol) of p-PDA and 0.280 g (3 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L14. The Mw of the polyamic acid L14 was 42,700, and the Mw / Mn was 2.6.

[合成例L15]ポリアミック酸L15の合成
m−PDA0.931g(9mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L15を得た。ポリアミック酸L15のMwは36,100、Mw/Mnは2.5であった。
[Synthesis Example L15] Synthesis of polyamic acid L15 0.931 g (9 mmol) of m-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L15. The Mw of the polyamic acid L15 was 36,100, and the Mw / Mn was 2.5.

<合成例L16]ポリアミック酸L16の合成
p−PDA0.816g(8mmol)とDATP0.218g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.765g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L16を得た。ポリアミック酸L16のMwは43,800、Mw/Mnは2.5であった。
<Synthesis Example L16] Synthesis of polyamic acid L16 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. 3.765 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L16. The Mw of the polyamic acid L16 was 43,800, and the Mw / Mn was 2.5.

[合成例L17]ポリアミック酸L17の合成
p−PDA0.603g(6mmol)及びDATP0.622g(2mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.575g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L17を得た。ポリアミック酸L17のMwは46,000、Mw/Mnは2.6であった。
[Synthesis Example L17] Synthesis of polyamic acid L17 p-PDA 0.603 g (6 mmol) and DATP 0.622 g (2 mmol) were dissolved in NMP 35.2 g. 3.575 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L17. The Mw of the polyamic acid L17 was 46,000, and the Mw / Mn was 2.6.

[合成例L18]ポリアミック酸L18の合成
p−PDA0.832g(8mmol)及びDBA0.130g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.838g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L18を得た。ポリアミック酸L18のMwは57,000、Mw/Mnは3.0であった。
[Synthesis Example L18] Synthesis of polyamic acid L18 0.832 g (8 mmol) of p-PDA and 0.130 g (1 mmol) of DBA were dissolved in 35.2 g of NMP. 3.838 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L18. The Mw of the polyamic acid L18 was 57,000, and the Mw / Mn was 3.0.

[合成例L19]ポリアミック酸L19の合成
p−PDA0.822g(8mmol)及びHAB0.183g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.794g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L19を得た。ポリアミック酸L19のMwは54,200、Mw/Mnは2.7であった。
[Synthesis Example L19] Synthesis of polyamic acid L19 0.822 g (8 mmol) of p-PDA and 0.183 g (1 mmol) of HAB were dissolved in 35.2 g of NMP. 3.794 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L19. The Mw of the polyamic acid L19 was 54,200, and the Mw / Mn was 2.7.

[合成例L20]ポリアミック酸L20の合成
p−PDA0.616g(6mmol)及びHAB0.528g(2mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.655g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L20を得た。ポリアミック酸L20のMwは55,900、Mw/Mnは2.6であった。
[Synthesis Example L20] Synthesis of polyamic acid L20 0.616 g (6 mmol) of p-PDA and 0.528 g (2 mmol) of HAB were dissolved in 35.2 g of NMP. 3.655 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain a polyamic acid L20. The Mw of the polyamic acid L20 was 55,900, and the Mw / Mn was 2.6.

[合成例L21]ポリアミック酸L21の合成
APAB−E1.239g(5mmol)をNMP17.6gに溶解させた。得られた溶液にPMDA1.160g(5mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L21を得た。ポリアミック酸L21のMwは20,900、Mw/Mnは2.1であった。
[Synthesis Example L21] Synthesis of polyamic acid L21 1.239 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. 1.160 g (5 mmol) of PMDA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L21. The Mw of the polyamic acid L21 was 20,900, and the Mw / Mn was 2.1.

[合成例L22]ポリアミック酸L22の合成
APAB−E1.060g(5mmol)をNMP17.6gに溶解させた。得られた溶液にBPDA1.339g(5mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L22を得た。ポリアミック酸L22のMwは26,600、Mw/Mnは2.3であった。
[Synthesis Example L22] Synthesis of polyamic acid L22 1.060 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. 1.339 g (5 mmol) of BPDA was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L22. The Mw of the polyamic acid L22 was 26,600, and the Mw / Mn was 2.3.

[比較合成例1]ポリベンゾオキサゾール前駆体B1の合成
6FAP5.49g(0.015mol)をNMP27gに溶解させた。得られた溶液にIPBBT6.48g(0.015mol)を加え、窒素雰囲気下、23℃で3時間反応させた。その後、この溶液を純水300gへ投入し、24時間撹拌後、析出物を濾過した。その後、減圧乾燥し、ポリベンゾオキサゾール前駆体B1を得た。ポリベンゾオキサゾール前駆体B1のMwは21,000、Mw/Mnは3.9であった。
[Comparative Synthesis Example 1] Synthesis of polybenzoxazole precursor B1 5.49 g (0.015 mol) of 6FAP was dissolved in 27 g of NMP. 6.48 g (0.015 mol) of IPBBT was added to the obtained solution, and the mixture was reacted at 23 ° C. for 3 hours under a nitrogen atmosphere. Then, this solution was put into 300 g of pure water, stirred for 24 hours, and then the precipitate was filtered. Then, it was dried under reduced pressure to obtain a polybenzoxazole precursor B1. The Mw of the polybenzoxazole precursor B1 was 21,000 , and the Mw / Mn was 3.9.

[2]樹脂基板形成用組成物の調製
合成例S1〜S4で得られた反応液を、それぞれ、そのまま樹脂基板形成用組成物W、X、Y及びZとして用いた。
[2] Preparation of Resin Substrate Forming Composition The reaction solutions obtained in Synthesis Examples S1 to S4 were used as they were as the resin substrate forming compositions W, X, Y and Z, respectively.

[3]剥離層形成用組成物の調製
[実施例1−1]
合成例L1で得られた反応液に、BCSを加え、ポリマー濃度が5質量%、BCSが20質量%となるようにNMPで希釈し、剥離層形成用組成物を得た。
[3] Preparation of composition for forming a release layer [Example 1-1]
BCS was added to the reaction solution obtained in Synthesis Example L1 and diluted with NMP so that the polymer concentration was 5% by mass and the BCS was 20% by mass to obtain a composition for forming a release layer.

[実施例1−2〜1−22]
合成例L1で得られた反応液のかわりに、それぞれ合成例L2〜L22で得られた反応液を用いた以外は、実施例1−1と同様の方法で、剥離層形成用組成物を得た。
[Examples 1-2 to 1-22]
A composition for forming a release layer was obtained in the same manner as in Example 1-1, except that the reaction solutions obtained in Synthesis Examples L2 to L22 were used instead of the reaction solutions obtained in Synthesis Example L1. rice field.

[比較例1]
比較合成例1で得られた反応液を、ポリマー濃度が5質量%となるようにNMPで希釈して、組成物を得た。
[Comparative Example 1]
The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP so that the polymer concentration was 5% by mass to obtain a composition.

[4]剥離層の形成及びその評価
[実施例2−1]
スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1−1で得られた剥離層形成用組成物を、ガラス基体として100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[4] Formation of release layer and evaluation thereof [Example 2-1]
Using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm), the composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate on a 100 mm × 100 mm glass substrate (the same applies hereinafter). ..
Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven to raise the heating temperature to 400 ° C. (10 ° C./min). ), And further heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature rise, the substrate with the film was not taken out of the oven, but was heated in the oven.

[実施例2−2〜2−22]
実施例1−1で得られた剥離層形成用組成物のかわりに、それぞれ実施例1−2〜1−22で得られた剥離層形成用組成物を用いた以外は、実施例2−1と同様の方法で、剥離層を形成した。
[Examples 2-2-2-22]
Example 2-1 except that the composition for forming a release layer obtained in Examples 1-2 to 1-22 was used instead of the composition for forming a release layer obtained in Example 1-1. The release layer was formed in the same manner as in the above.

[実施例2−23]
スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1−12で得られた剥離層形成用組成物を、100mm×100mmガラス基板上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を250℃まで昇温(2℃/分)し、更に250℃で60分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[Example 2-23]
Using a spin coater (condition: rotation speed 3000 rpm for about 30 seconds), the composition for forming a release layer obtained in Example 1-12 was applied onto a 100 mm × 100 mm glass substrate.
Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven to raise the heating temperature to 250 ° C. (2 ° C./min). ), And further heated at 250 ° C. for 60 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature rise, the substrate with the film was not taken out of the oven, but was heated in the oven.

[実施例2−24]
スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1−8で得られた剥離層形成用組成物を、ガラス基体としての100mm×100mmガラス基板の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて窒素雰囲気下、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で60分間加熱し、最終的に500℃で10分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[Example 2-24]
Using a spin coater (condition: rotation speed 3000 rpm for about 30 seconds), the composition for forming a release layer obtained in Example 1-8 was applied onto a 100 mm × 100 mm glass substrate as a glass substrate.
Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes in a nitrogen atmosphere using an oven to raise the heating temperature to 400 ° C. (10). (° C./min), further heated at 400 ° C. for 60 minutes, and finally heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature rise, the substrate with the film was not taken out of the oven, but was heated in the oven.

[実施例2−25]
実施例1−8で得られた剥離層形成用組成物のかわりに、実施例1−12で得られた組成物を用いた以外は、実施例2−24と同様の方法で、樹脂薄膜を形成した。
[Example 2-25]
A resin thin film was prepared in the same manner as in Examples 2-24, except that the composition obtained in Example 1-12 was used instead of the composition for forming a release layer obtained in Example 1-8. Formed.

[比較例2]
実施例1−1で得られた剥離層形成用組成物のかわりに、比較例1で得られた組成物を用いた以外は、実施例2−1と同様の方法で、樹脂薄膜を形成した。
[Comparative Example 2]
A resin thin film was formed in the same manner as in Example 2-1 except that the composition obtained in Comparative Example 1 was used instead of the composition for forming a release layer obtained in Example 1-1. ..

[5]剥離性の評価
[実施例3−1〜3−47、比較例3]
実施例2−1〜2−25で得られた剥離層とガラス基板の剥離性及び当該剥離層(樹脂薄膜)と樹脂基板の剥離性を確認した。なお、樹脂基板としては、ポリイミドからなる樹脂基板を用いた。
まず、実施例2−1〜2−25で得られた剥離層付きガラス基板上の剥離層のクロスカット(縦横1mm間隔、以下同様)、並びに、樹脂基板・剥離層付きガラス基板上の樹脂基板・剥離層のクロスカットを行うことにより、100マスカットを行った。すなわち、このクロスカットにより、1mm四方のマス目を100個形成した。
そして、この100マスカット部分に粘着テープを張り付けて、そのテープを剥がし、以下の基準(5B〜0B、B、A、AA)に基づき、剥離の程度を評価した(実施例3−1〜3−47)。また、前記手法に準じて、比較例2で得られた樹脂薄膜付きガラス基板を用いて、同様の試験を行った(比較例3)。結果を表1に示す。なお、表1中の剥離性の評価基準は、以下のとおりである。
[5] Evaluation of peelability [Examples 3-1 to 3-47, Comparative Example 3]
The peelability between the release layer and the glass substrate obtained in Examples 2-1 to 2-25 and the peelability between the release layer (resin thin film) and the resin substrate were confirmed. As the resin substrate, a resin substrate made of polyimide was used.
First, the cross-cut of the release layer on the glass substrate with the release layer obtained in Examples 2-1 to 2-25 (1 mm intervals in length and width, the same applies hereinafter), and the resin substrate / resin substrate on the glass substrate with the release layer. -100 muscats were performed by cross-cutting the release layer. That is, by this cross cut, 100 squares of 1 mm square were formed.
Then, an adhesive tape was attached to the 100 muscat portion, the tape was peeled off, and the degree of peeling was evaluated based on the following criteria (5B to 0B, B, A, AA) (Examples 3 to 1-3-). 47). Further, according to the above method, the same test was conducted using the glass substrate with the resin thin film obtained in Comparative Example 2 (Comparative Example 3). The results are shown in Table 1. The evaluation criteria for peelability in Table 1 are as follows.

5B:0%剥離(剥離なし)
4B:5%未満の剥離
3B:5〜15%の剥離
2B:15〜35%未満の剥離
1B:35〜65%未満の剥離
0B:65%〜80%未満の剥離
B:80%〜95%未満の剥離
A:95%〜100%未満の剥離
AA:100%剥離(すべて剥離)
5B: 0% peeling (no peeling)
4B: Peeling less than 5% 3B: Peeling 5 to 15% 2B: Peeling less than 15-35% 1B: Peeling less than 35-65% 0B: Peeling less than 65% to 80% B: 80% to 95% Less than peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)

実施例3−1〜3−41、3−44〜3−47及び比較例3の樹脂基板は、以下の方法で形成した。
バーコーター(ギャップ:250μm)を用いて、ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物W又はXのいずれかを塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を210℃まで昇温(10℃/分、以下同様)し、210℃で30分間、加熱温度を300℃まで昇温し、300℃で30分間、加熱温度を400℃まで昇温し、400℃で60分間加熱し、剥離層上に厚さ約20μmのポリイミド基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
The resin substrates of Examples 3-1 to 3-41, 3-44 to 3-47 and Comparative Example 3 were formed by the following methods.
Using a bar coater (gap: 250 μm), either the resin substrate forming composition W or X was applied onto the release layer (resin thin film) on the glass substrate. Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven to raise the heating temperature to 210 ° C. (10 ° C./min). , And so on), raise the heating temperature to 300 ° C for 30 minutes at 210 ° C, raise the heating temperature to 400 ° C for 30 minutes at 300 ° C, heat at 400 ° C for 60 minutes, and put it on the release layer. A polyimide substrate having a thickness of about 20 μm was formed. During the temperature rise, the substrate with the membrane was not removed from the oven, but was heated in the oven.

実施例3−42〜3−43の樹脂基板は、以下の方法で形成した。
バーコーター(ギャップ:50μm)を用いて、ガラス基板上の剥離層の上に樹脂基板形成用組成物Y又はZのいずれかを塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を250℃まで昇温(2℃/分)し、250℃で60分間加熱し、剥離層上に厚さ約0.8μmのポリイミド基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
The resin substrates of Examples 3-42 to 3-43 were formed by the following methods.
Using a bar coater (gap: 50 μm), either the resin substrate forming composition Y or Z was applied onto the release layer on the glass substrate. Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven to raise the heating temperature to 250 ° C. (2 ° C./min). ), And heated at 250 ° C. for 60 minutes to form a polyimide substrate having a thickness of about 0.8 μm on the release layer. During the temperature rise, the substrate with the membrane was not removed from the oven, but was heated in the oven.

Figure 0006939862
Figure 0006939862

Figure 0006939862
Figure 0006939862

表1及び2に示したように、実施例の剥離層は、ガラス基板との密着性に優れ、かつ、樹脂基板との剥離性に優れていることがわかった。一方、比較例の剥離層は、樹脂基板とガラス基板から剥離せず、剥離層として機能しなかった。 As shown in Tables 1 and 2, it was found that the release layer of the example was excellent in adhesion to the glass substrate and excellent in peelability to the resin substrate. On the other hand, the release layer of the comparative example did not separate from the resin substrate and the glass substrate and did not function as the release layer.

[6]透過率の評価
[実施例4]
スピンコータ(条件:回転数800rpmで約30秒)を用いて、実施例2−8で得られた剥離層形成用組成物を、ガラス基体として100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.4μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。得られたフィルムを紫外線可視分光光度計((株)島津製作所製SIMADSU UV-2550型番)を用いて透過率を測定した。
結果を図1に示す。得られたフィルムの透過率は、波長308nmに対し1%以下であり、犠牲層として使用可能な透過率を示した。
[6] Evaluation of transmittance [Example 4]
Using a spin coater (condition: about 30 seconds at a rotation speed of 800 rpm), the composition for forming a release layer obtained in Example 2-8 was applied as a glass substrate on a 100 mm × 100 mm glass substrate (the same applies hereinafter). ..
Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven to raise the heating temperature to 400 ° C. (10 ° C./min). ), And further heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.4 μm on the glass substrate. During the temperature rise, the substrate with the film was not taken out of the oven, but was heated in the oven. The transmittance of the obtained film was measured using an ultraviolet visible spectrophotometer (SIMADSU UV-2550 model number manufactured by Shimadzu Corporation).
The results are shown in FIG. The transmittance of the obtained film was 1% or less with respect to a wavelength of 308 nm, indicating a transmittance that could be used as a sacrificial layer.

Claims (9)

芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られる重量平均分子量が15,000〜200,000のポリアミック酸、及び有機溶媒を含み、
前記芳香族ジアミンが、式(A25)及び(A40)からなる群から選ばれる少なくとも1種のエーテル結合を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、式(B8)である少なくとも1種のエーテル結合を含む芳香族テトラカルボン酸二無水物を含むことを特徴とする剥離層形成用組成物(ただし、前記ポリアミック酸は、2,2'−ジメチルベンジジンと、1,3−ビス(4−アミノフェノキシ)ベンゼンと、ピロメリット酸二無水物と、3,3',4,4'−ビフェニルテトラカルボン酸二無水物とを反応させて得られるものを含まない。)。
Figure 0006939862
Figure 0006939862
It contains a polyamic acid having a weight average molecular weight of 15,000 to 200,000 obtained by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride, and an organic solvent.
The aromatic diamine comprises an aromatic diamine containing at least one ether bond selected from the group consisting of formulas (A25) and (A40), and / or the aromatic tetracarboxylic acid dianhydride is of the formula ( A composition for forming a release layer, which comprises an aromatic tetracarboxylic acid dianhydride containing at least one ether bond of B8) (provided that the polyamic acid is 2,2'-dimethylbenzidine, and the like. Does not contain those obtained by reacting 1,3-bis (4-aminophenoxy) benzene, pyromellitic acid dianhydride, and 3,3', 4,4'-biphenyltetracarboxylic acid dianhydride. .).
Figure 0006939862
Figure 0006939862
前記芳香族テトラカルボン酸二無水物が、更にエステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物を含む請求項1に記載の剥離層形成用組成物。 The composition for forming a release layer according to claim 1, wherein the aromatic tetracarboxylic acid dianhydride further contains an aromatic tetracarboxylic acid dianhydride containing neither an ester bond nor an ether bond. 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、ベンゼン骨格、ナフチル骨格又はビフェニル骨格を含むものである請求項2に記載の剥離層形成用組成物。 The composition for forming a release layer according to claim 2, wherein the aromatic tetracarboxylic acid dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton or a biphenyl skeleton. 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、式(C1)〜(C12)からなる群から選ばれる少なくとも1種である請求項3に記載の剥離層形成用組成物。
Figure 0006939862
The peeling layer formation according to claim 3, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of the formulas (C1) to (C12). Composition.
Figure 0006939862
前記有機溶媒が、式(S1)で表されるアミド類、式(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1つを含む請求項1〜4のいずれか1項に記載の剥離層形成用組成物。
Figure 0006939862
(式中、R1及びR2は、互いに独立して、炭素数1〜10のアルキル基を表す。R3は、水素原子、又は炭素数1〜10のアルキル基を表す。hは、自然数を表す。)
Claims 1 to 4 wherein the organic solvent contains at least one selected from amides represented by the formula (S1), amides represented by the formula (S2) and amides represented by the formula (S3). The composition for forming a release layer according to any one of the above items.
Figure 0006939862
(In the formula, R 1 and R 2 represent an alkyl group having 1 to 10 carbon atoms independently of each other. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. H is a natural number. Represents.)
請求項1〜5のいずれか1項に記載の剥離層形成用組成物を用いて形成される剥離層。 A release layer formed by using the release layer forming composition according to any one of claims 1 to 5. 請求項6に記載の剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法。 A method for manufacturing a flexible electronic device including a resin substrate, which comprises using the release layer according to claim 6. 請求項に記載の剥離層を用いることを特徴とする、樹脂基板を備えるタッチパネルセンサーの製造方法。 A method for manufacturing a touch panel sensor including a resin substrate, which comprises using the release layer according to claim 6. 前記樹脂基板が、ポリイミドからなる基板である請求項7又は8に記載の製造方法。 The manufacturing method according to claim 7 or 8, wherein the resin substrate is a substrate made of polyimide.
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