KR20200081239A - 자기 진단 기능을 구비하는 가공 장치 - Google Patents
자기 진단 기능을 구비하는 가공 장치 Download PDFInfo
- Publication number
- KR20200081239A KR20200081239A KR1020190158480A KR20190158480A KR20200081239A KR 20200081239 A KR20200081239 A KR 20200081239A KR 1020190158480 A KR1020190158480 A KR 1020190158480A KR 20190158480 A KR20190158480 A KR 20190158480A KR 20200081239 A KR20200081239 A KR 20200081239A
- Authority
- KR
- South Korea
- Prior art keywords
- vibration
- frequency
- unit
- component
- self
- Prior art date
Links
- 238000012545 processing Methods 0.000 title claims abstract description 81
- 238000004092 self-diagnosis Methods 0.000 claims abstract description 21
- 238000003860 storage Methods 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims description 9
- 238000003754 machining Methods 0.000 claims description 7
- 230000001133 acceleration Effects 0.000 claims description 4
- 238000005520 cutting process Methods 0.000 description 63
- 238000004140 cleaning Methods 0.000 description 40
- 201000004384 Alopecia Diseases 0.000 description 5
- 208000024963 hair loss Diseases 0.000 description 5
- 230000003676 hair loss Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 230000001902 propagating effect Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 238000005406 washing Methods 0.000 description 4
- 239000002173 cutting fluid Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000000644 propagated effect Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/09—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool
- B23Q17/0952—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool during machining
- B23Q17/0957—Detection of tool breakage
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/09—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool
- B23Q17/0952—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool during machining
- B23Q17/0971—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool during machining by measuring mechanical vibrations of parts of the machine
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/09—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool
- B23Q17/0995—Tool life management
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Dicing (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Prostheses (AREA)
- Curing Cements, Concrete, And Artificial Stone (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2018-244899 | 2018-12-27 | ||
JP2018244899A JP7246827B2 (ja) | 2018-12-27 | 2018-12-27 | 自己診断機能を備える加工装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20200081239A true KR20200081239A (ko) | 2020-07-07 |
Family
ID=71221319
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020190158480A KR20200081239A (ko) | 2018-12-27 | 2019-12-02 | 자기 진단 기능을 구비하는 가공 장치 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7246827B2 (ja) |
KR (1) | KR20200081239A (ja) |
CN (1) | CN111383959A (ja) |
TW (1) | TWI821491B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116472446A (zh) * | 2020-11-27 | 2023-07-21 | 发那科株式会社 | 机床以及诊断方法 |
CN116568457A (zh) * | 2020-12-18 | 2023-08-08 | 发那科株式会社 | 振动诊断辅助装置、振动诊断辅助方法以及机床 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62173147A (ja) | 1986-01-24 | 1987-07-30 | Disco Abrasive Sys Ltd | 温度変化に起因する誤差が低減された精密装置 |
JP2012161861A (ja) | 2011-02-04 | 2012-08-30 | Disco Corp | 加工装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2695366B2 (ja) * | 1993-05-14 | 1997-12-24 | 川崎製鉄株式会社 | 低速回転機械の異常診断方法 |
JPH07270228A (ja) * | 1994-03-29 | 1995-10-20 | Kawasaki Steel Corp | 低速回転機械の異常診断方法 |
US5518347A (en) * | 1995-05-23 | 1996-05-21 | Design And Manufacturing Solutions, Inc. | Tuned damping system for suppressing vibrations during machining |
TW286359B (en) * | 1996-02-27 | 1996-09-21 | China Steel Co Ltd | The vibration diagnosis method for crack & breakdown of roller |
JP5318666B2 (ja) * | 2009-05-29 | 2013-10-16 | 一般財団法人電力中央研究所 | 常時微動計測に基づく建物の健全性診断法、診断装置及び診断プログラム |
JP5904025B2 (ja) | 2012-06-14 | 2016-04-13 | 日本精工株式会社 | ボールねじ装置の異常検出装置及び異常検出方法 |
JP6198393B2 (ja) | 2012-12-28 | 2017-09-20 | キヤノン株式会社 | 接触式三次元形状測定装置及びプローブ制御方法 |
WO2017170270A1 (ja) * | 2016-03-30 | 2017-10-05 | Ntn株式会社 | 歯車装置の状態監視システムおよび状態監視方法 |
JP6735183B2 (ja) | 2016-08-19 | 2020-08-05 | オークマ株式会社 | 回転軸を有する工作機械 |
TWI609737B (zh) * | 2016-12-22 | 2018-01-01 | Hiwin Tech Corp | 偵測工具機的線性滑軌預壓值變化的方法 |
US10393707B2 (en) | 2017-05-03 | 2019-08-27 | Hiwin Technologies Corp. | Method for estimating a variation in preload applied to linear guideway |
-
2018
- 2018-12-27 JP JP2018244899A patent/JP7246827B2/ja active Active
-
2019
- 2019-12-02 KR KR1020190158480A patent/KR20200081239A/ko not_active Application Discontinuation
- 2019-12-20 CN CN201911323381.6A patent/CN111383959A/zh active Pending
- 2019-12-24 TW TW108147480A patent/TWI821491B/zh active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62173147A (ja) | 1986-01-24 | 1987-07-30 | Disco Abrasive Sys Ltd | 温度変化に起因する誤差が低減された精密装置 |
JP2012161861A (ja) | 2011-02-04 | 2012-08-30 | Disco Corp | 加工装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2020106375A (ja) | 2020-07-09 |
JP7246827B2 (ja) | 2023-03-28 |
CN111383959A (zh) | 2020-07-07 |
TWI821491B (zh) | 2023-11-11 |
TW202023752A (zh) | 2020-07-01 |
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E902 | Notification of reason for refusal |