KR20200078737A - 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 - Google Patents
마스크부재의 세정 장치 및 마스크부재의 세정 시스템 Download PDFInfo
- Publication number
- KR20200078737A KR20200078737A KR1020180166969A KR20180166969A KR20200078737A KR 20200078737 A KR20200078737 A KR 20200078737A KR 1020180166969 A KR1020180166969 A KR 1020180166969A KR 20180166969 A KR20180166969 A KR 20180166969A KR 20200078737 A KR20200078737 A KR 20200078737A
- Authority
- KR
- South Korea
- Prior art keywords
- mask member
- chamber
- cleaning
- unit
- stored
- Prior art date
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 174
- 239000007788 liquid Substances 0.000 claims abstract description 77
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 15
- 238000005507 spraying Methods 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 12
- 238000009826 distribution Methods 0.000 claims description 11
- 238000005406 washing Methods 0.000 claims description 8
- 239000000243 solution Substances 0.000 description 15
- 230000008569 process Effects 0.000 description 12
- 230000008021 deposition Effects 0.000 description 8
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 5
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 238000005137 deposition process Methods 0.000 description 3
- 230000001965 increasing effect Effects 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- 239000000010 aprotic solvent Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- GNOIPBMMFNIUFM-UHFFFAOYSA-N hexamethylphosphoric triamide Chemical compound CN(C)P(=O)(N(C)C)N(C)C GNOIPBMMFNIUFM-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- LVWZTYCIRDMTEY-UHFFFAOYSA-N metamizole Chemical compound O=C1C(N(CS(O)(=O)=O)C)=C(C)N(C)N1C1=CC=CC=C1 LVWZTYCIRDMTEY-UHFFFAOYSA-N 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000000844 transformation Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
-
- H01L51/56—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/022—Cleaning travelling work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/14—Removing waste, e.g. labels, from cleaning liquid; Regenerating cleaning liquids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67236—Apparatus for manufacturing or treating in a plurality of work-stations the substrates being processed being not semiconductor wafers, e.g. leadframes or chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67751—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece
-
- H01L51/0018—
-
- H01L51/0025—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/02—Details of machines or methods for cleaning by the force of jets or sprays
- B08B2203/0211—Case coverings
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Details Or Accessories Of Spraying Plant Or Apparatus (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180166969A KR20200078737A (ko) | 2018-12-21 | 2018-12-21 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
CN201910706425.7A CN111346861B (zh) | 2018-12-21 | 2019-08-01 | 掩膜部件的清洗装置以及掩膜部件的清洗系统 |
KR1020240089885A KR20240114733A (ko) | 2018-12-21 | 2024-07-08 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180166969A KR20200078737A (ko) | 2018-12-21 | 2018-12-21 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020240089885A Division KR20240114733A (ko) | 2018-12-21 | 2024-07-08 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20200078737A true KR20200078737A (ko) | 2020-07-02 |
Family
ID=71193907
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020180166969A KR20200078737A (ko) | 2018-12-21 | 2018-12-21 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
KR1020240089885A KR20240114733A (ko) | 2018-12-21 | 2024-07-08 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020240089885A KR20240114733A (ko) | 2018-12-21 | 2024-07-08 | 마스크부재의 세정 장치 및 마스크부재의 세정 시스템 |
Country Status (2)
Country | Link |
---|---|
KR (2) | KR20200078737A (zh) |
CN (1) | CN111346861B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102674690B1 (ko) | 2023-09-26 | 2024-06-12 | (주) 유피테크 | 메탈마스크 자동 세정장치 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10948830B1 (en) | 2019-12-23 | 2021-03-16 | Waymo Llc | Systems and methods for lithography |
CN114995052A (zh) * | 2022-05-18 | 2022-09-02 | 上海图灵智算量子科技有限公司 | 光罩版清洁装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07313947A (ja) * | 1995-03-09 | 1995-12-05 | Seiko Epson Corp | ワーク洗浄方法および洗浄装置 |
JPH10144650A (ja) * | 1996-11-11 | 1998-05-29 | Mitsubishi Electric Corp | 半導体材料の洗浄装置 |
JPH10189526A (ja) * | 1996-12-20 | 1998-07-21 | Sony Corp | レチクルの洗浄方法及びその装置 |
KR20040045197A (ko) * | 2002-11-22 | 2004-06-01 | 어드벤스드 알케미(주) | 기판 처리 장치 |
ITMI20030335A1 (it) * | 2003-02-25 | 2004-08-26 | T I S R L Sa | Dispositivo di lavaggio per cartucce pieghettate e filtro comprendente tale dispositivo. |
JP2009088442A (ja) * | 2007-10-03 | 2009-04-23 | Hitachi High-Technologies Corp | 基板乾燥装置、フラットパネルディスプレイの製造装置及びフラットパネルディスプレイ |
JP2010236088A (ja) * | 2009-03-09 | 2010-10-21 | Hitachi High-Technologies Corp | マスク部材のクリーニング装置及びクリーニング方法並びに有機elディスプレイ |
CN104275324A (zh) * | 2013-07-08 | 2015-01-14 | 上海和辉光电有限公司 | 一种去除遮罩上有机或脏污的装置 |
KR20150057379A (ko) * | 2013-11-19 | 2015-05-28 | 삼성디스플레이 주식회사 | 기판 세정 장치 |
KR20150094200A (ko) * | 2014-02-11 | 2015-08-19 | 멤스피아 주식회사 | 마스크 세정장비 |
JP2017087700A (ja) * | 2015-11-17 | 2017-05-25 | 株式会社沖電気コミュニケーションシステムズ | 洗浄装置 |
KR20180089603A (ko) * | 2017-01-31 | 2018-08-09 | 삼성디스플레이 주식회사 | 유기물 증착 장치 및 방법 |
-
2018
- 2018-12-21 KR KR1020180166969A patent/KR20200078737A/ko not_active IP Right Cessation
-
2019
- 2019-08-01 CN CN201910706425.7A patent/CN111346861B/zh active Active
-
2024
- 2024-07-08 KR KR1020240089885A patent/KR20240114733A/ko not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102674690B1 (ko) | 2023-09-26 | 2024-06-12 | (주) 유피테크 | 메탈마스크 자동 세정장치 |
Also Published As
Publication number | Publication date |
---|---|
CN111346861A (zh) | 2020-06-30 |
CN111346861B (zh) | 2023-09-22 |
KR20240114733A (ko) | 2024-07-24 |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
AMND | Amendment | ||
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AMND | Amendment | ||
X601 | Decision of rejection after re-examination |