KR20150114963A - 조성 분석 시스템을 위한 레이저 어블레이션 셀 및 토치 시스템 - Google Patents

조성 분석 시스템을 위한 레이저 어블레이션 셀 및 토치 시스템 Download PDF

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Publication number
KR20150114963A
KR20150114963A KR1020157022052A KR20157022052A KR20150114963A KR 20150114963 A KR20150114963 A KR 20150114963A KR 1020157022052 A KR1020157022052 A KR 1020157022052A KR 20157022052 A KR20157022052 A KR 20157022052A KR 20150114963 A KR20150114963 A KR 20150114963A
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KR
South Korea
Prior art keywords
target
sample
transfer conduit
capture
flow
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KR1020157022052A
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English (en)
Korean (ko)
Inventor
베리 엘. 샤프
다비드 엔. 더글라스
아미 제이. 마나흐
Original Assignee
일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드
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Application filed by 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 filed Critical 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드
Publication of KR20150114963A publication Critical patent/KR20150114963A/ko
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44—Sample treatment involving radiation, e.g. heat
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N2001/045—Laser ablation; Microwave vaporisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G01N2001/383—Diluting, dispersing or mixing samples collecting and diluting in a flow of liquid
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Plasma Technology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
KR1020157022052A 2013-02-14 2014-02-12 조성 분석 시스템을 위한 레이저 어블레이션 셀 및 토치 시스템 Ceased KR20150114963A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361764976P 2013-02-14 2013-02-14
US61/764,976 2013-02-14
PCT/US2014/016085 WO2014127034A1 (en) 2013-02-14 2014-02-12 Laser ablation cell and torch system for a compositional analysis system

Publications (1)

Publication Number Publication Date
KR20150114963A true KR20150114963A (ko) 2015-10-13

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020157022052A Ceased KR20150114963A (ko) 2013-02-14 2014-02-12 조성 분석 시스템을 위한 레이저 어블레이션 셀 및 토치 시스템

Country Status (6)

Country Link
EP (1) EP2956756B1 (enExample)
JP (3) JP6463279B2 (enExample)
KR (1) KR20150114963A (enExample)
CN (1) CN105074419B (enExample)
TW (4) TW201447259A (enExample)
WO (1) WO2014127034A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210005742A (ko) * 2018-06-05 2021-01-14 엘레멘탈 사이언티픽 레이저스 엘엘씨 레이저 보조 분광에서 샘플 챔버를 바이패스하는 장치 및 방법
KR20210021687A (ko) * 2019-08-19 2021-03-02 한국과학기술연구원 에어로졸 발생 장치

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EP3240014A1 (en) 2016-04-29 2017-11-01 ETH Zurich Laser ablation cell
CN109791868A (zh) * 2016-08-02 2019-05-21 富鲁达加拿大公司 激光烧蚀系统
WO2018026910A1 (en) 2016-08-02 2018-02-08 Fluidigm Canada Inc. Sample imaging apparatus and method
AT519146B1 (de) 2016-10-05 2020-03-15 Univ Wien Tech Vorrichtung zur Analyse eines Feststoff-Probenmaterials
TW201903379A (zh) * 2017-04-20 2019-01-16 美商電子科學工業有限公司 用於極快速信號清除之可調整樣本底面
US11264221B2 (en) 2018-06-18 2022-03-01 Fluidigm Canada Inc. High resolution imaging apparatus and method
JP7651453B2 (ja) 2018-09-10 2025-03-26 フリューダイム カナダ インコーポレイテッド オートフォーカスサンプルイメージング装置及び方法
CN109444248B (zh) * 2018-11-20 2020-10-30 中国地质大学（武汉） 一种基于激光的溶液剥蚀进样分析方法
GB2582751B (en) * 2019-03-29 2021-07-07 Thermo Fisher Scient Ecublens Sarl Improved spark stand for optical emission spectrometry
JP6652212B2 (ja) * 2019-04-15 2020-02-19 株式会社島津製作所 サンプルプレート移動機構及びそれを備えたレーザ脱離イオン化質量分析装置
EP3987281A4 (en) 2019-06-18 2023-07-12 Fluidigm Canada Inc. ENHANCED MASS CYTOMETRY
JP7349632B2 (ja) * 2019-06-28 2023-09-25 株式会社エス・テイ・ジャパン レーザーアブレーション用のセルおよび分析装置
WO2024224612A1 (ja) * 2023-04-28 2024-10-31 株式会社 イアス レーザーアブレーションｉｃｐ分析方法及び分析装置

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210005742A (ko) * 2018-06-05 2021-01-14 엘레멘탈 사이언티픽 레이저스 엘엘씨 레이저 보조 분광에서 샘플 챔버를 바이패스하는 장치 및 방법
KR20210021687A (ko) * 2019-08-19 2021-03-02 한국과학기술연구원 에어로졸 발생 장치

Also Published As

Publication number Publication date
EP2956756A1 (en) 2015-12-23
JP2019082483A (ja) 2019-05-30
CN105074419B (zh) 2019-02-01
JP2016513254A (ja) 2016-05-12
WO2014127034A1 (en) 2014-08-21
CN105074419A (zh) 2015-11-18
TWI614488B (zh) 2018-02-11
TWI668422B (zh) 2019-08-11
TW201447259A (zh) 2014-12-16
JP6776323B2 (ja) 2020-10-28
TWI667462B (zh) 2019-08-01
TW201840962A (zh) 2018-11-16
TW201827806A (zh) 2018-08-01
TW201447261A (zh) 2014-12-16
EP2956756B1 (en) 2024-09-04
JP6463279B2 (ja) 2019-01-30
EP2956756A4 (en) 2016-10-12
JP2021039107A (ja) 2021-03-11

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