FR2700852B1 - Cellule d'ablation d'un échantillon au laser. - Google Patents

Cellule d'ablation d'un échantillon au laser.

Info

Publication number
FR2700852B1
FR2700852B1 FR9300784A FR9300784A FR2700852B1 FR 2700852 B1 FR2700852 B1 FR 2700852B1 FR 9300784 A FR9300784 A FR 9300784A FR 9300784 A FR9300784 A FR 9300784A FR 2700852 B1 FR2700852 B1 FR 2700852B1
Authority
FR
France
Prior art keywords
ablation cell
laser sample
laser
sample
ablation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9300784A
Other languages
English (en)
Other versions
FR2700852A1 (fr
Inventor
Sylvie Masseau
Alain Briand
Jacques Minier
Claude Bergey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR9300784A priority Critical patent/FR2700852B1/fr
Priority to PCT/FR1994/000093 priority patent/WO1994017385A1/fr
Publication of FR2700852A1 publication Critical patent/FR2700852A1/fr
Application granted granted Critical
Publication of FR2700852B1 publication Critical patent/FR2700852B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/40—Concentrating samples
    • G01N1/4022—Concentrating samples by thermal techniques; Phase changes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N2001/045—Laser ablation; Microwave vaporisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/10—Devices for withdrawing samples in the liquid or fluent state
    • G01N1/14—Suction devices, e.g. pumps; Ejector devices
    • G01N2001/1445—Overpressure, pressurisation at sampling point
    • G01N2001/1463—Injector; Air-lift
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Sampling And Sample Adjustment (AREA)
FR9300784A 1993-01-27 1993-01-27 Cellule d'ablation d'un échantillon au laser. Expired - Fee Related FR2700852B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9300784A FR2700852B1 (fr) 1993-01-27 1993-01-27 Cellule d'ablation d'un échantillon au laser.
PCT/FR1994/000093 WO1994017385A1 (fr) 1993-01-27 1994-01-26 Cellule d'ablation d'un echantillon au laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9300784A FR2700852B1 (fr) 1993-01-27 1993-01-27 Cellule d'ablation d'un échantillon au laser.

Publications (2)

Publication Number Publication Date
FR2700852A1 FR2700852A1 (fr) 1994-07-29
FR2700852B1 true FR2700852B1 (fr) 1995-03-03

Family

ID=9443390

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9300784A Expired - Fee Related FR2700852B1 (fr) 1993-01-27 1993-01-27 Cellule d'ablation d'un échantillon au laser.

Country Status (2)

Country Link
FR (1) FR2700852B1 (fr)
WO (1) WO1994017385A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2714464B1 (fr) * 1993-12-23 1996-02-09 Cogema Procédé de contrôle de la contamination surfacique d'un solide et dispositif de mise en Óoeuvre.
DE19529717A1 (de) * 1995-08-11 1997-02-13 Finnigan Mat Gmbh Verfahren und Vorrichtung zur Präparation einer anorganischen oder organischen Probe für die Isotopenverhältnisanalyse
US9524856B2 (en) 2013-02-09 2016-12-20 Electro Scientific Industries, Inc. In-chamber fluid handling system and methods handling fluids using the same
EP2956756A4 (fr) * 2013-02-14 2016-10-12 Electro Scient Ind Inc Système d'ablation laser à cellule et torche pour un système d'analyse de composition
US20140227776A1 (en) 2013-02-14 2014-08-14 Electro Scientific Industries, Inc. Laser ablation cell and torch system for a compositional analysis system
EP3240014A1 (fr) * 2016-04-29 2017-11-01 ETH Zurich Cellule d'ablation laser
CN117388351A (zh) * 2023-11-03 2024-01-12 中国地质大学（武汉） 一种激光剥蚀系统中气溶胶提取装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4150951A (en) * 1977-09-19 1979-04-24 The Aerospace Corporation Measurement of concentrations of gaseous phase elements
DD153921B1 (de) * 1980-10-29 1987-01-07 Werner Schroen Vorrichtung zum transport von probendampf
DE3422946A1 (de) * 1984-06-20 1986-01-02 Siemens AG, 1000 Berlin und 8000 München Verfahren zur feststoffanalyse in plasmen und plasmabrenner zur durchfuehrung des verfahrens
JPH02227652A (ja) * 1989-02-28 1990-09-10 Yokogawa Electric Corp 試料導入装置
JPH03167446A (ja) * 1989-11-27 1991-07-19 Seiko Instr Inc レーザー気化装置の試料交換装置

Also Published As

Publication number Publication date
WO1994017385A1 (fr) 1994-08-04
FR2700852A1 (fr) 1994-07-29

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Legal Events

Date Code Title Description
ST Notification of lapse