CN105074419B - 用于组成分析系统的雷射剥蚀单元和火炬系统 - Google Patents

用于组成分析系统的雷射剥蚀单元和火炬系统 Download PDF

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Publication number
CN105074419B
CN105074419B CN201480008569.0A CN201480008569A CN105074419B CN 105074419 B CN105074419 B CN 105074419B CN 201480008569 A CN201480008569 A CN 201480008569A CN 105074419 B CN105074419 B CN 105074419B
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China
Prior art keywords
sample
target
capture
entrance
fluid
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CN201480008569.0A
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English (en)
Chinese (zh)
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CN105074419A (zh
Inventor
贝利·L·沙普
大卫·N·道格拉斯
艾咪·J·玛那
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Elemental Scientific Lasers LLC
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Irecto Science Industry Co ltd
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N2001/045—Laser ablation; Microwave vaporisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G01N2001/383—Diluting, dispersing or mixing samples collecting and diluting in a flow of liquid
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Plasma Technology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
CN201480008569.0A 2013-02-14 2014-02-12 用于组成分析系统的雷射剥蚀单元和火炬系统 Active CN105074419B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361764976P 2013-02-14 2013-02-14
US61/764,976 2013-02-14
PCT/US2014/016085 WO2014127034A1 (en) 2013-02-14 2014-02-12 Laser ablation cell and torch system for a compositional analysis system

Publications (2)

Publication Number Publication Date
CN105074419A CN105074419A (zh) 2015-11-18
CN105074419B true CN105074419B (zh) 2019-02-01

Family

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Family Applications (1)

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CN201480008569.0A Active CN105074419B (zh) 2013-02-14 2014-02-12 用于组成分析系统的雷射剥蚀单元和火炬系统

Country Status (6)

Country Link
EP (1) EP2956756B1 (enExample)
JP (3) JP6463279B2 (enExample)
KR (1) KR20150114963A (enExample)
CN (1) CN105074419B (enExample)
TW (4) TW201447259A (enExample)
WO (1) WO2014127034A1 (enExample)

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EP3240014A1 (en) 2016-04-29 2017-11-01 ETH Zurich Laser ablation cell
WO2018026910A1 (en) 2016-08-02 2018-02-08 Fluidigm Canada Inc. Sample imaging apparatus and method
CA3032861A1 (en) * 2016-08-02 2018-02-08 Fluidigm Canada Inc. Laser ablation system
AT519146B1 (de) 2016-10-05 2020-03-15 Univ Wien Tech Vorrichtung zur Analyse eines Feststoff-Probenmaterials
KR20190133056A (ko) * 2017-04-20 2019-11-29 엘레멘탈 사이언티픽 레이저스 엘엘씨 초고속 신호 워시아웃을 위한 조정가능한 샘플 플로어
US11183378B2 (en) * 2018-06-05 2021-11-23 Elemental Scientific Lasers, Llc Apparatus and method to bypass a sample chamber in laser assisted spectroscopy
CN113678227B (zh) 2018-06-18 2024-11-12 富鲁达加拿大公司 高分辨率成像设备和方法
EP3850329A4 (en) 2018-09-10 2022-06-22 Fluidigm Canada Inc. APPARATUS AND METHOD FOR AUTO-FOCUSING SAMPLE IMAGING
CN109444248B (zh) * 2018-11-20 2020-10-30 中国地质大学（武汉） 一种基于激光的溶液剥蚀进样分析方法
GB2582751B (en) * 2019-03-29 2021-07-07 Thermo Fisher Scient Ecublens Sarl Improved spark stand for optical emission spectrometry
JP6652212B2 (ja) * 2019-04-15 2020-02-19 株式会社島津製作所 サンプルプレート移動機構及びそれを備えたレーザ脱離イオン化質量分析装置
WO2020257258A1 (en) 2019-06-18 2020-12-24 Fluidigm Corporation Improved mass cytometry
JP7349632B2 (ja) * 2019-06-28 2023-09-25 株式会社エス・テイ・ジャパン レーザーアブレーション用のセルおよび分析装置
KR102229252B1 (ko) * 2019-08-19 2021-03-18 한국과학기술연구원 에어로졸 발생 장치
WO2024224612A1 (ja) * 2023-04-28 2024-10-31 株式会社 イアス レーザーアブレーションｉｃｐ分析方法及び分析装置

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US20060024199A1 (en) * 2004-07-29 2006-02-02 National Institute Of Advanced Industrial Science Inductively-coupled plasma torch

Also Published As

Publication number Publication date
JP2016513254A (ja) 2016-05-12
JP2019082483A (ja) 2019-05-30
WO2014127034A1 (en) 2014-08-21
KR20150114963A (ko) 2015-10-13
TWI614488B (zh) 2018-02-11
EP2956756B1 (en) 2024-09-04
JP6776323B2 (ja) 2020-10-28
TWI667462B (zh) 2019-08-01
TW201840962A (zh) 2018-11-16
JP6463279B2 (ja) 2019-01-30
JP2021039107A (ja) 2021-03-11
EP2956756A1 (en) 2015-12-23
TW201827806A (zh) 2018-08-01
EP2956756A4 (en) 2016-10-12
TWI668422B (zh) 2019-08-11
TW201447259A (zh) 2014-12-16
CN105074419A (zh) 2015-11-18
TW201447261A (zh) 2014-12-16

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Effective date of registration: 20190311

Address after: Nebraska

Patentee after: Elemental Science Laser Company

Address before: No. 13900, Northwest Science Park Avenue, Portland, 97229, Oregon, USA

Patentee before: Electro Scient Ind Inc.