KR20140037763A - 연마 장치 - Google Patents
연마 장치 Download PDFInfo
- Publication number
- KR20140037763A KR20140037763A KR1020130109733A KR20130109733A KR20140037763A KR 20140037763 A KR20140037763 A KR 20140037763A KR 1020130109733 A KR1020130109733 A KR 1020130109733A KR 20130109733 A KR20130109733 A KR 20130109733A KR 20140037763 A KR20140037763 A KR 20140037763A
- Authority
- KR
- South Korea
- Prior art keywords
- top ring
- polishing
- connection sheet
- ring
- nozzle
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 151
- 238000005406 washing Methods 0.000 claims abstract description 85
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 85
- 239000000758 substrate Substances 0.000 claims abstract description 61
- 238000005507 spraying Methods 0.000 claims abstract description 8
- 238000004140 cleaning Methods 0.000 claims description 104
- 238000007789 sealing Methods 0.000 claims description 22
- 238000012546 transfer Methods 0.000 claims description 19
- 238000003825 pressing Methods 0.000 claims description 15
- 230000002093 peripheral effect Effects 0.000 claims description 13
- 238000000227 grinding Methods 0.000 claims description 12
- 239000007788 liquid Substances 0.000 abstract description 26
- 230000000903 blocking effect Effects 0.000 abstract 3
- 239000012528 membrane Substances 0.000 description 30
- 238000002347 injection Methods 0.000 description 19
- 239000007924 injection Substances 0.000 description 19
- 239000004065 semiconductor Substances 0.000 description 17
- 239000012530 fluid Substances 0.000 description 14
- 239000000356 contaminant Substances 0.000 description 12
- 239000000463 material Substances 0.000 description 7
- 239000002002 slurry Substances 0.000 description 6
- 239000004696 Poly ether ether ketone Substances 0.000 description 5
- JUPQTSLXMOCDHR-UHFFFAOYSA-N benzene-1,4-diol;bis(4-fluorophenyl)methanone Chemical compound OC1=CC=C(O)C=C1.C1=CC(F)=CC=C1C(=O)C1=CC=C(F)C=C1 JUPQTSLXMOCDHR-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000002783 friction material Substances 0.000 description 5
- 229920002530 polyetherether ketone Polymers 0.000 description 5
- 229920001971 elastomer Polymers 0.000 description 4
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 238000005096 rolling process Methods 0.000 description 4
- 239000011247 coating layer Substances 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 229920002943 EPDM rubber Polymers 0.000 description 2
- 229920000181 Ethylene propylene rubber Polymers 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000008595 infiltration Effects 0.000 description 2
- 238000001764 infiltration Methods 0.000 description 2
- 229920003225 polyurethane elastomer Polymers 0.000 description 2
- 229920002379 silicone rubber Polymers 0.000 description 2
- 239000004945 silicone rubber Substances 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 241000446313 Lamella Species 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical group FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012205394 | 2012-09-19 | ||
JPJP-P-2012-205394 | 2012-09-19 | ||
JPJP-P-2013-178935 | 2013-08-30 | ||
JP2013178935 | 2013-08-30 | ||
JP2013185884A JP2015062956A (ja) | 2012-09-19 | 2013-09-09 | 研磨装置 |
JPJP-P-2013-185884 | 2013-09-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20140037763A true KR20140037763A (ko) | 2014-03-27 |
Family
ID=50274942
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020130109733A KR20140037763A (ko) | 2012-09-19 | 2013-09-12 | 연마 장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20140080385A1 (ja) |
JP (1) | JP2015062956A (ja) |
KR (1) | KR20140037763A (ja) |
TW (1) | TW201417955A (ja) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104117916A (zh) * | 2014-07-21 | 2014-10-29 | 苏州塔可盛电子科技有限公司 | 一种防集屑式半自动往复抛光装置 |
JP6449194B2 (ja) * | 2015-05-25 | 2019-01-09 | 株式会社荏原製作所 | 研磨装置、研磨ヘッド、およびリテーナリング |
JP6517108B2 (ja) * | 2015-08-05 | 2019-05-22 | 株式会社ディスコ | Cmp研磨装置 |
JP6705362B2 (ja) * | 2016-10-25 | 2020-06-03 | 信越半導体株式会社 | 研磨ヘッドおよび研磨装置 |
JP6833591B2 (ja) * | 2016-10-28 | 2021-02-24 | 株式会社荏原製作所 | 基板保持装置、弾性膜、研磨装置、および弾性膜の交換方法 |
US11179823B2 (en) * | 2016-10-28 | 2021-11-23 | Ebara Corporation | Substrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane |
JP6941046B2 (ja) * | 2017-12-20 | 2021-09-29 | 株式会社荏原製作所 | 研磨ヘッドおよび研磨装置 |
KR102454873B1 (ko) * | 2018-02-01 | 2022-10-13 | 어플라이드 머티어리얼스, 인코포레이티드 | 도금 시스템의 세정 컴포넌트들 및 방법들 |
KR102486946B1 (ko) * | 2018-04-20 | 2023-01-09 | 어플라이드 머티어리얼스, 인코포레이티드 | 도금 시스템에서의 세정 컴포넌트들 및 방법들 |
JP7074606B2 (ja) * | 2018-08-02 | 2022-05-24 | 株式会社荏原製作所 | 基板を保持するためのトップリングおよび基板処理装置 |
CN111266993B (zh) * | 2018-12-05 | 2023-06-30 | 凯斯科技股份有限公司 | 化学机械式研磨装置用承载头的卡环及具备其的承载头 |
CN111300176B (zh) * | 2020-03-05 | 2021-10-22 | 深圳市可高机电有限公司 | 一种马达外壳拉伸件表面精加工处理工艺 |
CN111906597B (zh) * | 2020-08-05 | 2021-07-20 | 中国科学院西安光学精密机械研究所 | 一种大口径光学玻璃研磨抛光系统及方法 |
Family Cites Families (26)
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---|---|---|---|---|
US4326553A (en) * | 1980-08-28 | 1982-04-27 | Rca Corporation | Megasonic jet cleaner apparatus |
JP3187405B2 (ja) * | 1990-01-07 | 2001-07-11 | 忠弘 大見 | 高温・高圧洗浄方法及び洗浄装置 |
US6050884A (en) * | 1996-02-28 | 2000-04-18 | Ebara Corporation | Polishing apparatus |
JPH11347917A (ja) * | 1998-06-09 | 1999-12-21 | Ebara Corp | ポリッシング装置 |
JPH11347925A (ja) * | 1998-06-10 | 1999-12-21 | Ebara Corp | 基板受渡し装置 |
JP3701126B2 (ja) * | 1998-09-01 | 2005-09-28 | 株式会社荏原製作所 | 基板の洗浄方法及び研磨装置 |
KR100304706B1 (ko) * | 1999-06-16 | 2001-11-01 | 윤종용 | 화학기계적 연마장치 및 연마 헤드 내부의 오염 물질 세척방법 |
KR100355224B1 (ko) * | 1999-06-22 | 2002-10-11 | 삼성전자 주식회사 | 연마 헤드의 리테이너 링과 이를 구비한 화학기계적 연마장치 |
US6505636B1 (en) * | 2000-06-26 | 2003-01-14 | Lam Research Corporation | Apparatus for wafer carrier in-process clean and rinse |
US6481447B1 (en) * | 2000-09-27 | 2002-11-19 | Lam Research Corporation | Fluid delivery ring and methods for making and implementing the same |
JP2002299299A (ja) * | 2001-03-28 | 2002-10-11 | Toshiba Corp | 半導体基板研磨装置及びその洗浄方法 |
JP2004356517A (ja) * | 2003-05-30 | 2004-12-16 | Ebara Corp | 基板洗浄装置及び基板洗浄方法 |
US7044832B2 (en) * | 2003-11-17 | 2006-05-16 | Applied Materials | Load cup for chemical mechanical polishing |
JP2005191511A (ja) * | 2003-12-02 | 2005-07-14 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
TW200608453A (en) * | 2004-08-20 | 2006-03-01 | Aqua Science Corp | Object treating device and method |
JP2006066447A (ja) * | 2004-08-24 | 2006-03-09 | Komatsu Electronic Metals Co Ltd | ワークチャックの洗浄装置、ワークチャックの洗浄方法、及びワークチャックの洗浄装置を備えた研磨装置 |
US20060042664A1 (en) * | 2004-08-30 | 2006-03-02 | Vishwas Hardikar | Apparatus and method for removing a liquid from a rotating substrate surface |
KR100696378B1 (ko) * | 2005-04-13 | 2007-03-19 | 삼성전자주식회사 | 반도체 기판을 세정하는 장치 및 방법 |
US7052376B1 (en) * | 2005-05-26 | 2006-05-30 | United Microelectronics Corp. | Wafer carrier gap washer |
US7172496B1 (en) * | 2005-08-17 | 2007-02-06 | Agere Systems, Inc. | Method and apparatus for cleaning slurry depositions from a water carrier |
US7258599B2 (en) * | 2005-09-15 | 2007-08-21 | Fujitsu Limited | Polishing machine, workpiece supporting table pad, polishing method and manufacturing method of semiconductor device |
JP4829631B2 (ja) * | 2005-09-15 | 2011-12-07 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法及び研磨装置 |
JP2008272902A (ja) * | 2007-05-01 | 2008-11-13 | Tokyo Seimitsu Co Ltd | Cmp装置における研磨ヘッド洗浄装置及び研磨ヘッド洗浄方法 |
JP5464820B2 (ja) * | 2007-10-29 | 2014-04-09 | 株式会社荏原製作所 | 研磨装置 |
JP5199691B2 (ja) * | 2008-02-13 | 2013-05-15 | 株式会社荏原製作所 | 研磨装置 |
JP2009212459A (ja) * | 2008-03-06 | 2009-09-17 | Sharp Corp | Cmp装置及びウェハーの洗浄方法 |
-
2013
- 2013-09-09 JP JP2013185884A patent/JP2015062956A/ja active Pending
- 2013-09-12 KR KR1020130109733A patent/KR20140037763A/ko not_active Application Discontinuation
- 2013-09-16 TW TW102133450A patent/TW201417955A/zh unknown
- 2013-09-18 US US14/030,718 patent/US20140080385A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2015062956A (ja) | 2015-04-09 |
US20140080385A1 (en) | 2014-03-20 |
TW201417955A (zh) | 2014-05-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |