KR20090127041A - 기판 검사 장치 - Google Patents
기판 검사 장치 Download PDFInfo
- Publication number
- KR20090127041A KR20090127041A KR1020090017455A KR20090017455A KR20090127041A KR 20090127041 A KR20090127041 A KR 20090127041A KR 1020090017455 A KR1020090017455 A KR 1020090017455A KR 20090017455 A KR20090017455 A KR 20090017455A KR 20090127041 A KR20090127041 A KR 20090127041A
- Authority
- KR
- South Korea
- Prior art keywords
- lens
- line sensor
- led
- ccd line
- board
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Led Device Packages (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2008-147557 | 2008-06-05 | ||
JP2008147557A JP5395369B2 (ja) | 2008-06-05 | 2008-06-05 | 基板検査装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20090127041A true KR20090127041A (ko) | 2009-12-09 |
Family
ID=41542366
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020090017455A KR20090127041A (ko) | 2008-06-05 | 2009-03-02 | 기판 검사 장치 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5395369B2 (ja) |
KR (1) | KR20090127041A (ja) |
TW (1) | TW200951422A (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101182822B1 (ko) * | 2011-03-29 | 2012-09-13 | 삼성전자주식회사 | 발광소자 검사장치 및 방법 |
TWI596318B (zh) * | 2016-01-13 | 2017-08-21 | 德律科技股份有限公司 | 光學測量系統以及光學成像系統 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62103545A (ja) * | 1985-10-30 | 1987-05-14 | Nissan Motor Co Ltd | 鮮映性測定方法 |
JP2562299Y2 (ja) * | 1992-06-05 | 1998-02-10 | 大日本スクリーン製造株式会社 | 画像読取装置用の照明装置 |
JPH09236410A (ja) * | 1996-02-29 | 1997-09-09 | Idec Izumi Corp | 被検査対象検出装置 |
JP3570815B2 (ja) * | 1996-04-26 | 2004-09-29 | 松下電器産業株式会社 | 部品実装機用画像撮像装置 |
JPH11237850A (ja) * | 1998-02-23 | 1999-08-31 | Nokeg & G Opt Electronics Kk | Led表示装置 |
JP2000153601A (ja) * | 1998-11-19 | 2000-06-06 | Toshiba Mach Co Ltd | 印刷物監視装置 |
JP3634985B2 (ja) * | 1999-08-26 | 2005-03-30 | 住友大阪セメント株式会社 | 光学的表面検査機構及び光学的表面検査装置 |
JP2001242090A (ja) * | 2000-02-28 | 2001-09-07 | Nkk Corp | 表面検査装置 |
JP3686329B2 (ja) * | 2000-08-22 | 2005-08-24 | シーシーエス株式会社 | 表面検査用照明装置及び表面検査装置 |
JP3769670B2 (ja) * | 2002-02-18 | 2006-04-26 | 日本電気株式会社 | 多層配線構造 |
JP4222764B2 (ja) * | 2002-02-18 | 2009-02-12 | シーシーエス株式会社 | 検査用照明装置 |
JP3927878B2 (ja) * | 2002-04-16 | 2007-06-13 | シーシーエス株式会社 | 検査等に用いる照明装置 |
JP2004101311A (ja) * | 2002-09-09 | 2004-04-02 | Matsushita Electric Ind Co Ltd | ラインセンサカメラ用の照明装置および照明方法 |
JP2005337957A (ja) * | 2004-05-28 | 2005-12-08 | Dainippon Screen Mfg Co Ltd | 基板検査装置 |
JP2006275836A (ja) * | 2005-03-30 | 2006-10-12 | Dainippon Screen Mfg Co Ltd | 基板検査装置 |
TW200702656A (en) * | 2005-05-25 | 2007-01-16 | Olympus Corp | Surface defect inspection apparatus |
JP2008096430A (ja) * | 2006-09-13 | 2008-04-24 | Hitachi High-Technologies Corp | 欠陥検査方法およびその装置 |
-
2008
- 2008-06-05 JP JP2008147557A patent/JP5395369B2/ja active Active
-
2009
- 2009-03-02 TW TW098106704A patent/TW200951422A/zh unknown
- 2009-03-02 KR KR1020090017455A patent/KR20090127041A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
JP5395369B2 (ja) | 2014-01-22 |
JP2009294061A (ja) | 2009-12-17 |
TW200951422A (en) | 2009-12-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application | ||
J201 | Request for trial against refusal decision | ||
J301 | Trial decision |
Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20111024 Effective date: 20130318 |