KR20080014091A - 광 기억 매체 검사 장치, 광 기억 매체 및 그 재생 및 기록장치 - Google Patents
광 기억 매체 검사 장치, 광 기억 매체 및 그 재생 및 기록장치 Download PDFInfo
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- G11B20/10111—Improvement or modification of read or write signals filtering or equalising, e.g. setting the tap weights of an FIR filter using partial response filtering when writing the signal to the medium or reading it therefrom partial response PR(1,2,2,1)
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Abstract
Description
Claims (9)
- 광 빔을 광 기억 매체에 조사해서, 상기 광 기억 매체로부터 반사된 광 빔을 수광해서, 수광한 광에 근거하는 신호를 출력하는 광 픽업 헤드와,상기 광 픽업 헤드로부터 출력되는 신호의 지터를 계측하는 지터 계측부와,상기 계측한 지터로부터 상기 광 기억 매체가 양품인가 불량품인가의 여부를 판별하는 판별부를 구비하고,상기 지터 계측부는, 디지털 정보가 2 이상의 정수 k와 주기 T를 기본으로 하는 길이가 kT인 마크 혹은 스페이스 열로서 기록되어 있는 광 기억 매체에 대하여, 길이가 2T의 마크 또는 스페이스에 관한 에지(edge)로부터 얻어지는 신호의 지터를 제외하고, 지터를 계측하는 광 기억 매체 검사 장치.
- 제1항에 있어서, 상기 지터 계측부는, 길이가 2T인 마크의 폭이, 길이가 2T보다도 긴 마크의 폭보다도 좁은 광 기억 매체로부터의 지터를 계측하는 것을 특징으로 하는 광 기억 매체 검사 장치.
- 제1항에 있어서, 길이가 2T인 디지털 데이터의 마크 및 스페이스가 반복해 기록된 패턴으로부터 얻어지는 신호를 Ⅰ2pp로 하고, 길이가 8T인 디지털 정보의 마크 및 스페이스가 반복해 기록된 패턴으로부터 얻어지는 신호를 Ⅰ8pp로 하였을 때, Ⅰ2pp/Ⅰ8pp<0.2인 것을 특징으로 하는 광 기억 매체 검사 장치.
- 제1항에 있어서, 길이가 2T인 디지털 데이터의 마크 및 스페이스의 1쌍의 길이를 ML이라고 하고, 광 픽업 헤드가 조사하는 광 빔의 파장을 λ라고 하고, 광 픽업 헤드의 집광(集光) 광학계의 개구수(開口數)를 NA라고 하였을 때, ML<λ/(1.25·NA)인 것을 특징으로 하는 광 기억 매체 검사 장치.
- 제1항에 있어서, 상기 지터 계측부는, 조사된 광의 일부가 투과하는 반 투과 막(膜)으로서 형성되는 제1기록 층, 및 제2기록 층을 갖는 상기 광 기억 매체의 지터를 계측하는 것으로서, 일부의 광이 상기 제1기록 층을 투과하여 상기 제2기록 층에 도달해서 상기 제2기록 층으로부터 얻어지는 신호의 지터를 계측하는 것을 특징으로 하는 광 기억 매체 검사 장치.
- 제1항에 있어서, 상기 광 기억 매체의 반사율이 변동하였을 경우에 복조(復調) 수단에 입력되는 신호의 진폭의 변동을 감소시키는 이득 조정 수단을 추가로 포함하는 것을 특징으로 하는 광 기억 매체 검사 장치.
- 지터가 계측됨으로써, 양품인가 불량품인가의 여부가 판별되는 광 기억 매체로서,디지털 정보는, 정수 k와 주기 T로 하는 길이가 kT인 마크 또는 스페이스 열로서 기록되며,상기 계측되는 지터는, 길이가 2T의 마크 또는 스페이스에 관한 지터 이외의 지터인, 광 기억 매체.
- 제7항에 기재한 광 기억 매체로부터 정보를 재생하기 위한 재생 장치.
- 제7항에 기재한 광 기억 매체에 정보를 기록하기 위한 기록 장치.
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
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JPJP-P-2002-00100961 | 2002-04-03 | ||
JP2002100961 | 2002-04-03 | ||
JP2002152904 | 2002-05-27 | ||
JPJP-P-2002-00152904 | 2002-05-27 | ||
JP2002217856 | 2002-07-26 | ||
JPJP-P-2002-00217856 | 2002-07-26 |
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KR1020047015220A Division KR100982847B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법 |
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KR20080014091A true KR20080014091A (ko) | 2008-02-13 |
KR100982851B1 KR100982851B1 (ko) | 2010-09-16 |
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KR1020097019315A KR100982829B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020077030706A KR100982815B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 장치 |
KR1020107013089A KR101034413B1 (ko) | 2002-04-03 | 2003-04-02 | 광 정보 장치 |
KR1020107022223A KR101127300B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법, 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020097008321A KR100944074B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법, 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020047015220A KR100982847B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법 |
KR1020077030707A KR100982851B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 장치 |
KR1020107001536A KR100998826B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법, 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020077030708A KR100918900B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 장치 및 광 기억 매체 검사 방법 |
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KR1020097019315A KR100982829B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020077030706A KR100982815B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 장치 |
KR1020107013089A KR101034413B1 (ko) | 2002-04-03 | 2003-04-02 | 광 정보 장치 |
KR1020107022223A KR101127300B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법, 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020097008321A KR100944074B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법, 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020047015220A KR100982847B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법 |
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KR1020107001536A KR100998826B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 방법, 광 기억 매체 및 그 재생 및 기록 장치 |
KR1020077030708A KR100918900B1 (ko) | 2002-04-03 | 2003-04-02 | 광 기억 매체 검사 장치 및 광 기억 매체 검사 방법 |
Country Status (8)
Country | Link |
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US (10) | US20060007828A1 (ko) |
EP (6) | EP2275828A3 (ko) |
JP (5) | JPWO2003088221A1 (ko) |
KR (9) | KR100982829B1 (ko) |
CN (11) | CN101685641B (ko) |
AU (1) | AU2003220789A1 (ko) |
MX (1) | MXPA04009524A (ko) |
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