KR20020073750A - 반복적인 고속 편광 스크램블링을 이용한 편광의존성 손실측정장치 및 방법 - Google Patents
반복적인 고속 편광 스크램블링을 이용한 편광의존성 손실측정장치 및 방법 Download PDFInfo
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- KR20020073750A KR20020073750A KR1020010013540A KR20010013540A KR20020073750A KR 20020073750 A KR20020073750 A KR 20020073750A KR 1020010013540 A KR1020010013540 A KR 1020010013540A KR 20010013540 A KR20010013540 A KR 20010013540A KR 20020073750 A KR20020073750 A KR 20020073750A
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- South Korea
- Prior art keywords
- light
- polarization
- frequency
- modulators
- output
- Prior art date
Links
- 230000010287 polarization Effects 0.000 title claims abstract description 87
- 238000000034 method Methods 0.000 title claims abstract description 39
- 238000005259 measurement Methods 0.000 title claims abstract description 24
- 230000001419 dependent effect Effects 0.000 title abstract description 5
- 239000013307 optical fiber Substances 0.000 claims abstract description 19
- 238000012935 Averaging Methods 0.000 claims abstract description 11
- 230000001360 synchronised effect Effects 0.000 claims abstract description 10
- 239000000835 fiber Substances 0.000 claims abstract description 3
- 230000003287 optical effect Effects 0.000 claims description 26
- 238000012360 testing method Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 3
- 238000010408 sweeping Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims 1
- 229940125730 polarisation modulator Drugs 0.000 abstract description 4
- 230000003252 repetitive effect Effects 0.000 abstract 1
- 229920000740 poly(D-lysine) polymer Polymers 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
- G01M11/337—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization dependent loss [PDL]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/105—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type having optical polarisation effects
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Communication System (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
평균화 회수 | 소요시간 | 편광의존성 손실 측정값(dB) |
1 | 0.1밀리초 | 1.422 |
10 | 1밀리초 | 0.888 |
100 | 10밀리초 | 0.804 |
1000 | 0.1초 | 0.723 |
Claims (6)
- (a) 광원과;(b) 상기 광원으로부터 나오는 광을 편광상태의 광으로 만들어주는 편광기와;(c-1) 적어도 세 개의 원통형 압전소자들과, 이들의 외벽 둘레에 단절없이 각각 권선된 광섬유로 이루어진 광섬유 복굴절 변조기들과,(c-2) 상기 광섬유 복굴절 변조기마다, 하나의 클락에 동기되어 있으며 정해진 주파수 F와 서로 소인 정수의 곱에 해당하는 주파수의 교류전압을 인가하는 교류전압원들을 포함하여,(c) 상기 편광기로부터 편광된 광을 입력광으로서 받는 한편, 주파수 F로 반복되는 편광상태를 가지는 출력광을 내보내는 편광 스크램블러와;(d) 상기 편광 스크램블러의 출력광이 측정대상을 통과한 후, 그 통과광을 검출하는 광 검출기와;(f) 상기 복굴절 변조기들의 클락에 동기되어 매 주기의 통과광의 세기를 제공하는 아날로그-디지털 변환기와;(g) 상기 아날로그-디지털 변환기에서 나오는 매 주기의 통과광의 세기 변화 파형을 평균화하여 매 측정에 수반되는 잡음을 억제시키는 디지털 신호처리부;를 구비하는 편광의존성 손실 측정장치.
- 제1항에 있어서, 상기 복굴절 변조기들 중의 인접한 것 사이의 복굴절축이 서로 48도의 각도가 되도록, 상기 변조기들 사이를 연결하는 광섬유가 비틀어진 상태를 유지하고 있는 것을 특징으로 하는 편광의존성 손실 측정장치.
- 제1항에 있어서, 상기 주파수 F가 1㎑, 2㎑, 5㎑ 및 10㎑로 구성된 주파수 군으로부터 선택된 어느 하나인 것을 특징으로 하는 편광의존성 손실 측정장치.
- 제1항에 있어서, 상기 복굴절 변조기의 변조진폭이 3.14 이상인 것을 특징으로 하는 편광의존성 손실 측정장치.
- 제1항에 있어서, 상기 압전소자들의 외벽 둘레에 각각 권선된 광섬유가 단일모드 광섬유인 것을 특징으로 하는 편광의존성 손실 측정장치.
- 일정하게 편광된 입력광을 마련하는 단계와;적어도 세 개의 원통형 압전소자들과, 이들의 외벽 둘레에 단절없이 각각 권선된 광섬유로 이루어진 광섬유 복굴절 변조기들과, 상기 광섬유 복굴절 변조기마다, 하나의 클락에 동기되어 있으며 정해진 주파수 F와 서로 소인 정수의 곱에 해당하는 주파수의 교류전압을 인가하는 교류전압원 들을 포함하는 편광 스크램블러에 상기 입력광을 입력하고, 주파수 F로 반복되는 편광상태를 가지는 출력광을 내보내게 하는 단계와;상기 편광 스크램블러로부터의 출력광을 시험대상 광부품에 통과시키는 단계와;상기 광부품을 통과한 광의 출력을 광 검출기로 검출하는 단계와;상기 광 검출기의 검출값을 일정 주기의 복굴절 변조에 대해 평균을 취한 후, 그 주기에 대해 최대 출력과 최소 출력의 비율로부터 편광의존성 손실을 계산하는 단계;를 구비하는 것을 특징으로 하는 편광의존성 손실 측정방법.
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0013540A KR100380255B1 (ko) | 2001-03-16 | 2001-03-16 | 반복적인 고속 편광 스크램블링을 이용한 편광의존성 손실측정장치 및 방법 |
PCT/KR2002/000195 WO2002077680A1 (en) | 2001-03-16 | 2002-02-07 | Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling |
DE60206735T DE60206735T2 (de) | 2001-03-16 | 2002-02-07 | Vorrichtung und verfahren zur bestimmung polarisationsabhängiger verluste durch wiederholte hochgeschwindigkeitspolarisationsstörung |
US10/276,480 US6657709B2 (en) | 2001-03-16 | 2002-02-07 | Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling |
JP2002575679A JP2004519682A (ja) | 2001-03-16 | 2002-02-07 | 繰り返しの高速偏光スクランブリングを用いた偏光依存性の損失測定装置及び方法 |
CNB028006712A CN1214258C (zh) | 2001-03-16 | 2002-02-07 | 利用反复的高速偏振扰频测量偏振依赖损耗的装置和方法 |
CA002409182A CA2409182C (en) | 2001-03-16 | 2002-02-07 | Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling |
EP02700829A EP1368678B1 (en) | 2001-03-16 | 2002-02-07 | Apparatus and method for measuring polarization dependent loss using repeated high speed polarization scrambling |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR10-2001-0013540A KR100380255B1 (ko) | 2001-03-16 | 2001-03-16 | 반복적인 고속 편광 스크램블링을 이용한 편광의존성 손실측정장치 및 방법 |
Publications (2)
Publication Number | Publication Date |
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KR20020073750A true KR20020073750A (ko) | 2002-09-28 |
KR100380255B1 KR100380255B1 (ko) | 2003-04-18 |
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KR10-2001-0013540A KR100380255B1 (ko) | 2001-03-16 | 2001-03-16 | 반복적인 고속 편광 스크램블링을 이용한 편광의존성 손실측정장치 및 방법 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6657709B2 (ko) |
EP (1) | EP1368678B1 (ko) |
JP (1) | JP2004519682A (ko) |
KR (1) | KR100380255B1 (ko) |
CN (1) | CN1214258C (ko) |
CA (1) | CA2409182C (ko) |
DE (1) | DE60206735T2 (ko) |
WO (1) | WO2002077680A1 (ko) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7522785B2 (en) * | 2004-12-01 | 2009-04-21 | General Photonics Corporation | Measurements of polarization-dependent loss (PDL) and degree of polarization (DOP) using optical polarization controllers |
DE602005006958D1 (de) * | 2005-01-12 | 2008-07-03 | Alcatel Lucent | Optisches Kommunikationssystem zur Verminderung der Polarisationsmodendispersion mittels Polarisationsverwürfler |
EP1901052B1 (en) | 2006-09-16 | 2010-11-03 | Acterna, LLC | Measuring polarization mode dispersion |
US8059958B1 (en) | 2008-10-10 | 2011-11-15 | Sprint Communications Company L.P. | Measurement of polarization dependent loss in an optical transmission system |
CN103954435B (zh) * | 2014-04-30 | 2016-05-25 | 武汉光迅科技股份有限公司 | 一种检测相位延迟和偏振相关损耗的装置及其检测方法 |
CA2962215A1 (en) * | 2017-01-06 | 2018-07-06 | Sterlite Technologies Limited | Method and system for differentiating macro-bend losses from splice and connector losses in fiber-optic links |
CN106842765A (zh) * | 2017-03-23 | 2017-06-13 | 桂林电子科技大学 | 基于光纤非线性增益偏振相关性的光域偏振锁定装置及锁定方法 |
CN111366334B (zh) * | 2018-12-26 | 2022-05-13 | 海思光电子有限公司 | 偏振相关损耗的确定方法、检测系统及光信号传输结构 |
JP7347064B2 (ja) * | 2019-09-20 | 2023-09-20 | 富士通株式会社 | 光ネットワーク装置および伝送路監視方法 |
CN114448612B (zh) * | 2020-11-06 | 2023-12-22 | 科大国盾量子技术股份有限公司 | 一种时分复用光路插损测量装置及方法 |
Family Cites Families (15)
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US5298972A (en) * | 1990-01-22 | 1994-03-29 | Hewlett-Packard Company | Method and apparatus for measuring polarization sensitivity of optical devices |
US5337375A (en) * | 1992-12-31 | 1994-08-09 | At&T Bell Laboratories | Depolarizer using unpumped, doped optical fiber and method using same |
JPH0763669A (ja) | 1993-08-23 | 1995-03-10 | Sun Tec Kk | 偏波依存損失測定装置、偏波依存損失測定用光源装置及び偏波依存損失測定用受光装置 |
US5371597A (en) * | 1993-11-23 | 1994-12-06 | At&T Corp. | System and method for measuring polarization dependent loss |
JPH07243940A (ja) * | 1994-03-04 | 1995-09-19 | Nippon Telegr & Teleph Corp <Ntt> | 偏波依存損失測定方法および装置 |
TW312744B (ko) * | 1994-10-11 | 1997-08-11 | Adoban Tesuto Kk | |
JPH08278202A (ja) * | 1995-04-04 | 1996-10-22 | Advantest Corp | 偏光解析用光学系装置及びこれを用いた偏光解析装置 |
JPH08313354A (ja) * | 1995-05-23 | 1996-11-29 | Advantest Corp | 偏光依存性損失測定装置 |
JP3131144B2 (ja) * | 1996-03-29 | 2001-01-31 | 株式会社アドバンテスト | 偏波モード分散の測定装置 |
JP3107027B2 (ja) * | 1997-12-25 | 2000-11-06 | 日本電気株式会社 | 光部品特性測定システム |
US6137925A (en) * | 1998-11-24 | 2000-10-24 | Agilent Technologies Inc. | Multi-wavelength polarization scrambling device |
US6449033B2 (en) | 1999-04-26 | 2002-09-10 | Corning Incorporated | Apparatus and method for measuring polarization dependent loss |
JP2000329649A (ja) | 1999-05-19 | 2000-11-30 | Advantest Corp | 偏光依存損失測定装置 |
US6480637B1 (en) * | 2000-09-30 | 2002-11-12 | General Photonics Corporation | Fiber squeezer polarization controller with low activation loss |
US6493474B1 (en) * | 2000-09-30 | 2002-12-10 | General Photonics Corporation | Fiber devices based on fiber squeezer polarization controllers |
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2001
- 2001-03-16 KR KR10-2001-0013540A patent/KR100380255B1/ko active IP Right Grant
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2002
- 2002-02-07 JP JP2002575679A patent/JP2004519682A/ja active Pending
- 2002-02-07 EP EP02700829A patent/EP1368678B1/en not_active Expired - Lifetime
- 2002-02-07 DE DE60206735T patent/DE60206735T2/de not_active Expired - Lifetime
- 2002-02-07 CA CA002409182A patent/CA2409182C/en not_active Expired - Fee Related
- 2002-02-07 CN CNB028006712A patent/CN1214258C/zh not_active Expired - Lifetime
- 2002-02-07 WO PCT/KR2002/000195 patent/WO2002077680A1/en active IP Right Grant
- 2002-02-07 US US10/276,480 patent/US6657709B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1368678A1 (en) | 2003-12-10 |
DE60206735T2 (de) | 2006-04-20 |
US20030111998A1 (en) | 2003-06-19 |
CA2409182A1 (en) | 2002-10-03 |
EP1368678A4 (en) | 2003-12-10 |
CN1214258C (zh) | 2005-08-10 |
EP1368678B1 (en) | 2005-10-19 |
JP2004519682A (ja) | 2004-07-02 |
CA2409182C (en) | 2009-11-17 |
KR100380255B1 (ko) | 2003-04-18 |
WO2002077680A1 (en) | 2002-10-03 |
DE60206735D1 (de) | 2006-03-02 |
US6657709B2 (en) | 2003-12-02 |
CN1459037A (zh) | 2003-11-26 |
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