DE60206735D1 - Vorrichtung und verfahren zur bestimmung polarisationsabhängiger verluste durch wiederholte hochgeschwindigkeitspolarisationsstörung - Google Patents

Vorrichtung und verfahren zur bestimmung polarisationsabhängiger verluste durch wiederholte hochgeschwindigkeitspolarisationsstörung

Info

Publication number
DE60206735D1
DE60206735D1 DE60206735T DE60206735T DE60206735D1 DE 60206735 D1 DE60206735 D1 DE 60206735D1 DE 60206735 T DE60206735 T DE 60206735T DE 60206735 T DE60206735 T DE 60206735T DE 60206735 D1 DE60206735 D1 DE 60206735D1
Authority
DE
Germany
Prior art keywords
polarization
repeated high
determining
speed
related losses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60206735T
Other languages
English (en)
Other versions
DE60206735T2 (de
Inventor
Yeon-Wan Koh
Bong-Wan Lee
Jung-Won Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Donam Systems Inc
Original Assignee
Donam Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Donam Systems Inc filed Critical Donam Systems Inc
Publication of DE60206735D1 publication Critical patent/DE60206735D1/de
Application granted granted Critical
Publication of DE60206735T2 publication Critical patent/DE60206735T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/337—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization dependent loss [PDL]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/105—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type having optical polarisation effects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Communication System (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE60206735T 2001-03-16 2002-02-07 Vorrichtung und verfahren zur bestimmung polarisationsabhängiger verluste durch wiederholte hochgeschwindigkeitspolarisationsstörung Expired - Lifetime DE60206735T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR2001013540 2001-03-16
KR10-2001-0013540A KR100380255B1 (ko) 2001-03-16 2001-03-16 반복적인 고속 편광 스크램블링을 이용한 편광의존성 손실측정장치 및 방법
PCT/KR2002/000195 WO2002077680A1 (en) 2001-03-16 2002-02-07 Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling

Publications (2)

Publication Number Publication Date
DE60206735D1 true DE60206735D1 (de) 2006-03-02
DE60206735T2 DE60206735T2 (de) 2006-04-20

Family

ID=36120935

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60206735T Expired - Lifetime DE60206735T2 (de) 2001-03-16 2002-02-07 Vorrichtung und verfahren zur bestimmung polarisationsabhängiger verluste durch wiederholte hochgeschwindigkeitspolarisationsstörung

Country Status (8)

Country Link
US (1) US6657709B2 (de)
EP (1) EP1368678B1 (de)
JP (1) JP2004519682A (de)
KR (1) KR100380255B1 (de)
CN (1) CN1214258C (de)
CA (1) CA2409182C (de)
DE (1) DE60206735T2 (de)
WO (1) WO2002077680A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7522785B2 (en) * 2004-12-01 2009-04-21 General Photonics Corporation Measurements of polarization-dependent loss (PDL) and degree of polarization (DOP) using optical polarization controllers
ATE396557T1 (de) * 2005-01-12 2008-06-15 Alcatel Lucent Optisches kommunikationssystem zur verminderung der polarisationsmodendispersion mittels polarisationsverwürfler
ES2353530T3 (es) 2006-09-16 2011-03-02 Acterna, Llc Medición de la dispersión de modo de polarización.
US8059958B1 (en) 2008-10-10 2011-11-15 Sprint Communications Company L.P. Measurement of polarization dependent loss in an optical transmission system
CN103954435B (zh) * 2014-04-30 2016-05-25 武汉光迅科技股份有限公司 一种检测相位延迟和偏振相关损耗的装置及其检测方法
GB2558961A (en) * 2017-01-06 2018-07-25 Sterlite Tech Ltd Method and system for differentiating macro-bend losses from splice and connector losses in fiber-optic links
CN106842765A (zh) * 2017-03-23 2017-06-13 桂林电子科技大学 基于光纤非线性增益偏振相关性的光域偏振锁定装置及锁定方法
CN111366334B (zh) 2018-12-26 2022-05-13 海思光电子有限公司 偏振相关损耗的确定方法、检测系统及光信号传输结构
JP7347064B2 (ja) * 2019-09-20 2023-09-20 富士通株式会社 光ネットワーク装置および伝送路監視方法
CN114448612B (zh) * 2020-11-06 2023-12-22 科大国盾量子技术股份有限公司 一种时分复用光路插损测量装置及方法
US20220390322A1 (en) * 2021-06-07 2022-12-08 Viavi Solutions Inc. Techniques for providing a swept wavelength (sw) measurement for acquiring polarization dependent loss (pdl) in a single scan

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5298972A (en) * 1990-01-22 1994-03-29 Hewlett-Packard Company Method and apparatus for measuring polarization sensitivity of optical devices
US5337375A (en) * 1992-12-31 1994-08-09 At&T Bell Laboratories Depolarizer using unpumped, doped optical fiber and method using same
JPH0763669A (ja) 1993-08-23 1995-03-10 Sun Tec Kk 偏波依存損失測定装置、偏波依存損失測定用光源装置及び偏波依存損失測定用受光装置
US5371597A (en) * 1993-11-23 1994-12-06 At&T Corp. System and method for measuring polarization dependent loss
JPH07243940A (ja) * 1994-03-04 1995-09-19 Nippon Telegr & Teleph Corp <Ntt> 偏波依存損失測定方法および装置
TW312744B (de) * 1994-10-11 1997-08-11 Adoban Tesuto Kk
JPH08313354A (ja) * 1995-05-23 1996-11-29 Advantest Corp 偏光依存性損失測定装置
JPH08278202A (ja) * 1995-04-04 1996-10-22 Advantest Corp 偏光解析用光学系装置及びこれを用いた偏光解析装置
JP3131144B2 (ja) * 1996-03-29 2001-01-31 株式会社アドバンテスト 偏波モード分散の測定装置
JP3107027B2 (ja) * 1997-12-25 2000-11-06 日本電気株式会社 光部品特性測定システム
US6137925A (en) * 1998-11-24 2000-10-24 Agilent Technologies Inc. Multi-wavelength polarization scrambling device
US6449033B2 (en) 1999-04-26 2002-09-10 Corning Incorporated Apparatus and method for measuring polarization dependent loss
JP2000329649A (ja) 1999-05-19 2000-11-30 Advantest Corp 偏光依存損失測定装置
US6493474B1 (en) * 2000-09-30 2002-12-10 General Photonics Corporation Fiber devices based on fiber squeezer polarization controllers
US6480637B1 (en) * 2000-09-30 2002-11-12 General Photonics Corporation Fiber squeezer polarization controller with low activation loss

Also Published As

Publication number Publication date
KR100380255B1 (ko) 2003-04-18
EP1368678A1 (de) 2003-12-10
CN1214258C (zh) 2005-08-10
CA2409182A1 (en) 2002-10-03
EP1368678B1 (de) 2005-10-19
EP1368678A4 (de) 2003-12-10
CA2409182C (en) 2009-11-17
KR20020073750A (ko) 2002-09-28
WO2002077680A1 (en) 2002-10-03
JP2004519682A (ja) 2004-07-02
US20030111998A1 (en) 2003-06-19
DE60206735T2 (de) 2006-04-20
CN1459037A (zh) 2003-11-26
US6657709B2 (en) 2003-12-02

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