KR102289103B1 - 전자부품 핸들러용 개방장치 - Google Patents

전자부품 핸들러용 개방장치 Download PDF

Info

Publication number
KR102289103B1
KR102289103B1 KR1020170155892A KR20170155892A KR102289103B1 KR 102289103 B1 KR102289103 B1 KR 102289103B1 KR 1020170155892 A KR1020170155892 A KR 1020170155892A KR 20170155892 A KR20170155892 A KR 20170155892A KR 102289103 B1 KR102289103 B1 KR 102289103B1
Authority
KR
South Korea
Prior art keywords
loading
electronic component
opening
carrier frame
frame
Prior art date
Application number
KR1020170155892A
Other languages
English (en)
Korean (ko)
Other versions
KR20190058164A (ko
Inventor
김조희
김동일
김원희
Original Assignee
(주)테크윙
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)테크윙 filed Critical (주)테크윙
Priority to KR1020170155892A priority Critical patent/KR102289103B1/ko
Priority to CN201811122542.0A priority patent/CN109807084B/zh
Priority to TW107136924A priority patent/TWI699319B/zh
Publication of KR20190058164A publication Critical patent/KR20190058164A/ko
Priority to KR1020210090088A priority patent/KR102438462B1/ko
Application granted granted Critical
Publication of KR102289103B1 publication Critical patent/KR102289103B1/ko
Priority to KR1020220107158A priority patent/KR102624971B1/ko
Priority to KR1020240003797A priority patent/KR20240011210A/ko

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
KR1020170155892A 2017-11-21 2017-11-21 전자부품 핸들러용 개방장치 KR102289103B1 (ko)

Priority Applications (6)

Application Number Priority Date Filing Date Title
KR1020170155892A KR102289103B1 (ko) 2017-11-21 2017-11-21 전자부품 핸들러용 개방장치
CN201811122542.0A CN109807084B (zh) 2017-11-21 2018-09-26 电子部件分选机用开放装置
TW107136924A TWI699319B (zh) 2017-11-21 2018-10-19 電子部件分選機用開放裝置
KR1020210090088A KR102438462B1 (ko) 2017-11-21 2021-07-09 전자부품 핸들러용 개방장치
KR1020220107158A KR102624971B1 (ko) 2017-11-21 2022-08-25 전자부품 핸들러용 캐리어프레임
KR1020240003797A KR20240011210A (ko) 2017-11-21 2024-01-09 전자부품 핸들러용 캐리어프레임

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020170155892A KR102289103B1 (ko) 2017-11-21 2017-11-21 전자부품 핸들러용 개방장치

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020210090088A Division KR102438462B1 (ko) 2017-11-21 2021-07-09 전자부품 핸들러용 개방장치

Publications (2)

Publication Number Publication Date
KR20190058164A KR20190058164A (ko) 2019-05-29
KR102289103B1 true KR102289103B1 (ko) 2021-08-13

Family

ID=66601485

Family Applications (4)

Application Number Title Priority Date Filing Date
KR1020170155892A KR102289103B1 (ko) 2017-11-21 2017-11-21 전자부품 핸들러용 개방장치
KR1020210090088A KR102438462B1 (ko) 2017-11-21 2021-07-09 전자부품 핸들러용 개방장치
KR1020220107158A KR102624971B1 (ko) 2017-11-21 2022-08-25 전자부품 핸들러용 캐리어프레임
KR1020240003797A KR20240011210A (ko) 2017-11-21 2024-01-09 전자부품 핸들러용 캐리어프레임

Family Applications After (3)

Application Number Title Priority Date Filing Date
KR1020210090088A KR102438462B1 (ko) 2017-11-21 2021-07-09 전자부품 핸들러용 개방장치
KR1020220107158A KR102624971B1 (ko) 2017-11-21 2022-08-25 전자부품 핸들러용 캐리어프레임
KR1020240003797A KR20240011210A (ko) 2017-11-21 2024-01-09 전자부품 핸들러용 캐리어프레임

Country Status (3)

Country Link
KR (4) KR102289103B1 (zh)
CN (1) CN109807084B (zh)
TW (1) TWI699319B (zh)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100232260B1 (ko) * 1997-11-13 1999-12-01 윤종용 테스트 소켓 및 그를 이용한 모듈 테스트 장치
KR100689972B1 (ko) * 2006-01-26 2007-03-12 미래산업 주식회사 모듈 아이씨 테스트 핸들러

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10291140A (ja) * 1997-04-17 1998-11-04 Sanyu Kikai Seisakusho:Kk 無端状ベルトを用いた部品供給装置
KR101304274B1 (ko) * 2008-12-31 2013-09-26 (주)테크윙 테스트 핸들러의 픽앤플레이스장치
KR101505955B1 (ko) * 2009-11-17 2015-03-27 (주)테크윙 테스트핸들러용 개방장치
KR101439129B1 (ko) * 2010-06-14 2014-09-18 (주)테크윙 모듈아이씨 핸들러
KR101499574B1 (ko) * 2010-06-15 2015-03-10 (주)테크윙 모듈아이씨 핸들러 및 모듈아이씨 핸들러에서의 로딩방법
TWM469293U (zh) * 2013-08-07 2014-01-01 Chroma Ate Inc 可調整寬度之移載裝置
KR101439128B1 (ko) * 2014-05-14 2014-09-18 (주)테크윙 핸들러용 가압장치 및 핸들러
CN205325058U (zh) * 2015-12-28 2016-06-22 常州市第一橡塑设备有限公司 一种h钢定位组装夹具
KR102550248B1 (ko) * 2016-02-02 2023-07-03 (주)테크윙 운송 설비
KR102650702B1 (ko) * 2016-03-04 2024-03-25 (주)테크윙 전자부품 공급용 트레이 공급대차 및 전자부품을 처리하는 핸들러
CN205946509U (zh) * 2016-08-28 2017-02-08 中山市鸿菊自动化设备制造有限公司 一种贴片机新型pcb进出板机构
CN106935897B (zh) * 2017-03-14 2023-09-19 深圳市联赢激光股份有限公司 一种兼容型夹具

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100232260B1 (ko) * 1997-11-13 1999-12-01 윤종용 테스트 소켓 및 그를 이용한 모듈 테스트 장치
KR100689972B1 (ko) * 2006-01-26 2007-03-12 미래산업 주식회사 모듈 아이씨 테스트 핸들러

Also Published As

Publication number Publication date
TWI699319B (zh) 2020-07-21
TW201925065A (zh) 2019-07-01
KR20190058164A (ko) 2019-05-29
CN109807084A (zh) 2019-05-28
KR20210090136A (ko) 2021-07-19
KR20240011210A (ko) 2024-01-25
KR20220131374A (ko) 2022-09-27
KR102624971B1 (ko) 2024-01-16
CN109807084B (zh) 2022-01-04
KR102438462B1 (ko) 2022-09-01

Similar Documents

Publication Publication Date Title
US7258703B2 (en) Apparatus and method for aligning devices on carriers
KR102650702B1 (ko) 전자부품 공급용 트레이 공급대차 및 전자부품을 처리하는 핸들러
TWI448703B (zh) 電子部件測試設備用分選機及向裝載機構裝載電子部件之方法
KR100724044B1 (ko) 반도체 제조 공정용 이송장치
KR102289103B1 (ko) 전자부품 핸들러용 개방장치
KR102249574B1 (ko) 전자부품 언로딩장비
KR20150096912A (ko) 반도체소자 테스트용 핸들러 및 반도체소자 테스트용 핸들러의 작동 방법
KR101508507B1 (ko) 비전검사장비의 픽커 유니트
KR20010081820A (ko) 모듈 테스트 핸들러
KR101007934B1 (ko) 테스트 트레이 이송 방법 및 장치
KR102252639B1 (ko) 전자부품 언로딩장비
US6190111B1 (en) Tray inverting apparatus and methods
KR100988520B1 (ko) 확장장치 및 이를 구비한 칩 분류장치
KR20220063137A (ko) 전자부품 이동장치
KR101029064B1 (ko) 반도체 소자 이송장치 및 이를 포함하는 테스트 핸들러
KR101308050B1 (ko) 전자부품 검사 지원 장치의 로딩방법
KR940009574B1 (ko) 디바이스 테스터용 핸들러
KR102231407B1 (ko) 전자부품 분류 장비
CN219378034U (zh) 一种芯片测试分选设备
KR102606650B1 (ko) 픽커 팁 교환 장치
KR20230001222A (ko) 전자부품 테스트용 핸들러의 거치기
KR20200121191A (ko) 테스트 핸들러용 유저 트레이 정렬 장치, 테스트 핸들러용 유저 트레이 정렬 방법 및 테스트 핸들러
KR20210107371A (ko) 전자부품 테스트 핸들러
KR101541038B1 (ko) 기판 로딩 장치
KR20220019493A (ko) 보드 조립체 및 이를 포함하는 테스트 핸들러

Legal Events

Date Code Title Description
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right