KR102031991B1 - 콘투어된 컵 저부를 갖는 도금 컵 - Google Patents

콘투어된 컵 저부를 갖는 도금 컵 Download PDF

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Publication number
KR102031991B1
KR102031991B1 KR1020120101238A KR20120101238A KR102031991B1 KR 102031991 B1 KR102031991 B1 KR 102031991B1 KR 1020120101238 A KR1020120101238 A KR 1020120101238A KR 20120101238 A KR20120101238 A KR 20120101238A KR 102031991 B1 KR102031991 B1 KR 102031991B1
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KR
South Korea
Prior art keywords
wafer
cup
during electroplating
elastomeric seal
engaging
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KR1020120101238A
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Korean (ko)
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KR20130028888A (ko
Inventor
지안 헤
징빈 펑
산티나트 공가디
프레데릭 디 윌모트
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노벨러스 시스템즈, 인코포레이티드
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Publication of KR20130028888A publication Critical patent/KR20130028888A/ko
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    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/06—Suspending or supporting devices for articles to be coated
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/004—Sealing devices
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/005—Contacting devices
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/007—Current directing devices
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/10—Electrodes, e.g. composition, counter electrode
    • C25D17/12—Shape or form
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00—Electroplating characterised by the article coated
    • C25D7/12—Semiconductors
    • C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00—Electroplating characterised by the article coated
    • C25D7/12—Semiconductors
    • C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
    • C25D7/126—Semiconductors first coated with a seed layer or a conductive layer for solar cells

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Electrodes Of Semiconductors (AREA)
KR1020120101238A 2011-09-12 2012-09-12 콘투어된 컵 저부를 갖는 도금 컵 Active KR102031991B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201161533779P 2011-09-12 2011-09-12
US61/533,779 2011-09-12
US13/609,037 US9512538B2 (en) 2008-12-10 2012-09-10 Plating cup with contoured cup bottom
US13/609,037 2012-09-10

Publications (2)

Publication Number Publication Date
KR20130028888A KR20130028888A (ko) 2013-03-20
KR102031991B1 true KR102031991B1 (ko) 2019-11-08

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020120101238A Active KR102031991B1 (ko) 2011-09-12 2012-09-12 콘투어된 컵 저부를 갖는 도금 컵

Country Status (6)

Country Link
US (2) US9512538B2 (enExample)
JP (1) JP6087549B2 (enExample)
KR (1) KR102031991B1 (enExample)
CN (2) CN103031580B (enExample)
SG (1) SG188752A1 (enExample)
TW (1) TWI567247B (enExample)

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US9228270B2 (en) 2011-08-15 2016-01-05 Novellus Systems, Inc. Lipseals and contact elements for semiconductor electroplating apparatuses
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US10416092B2 (en) 2013-02-15 2019-09-17 Lam Research Corporation Remote detection of plating on wafer holding apparatus
US9518334B2 (en) 2013-03-11 2016-12-13 Taiwan Semiconductor Manufacturing Company, Ltd. Electro-plating and apparatus for performing the same
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US20170073832A1 (en) * 2015-09-11 2017-03-16 Lam Research Corporation Durable low cure temperature hydrophobic coating in electroplating cup assembly
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JP6893142B2 (ja) * 2017-07-25 2021-06-23 上村工業株式会社 ワーク保持治具及び電気めっき装置
JP6994273B2 (ja) * 2017-09-07 2022-01-14 エーシーエム リサーチ （シャンハイ） インコーポレーテッド めっき用チャック装置
TWI791785B (zh) * 2019-03-06 2023-02-11 大陸商盛美半導體設備（上海）股份有限公司 電鍍夾盤
CN114502778B (zh) * 2019-10-04 2025-03-18 朗姆研究公司 用于防止唇形密封件镀出的晶片屏蔽
CN115516140A (zh) * 2020-04-30 2022-12-23 朗姆研究公司 用于保持晶片边缘的材料完整性的唇形密封件边缘排除工程
CN114645311A (zh) * 2020-12-18 2022-06-21 盛美半导体设备(上海)股份有限公司 基板保持装置的杯形夹盘及基板保持装置
US11920254B2 (en) * 2021-08-30 2024-03-05 Taiwan Semiconductor Manufacturing Co., Ltd. Detection of contact formation between a substrate and contact pins in an electroplating system
CN113957500B (zh) * 2021-10-15 2023-02-28 长鑫存储技术有限公司 晶圆电镀设备
CN113846363B (zh) * 2021-10-27 2022-09-23 上海戴丰科技有限公司 一种晶圆电镀挂具
CN117737818B (zh) * 2023-12-20 2024-09-06 西安赛富乐斯半导体科技有限公司 改善电化学刻蚀均匀性装置
CN117448927B (zh) * 2023-12-26 2024-03-15 苏州智程半导体科技股份有限公司 一种晶圆电镀抗疲劳电环

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Also Published As

Publication number Publication date
US20160115615A1 (en) 2016-04-28
JP6087549B2 (ja) 2017-03-01
TWI567247B (zh) 2017-01-21
SG188752A1 (en) 2013-04-30
CN103031580A (zh) 2013-04-10
CN107012495B (zh) 2019-04-30
US9512538B2 (en) 2016-12-06
US20150191843A9 (en) 2015-07-09
CN107012495A (zh) 2017-08-04
CN103031580B (zh) 2017-04-12
KR20130028888A (ko) 2013-03-20
US20130062197A1 (en) 2013-03-14
TW201331424A (zh) 2013-08-01
JP2013064196A (ja) 2013-04-11
US10053792B2 (en) 2018-08-21

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