KR101931419B1 - 구성가능한 핀을 갖는 3차원 플래시 nor 메모리 시스템 - Google Patents
구성가능한 핀을 갖는 3차원 플래시 nor 메모리 시스템 Download PDFInfo
- Publication number
- KR101931419B1 KR101931419B1 KR1020167017759A KR20167017759A KR101931419B1 KR 101931419 B1 KR101931419 B1 KR 101931419B1 KR 1020167017759 A KR1020167017759 A KR 1020167017759A KR 20167017759 A KR20167017759 A KR 20167017759A KR 101931419 B1 KR101931419 B1 KR 101931419B1
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- KR
- South Korea
- Prior art keywords
- delete delete
- die
- tsv
- pin
- dies
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1045—Read-write mode select circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1057—Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
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- H01L24/13—
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- H01L24/14—
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- H01L24/16—
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- H01L25/0652—
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- H01L25/0657—
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- H01L25/18—
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/10—Aspects relating to interfaces of memory device to external buses
- G11C2207/105—Aspects related to pads, pins or terminals
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
- H10W72/247—Dispositions of multiple bumps
- H10W72/248—Top-view layouts, e.g. mirror arrays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/297—Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/094,595 US20150155039A1 (en) | 2013-12-02 | 2013-12-02 | Three-Dimensional Flash NOR Memory System With Configurable Pins |
| US14/094,595 | 2013-12-02 | ||
| PCT/US2014/064381 WO2015084534A1 (en) | 2013-12-02 | 2014-11-06 | Three-dimensional flash nor memory system with configurable pins |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20160094423A KR20160094423A (ko) | 2016-08-09 |
| KR101931419B1 true KR101931419B1 (ko) | 2018-12-20 |
Family
ID=52001074
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167017759A Active KR101931419B1 (ko) | 2013-12-02 | 2014-11-06 | 구성가능한 핀을 갖는 3차원 플래시 nor 메모리 시스템 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US20150155039A1 (https=) |
| EP (1) | EP3078028A1 (https=) |
| JP (1) | JP6670749B2 (https=) |
| KR (1) | KR101931419B1 (https=) |
| CN (1) | CN105793928B (https=) |
| TW (1) | TWI550926B (https=) |
| WO (1) | WO2015084534A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12210777B2 (en) | 2022-09-05 | 2025-01-28 | Samsung Electronics Co., Ltd. | Memory device, operating method of the memory device, and memory system including the same |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9361995B1 (en) | 2015-01-21 | 2016-06-07 | Silicon Storage Technology, Inc. | Flash memory system using complementary voltage supplies |
| KR102290020B1 (ko) * | 2015-06-05 | 2021-08-19 | 삼성전자주식회사 | 스택드 칩 구조에서 소프트 데이터 페일 분석 및 구제 기능을 제공하는 반도체 메모리 장치 |
| KR20170030307A (ko) * | 2015-09-09 | 2017-03-17 | 삼성전자주식회사 | 분리 배치된 커패시터를 갖는 메모리 장치 |
| WO2017111838A1 (en) * | 2015-12-26 | 2017-06-29 | Intel Corporation | Vertically embedded passive components |
| US20170221871A1 (en) * | 2016-02-01 | 2017-08-03 | Octavo Systems Llc | Systems and methods for manufacturing electronic devices |
| WO2017210305A1 (en) | 2016-06-01 | 2017-12-07 | Cpi Card Group - Colorado, Inc. | Ic chip card with integrated biometric sensor pads |
| US10541010B2 (en) * | 2018-03-19 | 2020-01-21 | Micron Technology, Inc. | Memory device with configurable input/output interface |
| US10580491B2 (en) * | 2018-03-23 | 2020-03-03 | Silicon Storage Technology, Inc. | System and method for managing peak power demand and noise in non-volatile memory array |
| US10923462B2 (en) | 2018-05-01 | 2021-02-16 | Western Digital Technologies, Inc. | Bifurcated memory die module semiconductor device |
| US10522489B1 (en) | 2018-06-28 | 2019-12-31 | Western Digital Technologies, Inc. | Manufacturing process for separating logic and memory array |
| US10579425B1 (en) | 2018-10-04 | 2020-03-03 | International Business Machines Corporation | Power aware scheduling of requests in 3D chip stack |
| US11222884B2 (en) | 2018-11-28 | 2022-01-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Layout design methodology for stacked devices |
| JP2021048230A (ja) | 2019-09-18 | 2021-03-25 | キオクシア株式会社 | 半導体記憶装置 |
| US11239203B2 (en) * | 2019-11-01 | 2022-02-01 | Xilinx, Inc. | Multi-chip stacked devices |
| CN114631145A (zh) | 2019-11-11 | 2022-06-14 | 株式会社半导体能源研究所 | 信息处理装置及信息处理装置的工作方法 |
| JPWO2021099879A1 (https=) | 2019-11-22 | 2021-05-27 | ||
| US11435811B2 (en) | 2019-12-09 | 2022-09-06 | Micron Technology, Inc. | Memory device sensors |
| US11726721B2 (en) | 2020-09-09 | 2023-08-15 | Samsung Electronics Co., Ltd. | Memory device for adjusting delay on data clock path, memory system including the memory device, and operating method of the memory system |
| KR102837298B1 (ko) | 2020-12-22 | 2025-07-23 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
| CN112752097B (zh) * | 2020-12-30 | 2023-05-26 | 长春长光辰芯微电子股份有限公司 | 一种cmos图像传感器的测试方法和系统 |
| US11856114B2 (en) | 2021-02-12 | 2023-12-26 | Taiwan Semiconductor Manufacturing Co., Ltd. | Device signature based on trim and redundancy information |
| US11557572B2 (en) * | 2021-05-13 | 2023-01-17 | Nanya Technology Corporation | Semiconductor device with stacked dies and method for fabricating the same |
| US12100468B2 (en) * | 2022-09-06 | 2024-09-24 | Micron Technology, Inc. | Standalone mode |
| US20240389363A1 (en) * | 2023-05-16 | 2024-11-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package structure and method for forming the same |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009151865A (ja) | 2007-12-20 | 2009-07-09 | Vantel Corp | 不揮発性半導体記憶装置とその書き込み方法 |
| US20110090004A1 (en) * | 2009-10-19 | 2011-04-21 | Mosaid Technologies Incorporated | Reconfiguring through silicon vias in stacked multi-die packages |
| US20120314501A1 (en) | 2011-06-09 | 2012-12-13 | SK Hynix Inc. | Semiconductor device and method of programming the same |
| US20120322203A1 (en) * | 2009-04-14 | 2012-12-20 | Monolithic 3D Inc. | Method to construct systems |
| US20130162275A1 (en) | 2011-12-26 | 2013-06-27 | Elpida Memory, Inc. | Semiconductor device having command monitor circuit |
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| JPS6085500A (ja) * | 1983-10-18 | 1985-05-14 | Fujitsu Ltd | 高集積回路素子内蔵メモリの試験方式 |
| US5619461A (en) * | 1995-07-28 | 1997-04-08 | Micron Quantum Devices, Inc. | Memory system having internal state monitoring circuit |
| JP3710931B2 (ja) * | 1998-03-26 | 2005-10-26 | 三洋電機株式会社 | マイクロコンピュータ |
| US6651196B1 (en) * | 1999-02-16 | 2003-11-18 | Fujitsu Limited | Semiconductor device having test mode entry circuit |
| WO2001059571A2 (en) * | 2000-02-11 | 2001-08-16 | Advanced Micro Devices, Inc. | Command-driven test modes |
| ITVA20010034A1 (it) * | 2001-10-12 | 2003-04-12 | St Microelectronics Srl | Dispositivo di memoria non volatile a doppia modalita' di funzionamento parallela e seriale con protocollo di comunicazione selezionabile. |
| KR100462877B1 (ko) * | 2002-02-04 | 2004-12-17 | 삼성전자주식회사 | 반도체 메모리 장치, 및 이 장치의 불량 셀 어드레스프로그램 회로 및 방법 |
| US6788595B2 (en) | 2002-08-05 | 2004-09-07 | Silicon Storage Technology, Inc. | Embedded recall apparatus and method in nonvolatile memory |
| EP1424635B1 (en) * | 2002-11-28 | 2008-10-29 | STMicroelectronics S.r.l. | Non volatile memory device architecture, for instance a flash kind, having a serial communication interface |
| CN1523367A (zh) * | 2003-02-17 | 2004-08-25 | 上海华园微电子技术有限公司 | 一种测试电可擦除电可编程存储器的性能及其故障的方法 |
| US7233024B2 (en) * | 2003-03-31 | 2007-06-19 | Sandisk 3D Llc | Three-dimensional memory device incorporating segmented bit line memory array |
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| KR20080026725A (ko) * | 2006-09-21 | 2008-03-26 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 내부신호 모니터장치 및 모니터방법 |
| US7613049B2 (en) * | 2007-01-08 | 2009-11-03 | Macronix International Co., Ltd | Method and system for a serial peripheral interface |
| US20090039410A1 (en) | 2007-08-06 | 2009-02-12 | Xian Liu | Split Gate Non-Volatile Flash Memory Cell Having A Floating Gate, Control Gate, Select Gate And An Erase Gate With An Overhang Over The Floating Gate, Array And Method Of Manufacturing |
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-
2013
- 2013-12-02 US US14/094,595 patent/US20150155039A1/en not_active Abandoned
-
2014
- 2014-11-06 KR KR1020167017759A patent/KR101931419B1/ko active Active
- 2014-11-06 WO PCT/US2014/064381 patent/WO2015084534A1/en not_active Ceased
- 2014-11-06 JP JP2016536215A patent/JP6670749B2/ja active Active
- 2014-11-06 CN CN201480065987.3A patent/CN105793928B/zh active Active
- 2014-11-06 EP EP14805727.6A patent/EP3078028A1/en not_active Withdrawn
- 2014-11-13 TW TW103139403A patent/TWI550926B/zh active
-
2017
- 2017-07-26 US US15/660,552 patent/US10373686B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009151865A (ja) | 2007-12-20 | 2009-07-09 | Vantel Corp | 不揮発性半導体記憶装置とその書き込み方法 |
| US20120322203A1 (en) * | 2009-04-14 | 2012-12-20 | Monolithic 3D Inc. | Method to construct systems |
| US20110090004A1 (en) * | 2009-10-19 | 2011-04-21 | Mosaid Technologies Incorporated | Reconfiguring through silicon vias in stacked multi-die packages |
| US20120314501A1 (en) | 2011-06-09 | 2012-12-13 | SK Hynix Inc. | Semiconductor device and method of programming the same |
| US20130162275A1 (en) | 2011-12-26 | 2013-06-27 | Elpida Memory, Inc. | Semiconductor device having command monitor circuit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12210777B2 (en) | 2022-09-05 | 2025-01-28 | Samsung Electronics Co., Ltd. | Memory device, operating method of the memory device, and memory system including the same |
Also Published As
| Publication number | Publication date |
|---|---|
| US20170323682A1 (en) | 2017-11-09 |
| TWI550926B (zh) | 2016-09-21 |
| KR20160094423A (ko) | 2016-08-09 |
| JP2017502444A (ja) | 2017-01-19 |
| CN105793928B (zh) | 2020-12-25 |
| TW201532326A (zh) | 2015-08-16 |
| JP6670749B2 (ja) | 2020-03-25 |
| US20150155039A1 (en) | 2015-06-04 |
| EP3078028A1 (en) | 2016-10-12 |
| WO2015084534A1 (en) | 2015-06-11 |
| CN105793928A (zh) | 2016-07-20 |
| US10373686B2 (en) | 2019-08-06 |
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