KR101889366B1 - 탄소 나노튜브 칼럼 및 프로브로서의 탄소 나노튜브 칼럼 제조방법과 사용방법 - Google Patents
탄소 나노튜브 칼럼 및 프로브로서의 탄소 나노튜브 칼럼 제조방법과 사용방법 Download PDFInfo
- Publication number
- KR101889366B1 KR101889366B1 KR1020127009762A KR20127009762A KR101889366B1 KR 101889366 B1 KR101889366 B1 KR 101889366B1 KR 1020127009762 A KR1020127009762 A KR 1020127009762A KR 20127009762 A KR20127009762 A KR 20127009762A KR 101889366 B1 KR101889366 B1 KR 101889366B1
- Authority
- KR
- South Korea
- Prior art keywords
- column
- carbon nanotube
- columns
- substrate
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/158—Carbon nanotubes
- C01B32/16—Preparation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B2202/00—Structure or properties of carbon nanotubes
- C01B2202/08—Aligned nanotubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Composite Materials (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Carbon And Carbon Compounds (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US24220609P | 2009-09-14 | 2009-09-14 | |
| US61/242,206 | 2009-09-14 | ||
| US12/632,428 US8354855B2 (en) | 2006-10-16 | 2009-12-07 | Carbon nanotube columns and methods of making and using carbon nanotube columns as probes |
| US12/632,428 | 2009-12-07 | ||
| PCT/US2010/048129 WO2011031759A2 (en) | 2009-09-14 | 2010-09-08 | Carbon nanotube columns and methods of making and using carbon nanotube columns as probes |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020187022982A Division KR20180095099A (ko) | 2009-09-14 | 2010-09-08 | 탄소 나노튜브 칼럼 및 프로브로서의 탄소 나노튜브 칼럼 제조방법과 사용방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20120082427A KR20120082427A (ko) | 2012-07-23 |
| KR101889366B1 true KR101889366B1 (ko) | 2018-08-17 |
Family
ID=43733080
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020187022982A Ceased KR20180095099A (ko) | 2009-09-14 | 2010-09-08 | 탄소 나노튜브 칼럼 및 프로브로서의 탄소 나노튜브 칼럼 제조방법과 사용방법 |
| KR1020127009762A Expired - Fee Related KR101889366B1 (ko) | 2009-09-14 | 2010-09-08 | 탄소 나노튜브 칼럼 및 프로브로서의 탄소 나노튜브 칼럼 제조방법과 사용방법 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020187022982A Ceased KR20180095099A (ko) | 2009-09-14 | 2010-09-08 | 탄소 나노튜브 칼럼 및 프로브로서의 탄소 나노튜브 칼럼 제조방법과 사용방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8354855B2 (enExample) |
| JP (1) | JP5796013B2 (enExample) |
| KR (2) | KR20180095099A (enExample) |
| TW (1) | TWI526689B (enExample) |
| WO (1) | WO2011031759A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200117505A (ko) * | 2019-04-04 | 2020-10-14 | 연세대학교 산학협력단 | 금속 나노입자가 코팅된 탄소나노튜브 네트워크를 포함하는 접촉식 마이크로 소자 및 이의 제조 방법 |
Families Citing this family (22)
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| US7439731B2 (en) | 2005-06-24 | 2008-10-21 | Crafts Douglas E | Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
| US8045859B2 (en) * | 2008-05-02 | 2011-10-25 | The United States Of America As Represented By The Secretary Of The Navy | High-speed underwater data transmission system and method |
| SG193876A1 (en) | 2008-09-29 | 2013-10-30 | Wentworth Lab Inc | Probe cards including nanotube probes and methods of fabricating |
| US20100252317A1 (en) * | 2009-04-03 | 2010-10-07 | Formfactor, Inc. | Carbon nanotube contact structures for use with semiconductor dies and other electronic devices |
| US8272124B2 (en) * | 2009-04-03 | 2012-09-25 | Formfactor, Inc. | Anchoring carbon nanotube columns |
| US8872176B2 (en) | 2010-10-06 | 2014-10-28 | Formfactor, Inc. | Elastic encapsulated carbon nanotube based electrical contacts |
| US9267968B2 (en) | 2010-12-09 | 2016-02-23 | Wentworth Laboratories, Inc. | Probe card assemblies and probe pins including carbon nanotubes |
| US9505615B2 (en) | 2011-07-27 | 2016-11-29 | California Institute Of Technology | Method for controlling microstructural arrangement of nominally-aligned arrays of carbon nanotubes |
| WO2013052176A2 (en) * | 2011-07-27 | 2013-04-11 | California Institute Of Technology | Carbon nanotube foams with controllable mechanical properties |
| EP2763167B1 (en) | 2011-09-26 | 2016-06-29 | Fujitsu Limited | Heat-dissipating material and method for producing same, and electronic device and method for producing same |
| JP5863168B2 (ja) * | 2011-11-10 | 2016-02-16 | 株式会社日本マイクロニクス | プローブカード及びその製造方法 |
| US9616635B2 (en) | 2012-04-20 | 2017-04-11 | California Institute Of Technology | Multilayer foam structures of nominally-aligned carbon nanotubes (CNTS) |
| US10266402B2 (en) * | 2012-11-20 | 2019-04-23 | Formfactor, Inc. | Contactor devices with carbon nanotube probes embedded in a flexible film and processes of making such |
| US9523713B2 (en) * | 2013-05-28 | 2016-12-20 | Intel Corporation | Interconnects including liquid metal |
| TWI539164B (zh) | 2013-11-22 | 2016-06-21 | 財團法人工業技術研究院 | 塗佈探針及其製作方法 |
| US10732201B2 (en) | 2014-04-13 | 2020-08-04 | Infineon Technologies Ag | Test probe and method of manufacturing a test probe |
| WO2017156502A1 (en) | 2016-03-10 | 2017-09-14 | Carnegie Mellon University | Integrated electronic device with flexible and stretchable substrate |
| US20200041543A1 (en) * | 2017-03-21 | 2020-02-06 | Nidec-Read Corporation | Probe structure and method for producing probe structure |
| US20190011497A1 (en) * | 2017-07-09 | 2019-01-10 | Texas Instruments Incorporated | Test Fixture with Sintered Connections Between Mother Board and Daughter Board |
| JP2019035698A (ja) * | 2017-08-18 | 2019-03-07 | 日本電産リード株式会社 | プローブ構造体、及びプローブ構造体の製造方法 |
| US11774467B1 (en) | 2020-09-01 | 2023-10-03 | Microfabrica Inc. | Method of in situ modulation of structural material properties and/or template shape |
| WO2025029299A1 (en) * | 2023-08-03 | 2025-02-06 | Microfabrica Inc. | Probe array incorporating probes that have selected mechanical properties manipulated during formation of at least portions of the probes and corresponding fabrication method |
Citations (1)
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|---|---|---|---|---|
| JP3860057B2 (ja) * | 2002-03-20 | 2006-12-20 | アンリツ株式会社 | 電気接点装置及び接触子 |
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| US8272124B2 (en) * | 2009-04-03 | 2012-09-25 | Formfactor, Inc. | Anchoring carbon nanotube columns |
| US8872176B2 (en) * | 2010-10-06 | 2014-10-28 | Formfactor, Inc. | Elastic encapsulated carbon nanotube based electrical contacts |
-
2009
- 2009-12-07 US US12/632,428 patent/US8354855B2/en not_active Expired - Fee Related
-
2010
- 2010-09-08 KR KR1020187022982A patent/KR20180095099A/ko not_active Ceased
- 2010-09-08 JP JP2012528877A patent/JP5796013B2/ja not_active Expired - Fee Related
- 2010-09-08 WO PCT/US2010/048129 patent/WO2011031759A2/en not_active Ceased
- 2010-09-08 KR KR1020127009762A patent/KR101889366B1/ko not_active Expired - Fee Related
- 2010-09-13 TW TW099130847A patent/TWI526689B/zh not_active IP Right Cessation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3860057B2 (ja) * | 2002-03-20 | 2006-12-20 | アンリツ株式会社 | 電気接点装置及び接触子 |
Non-Patent Citations (1)
| Title |
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| Scripta Materialia. 2008, Vol. 59, pp. 649-652 (2008.06.06.) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200117505A (ko) * | 2019-04-04 | 2020-10-14 | 연세대학교 산학협력단 | 금속 나노입자가 코팅된 탄소나노튜브 네트워크를 포함하는 접촉식 마이크로 소자 및 이의 제조 방법 |
| KR102221162B1 (ko) | 2019-04-04 | 2021-02-26 | 연세대학교 산학협력단 | 금속 나노입자가 코팅된 탄소나노튜브 네트워크를 포함하는 접촉식 마이크로 소자 및 이의 제조 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI526689B (zh) | 2016-03-21 |
| WO2011031759A3 (en) | 2011-08-25 |
| JP5796013B2 (ja) | 2015-10-21 |
| KR20120082427A (ko) | 2012-07-23 |
| JP2013504509A (ja) | 2013-02-07 |
| TW201113529A (en) | 2011-04-16 |
| US8354855B2 (en) | 2013-01-15 |
| WO2011031759A2 (en) | 2011-03-17 |
| KR20180095099A (ko) | 2018-08-24 |
| US20100083489A1 (en) | 2010-04-08 |
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