KR101850584B1 - 조명 장치, 노광 장치, 조정 방법 및 물품의 제조 방법 - Google Patents
조명 장치, 노광 장치, 조정 방법 및 물품의 제조 방법 Download PDFInfo
- Publication number
- KR101850584B1 KR101850584B1 KR1020150084943A KR20150084943A KR101850584B1 KR 101850584 B1 KR101850584 B1 KR 101850584B1 KR 1020150084943 A KR1020150084943 A KR 1020150084943A KR 20150084943 A KR20150084943 A KR 20150084943A KR 101850584 B1 KR101850584 B1 KR 101850584B1
- Authority
- KR
- South Korea
- Prior art keywords
- light
- light source
- optical system
- intensity distribution
- illumination optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005286 illumination Methods 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims description 21
- 238000004519 manufacturing process Methods 0.000 title claims description 6
- 238000009826 distribution Methods 0.000 claims abstract description 123
- 230000003287 optical effect Effects 0.000 claims abstract description 53
- 210000001747 pupil Anatomy 0.000 claims abstract description 33
- 238000001816 cooling Methods 0.000 claims description 48
- 239000000758 substrate Substances 0.000 claims description 28
- 238000005259 measurement Methods 0.000 claims description 9
- 230000000737 periodic effect Effects 0.000 claims description 7
- 230000008569 process Effects 0.000 claims description 7
- 238000012545 processing Methods 0.000 claims description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 22
- 229910052753 mercury Inorganic materials 0.000 description 22
- 230000000052 comparative effect Effects 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000003786 synthesis reaction Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 230000005405 multipole Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000003504 photosensitizing agent Substances 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21S—NON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
- F21S2/00—Systems of lighting devices, not provided for in main groups F21S4/00 - F21S10/00 or F21S19/00, e.g. of modular construction
- F21S2/005—Systems of lighting devices, not provided for in main groups F21S4/00 - F21S10/00 or F21S19/00, e.g. of modular construction of modular construction
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21S—NON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
- F21S10/00—Lighting devices or systems producing a varying lighting effect
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V11/00—Screens not covered by groups F21V1/00, F21V3/00, F21V7/00 or F21V9/00
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V29/00—Protecting lighting devices from thermal damage; Cooling or heating arrangements specially adapted for lighting devices or systems
- F21V29/50—Cooling arrangements
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V5/00—Refractors for light sources
- F21V5/007—Array of lenses or refractors for a cluster of light sources, e.g. for arrangement of multiple light sources in one plane
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0028—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed refractive and reflective surfaces, e.g. non-imaging catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/7005—Production of exposure light, i.e. light sources by multiple sources, e.g. light-emitting diodes [LED] or light source arrays
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70133—Measurement of illumination distribution, in pupil plane or field plane
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21W—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO USES OR APPLICATIONS OF LIGHTING DEVICES OR SYSTEMS
- F21W2131/00—Use or application of lighting devices or systems not provided for in codes F21W2102/00-F21W2121/00
- F21W2131/40—Lighting for industrial, commercial, recreational or military use
- F21W2131/403—Lighting for industrial, commercial, recreational or military use for machines
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2014-124752 | 2014-06-17 | ||
| JP2014124752A JP6362095B2 (ja) | 2014-06-17 | 2014-06-17 | 照明装置、露光装置、調整方法、及び、物品の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150144711A KR20150144711A (ko) | 2015-12-28 |
| KR101850584B1 true KR101850584B1 (ko) | 2018-04-19 |
Family
ID=54836065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020150084943A Active KR101850584B1 (ko) | 2014-06-17 | 2015-06-16 | 조명 장치, 노광 장치, 조정 방법 및 물품의 제조 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9632423B2 (enExample) |
| JP (1) | JP6362095B2 (enExample) |
| KR (1) | KR101850584B1 (enExample) |
| CN (1) | CN105278258B (enExample) |
| TW (1) | TWI587097B (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE202016103819U1 (de) * | 2016-07-14 | 2017-10-20 | Suss Microtec Lithography Gmbh | Lichtquellenanordnung für ein Belichtungssystem sowie Fotolithografie-Belichtungssystem |
| CN107179653B (zh) * | 2017-07-20 | 2018-10-19 | 武汉华星光电技术有限公司 | 一种曝光机及其发光装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100259740A1 (en) * | 2009-04-13 | 2010-10-14 | Canon Kabushiki Kaisha | Exposure method, exposure apparatus, and device manufacturing method |
| JP4990416B2 (ja) | 2010-08-23 | 2012-08-01 | 三菱電機株式会社 | 投写型表示装置 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2899026B2 (ja) | 1989-11-27 | 1999-06-02 | 株式会社日立製作所 | マーク検出装置 |
| US5305054A (en) * | 1991-02-22 | 1994-04-19 | Canon Kabushiki Kaisha | Imaging method for manufacture of microdevices |
| JP2633091B2 (ja) * | 1991-02-22 | 1997-07-23 | キヤノン株式会社 | 像投影方法、回路製造方法及び投影露光装置 |
| JP2890892B2 (ja) * | 1991-04-30 | 1999-05-17 | キヤノン株式会社 | 露光装置及びそれを用いた素子製造方法 |
| CN1045103C (zh) | 1994-06-18 | 1999-09-15 | 兰州炼油化工总厂三星公司 | 一种烷基水杨酸盐润滑油添加剂 |
| JP2000075496A (ja) * | 1998-08-31 | 2000-03-14 | Canon Inc | 冷却機構を有する光源、光源装置及びこれを用いた露光装置 |
| JP2000098099A (ja) * | 1998-09-21 | 2000-04-07 | Nikon Corp | X線照明装置及びx線投影露光装置 |
| US6704090B2 (en) * | 2000-05-11 | 2004-03-09 | Nikon Corporation | Exposure method and exposure apparatus |
| JP2001326171A (ja) * | 2000-05-18 | 2001-11-22 | Canon Inc | 照明装置 |
| EP1280008B2 (en) | 2001-07-27 | 2011-09-14 | Canon Kabushiki Kaisha | Illumination system, projection exposure apparatus and device manufacturing method |
| JP2004063988A (ja) * | 2002-07-31 | 2004-02-26 | Canon Inc | 照明光学系、当該照明光学系を有する露光装置及びデバイス製造方法 |
| JP4086582B2 (ja) * | 2002-08-06 | 2008-05-14 | キヤノン株式会社 | 照明装置及び露光装置 |
| JP2004079254A (ja) * | 2002-08-13 | 2004-03-11 | Canon Inc | 光源装置及び露光装置 |
| JP4470558B2 (ja) * | 2004-03-31 | 2010-06-02 | ウシオ電機株式会社 | 光照射装置 |
| TWI401538B (zh) | 2007-03-28 | 2013-07-11 | Orc Mfg Co Ltd | Exposure drawing device |
| KR102016673B1 (ko) | 2007-04-12 | 2019-08-30 | 가부시키가이샤 니콘 | 방전램프 |
-
2014
- 2014-06-17 JP JP2014124752A patent/JP6362095B2/ja not_active Expired - Fee Related
-
2015
- 2015-06-08 TW TW104118491A patent/TWI587097B/zh active
- 2015-06-15 US US14/740,071 patent/US9632423B2/en not_active Expired - Fee Related
- 2015-06-16 KR KR1020150084943A patent/KR101850584B1/ko active Active
- 2015-06-17 CN CN201510336459.3A patent/CN105278258B/zh active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100259740A1 (en) * | 2009-04-13 | 2010-10-14 | Canon Kabushiki Kaisha | Exposure method, exposure apparatus, and device manufacturing method |
| JP4990416B2 (ja) | 2010-08-23 | 2012-08-01 | 三菱電機株式会社 | 投写型表示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20150144711A (ko) | 2015-12-28 |
| US9632423B2 (en) | 2017-04-25 |
| US20150362843A1 (en) | 2015-12-17 |
| CN105278258A (zh) | 2016-01-27 |
| JP6362095B2 (ja) | 2018-07-25 |
| TWI587097B (zh) | 2017-06-11 |
| CN105278258B (zh) | 2017-10-24 |
| TW201600936A (zh) | 2016-01-01 |
| JP2016004921A (ja) | 2016-01-12 |
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