KR101838417B1 - 폭 측정 장치 및 폭 측정 방법 - Google Patents

폭 측정 장치 및 폭 측정 방법 Download PDF

Info

Publication number
KR101838417B1
KR101838417B1 KR1020167010294A KR20167010294A KR101838417B1 KR 101838417 B1 KR101838417 B1 KR 101838417B1 KR 1020167010294 A KR1020167010294 A KR 1020167010294A KR 20167010294 A KR20167010294 A KR 20167010294A KR 101838417 B1 KR101838417 B1 KR 101838417B1
Authority
KR
South Korea
Prior art keywords
packaging container
width
detected
transducer
state
Prior art date
Application number
KR1020167010294A
Other languages
English (en)
Korean (ko)
Other versions
KR20160058174A (ko
Inventor
아키히로 나라
히데미 다카하시
Original Assignee
야마하 파인 테크 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 야마하 파인 테크 가부시키가이샤 filed Critical 야마하 파인 테크 가부시키가이샤
Publication of KR20160058174A publication Critical patent/KR20160058174A/ko
Application granted granted Critical
Publication of KR101838417B1 publication Critical patent/KR101838417B1/ko

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/06Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness specially adapted for measuring length or width of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/11Analysing solids by measuring attenuation of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/02854Length, thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Acoustics & Sound (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
KR1020167010294A 2013-09-24 2014-09-04 폭 측정 장치 및 폭 측정 방법 KR101838417B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2013-197076 2013-09-24
JP2013197076 2013-09-24
PCT/JP2014/073312 WO2015045781A1 (ja) 2013-09-24 2014-09-04 幅測定装置及び幅測定方法

Publications (2)

Publication Number Publication Date
KR20160058174A KR20160058174A (ko) 2016-05-24
KR101838417B1 true KR101838417B1 (ko) 2018-03-13

Family

ID=52742928

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167010294A KR101838417B1 (ko) 2013-09-24 2014-09-04 폭 측정 장치 및 폭 측정 방법

Country Status (4)

Country Link
JP (2) JPWO2015045781A1 (zh)
KR (1) KR101838417B1 (zh)
CN (1) CN105705904A (zh)
WO (1) WO2015045781A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200018268A (ko) * 2018-08-10 2020-02-19 야마하 파인 테크 가부시키가이샤 초음파 검사 장치 및 초음파 검사 방법

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7081143B2 (ja) 2017-12-27 2022-06-07 セイコーエプソン株式会社 超音波装置、及び超音波測定方法
JP7190154B2 (ja) 2018-08-10 2022-12-15 ヤマハファインテック株式会社 超音波検査装置
KR20210102449A (ko) * 2019-02-08 2021-08-19 야마하 파인 테크 가부시키가이샤 검사 장치 및 검사 방법
JP2020155919A (ja) * 2019-03-20 2020-09-24 ヤマハ株式会社 超音波センサ
CN113091664B (zh) * 2021-04-01 2023-04-18 佛山市恒溢彩印有限公司 一种宽度检测方法、系统、终端及存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003028631A (ja) * 2001-07-16 2003-01-29 Fuji Photo Film Co Ltd 長さ計測装置および方法
JP2007010353A (ja) * 2005-06-28 2007-01-18 Mitsuhashi Seisakusho:Kk 連続包装体のピッチ測定装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62282217A (ja) * 1986-05-30 1987-12-08 Tokyo Keiki Co Ltd 路面凹凸計測装置
JPH0377056A (ja) * 1989-08-19 1991-04-02 Mitsubishi Electric Corp 超音波検査装置
DE4010952A1 (de) * 1990-04-05 1991-10-10 Mpv Mess Und Prueftechnik Vogt Verfahren und vorrichtung zur ultraschallpruefung von schweissnaehten zwischen kunststoffpackungen und abdeckfolien
JP3124727B2 (ja) * 1996-12-13 2001-01-15 サンクス株式会社 連続小袋体の継ぎ目検出装置
CN1265169C (zh) * 2005-03-28 2006-07-19 浙江大学 水果尺寸检测的方法
JP2008156010A (ja) * 2006-12-20 2008-07-10 Hitachi Computer Peripherals Co Ltd 重送検出装置及び重送検出方法
CN202485473U (zh) * 2012-02-24 2012-10-10 宝山钢铁股份有限公司 一种加热炉热装板坯的测宽装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003028631A (ja) * 2001-07-16 2003-01-29 Fuji Photo Film Co Ltd 長さ計測装置および方法
JP2007010353A (ja) * 2005-06-28 2007-01-18 Mitsuhashi Seisakusho:Kk 連続包装体のピッチ測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200018268A (ko) * 2018-08-10 2020-02-19 야마하 파인 테크 가부시키가이샤 초음파 검사 장치 및 초음파 검사 방법
KR102315651B1 (ko) 2018-08-10 2021-10-21 야마하 파인 테크 가부시키가이샤 초음파 검사 장치 및 초음파 검사 방법

Also Published As

Publication number Publication date
JP6508755B2 (ja) 2019-05-08
WO2015045781A1 (ja) 2015-04-02
JP2018141813A (ja) 2018-09-13
JPWO2015045781A1 (ja) 2017-03-09
KR20160058174A (ko) 2016-05-24
CN105705904A (zh) 2016-06-22

Similar Documents

Publication Publication Date Title
KR101838417B1 (ko) 폭 측정 장치 및 폭 측정 방법
CN108627105B (zh) 膜厚测定方法和膜厚测定装置
EP2352015A1 (en) Radioactive ray detecting appratus, radioactive image acquiring system, and radioactive ray detecting method
US20120061901A1 (en) Ultrasonic detecting device and sheet handling apparatus comprising ultrasonic detecting device
US8625112B2 (en) Thickness measuring system for measuring a thickness of a plate-shaped member
WO2006019070A1 (ja) 帯状部材の測長方法および装置
JP2009516629A (ja) 容器の側壁の輪郭を検査する方法及び装置
US10234427B2 (en) Noncontact deformation detecting device with inclination measurement
JP3939743B2 (ja) 位置検出機構および位置検出センサ
WO2013061645A1 (ja) 密封容器の内圧検査装置および内圧検査方法
JP5214757B2 (ja) 状態判定装置
JP2013137206A (ja) 被搬送物の検査方法
JP6126485B2 (ja) 速度計測装置および方法
JP2011169796A (ja) 曲率測定装置
JP5368367B2 (ja) 缶詰内圧判定方法およびその装置
JP5149555B2 (ja) 物品検査選別システム、および選別装置
WO2020162618A1 (ja) 検査装置、および検査方法
JP2003028631A (ja) 長さ計測装置および方法
WO2023199679A1 (ja) 表面形状測定装置、表面形状測定方法及びベルトの管理方法
JP6054250B2 (ja) 接合部材の検査方法及び検査装置
JP7023651B2 (ja) 重送検知装置、画像読取装置、重送検知方法
JP2003321004A (ja) 充填機
JP2009085666A (ja) シート傾斜角測定方法、シート検査方法、およびシート検査装置
JP5933270B2 (ja) 姿勢検知装置
JP6097179B2 (ja) 速度計測装置

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant