KR101809073B1 - 근적외광 흡수층 형성재료 및 적층막 - Google Patents

근적외광 흡수층 형성재료 및 적층막 Download PDF

Info

Publication number
KR101809073B1
KR101809073B1 KR1020110037715A KR20110037715A KR101809073B1 KR 101809073 B1 KR101809073 B1 KR 101809073B1 KR 1020110037715 A KR1020110037715 A KR 1020110037715A KR 20110037715 A KR20110037715 A KR 20110037715A KR 101809073 B1 KR101809073 B1 KR 101809073B1
Authority
KR
South Korea
Prior art keywords
layer
polymer
nir
independently
absorbing
Prior art date
Application number
KR1020110037715A
Other languages
English (en)
Korean (ko)
Other versions
KR20110118102A (ko
Inventor
세이이치로 타치바나
마사키 오하시
카즈미 노다
쇼조 시라이
타케시 킨쇼
우송 황
다리오 엘. 골드파브
와이킨 리
마틴 글로데
Original Assignee
신에쓰 가가꾸 고교 가부시끼가이샤
인터내셔날 비즈니스 머신 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 신에쓰 가가꾸 고교 가부시끼가이샤, 인터내셔날 비즈니스 머신 코포레이션 filed Critical 신에쓰 가가꾸 고교 가부시끼가이샤
Publication of KR20110118102A publication Critical patent/KR20110118102A/ko
Application granted granted Critical
Publication of KR101809073B1 publication Critical patent/KR101809073B1/ko

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/091Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L65/00Compositions of macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain; Compositions of derivatives of such polymers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09BORGANIC DYES OR CLOSELY-RELATED COMPOUNDS FOR PRODUCING DYES, e.g. PIGMENTS; MORDANTS; LAKES
    • C09B23/00Methine or polymethine dyes, e.g. cyanine dyes
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0045Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials For Photolithography (AREA)
  • Optical Filters (AREA)
KR1020110037715A 2010-04-22 2011-04-22 근적외광 흡수층 형성재료 및 적층막 KR101809073B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2010098453 2010-04-22
JPJP-P-2010-098453 2010-04-22
JP2011047254A JP5768410B2 (ja) 2010-04-22 2011-03-04 近赤外光吸収膜形成材料及び積層膜
JPJP-P-2011-047254 2011-03-04

Publications (2)

Publication Number Publication Date
KR20110118102A KR20110118102A (ko) 2011-10-28
KR101809073B1 true KR101809073B1 (ko) 2017-12-14

Family

ID=44816091

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110037715A KR101809073B1 (ko) 2010-04-22 2011-04-22 근적외광 흡수층 형성재료 및 적층막

Country Status (4)

Country Link
US (1) US20110262863A1 (zh)
JP (1) JP5768410B2 (zh)
KR (1) KR101809073B1 (zh)
TW (1) TWI477529B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11561331B2 (en) 2019-09-10 2023-01-24 Samsung Electronics Co., Ltd. Combination structures and optical filters and image sensors and camera modules and electronic devices
US11569284B2 (en) 2019-09-03 2023-01-31 Samsung Electronics Co., Ltd. Combination structures and optical filters and image sensors and camera modules and electronic devices

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130157463A1 (en) * 2011-12-14 2013-06-20 Shin-Etsu Chemical Co., Ltd. Near-infrared absorbing film composition for lithographic application
WO2013172145A1 (ja) * 2012-05-15 2013-11-21 株式会社Adeka 光硬化性樹脂組成物
JP6477270B2 (ja) * 2015-06-09 2019-03-06 信越化学工業株式会社 パターン形成方法
JP6783435B2 (ja) * 2015-10-01 2020-11-11 トルンプ フォトニック コンポーネンツ ゲーエムベーハー 発光デバイス
JP7434773B2 (ja) * 2019-09-17 2024-02-21 Toppanホールディングス株式会社 赤外光カットフィルター、固体撮像素子用フィルター、固体撮像素子、および、固体撮像素子用フィルターの製造方法
JP7434772B2 (ja) * 2019-09-17 2024-02-21 Toppanホールディングス株式会社 赤外光カットフィルター、固体撮像素子用フィルター、固体撮像素子、および、固体撮像素子用フィルターの製造方法
JP7459468B2 (ja) * 2019-09-17 2024-04-02 Toppanホールディングス株式会社 赤外光カットフィルター、固体撮像素子用フィルター、固体撮像素子、および、固体撮像素子用フィルターの製造方法
JP7404728B2 (ja) * 2019-09-17 2023-12-26 Toppanホールディングス株式会社 赤外光カットフィルター、固体撮像素子用フィルター、固体撮像素子、および、固体撮像素子用フィルターの製造方法
TW202113024A (zh) * 2019-09-17 2021-04-01 日商凸版印刷股份有限公司 紅外光截止濾光片、固態攝影元件用濾光片、固態攝影元件、及固態攝影元件用濾光片之製造方法
JP2022100141A (ja) * 2020-12-23 2022-07-05 凸版印刷株式会社 着色樹脂組成物、光学フィルター、および、光学フィルターの製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005015532A (ja) * 2003-06-23 2005-01-20 Jsr Corp 重合体および反射防止膜形成組成物
US20090208865A1 (en) * 2008-02-19 2009-08-20 International Business Machines Corporation Photolithography focus improvement by reduction of autofocus radiation transmission into substrate

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4822718A (en) * 1982-09-30 1989-04-18 Brewer Science, Inc. Light absorbing coating
JPH0612452B2 (ja) * 1982-09-30 1994-02-16 ブリュ−ワ−・サイエンス・インコ−ポレイテッド 集積回路素子の製造方法
GB8720417D0 (en) * 1987-08-28 1987-10-07 Minnesota Mining & Mfg Recording medium for optical data storage
JPH07146551A (ja) * 1991-10-31 1995-06-06 Sony Corp フォトレジスト組成物及びフォトレジストの露光方法
TWI317365B (en) * 2002-07-31 2009-11-21 Jsr Corp Acenaphthylene derivative, polymer, and antireflection film-forming composition
JP4433933B2 (ja) * 2004-08-13 2010-03-17 Jsr株式会社 感放射線性組成物およびハードマスク形成材料
JP4086871B2 (ja) * 2004-11-18 2008-05-14 日立マクセル株式会社 近赤外線遮蔽体及びディスプレイ用前面板
KR100938065B1 (ko) * 2005-03-11 2010-01-21 신에쓰 가가꾸 고교 가부시끼가이샤 포토레지스트 하층막 형성 재료 및 패턴 형성 방법
JP4575220B2 (ja) * 2005-04-14 2010-11-04 信越化学工業株式会社 レジスト下層膜材料およびパターン形成方法
JP4666166B2 (ja) * 2005-11-28 2011-04-06 信越化学工業株式会社 レジスト下層膜材料及びパターン形成方法
JP4809376B2 (ja) * 2007-03-09 2011-11-09 信越化学工業株式会社 反射防止膜材料およびこれを用いたパターン形成方法
JP2009092784A (ja) * 2007-10-04 2009-04-30 Fujifilm Corp 近赤外吸収チアゾール化合物およびそれを用いた近赤外吸収フィルター
JP5417994B2 (ja) * 2008-07-17 2014-02-19 Jsr株式会社 着色層形成用感放射線性組成物、カラーフィルタおよびカラー液晶表示素子
US8304170B2 (en) * 2008-09-04 2012-11-06 Eastman Kodak Company Negative-working imageable element and method of use

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005015532A (ja) * 2003-06-23 2005-01-20 Jsr Corp 重合体および反射防止膜形成組成物
US20090208865A1 (en) * 2008-02-19 2009-08-20 International Business Machines Corporation Photolithography focus improvement by reduction of autofocus radiation transmission into substrate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11569284B2 (en) 2019-09-03 2023-01-31 Samsung Electronics Co., Ltd. Combination structures and optical filters and image sensors and camera modules and electronic devices
US11561331B2 (en) 2019-09-10 2023-01-24 Samsung Electronics Co., Ltd. Combination structures and optical filters and image sensors and camera modules and electronic devices

Also Published As

Publication number Publication date
KR20110118102A (ko) 2011-10-28
TW201211098A (en) 2012-03-16
JP2011242751A (ja) 2011-12-01
TWI477529B (zh) 2015-03-21
JP5768410B2 (ja) 2015-08-26
US20110262863A1 (en) 2011-10-27

Similar Documents

Publication Publication Date Title
KR101809073B1 (ko) 근적외광 흡수층 형성재료 및 적층막
JP6072107B2 (ja) 上塗りフォトレジストと共に使用するためのコーティング組成物
JP5840352B2 (ja) 上塗りフォトレジストと共に使用するためのコーティング組成物
US11048169B2 (en) Resist underlayer composition, and method of forming patterns using the composition
TWI432905B (zh) 形成光阻底層膜之組成物及使用其形成光阻圖型之方法
KR101465488B1 (ko) 근적외광 흡수층 형성 조성물 및 근적외광 흡수층을 포함하는 다층막
KR101824763B1 (ko) 하층 조성물 및 이의 방법
KR100886314B1 (ko) 유기반사방지막용 공중합체 및 이를 포함하는유기반사방지막 조성물
JP2011520148A (ja) 反射防止コーティング組成物
JP2008532059A (ja) 多重反射防止膜を有するフォトレジストの像形成方法
KR20010023776A (ko) 저면 반사 방지막용 조성물 및 이에 사용하기 위한 신규중합체 염료
KR101755595B1 (ko) 근적외광 흡수층 형성재료 및 적층막
JP5418906B2 (ja) 反射防止コーティング組成物
TWI454849B (zh) 與上塗光阻合用之塗覆組成物
KR101711424B1 (ko) 반도체 기판 코팅을 위한 비중합체성 결합제
JPH06110199A (ja) 反射防止膜およびレジストパターンの形成方法
KR102159557B1 (ko) 오버코팅된 포토레지스트와 함께 사용하기 위한 코팅 조성물
TWI639662B (zh) 與上塗光阻合用之塗覆組成物

Legal Events

Date Code Title Description
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant