KR101650054B1 - 생물 시료를 그대로의 모습으로 관찰하기 위한 전자 현미경에 의한 관찰 방법과 그것에 사용되는 진공 하에서의 증발 억제용 조성물, 주사형 전자 현미경, 및 투과형 전자 현미경 - Google Patents

생물 시료를 그대로의 모습으로 관찰하기 위한 전자 현미경에 의한 관찰 방법과 그것에 사용되는 진공 하에서의 증발 억제용 조성물, 주사형 전자 현미경, 및 투과형 전자 현미경 Download PDF

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KR101650054B1
KR101650054B1 KR1020147006126A KR20147006126A KR101650054B1 KR 101650054 B1 KR101650054 B1 KR 101650054B1 KR 1020147006126 A KR1020147006126 A KR 1020147006126A KR 20147006126 A KR20147006126 A KR 20147006126A KR 101650054 B1 KR101650054 B1 KR 101650054B1
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electron microscope
acid
thin film
evaporation
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KR20140074287A (ko
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타카히코 하리야마
야스하루 타카쿠
히로시 스즈키
요시노리 무라나카
이사오 오타
마사츠구 시로무라
다이스케 이시이
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고쿠리츠켄큐카이하츠호진 카가쿠기쥬츠신코키코
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2853—Shadowing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44—Sample treatment involving radiation, e.g. heat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/612—Specific applications or type of materials biological material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H01J2237/2004—Biological samples

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  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
KR1020147006126A 2011-09-09 2012-09-07 생물 시료를 그대로의 모습으로 관찰하기 위한 전자 현미경에 의한 관찰 방법과 그것에 사용되는 진공 하에서의 증발 억제용 조성물, 주사형 전자 현미경, 및 투과형 전자 현미경 Active KR101650054B1 (ko)

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JP2011197685 2011-09-09
JPJP-P-2011-197685 2011-09-09
JP2012044383 2012-02-29
JPJP-P-2012-044383 2012-02-29
PCT/JP2012/072982 WO2013035866A1 (ja) 2011-09-09 2012-09-07 生物試料をそのままの姿で観察するための電子顕微鏡による観察方法とそれに用いられる真空下での蒸発抑制用組成物、走査型電子顕微鏡および透過型電子顕微鏡

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KR20140074287A KR20140074287A (ko) 2014-06-17
KR101650054B1 true KR101650054B1 (ko) 2016-08-22

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US (1) US9557253B2 (enExample)
EP (1) EP2755225B1 (enExample)
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CN (1) CN103843106B (enExample)
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WO (1) WO2013035866A1 (enExample)

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KR20230064315A (ko) 2021-11-03 2023-05-10 대한민국(농촌진흥청장) 스마트 온실 로봇을 위한 농약 자동 공급 장치 및 그 동작 방법

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JP6496184B2 (ja) * 2014-06-27 2019-04-03 日本電子株式会社 試料導入方法、試料ステージ、および荷電粒子線装置
KR101792832B1 (ko) * 2014-10-29 2017-11-20 충남대학교산학협력단 기-액 계면 플라즈마 중합에 의한 고분자 박막의 제조방법 및 이에 의해 제조된 고분자 박막
JP6569151B2 (ja) * 2015-02-25 2019-09-04 学校法人日本大学 イオン液体を用いた透過型電子顕微鏡による錯体の観察方法及び観察用試料
CN104908063A (zh) * 2015-06-24 2015-09-16 中山安荞生物科技有限公司 一种真空手套箱
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JP2018078028A (ja) * 2016-11-09 2018-05-17 株式会社メルビル 試料ホルダー
CN107860783B (zh) * 2017-10-23 2019-09-24 中国科学院化学研究所 Xps进样装置
JP7001425B2 (ja) * 2017-10-26 2022-01-19 シンフォニアテクノロジー株式会社 マウンタ用エア制御装置
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CN110243640B (zh) * 2018-03-08 2022-01-25 中国科学院海洋研究所 深海有孔虫的内腔磨片快速制备方法
CN108802080A (zh) * 2018-08-16 2018-11-13 扬州大学 一种玉米成熟种子中胚乳淀粉生长环的原位观察方法
AU2020241583A1 (en) * 2019-03-21 2021-10-14 Miromatrix Medical Inc. Improved decellularization of isolated organs
CN109916942B (zh) * 2019-04-18 2021-09-21 攀钢集团攀枝花钢铁研究院有限公司 捕收剂的电子显微镜表征方法
CN110441084A (zh) * 2019-09-04 2019-11-12 海南省农业科学院热带果树研究所 一种菠萝蜜果肉的冰冻切片方法
WO2021070338A1 (ja) * 2019-10-10 2021-04-15 株式会社日立ハイテク 荷電粒子線装置
JP7142404B2 (ja) 2020-06-16 2022-09-27 学校法人中部大学 走査型電子顕微鏡を用いた観察方法、及びそのための試料ホルダ
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KR20230064315A (ko) 2021-11-03 2023-05-10 대한민국(농촌진흥청장) 스마트 온실 로봇을 위한 농약 자동 공급 장치 및 그 동작 방법

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IN2014DN01848A (enExample) 2015-05-15
US9557253B2 (en) 2017-01-31
CN103843106B (zh) 2016-12-07
KR20140074287A (ko) 2014-06-17
WO2013035866A1 (ja) 2013-03-14
CN103843106A (zh) 2014-06-04
EP2755225A4 (en) 2015-08-05
EP2755225A1 (en) 2014-07-16
JPWO2013035866A1 (ja) 2015-03-23
US20140227734A1 (en) 2014-08-14
JP6055766B2 (ja) 2016-12-27

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