KR101514627B1 - 반도체 장치의 제작 방법 - Google Patents

반도체 장치의 제작 방법 Download PDF

Info

Publication number
KR101514627B1
KR101514627B1 KR1020080083209A KR20080083209A KR101514627B1 KR 101514627 B1 KR101514627 B1 KR 101514627B1 KR 1020080083209 A KR1020080083209 A KR 1020080083209A KR 20080083209 A KR20080083209 A KR 20080083209A KR 101514627 B1 KR101514627 B1 KR 101514627B1
Authority
KR
South Korea
Prior art keywords
layer
substrate
organic compound
semiconductor
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020080083209A
Other languages
English (en)
Korean (ko)
Other versions
KR20090023158A (ko
Inventor
토시유키 이사
Original Assignee
가부시키가이샤 한도오따이 에네루기 켄큐쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 한도오따이 에네루기 켄큐쇼 filed Critical 가부시키가이샤 한도오따이 에네루기 켄큐쇼
Publication of KR20090023158A publication Critical patent/KR20090023158A/ko
Application granted granted Critical
Publication of KR101514627B1 publication Critical patent/KR101514627B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • H10D86/021Manufacture or treatment of multiple TFTs
    • H10D86/0214Manufacture or treatment of multiple TFTs using temporary substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/411Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs characterised by materials, geometry or structure of the substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

Landscapes

  • Thin Film Transistor (AREA)
  • Electroluminescent Light Sources (AREA)
KR1020080083209A 2007-08-30 2008-08-26 반도체 장치의 제작 방법 Expired - Fee Related KR101514627B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2007-00224043 2007-08-30
JP2007224043 2007-08-30

Publications (2)

Publication Number Publication Date
KR20090023158A KR20090023158A (ko) 2009-03-04
KR101514627B1 true KR101514627B1 (ko) 2015-04-23

Family

ID=40408198

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080083209A Expired - Fee Related KR101514627B1 (ko) 2007-08-30 2008-08-26 반도체 장치의 제작 방법

Country Status (3)

Country Link
US (1) US7838328B2 (enExample)
JP (1) JP5388500B2 (enExample)
KR (1) KR101514627B1 (enExample)

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101405915A (zh) * 2006-03-17 2009-04-08 Nxp股份有限公司 天线装置以及rf通信设备
JP5371341B2 (ja) * 2007-09-21 2013-12-18 株式会社半導体エネルギー研究所 電気泳動方式の表示装置
JP5451036B2 (ja) * 2008-11-21 2014-03-26 株式会社ジャパンディスプレイ 表示装置及びその製造方法
US9601530B2 (en) 2008-12-02 2017-03-21 Arizona Board Of Regents, A Body Corporated Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Dual active layer semiconductor device and method of manufacturing the same
WO2010138811A2 (en) * 2009-05-29 2010-12-02 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device at high temperatures and flexible semiconductor device thereof
US9991311B2 (en) 2008-12-02 2018-06-05 Arizona Board Of Regents On Behalf Of Arizona State University Dual active layer semiconductor device and method of manufacturing the same
US9721825B2 (en) 2008-12-02 2017-08-01 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device and flexible semiconductor device thereof
SG171917A1 (en) 2008-12-02 2011-07-28 Univ Arizona Method of preparing a flexible substrate assembly and flexible substrate assembly therefrom
CN101762922B (zh) * 2008-12-24 2012-05-30 京东方科技集团股份有限公司 触摸式电子纸及其制造方法
JP5632654B2 (ja) * 2009-05-29 2014-11-26 株式会社半導体エネルギー研究所 表示装置
WO2011002046A1 (en) 2009-06-30 2011-01-06 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
EP3217435A1 (en) * 2009-09-16 2017-09-13 Semiconductor Energy Laboratory Co., Ltd. Transistor and display device
KR101730347B1 (ko) 2009-09-16 2017-04-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR101940962B1 (ko) * 2009-10-09 2019-01-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
IN2012DN01823A (enExample) * 2009-10-16 2015-06-05 Semiconductor Energy Lab
KR20190066086A (ko) 2009-11-06 2019-06-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR102771839B1 (ko) 2009-11-13 2025-02-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
WO2011068950A1 (en) * 2009-12-03 2011-06-09 The Trustees Of Columbia University In The City Of New York Hierarchical assembly of nanostructured organic heterojunctions for photovoltaic devices
JP2011181591A (ja) * 2010-02-26 2011-09-15 Sumitomo Chemical Co Ltd 薄膜半導体装置、薄膜半導体製造装置及び薄膜半導体製造方法
EP2362421A1 (en) 2010-02-26 2011-08-31 STMicroelectronics S.r.l. Tailorable flexible sheet of monolithically fabricated array of separable cells each comprising a wholly organic, integrated circuit adapted to perform a specific function
JP5565038B2 (ja) * 2010-03-30 2014-08-06 凸版印刷株式会社 電界効果型トランジスタ及びその製造方法並びに画像表示装置
WO2012021197A2 (en) 2010-05-21 2012-02-16 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method of manufacturing electronic devices on both sides of a carrier substrate and electronic devices thereof
WO2012021196A2 (en) 2010-05-21 2012-02-16 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method for manufacturing electronic devices and electronic devices thereof
JP2012015491A (ja) * 2010-06-04 2012-01-19 Semiconductor Energy Lab Co Ltd 光電変換装置
KR101856722B1 (ko) * 2010-09-22 2018-05-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 파워 절연 게이트형 전계 효과 트랜지스터
US20130308076A1 (en) * 2010-10-01 2013-11-21 Sharp Kabushiki Kaisha Flexible display and method for manufacturing the same
JP5982125B2 (ja) 2011-01-12 2016-08-31 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP5872912B2 (ja) * 2011-01-21 2016-03-01 株式会社半導体エネルギー研究所 発光装置
KR102040242B1 (ko) * 2011-05-12 2019-11-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 발광 장치를 이용한 전자 기기
TWI527207B (zh) 2011-10-21 2016-03-21 友達光電股份有限公司 可撓式有機發光裝置及其製作方法
JP5674707B2 (ja) * 2012-05-22 2015-02-25 株式会社東芝 表示装置
DE102012224424A1 (de) * 2012-12-27 2014-07-17 Robert Bosch Gmbh Sensorsystem und Abdeckvorrichtung für ein Sensorsystem
US8878275B2 (en) * 2013-02-18 2014-11-04 Fairchild Semiconductor Corporation LDMOS device with double-sloped field plate
KR101802558B1 (ko) * 2013-04-09 2017-11-29 주식회사 엘지화학 디스플레이 소자의 제조방법 및 이를 이용하여 제조된 디스플레이 소자
US10486359B2 (en) * 2013-05-21 2019-11-26 Sharp Kabushiki Kaisha Method for manufacturing display apparatus, display apparatus, and film device
WO2017034644A2 (en) 2015-06-09 2017-03-02 ARIZONA BOARD OF REGENTS a body corporate for THE STATE OF ARIZONA for and on behalf of ARIZONA STATE UNIVERSITY Method of providing an electronic device and electronic device thereof
WO2015156891A2 (en) 2014-01-23 2015-10-15 Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device and flexible semiconductor device thereof
US10381224B2 (en) 2014-01-23 2019-08-13 Arizona Board Of Regents On Behalf Of Arizona State University Method of providing an electronic device and electronic device thereof
JP2017518638A (ja) 2014-05-13 2017-07-06 アリゾナ・ボード・オブ・リージェンツ・フォー・アンド・オン・ビハーフ・オブ・アリゾナ・ステイト・ユニバーシティArizona Board Of Regents For And On Behalf Of Arizona State University 電子デバイスを提供する方法およびその電子デバイス
WO2015198604A1 (ja) * 2014-06-26 2015-12-30 株式会社Joled 薄膜トランジスタ及び有機el表示装置
DE202014103821U1 (de) * 2014-07-09 2014-09-09 Carmen Diegel Flexible elektrische Leiterstruktur
US10446582B2 (en) 2014-12-22 2019-10-15 Arizona Board Of Regents On Behalf Of Arizona State University Method of providing an imaging system and imaging system thereof
US9741742B2 (en) 2014-12-22 2017-08-22 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Deformable electronic device and methods of providing and using deformable electronic device
CN105118844A (zh) * 2015-07-01 2015-12-02 深圳市华星光电技术有限公司 一种柔性显示面板的制备方法及柔性显示面板
WO2017115225A2 (en) * 2015-12-28 2017-07-06 Semiconductor Energy Laboratory Co., Ltd. Flexible device, display device, and manufacturing methods thereof
KR102499288B1 (ko) * 2016-01-08 2023-02-14 삼성디스플레이 주식회사 표시 장치
CN107808892B (zh) * 2016-09-08 2020-06-26 群创光电股份有限公司 显示设备
KR102079423B1 (ko) * 2016-10-31 2020-02-19 주식회사 엘지화학 폴리이미드 필름 형성용 조성물 및 이를 이용하여 제조된 폴리이미드 필름
CN106773206B (zh) * 2016-12-26 2019-03-19 武汉华星光电技术有限公司 显示面板的制造方法
CN106773207B (zh) * 2016-12-26 2020-01-17 武汉华星光电技术有限公司 显示面板的制造方法
CN206602182U (zh) * 2017-04-06 2017-10-31 京东方科技集团股份有限公司 一种天线结构及通讯设备
JPWO2019159614A1 (ja) * 2018-02-13 2021-01-28 パナソニックIpマネジメント株式会社 無線通信半導体装置およびその製造方法
WO2019203200A1 (ja) * 2018-04-17 2019-10-24 凸版印刷株式会社 薄膜トランジスタアレイ、薄膜トランジスタアレイ多面付け基板、およびそれらの製造方法
CN112310615B (zh) * 2019-07-31 2023-03-28 庆鼎精密电子(淮安)有限公司 天线模组及其制备方法
CN110838544A (zh) * 2019-11-08 2020-02-25 福仕保(江苏)新材料有限公司 超薄柔性有机电子器件制备与封装一体式结构设计和制备流程工艺
CN114730823B (zh) 2019-12-11 2025-02-28 新唐科技日本株式会社 半导体装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000349266A (ja) 1999-03-26 2000-12-15 Canon Inc 半導体部材の製造方法、半導体基体の利用方法、半導体部材の製造システム、半導体部材の生産管理方法及び堆積膜形成装置の利用方法
JP2007251080A (ja) 2006-03-20 2007-09-27 Fujifilm Corp プラスチック基板の固定方法、回路基板およびその製造方法
US20090004772A1 (en) 2007-02-02 2009-01-01 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3364081B2 (ja) 1995-02-16 2003-01-08 株式会社半導体エネルギー研究所 半導体装置の作製方法
US5757456A (en) 1995-03-10 1998-05-26 Semiconductor Energy Laboratory Co., Ltd. Display device and method of fabricating involving peeling circuits from one substrate and mounting on other
JP3406727B2 (ja) 1995-03-10 2003-05-12 株式会社半導体エネルギー研究所 表示装置
JP2001284622A (ja) * 2000-03-31 2001-10-12 Canon Inc 半導体部材の製造方法及び太陽電池の製造方法
US6489659B2 (en) * 2000-04-20 2002-12-03 Agere Systems Inc. Non-hermetic APD
US8415208B2 (en) 2001-07-16 2013-04-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and peeling off method and method of manufacturing semiconductor device
JP4027740B2 (ja) 2001-07-16 2007-12-26 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP4836445B2 (ja) * 2003-12-12 2011-12-14 株式会社半導体エネルギー研究所 半導体装置の作製方法
US7439111B2 (en) 2004-09-29 2008-10-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
TWI427702B (zh) * 2006-07-28 2014-02-21 Semiconductor Energy Lab 顯示裝置的製造方法
JP4611270B2 (ja) * 2006-09-27 2011-01-12 Okiセミコンダクタ株式会社 半導体装置の製造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000349266A (ja) 1999-03-26 2000-12-15 Canon Inc 半導体部材の製造方法、半導体基体の利用方法、半導体部材の製造システム、半導体部材の生産管理方法及び堆積膜形成装置の利用方法
JP2007251080A (ja) 2006-03-20 2007-09-27 Fujifilm Corp プラスチック基板の固定方法、回路基板およびその製造方法
US20090004772A1 (en) 2007-02-02 2009-01-01 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device

Also Published As

Publication number Publication date
JP5388500B2 (ja) 2014-01-15
KR20090023158A (ko) 2009-03-04
US20090061721A1 (en) 2009-03-05
JP2009076877A (ja) 2009-04-09
US7838328B2 (en) 2010-11-23

Similar Documents

Publication Publication Date Title
KR101514627B1 (ko) 반도체 장치의 제작 방법
JP6175174B2 (ja) 表示装置の作製方法
JP5651747B2 (ja) 半導体装置
KR101442522B1 (ko) 반도체 장치, 및 그 제작 방법
JP5364242B2 (ja) 半導体装置の作製方法

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20200418

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20200418

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000