KR101437175B1 - 렌즈 미터 - Google Patents

렌즈 미터 Download PDF

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Publication number
KR101437175B1
KR101437175B1 KR1020080018177A KR20080018177A KR101437175B1 KR 101437175 B1 KR101437175 B1 KR 101437175B1 KR 1020080018177 A KR1020080018177 A KR 1020080018177A KR 20080018177 A KR20080018177 A KR 20080018177A KR 101437175 B1 KR101437175 B1 KR 101437175B1
Authority
KR
South Korea
Prior art keywords
measurement
lens
optical characteristic
optical
index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020080018177A
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English (en)
Korean (ko)
Other versions
KR20080080048A (ko
Inventor
다다시 가지노
Original Assignee
가부시키가이샤 니데크
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Publication date
Application filed by 가부시키가이샤 니데크 filed Critical 가부시키가이샤 니데크
Publication of KR20080080048A publication Critical patent/KR20080080048A/ko
Application granted granted Critical
Publication of KR101437175B1 publication Critical patent/KR101437175B1/ko
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020080018177A 2007-02-28 2008-02-28 렌즈 미터 Expired - Fee Related KR101437175B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2007-00050813 2007-02-28
JP2007050813 2007-02-28
JPJP-P-2008-00025638 2008-02-05
JP2008025638A JP5202011B2 (ja) 2007-02-28 2008-02-05 レンズメータ

Publications (2)

Publication Number Publication Date
KR20080080048A KR20080080048A (ko) 2008-09-02
KR101437175B1 true KR101437175B1 (ko) 2014-09-03

Family

ID=39891097

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080018177A Expired - Fee Related KR101437175B1 (ko) 2007-02-28 2008-02-28 렌즈 미터

Country Status (3)

Country Link
JP (1) JP5202011B2 (enrdf_load_stackoverflow)
KR (1) KR101437175B1 (enrdf_load_stackoverflow)
CN (1) CN101256114B (enrdf_load_stackoverflow)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5862139B2 (ja) * 2010-09-30 2016-02-16 株式会社ニデック レンズメータ及び単焦点レンズ評価用プログラム
KR101244637B1 (ko) * 2011-04-08 2013-03-18 주식회사 휴비츠 안경 렌즈의 ｕｖ 투과율 측정 장치 및 방법
JP2014199303A (ja) 2013-03-29 2014-10-23 株式会社ニデック 眼鏡レンズ測定装置、眼鏡レンズの上下判別方法、眼鏡レンズ測定装置に設けられる印点アダプタ
JP6536029B2 (ja) * 2014-12-12 2019-07-03 株式会社ニデック レンズメータ、及び演算プログラム
JP6984163B2 (ja) 2016-07-05 2021-12-17 株式会社ニデック レンズメータ
CN107796596A (zh) 2016-08-30 2018-03-13 尼德克株式会社 透镜测定装置及透镜测定装置用标识板
EP3438635A3 (en) 2017-07-31 2019-06-12 Nidek Co., Ltd. Glasses measurement apparatus
KR101964214B1 (ko) * 2017-11-17 2019-04-01 주식회사 포텍 손실된 멀티 광원 추적이 가능한 렌즈 미터의 측정 방법
JP7087366B2 (ja) 2017-12-05 2022-06-21 株式会社ニデック 軸出し装置、眼鏡レンズ加工システム、及び眼鏡レンズ加工方法
JP7143652B2 (ja) 2018-07-02 2022-09-29 株式会社ニデック 眼鏡測定システム及び眼鏡測定プログラム
WO2021059531A1 (ja) * 2019-09-27 2021-04-01 株式会社レクザム レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001124662A (ja) * 1999-10-25 2001-05-11 Topcon Corp レンズメータ
US20030030789A1 (en) * 2001-08-09 2003-02-13 Nidek Co., Ltd. Lens meter

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001188030A (ja) * 1999-12-28 2001-07-10 Topcon Corp レンズメータ
EP1251401A1 (en) * 2001-04-20 2002-10-23 Infineon Technologies SC300 GmbH & Co. KG Method of measuring the aberration of a projection lens
JP4421332B2 (ja) * 2004-02-27 2010-02-24 株式会社ニデック レンズメータ
JP4646017B2 (ja) * 2004-04-23 2011-03-09 株式会社ニデック レンズメータ
JP4756828B2 (ja) * 2004-04-27 2011-08-24 株式会社ニデック レンズメータ
FR2880118B1 (fr) * 2004-12-23 2007-03-02 Essilor Int Procede et appareil de mesure locale des caracteristiques de refraction d'une lentille en un ou plusieurs points specifiques de cette lentille

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001124662A (ja) * 1999-10-25 2001-05-11 Topcon Corp レンズメータ
US20030030789A1 (en) * 2001-08-09 2003-02-13 Nidek Co., Ltd. Lens meter

Also Published As

Publication number Publication date
JP5202011B2 (ja) 2013-06-05
JP2008241694A (ja) 2008-10-09
CN101256114B (zh) 2012-08-08
KR20080080048A (ko) 2008-09-02
CN101256114A (zh) 2008-09-03

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