JP5202011B2 - レンズメータ - Google Patents

レンズメータ Download PDF

Info

Publication number
JP5202011B2
JP5202011B2 JP2008025638A JP2008025638A JP5202011B2 JP 5202011 B2 JP5202011 B2 JP 5202011B2 JP 2008025638 A JP2008025638 A JP 2008025638A JP 2008025638 A JP2008025638 A JP 2008025638A JP 5202011 B2 JP5202011 B2 JP 5202011B2
Authority
JP
Japan
Prior art keywords
measurement
power
index
lens
column surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008025638A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008241694A5 (enrdf_load_stackoverflow
JP2008241694A (ja
Inventor
正 梶野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2008025638A priority Critical patent/JP5202011B2/ja
Priority to US12/071,260 priority patent/US7733468B2/en
Priority to EP08151684.1A priority patent/EP1965189B1/en
Priority to CN2008100820325A priority patent/CN101256114B/zh
Priority to KR1020080018177A priority patent/KR101437175B1/ko
Publication of JP2008241694A publication Critical patent/JP2008241694A/ja
Publication of JP2008241694A5 publication Critical patent/JP2008241694A5/ja
Application granted granted Critical
Publication of JP5202011B2 publication Critical patent/JP5202011B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2008025638A 2007-02-28 2008-02-05 レンズメータ Expired - Fee Related JP5202011B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008025638A JP5202011B2 (ja) 2007-02-28 2008-02-05 レンズメータ
US12/071,260 US7733468B2 (en) 2007-02-28 2008-02-19 Lens meter
EP08151684.1A EP1965189B1 (en) 2007-02-28 2008-02-20 Lens Meter
CN2008100820325A CN101256114B (zh) 2007-02-28 2008-02-28 透镜测量仪
KR1020080018177A KR101437175B1 (ko) 2007-02-28 2008-02-28 렌즈 미터

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007050813 2007-02-28
JP2007050813 2007-02-28
JP2008025638A JP5202011B2 (ja) 2007-02-28 2008-02-05 レンズメータ

Publications (3)

Publication Number Publication Date
JP2008241694A JP2008241694A (ja) 2008-10-09
JP2008241694A5 JP2008241694A5 (enrdf_load_stackoverflow) 2011-03-24
JP5202011B2 true JP5202011B2 (ja) 2013-06-05

Family

ID=39891097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008025638A Expired - Fee Related JP5202011B2 (ja) 2007-02-28 2008-02-05 レンズメータ

Country Status (3)

Country Link
JP (1) JP5202011B2 (enrdf_load_stackoverflow)
KR (1) KR101437175B1 (enrdf_load_stackoverflow)
CN (1) CN101256114B (enrdf_load_stackoverflow)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5862139B2 (ja) * 2010-09-30 2016-02-16 株式会社ニデック レンズメータ及び単焦点レンズ評価用プログラム
KR101244637B1 (ko) * 2011-04-08 2013-03-18 주식회사 휴비츠 안경 렌즈의 ｕｖ 투과율 측정 장치 및 방법
JP2014199303A (ja) 2013-03-29 2014-10-23 株式会社ニデック 眼鏡レンズ測定装置、眼鏡レンズの上下判別方法、眼鏡レンズ測定装置に設けられる印点アダプタ
JP6536029B2 (ja) * 2014-12-12 2019-07-03 株式会社ニデック レンズメータ、及び演算プログラム
JP6984163B2 (ja) 2016-07-05 2021-12-17 株式会社ニデック レンズメータ
CN107796596A (zh) 2016-08-30 2018-03-13 尼德克株式会社 透镜测定装置及透镜测定装置用标识板
EP3438635A3 (en) 2017-07-31 2019-06-12 Nidek Co., Ltd. Glasses measurement apparatus
KR101964214B1 (ko) * 2017-11-17 2019-04-01 주식회사 포텍 손실된 멀티 광원 추적이 가능한 렌즈 미터의 측정 방법
JP7087366B2 (ja) 2017-12-05 2022-06-21 株式会社ニデック 軸出し装置、眼鏡レンズ加工システム、及び眼鏡レンズ加工方法
JP7143652B2 (ja) 2018-07-02 2022-09-29 株式会社ニデック 眼鏡測定システム及び眼鏡測定プログラム
WO2021059531A1 (ja) * 2019-09-27 2021-04-01 株式会社レクザム レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001124662A (ja) * 1999-10-25 2001-05-11 Topcon Corp レンズメータ
JP2001188030A (ja) * 1999-12-28 2001-07-10 Topcon Corp レンズメータ
EP1251401A1 (en) * 2001-04-20 2002-10-23 Infineon Technologies SC300 GmbH & Co. KG Method of measuring the aberration of a projection lens
JP4646014B2 (ja) * 2001-08-09 2011-03-09 株式会社ニデック レンズメータ
JP4421332B2 (ja) * 2004-02-27 2010-02-24 株式会社ニデック レンズメータ
JP4646017B2 (ja) * 2004-04-23 2011-03-09 株式会社ニデック レンズメータ
JP4756828B2 (ja) * 2004-04-27 2011-08-24 株式会社ニデック レンズメータ
FR2880118B1 (fr) * 2004-12-23 2007-03-02 Essilor Int Procede et appareil de mesure locale des caracteristiques de refraction d'une lentille en un ou plusieurs points specifiques de cette lentille

Also Published As

Publication number Publication date
JP2008241694A (ja) 2008-10-09
CN101256114B (zh) 2012-08-08
KR101437175B1 (ko) 2014-09-03
KR20080080048A (ko) 2008-09-02
CN101256114A (zh) 2008-09-03

Similar Documents

Publication Publication Date Title
JP5202011B2 (ja) レンズメータ
JP4646017B2 (ja) レンズメータ
JPH0466834A (ja) 自動レンズメーター
JP5362159B2 (ja) レンズメータ
EP1965189B1 (en) Lens Meter
US7609371B2 (en) Lens meter
JP4646014B2 (ja) レンズメータ
JP5862139B2 (ja) レンズメータ及び単焦点レンズ評価用プログラム
JP4421332B2 (ja) レンズメータ
JP4756828B2 (ja) レンズメータ
JP4920181B2 (ja) レンズメータ
JP5397882B2 (ja) レンズメータ
JP4781705B2 (ja) レンズメータ
JP4699006B2 (ja) レンズメータ
JP5015429B2 (ja) レンズメータ
JP2006058247A (ja) 眼鏡レンズ測定装置
JP3069311B2 (ja) 自動レンズメーター
JP3011742B2 (ja) 自動レンズメーター
JP3396676B2 (ja) レンズメ−タ
JP3069320B2 (ja) 自動レンズメータ
JPH11337445A (ja) レンズメ―タ
JPH06347732A (ja) レンズメータ
JPH06102138A (ja) 屈折特性測定装置
JP2000136985A (ja) レンズメ―タ

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110203

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110203

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20121010

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20121016

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121217

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130115

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130212

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 5202011

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160222

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees