CN101256114B - 透镜测量仪 - Google Patents

透镜测量仪 Download PDF

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Publication number
CN101256114B
CN101256114B CN2008100820325A CN200810082032A CN101256114B CN 101256114 B CN101256114 B CN 101256114B CN 2008100820325 A CN2008100820325 A CN 2008100820325A CN 200810082032 A CN200810082032 A CN 200810082032A CN 101256114 B CN101256114 B CN 101256114B
Authority
CN
China
Prior art keywords
lens
optical characteristics
measurement target
measurement
row
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2008100820325A
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English (en)
Chinese (zh)
Other versions
CN101256114A (zh
Inventor
梶野正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Publication of CN101256114A publication Critical patent/CN101256114A/zh
Application granted granted Critical
Publication of CN101256114B publication Critical patent/CN101256114B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN2008100820325A 2007-02-28 2008-02-28 透镜测量仪 Expired - Fee Related CN101256114B (zh)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP200750813 2007-02-28
JP2007050813 2007-02-28
JP2007-50813 2007-02-28
JP2008025638A JP5202011B2 (ja) 2007-02-28 2008-02-05 レンズメータ
JP2008-25638 2008-02-05
JP200825638 2008-02-05

Publications (2)

Publication Number Publication Date
CN101256114A CN101256114A (zh) 2008-09-03
CN101256114B true CN101256114B (zh) 2012-08-08

Family

ID=39891097

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008100820325A Expired - Fee Related CN101256114B (zh) 2007-02-28 2008-02-28 透镜测量仪

Country Status (3)

Country Link
JP (1) JP5202011B2 (enrdf_load_stackoverflow)
KR (1) KR101437175B1 (enrdf_load_stackoverflow)
CN (1) CN101256114B (enrdf_load_stackoverflow)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5862139B2 (ja) * 2010-09-30 2016-02-16 株式会社ニデック レンズメータ及び単焦点レンズ評価用プログラム
KR101244637B1 (ko) * 2011-04-08 2013-03-18 주식회사 휴비츠 안경 렌즈의 ｕｖ 투과율 측정 장치 및 방법
JP2014199303A (ja) 2013-03-29 2014-10-23 株式会社ニデック 眼鏡レンズ測定装置、眼鏡レンズの上下判別方法、眼鏡レンズ測定装置に設けられる印点アダプタ
JP6536029B2 (ja) * 2014-12-12 2019-07-03 株式会社ニデック レンズメータ、及び演算プログラム
JP6984163B2 (ja) 2016-07-05 2021-12-17 株式会社ニデック レンズメータ
CN107796596A (zh) 2016-08-30 2018-03-13 尼德克株式会社 透镜测定装置及透镜测定装置用标识板
EP3438635A3 (en) 2017-07-31 2019-06-12 Nidek Co., Ltd. Glasses measurement apparatus
KR101964214B1 (ko) * 2017-11-17 2019-04-01 주식회사 포텍 손실된 멀티 광원 추적이 가능한 렌즈 미터의 측정 방법
JP7087366B2 (ja) 2017-12-05 2022-06-21 株式会社ニデック 軸出し装置、眼鏡レンズ加工システム、及び眼鏡レンズ加工方法
JP7143652B2 (ja) 2018-07-02 2022-09-29 株式会社ニデック 眼鏡測定システム及び眼鏡測定プログラム
WO2021059531A1 (ja) * 2019-09-27 2021-04-01 株式会社レクザム レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001124662A (ja) * 1999-10-25 2001-05-11 Topcon Corp レンズメータ
EP1251401A1 (en) * 2001-04-20 2002-10-23 Infineon Technologies SC300 GmbH & Co. KG Method of measuring the aberration of a projection lens
CN1690680A (zh) * 2004-04-23 2005-11-02 株式会社尼德克 透镜检查仪
CN1690679A (zh) * 2004-04-27 2005-11-02 株式会社尼德克 透镜检查仪
FR2880118A1 (fr) * 2004-12-23 2006-06-30 Essilor Int Procede et appareil de mesure locale des caracteristiques de refraction d'une lentille en un ou plusieurs points specifiques de cette lentille

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001188030A (ja) * 1999-12-28 2001-07-10 Topcon Corp レンズメータ
JP4646014B2 (ja) * 2001-08-09 2011-03-09 株式会社ニデック レンズメータ
JP4421332B2 (ja) * 2004-02-27 2010-02-24 株式会社ニデック レンズメータ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001124662A (ja) * 1999-10-25 2001-05-11 Topcon Corp レンズメータ
EP1251401A1 (en) * 2001-04-20 2002-10-23 Infineon Technologies SC300 GmbH & Co. KG Method of measuring the aberration of a projection lens
CN1690680A (zh) * 2004-04-23 2005-11-02 株式会社尼德克 透镜检查仪
CN1690679A (zh) * 2004-04-27 2005-11-02 株式会社尼德克 透镜检查仪
FR2880118A1 (fr) * 2004-12-23 2006-06-30 Essilor Int Procede et appareil de mesure locale des caracteristiques de refraction d'une lentille en un ou plusieurs points specifiques de cette lentille

Also Published As

Publication number Publication date
JP5202011B2 (ja) 2013-06-05
JP2008241694A (ja) 2008-10-09
KR101437175B1 (ko) 2014-09-03
KR20080080048A (ko) 2008-09-02
CN101256114A (zh) 2008-09-03

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120808

Termination date: 20170228