JP4421332B2 - レンズメータ - Google Patents
レンズメータ Download PDFInfo
- Publication number
- JP4421332B2 JP4421332B2 JP2004055425A JP2004055425A JP4421332B2 JP 4421332 B2 JP4421332 B2 JP 4421332B2 JP 2004055425 A JP2004055425 A JP 2004055425A JP 2004055425 A JP2004055425 A JP 2004055425A JP 4421332 B2 JP4421332 B2 JP 4421332B2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- measurement
- index
- dot
- light receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
- G01M11/0214—Details of devices holding the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
- G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
Description
2 ディスプレイ
3 ノーズピース
10 測定光学系
11 測定光源
14 グリッド板
15 受光センサ
20 測定指標
21 中心孔
22 小孔
Claims (1)
- 被検レンズに光束を投光し、被検レンズを透過した光束を受光センサで受光する測定光学系を持ち、被検レンズが測定光路に配置されないレンズ無しの状態を基準とし、被検レンズを測定光路に配置したときに前記受光センサの受光面で検出される測定指標に基づいて被検レンズの光学特性を測定するレンズメータにおいて、被検レンズが光路上にないときに、前記受光センサで受光される第1領域に分布する第1ドット状指標と第1領域の外側の第2領域に分布する第2ドット状指標とを有し、被検レンズの光学特性の分布を測定するために前記測定光学系に設けられた測定指標と、組み立て調整時に、被検レンズ無しの状態で得られる前記第1ドット状指標の各指標の位置関係と、前記測定光学系の光路に光束変位用の光学部材を配置して前記第2ドット状指標を前記受光センサに受光させることによって得られた前記第2ドット状指標の各指標の位置関係と、を記憶する記憶手段と、経年変化等による光学系の位置ズレを補正するために、前記記憶手段に記憶された各指標の位置関係と被検レンズが光路上に無いときに前記受光センサにより検出される各指標の位置とに基づいて、前記第1ドット状指標及び第2ドット状指標の各指標の0D基準での位置関係を新たに得る演算手段と、を備えることを特徴とするレンズメータ。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004055425A JP4421332B2 (ja) | 2004-02-27 | 2004-02-27 | レンズメータ |
US11/066,246 US7209224B2 (en) | 2004-02-27 | 2005-02-25 | Lens meter |
KR1020050016792A KR101126155B1 (ko) | 2004-02-27 | 2005-02-28 | 렌즈미터 |
EP05004383A EP1568984B1 (en) | 2004-02-27 | 2005-02-28 | Lens meter |
DE602005015045T DE602005015045D1 (de) | 2004-02-27 | 2005-02-28 | Linsenmesser |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004055425A JP4421332B2 (ja) | 2004-02-27 | 2004-02-27 | レンズメータ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005241605A JP2005241605A (ja) | 2005-09-08 |
JP4421332B2 true JP4421332B2 (ja) | 2010-02-24 |
Family
ID=34747591
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004055425A Expired - Fee Related JP4421332B2 (ja) | 2004-02-27 | 2004-02-27 | レンズメータ |
Country Status (5)
Country | Link |
---|---|
US (1) | US7209224B2 (ja) |
EP (1) | EP1568984B1 (ja) |
JP (1) | JP4421332B2 (ja) |
KR (1) | KR101126155B1 (ja) |
DE (1) | DE602005015045D1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4756828B2 (ja) * | 2004-04-27 | 2011-08-24 | 株式会社ニデック | レンズメータ |
JP5015429B2 (ja) * | 2005-04-14 | 2012-08-29 | 株式会社ニデック | レンズメータ |
JP5202011B2 (ja) * | 2007-02-28 | 2013-06-05 | 株式会社ニデック | レンズメータ |
US7733468B2 (en) * | 2007-02-28 | 2010-06-08 | Nidek Co., Ltd. | Lens meter |
US10670494B2 (en) | 2015-05-10 | 2020-06-02 | 6 Over 6 Vision Ltd. | Apparatus, system and method of determining one or more optical parameters of a lens |
KR102625523B1 (ko) * | 2015-05-10 | 2024-01-15 | 식스 오버 식스 비젼 엘티디 | 렌즈의 하나 또는 그 이상의 광학 파라미터를 결정하는 장치와 시스템 및 방법 |
US10557773B2 (en) | 2016-05-18 | 2020-02-11 | Jand, Inc. | Fixtureless lensmeter system |
US10036685B2 (en) | 2016-05-18 | 2018-07-31 | Jand, Inc. | Fixtureless lensmeter and methods of operating same |
US11488239B2 (en) | 2019-08-26 | 2022-11-01 | Warby Parker Inc. | Virtual fitting systems and methods for spectacles |
KR20230002738A (ko) | 2020-04-15 | 2023-01-05 | 와비 파커 인코포레이티드 | 참조 프레임을 사용하는 안경용 가상 시착 시스템 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3880525A (en) | 1974-05-08 | 1975-04-29 | American Optical Corp | Method and apparatus for determining the refractive characteristics of a lens |
JPS6029634A (ja) | 1983-07-27 | 1985-02-15 | Nippon Kogaku Kk <Nikon> | 光学特性測定装置 |
JPH01185765A (ja) * | 1988-01-20 | 1989-07-25 | Sanyo Electric Co Ltd | 電子漢字辞書 |
US5489978A (en) | 1992-11-05 | 1996-02-06 | Canon Kabushiki Kaisha | Lens measuring apparatus |
JPH06249749A (ja) | 1993-02-26 | 1994-09-09 | Topcon Corp | レンズメータ |
IL113945A0 (en) | 1994-06-10 | 1995-08-31 | Johnson & Johnson Vision Prod | System and method for inspecting lenses |
JP3406944B2 (ja) | 1994-10-19 | 2003-05-19 | キヤノン株式会社 | レンズ測定装置 |
JPH09257644A (ja) | 1996-03-26 | 1997-10-03 | Topcon Corp | レンズメーター |
JPH09288040A (ja) | 1996-04-19 | 1997-11-04 | Topcon Corp | レンズメータ |
JP3647991B2 (ja) | 1996-09-30 | 2005-05-18 | 株式会社トプコン | レンズメーター |
JP2001188030A (ja) * | 1999-12-28 | 2001-07-10 | Topcon Corp | レンズメータ |
US6937328B2 (en) | 2000-08-11 | 2005-08-30 | Kabushiki Kaisha Topcon | Method for measuring refractive power and apparatus therefor |
KR100530643B1 (ko) | 2000-08-11 | 2005-11-22 | 가부시키가이샤 탑콘 | 굴절력측정장치 |
JP3814155B2 (ja) | 2001-03-14 | 2006-08-23 | Hoya株式会社 | 透過率測定方法及び装置 |
JP5362159B2 (ja) | 2001-09-04 | 2013-12-11 | 株式会社ニデック | レンズメータ |
-
2004
- 2004-02-27 JP JP2004055425A patent/JP4421332B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-25 US US11/066,246 patent/US7209224B2/en not_active Expired - Fee Related
- 2005-02-28 EP EP05004383A patent/EP1568984B1/en not_active Expired - Fee Related
- 2005-02-28 DE DE602005015045T patent/DE602005015045D1/de active Active
- 2005-02-28 KR KR1020050016792A patent/KR101126155B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR20060043277A (ko) | 2006-05-15 |
EP1568984B1 (en) | 2009-06-24 |
JP2005241605A (ja) | 2005-09-08 |
DE602005015045D1 (de) | 2009-08-06 |
US20050190360A1 (en) | 2005-09-01 |
EP1568984A3 (en) | 2006-02-08 |
EP1568984A2 (en) | 2005-08-31 |
US7209224B2 (en) | 2007-04-24 |
KR101126155B1 (ko) | 2012-03-23 |
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