KR101409644B1 - 입체 형상 계측 장치 - Google Patents
입체 형상 계측 장치 Download PDFInfo
- Publication number
- KR101409644B1 KR101409644B1 KR1020120118657A KR20120118657A KR101409644B1 KR 101409644 B1 KR101409644 B1 KR 101409644B1 KR 1020120118657 A KR1020120118657 A KR 1020120118657A KR 20120118657 A KR20120118657 A KR 20120118657A KR 101409644 B1 KR101409644 B1 KR 101409644B1
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- South Korea
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0028—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Health & Medical Sciences (AREA)
- Surgery (AREA)
- Radiology & Medical Imaging (AREA)
- Ophthalmology & Optometry (AREA)
- Health & Medical Sciences (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2012-022189 | 2012-02-03 | ||
| JP2012022189A JP5955574B2 (ja) | 2012-02-03 | 2012-02-03 | 立体形状計測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20130090313A KR20130090313A (ko) | 2013-08-13 |
| KR101409644B1 true KR101409644B1 (ko) | 2014-06-18 |
Family
ID=48902626
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020120118657A Active KR101409644B1 (ko) | 2012-02-03 | 2012-10-24 | 입체 형상 계측 장치 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9041940B2 (https=) |
| JP (1) | JP5955574B2 (https=) |
| KR (1) | KR101409644B1 (https=) |
| CN (1) | CN103245302B (https=) |
| TW (1) | TWI507659B (https=) |
Families Citing this family (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9220580B2 (en) | 2012-03-01 | 2015-12-29 | Align Technology, Inc. | Determining a dental treatment difficulty |
| US9414897B2 (en) | 2012-05-22 | 2016-08-16 | Align Technology, Inc. | Adjustment of tooth position in a virtual dental model |
| JP6113021B2 (ja) * | 2013-08-09 | 2017-04-12 | 株式会社キーエンス | 接触式変位計 |
| JP6198312B2 (ja) * | 2013-09-30 | 2017-09-20 | Jukiオートメーションシステムズ株式会社 | 3次元測定装置、3次元測定方法および基板の製造方法 |
| US10772506B2 (en) | 2014-07-07 | 2020-09-15 | Align Technology, Inc. | Apparatus for dental confocal imaging |
| US9693839B2 (en) | 2014-07-17 | 2017-07-04 | Align Technology, Inc. | Probe head and apparatus for intraoral confocal imaging using polarization-retarding coatings |
| US9675430B2 (en) | 2014-08-15 | 2017-06-13 | Align Technology, Inc. | Confocal imaging apparatus with curved focal surface |
| US9610141B2 (en) | 2014-09-19 | 2017-04-04 | Align Technology, Inc. | Arch expanding appliance |
| US10449016B2 (en) | 2014-09-19 | 2019-10-22 | Align Technology, Inc. | Arch adjustment appliance |
| US9744001B2 (en) | 2014-11-13 | 2017-08-29 | Align Technology, Inc. | Dental appliance with cavity for an unerupted or erupting tooth |
| US10504386B2 (en) | 2015-01-27 | 2019-12-10 | Align Technology, Inc. | Training method and system for oral-cavity-imaging-and-modeling equipment |
| JP6342842B2 (ja) * | 2015-04-30 | 2018-06-13 | オリンパス株式会社 | 走査型顕微鏡システム |
| DE102015110795A1 (de) * | 2015-07-03 | 2017-01-05 | Carl Zeiss Microscopy Gmbh | Optikvorrichtung mit einem Optikmodul, das mindestens ein optisches Element aufweist |
| US10248883B2 (en) | 2015-08-20 | 2019-04-02 | Align Technology, Inc. | Photograph-based assessment of dental treatments and procedures |
| US11554000B2 (en) | 2015-11-12 | 2023-01-17 | Align Technology, Inc. | Dental attachment formation structure |
| US11931222B2 (en) | 2015-11-12 | 2024-03-19 | Align Technology, Inc. | Dental attachment formation structures |
| US11103330B2 (en) | 2015-12-09 | 2021-08-31 | Align Technology, Inc. | Dental attachment placement structure |
| US11596502B2 (en) | 2015-12-09 | 2023-03-07 | Align Technology, Inc. | Dental attachment placement structure |
| CN105596088B (zh) * | 2015-12-22 | 2018-05-18 | 吉林亚泰中科医疗器械工程技术研究院股份有限公司 | 基于皮肤共焦系统的可调节三轴成像机构 |
| JP6189984B2 (ja) * | 2016-02-12 | 2017-08-30 | Ckd株式会社 | 三次元計測装置 |
| KR101754148B1 (ko) | 2016-04-07 | 2017-07-06 | 주식회사 에타맥스 | 곡률 측정 장치 |
| EP3471653B1 (en) | 2016-06-17 | 2021-12-22 | Align Technology, Inc. | Orthodontic appliance performance monitor |
| WO2017218947A1 (en) | 2016-06-17 | 2017-12-21 | Align Technology, Inc. | Intraoral appliances with sensing |
| DE102016113149A1 (de) * | 2016-07-15 | 2018-01-18 | Triple-In Holding Ag | Aufnahme von Entfernungsprofilen |
| DE102016213237A1 (de) * | 2016-07-20 | 2018-01-25 | Carl Zeiss Smt Gmbh | Messvorrichtung zur interferometrischen Bestimmung einer Form einer optischen Oberfläche |
| US10507087B2 (en) | 2016-07-27 | 2019-12-17 | Align Technology, Inc. | Methods and apparatuses for forming a three-dimensional volumetric model of a subject's teeth |
| ES2843501T3 (es) | 2016-07-27 | 2021-07-19 | Align Technology Inc | Escáner intraoral con capacidades de diagnóstico dental |
| DE102016115827A1 (de) | 2016-08-25 | 2018-03-01 | Nanofocus Ag | Verfahren und Vorrichtung zur optischen Oberflächenmessung mit Hilfe eines chromatisch konfokalen Sensors |
| CN111142251B (zh) * | 2016-10-26 | 2022-03-25 | 合肥百会拓知科技有限公司 | 一种具有三维成像能力的显微镜和成像方法 |
| WO2018085718A2 (en) | 2016-11-04 | 2018-05-11 | Align Technology, Inc. | Methods and apparatuses for dental images |
| WO2018102770A1 (en) | 2016-12-02 | 2018-06-07 | Align Technology, Inc. | Force control, stop mechanism, regulating structure of removable arch adjustment appliance |
| WO2018102811A1 (en) | 2016-12-02 | 2018-06-07 | Align Technology, Inc. | Methods and apparatuses for customizing rapid palatal expanders using digital models |
| US11026831B2 (en) | 2016-12-02 | 2021-06-08 | Align Technology, Inc. | Dental appliance features for speech enhancement |
| EP3824843B1 (en) | 2016-12-02 | 2024-12-25 | Align Technology, Inc. | Series of palatal expanders |
| US10548700B2 (en) | 2016-12-16 | 2020-02-04 | Align Technology, Inc. | Dental appliance etch template |
| US10456043B2 (en) | 2017-01-12 | 2019-10-29 | Align Technology, Inc. | Compact confocal dental scanning apparatus |
| US10779718B2 (en) | 2017-02-13 | 2020-09-22 | Align Technology, Inc. | Cheek retractor and mobile device holder |
| WO2018183358A1 (en) | 2017-03-27 | 2018-10-04 | Align Technology, Inc. | Apparatuses and methods assisting in dental therapies |
| US10613515B2 (en) | 2017-03-31 | 2020-04-07 | Align Technology, Inc. | Orthodontic appliances including at least partially un-erupted teeth and method of forming them |
| US11045283B2 (en) | 2017-06-09 | 2021-06-29 | Align Technology, Inc. | Palatal expander with skeletal anchorage devices |
| WO2018232299A1 (en) | 2017-06-16 | 2018-12-20 | Align Technology, Inc. | Automatic detection of tooth type and eruption status |
| US10639134B2 (en) | 2017-06-26 | 2020-05-05 | Align Technology, Inc. | Biosensor performance indicator for intraoral appliances |
| US10885521B2 (en) | 2017-07-17 | 2021-01-05 | Align Technology, Inc. | Method and apparatuses for interactive ordering of dental aligners |
| WO2019018784A1 (en) | 2017-07-21 | 2019-01-24 | Align Technology, Inc. | ANCHOR OF CONTOUR PALATIN |
| WO2019023631A1 (en) | 2017-07-27 | 2019-01-31 | Align Technology, Inc. | SYSTEM AND METHODS FOR TREATING AN ORTHODONTIC ALIGNMENT USING OPTICAL COHERENCE TOMOGRAPHY |
| CN115462921B (zh) | 2017-07-27 | 2025-05-06 | 阿莱恩技术有限公司 | 牙齿着色、透明度和上釉 |
| US12274597B2 (en) * | 2017-08-11 | 2025-04-15 | Align Technology, Inc. | Dental attachment template tray systems |
| WO2019035979A1 (en) | 2017-08-15 | 2019-02-21 | Align Technology, Inc. | EVALUATION AND CALCULATION OF BUCCAL CORRIDOR |
| WO2019036677A1 (en) | 2017-08-17 | 2019-02-21 | Align Technology, Inc. | SURVEILLANCE OF CONFORMITY OF DENTAL DEVICE |
| EP3450913B1 (en) * | 2017-08-30 | 2021-06-09 | Hexagon Technology Center GmbH | Surveying instrument for scanning an object and for projection of information |
| WO2019071019A1 (en) | 2017-10-04 | 2019-04-11 | Align Technology, Inc. | INTRAORAL APPARATUS FOR SAMPLING MOUTH TISSUE |
| US10813720B2 (en) | 2017-10-05 | 2020-10-27 | Align Technology, Inc. | Interproximal reduction templates |
| CN114939001B (zh) | 2017-10-27 | 2025-02-18 | 阿莱恩技术有限公司 | 替代咬合调整结构 |
| US11576752B2 (en) | 2017-10-31 | 2023-02-14 | Align Technology, Inc. | Dental appliance having selective occlusal loading and controlled intercuspation |
| US11096763B2 (en) | 2017-11-01 | 2021-08-24 | Align Technology, Inc. | Automatic treatment planning |
| US11534974B2 (en) | 2017-11-17 | 2022-12-27 | Align Technology, Inc. | Customized fabrication of orthodontic retainers based on patient anatomy |
| US11219506B2 (en) | 2017-11-30 | 2022-01-11 | Align Technology, Inc. | Sensors for monitoring oral appliances |
| WO2019118876A1 (en) | 2017-12-15 | 2019-06-20 | Align Technology, Inc. | Closed loop adaptive orthodontic treatment methods and apparatuses |
| CN112119280B (zh) * | 2017-12-22 | 2023-05-23 | 驱动责任资金投入公司 | 具有双重结构的三维目标、具有该三维目标的光学测量装置和方法 |
| US10980613B2 (en) | 2017-12-29 | 2021-04-20 | Align Technology, Inc. | Augmented reality enhancements for dental practitioners |
| CN114587237B (zh) | 2018-01-26 | 2025-09-30 | 阿莱恩技术有限公司 | 诊断性口内扫描和追踪 |
| US11937991B2 (en) | 2018-03-27 | 2024-03-26 | Align Technology, Inc. | Dental attachment placement structure |
| KR102736991B1 (ko) | 2018-04-11 | 2024-12-03 | 얼라인 테크널러지, 인크. | 해제 가능한 구개 확장기 |
| CN112648926B (zh) * | 2021-01-13 | 2023-03-28 | 宁波五维检测科技有限公司 | 一种线聚焦彩色共焦三维表面高度测量装置及方法 |
| CN114964045B (zh) * | 2022-05-31 | 2025-04-04 | 武汉加特林光学仪器有限公司 | 基于光谱色散的三维测量设备与方法 |
| JP7262693B1 (ja) * | 2022-10-21 | 2023-04-21 | 株式会社東光高岳 | ワーク検査装置 |
| CN115665563B (zh) * | 2022-12-14 | 2023-06-27 | 深圳市中图仪器股份有限公司 | 光学测量系统及基于光学测量系统的成像方法 |
| WO2025249583A1 (ja) * | 2025-08-07 | 2025-12-04 | 株式会社東光高岳 | 立体形状計測装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09257440A (ja) * | 1996-03-26 | 1997-10-03 | Takaoka Electric Mfg Co Ltd | 2次元配列型共焦点光学装置 |
| JP2000275019A (ja) | 1999-03-23 | 2000-10-06 | Takaoka Electric Mfg Co Ltd | 能動共焦点撮像装置とそれを用いた三次元計測方法 |
| KR20020060224A (ko) * | 2000-09-11 | 2002-07-16 | 기시모토 마사도시 | 공초점 현미경 및 이것을 이용한 높이 측정방법 |
| JP2003247817A (ja) | 2002-02-27 | 2003-09-05 | Takaoka Electric Mfg Co Ltd | リニアスキャン型共焦点表面形状計測装置 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59183305A (ja) * | 1983-04-01 | 1984-10-18 | Ricoh Co Ltd | 位置検出装置 |
| JPS6022633A (ja) * | 1983-07-18 | 1985-02-05 | Nec Corp | フ−リエ分光器の高速ミラ−走査機構 |
| US4748335A (en) * | 1985-04-19 | 1988-05-31 | Siscan Systems, Inc. | Method and aparatus for determining surface profiles |
| JP3306858B2 (ja) | 1995-11-02 | 2002-07-24 | 株式会社高岳製作所 | 立体形状計測装置 |
| JPH0996512A (ja) * | 1995-09-29 | 1997-04-08 | Takaoka Electric Mfg Co Ltd | 立体形状計測装置 |
| JPH09127420A (ja) * | 1995-11-02 | 1997-05-16 | Takaoka Electric Mfg Co Ltd | 共焦点走査顕微鏡の走査装置 |
| JP3509088B2 (ja) * | 1997-02-25 | 2004-03-22 | 株式会社高岳製作所 | 3次元形状計測用光学装置 |
| US5959427A (en) * | 1998-03-04 | 1999-09-28 | Nikon Corporation | Method and apparatus for compensating for reaction forces in a stage assembly |
| US6496273B1 (en) * | 1999-05-05 | 2002-12-17 | Renishaw Plc | Position determining apparatus for coordinate positioning machine |
| JP2001083426A (ja) | 1999-07-09 | 2001-03-30 | Olympus Optical Co Ltd | 共焦点顕微鏡 |
| CN1271387C (zh) | 2002-03-07 | 2006-08-23 | 株式会社高岳制作所 | 偏振方向测定型两维光接收时标测定装置及使用它的表面形状测量装置 |
| US7136344B2 (en) | 2003-04-25 | 2006-11-14 | Nec Corporation | Optical head device and optical information recording/reproducing apparatus |
| JP2005265640A (ja) * | 2004-03-18 | 2005-09-29 | Sharp Corp | 距離測定装置、距離測定方法、画像読取装置、画像読取方法および画像形成装置 |
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| US7704402B2 (en) * | 2004-10-27 | 2010-04-27 | Nikon Corporation | Optical element manufacturing method, optical element, Nipkow disk, confocal optical system and 3-D measurement device |
| JP2006235250A (ja) | 2005-02-25 | 2006-09-07 | Nikon Corp | 測定顕微鏡 |
| TWI279580B (en) | 2005-12-22 | 2007-04-21 | Metal Ind Res & Dev Ct | Co-focal microscopic imaging system with adjustable light source pattern |
| TWI329207B (en) | 2007-03-14 | 2010-08-21 | Univ Nat Yang Ming | Modulation differential confocal microscopy |
| TWI357973B (en) | 2008-01-16 | 2012-02-11 | Univ Nat Taipei Technology | Apparatus and method for simulataneous confocal fu |
| TWI403756B (zh) | 2010-06-18 | 2013-08-01 | Univ Nat Taiwan | 三維同調斷層式共焦顯微成像裝置 |
-
2012
- 2012-02-03 JP JP2012022189A patent/JP5955574B2/ja active Active
- 2012-09-11 US US13/610,052 patent/US9041940B2/en active Active
- 2012-10-04 TW TW101136679A patent/TWI507659B/zh active
- 2012-10-24 KR KR1020120118657A patent/KR101409644B1/ko active Active
- 2012-11-26 CN CN201210487146.4A patent/CN103245302B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09257440A (ja) * | 1996-03-26 | 1997-10-03 | Takaoka Electric Mfg Co Ltd | 2次元配列型共焦点光学装置 |
| JP2000275019A (ja) | 1999-03-23 | 2000-10-06 | Takaoka Electric Mfg Co Ltd | 能動共焦点撮像装置とそれを用いた三次元計測方法 |
| KR20020060224A (ko) * | 2000-09-11 | 2002-07-16 | 기시모토 마사도시 | 공초점 현미경 및 이것을 이용한 높이 측정방법 |
| JP2003247817A (ja) | 2002-02-27 | 2003-09-05 | Takaoka Electric Mfg Co Ltd | リニアスキャン型共焦点表面形状計測装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013160612A (ja) | 2013-08-19 |
| TW201333420A (zh) | 2013-08-16 |
| CN103245302A (zh) | 2013-08-14 |
| CN103245302B (zh) | 2015-11-25 |
| TWI507659B (zh) | 2015-11-11 |
| US9041940B2 (en) | 2015-05-26 |
| US20130201488A1 (en) | 2013-08-08 |
| JP5955574B2 (ja) | 2016-07-20 |
| KR20130090313A (ko) | 2013-08-13 |
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Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20121024 |
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