TWI507659B - 三維形狀測量裝置 - Google Patents

三維形狀測量裝置 Download PDF

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Publication number
TWI507659B
TWI507659B TW101136679A TW101136679A TWI507659B TW I507659 B TWI507659 B TW I507659B TW 101136679 A TW101136679 A TW 101136679A TW 101136679 A TW101136679 A TW 101136679A TW I507659 B TWI507659 B TW I507659B
Authority
TW
Taiwan
Prior art keywords
aperture plate
optical axis
aperture
plate
axis direction
Prior art date
Application number
TW101136679A
Other languages
English (en)
Chinese (zh)
Other versions
TW201333420A (zh
Inventor
Mitsuhiro Ishihara
Original Assignee
Takaoka Toko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Takaoka Toko Co Ltd filed Critical Takaoka Toko Co Ltd
Publication of TW201333420A publication Critical patent/TW201333420A/zh
Application granted granted Critical
Publication of TWI507659B publication Critical patent/TWI507659B/zh

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0028Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • G02B21/0044Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/006Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008Details of detection or image processing, including general computer control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Surgery (AREA)
  • Radiology & Medical Imaging (AREA)
  • Ophthalmology & Optometry (AREA)
  • Health & Medical Sciences (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
TW101136679A 2012-02-03 2012-10-04 三維形狀測量裝置 TWI507659B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012022189A JP5955574B2 (ja) 2012-02-03 2012-02-03 立体形状計測装置

Publications (2)

Publication Number Publication Date
TW201333420A TW201333420A (zh) 2013-08-16
TWI507659B true TWI507659B (zh) 2015-11-11

Family

ID=48902626

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101136679A TWI507659B (zh) 2012-02-03 2012-10-04 三維形狀測量裝置

Country Status (5)

Country Link
US (1) US9041940B2 (https=)
JP (1) JP5955574B2 (https=)
KR (1) KR101409644B1 (https=)
CN (1) CN103245302B (https=)
TW (1) TWI507659B (https=)

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KR101754148B1 (ko) 2016-04-07 2017-07-06 주식회사 에타맥스 곡률 측정 장치
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US10507087B2 (en) 2016-07-27 2019-12-17 Align Technology, Inc. Methods and apparatuses for forming a three-dimensional volumetric model of a subject's teeth
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US11376101B2 (en) 2016-12-02 2022-07-05 Align Technology, Inc. Force control, stop mechanism, regulating structure of removable arch adjustment appliance
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US10639134B2 (en) 2017-06-26 2020-05-05 Align Technology, Inc. Biosensor performance indicator for intraoral appliances
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Publication number Priority date Publication date Assignee Title
TWI622754B (zh) * 2016-02-12 2018-05-01 Ckd Corp Three-dimensional measuring device

Also Published As

Publication number Publication date
TW201333420A (zh) 2013-08-16
JP2013160612A (ja) 2013-08-19
JP5955574B2 (ja) 2016-07-20
KR20130090313A (ko) 2013-08-13
CN103245302A (zh) 2013-08-14
KR101409644B1 (ko) 2014-06-18
US20130201488A1 (en) 2013-08-08
CN103245302B (zh) 2015-11-25
US9041940B2 (en) 2015-05-26

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