KR101358069B1 - 모터의 선형화된 데이터를 이용한 led모듈 렌즈의 설치 이상 유무 검사방법 - Google Patents
모터의 선형화된 데이터를 이용한 led모듈 렌즈의 설치 이상 유무 검사방법 Download PDFInfo
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- KR101358069B1 KR101358069B1 KR1020130073931A KR20130073931A KR101358069B1 KR 101358069 B1 KR101358069 B1 KR 101358069B1 KR 1020130073931 A KR1020130073931 A KR 1020130073931A KR 20130073931 A KR20130073931 A KR 20130073931A KR 101358069 B1 KR101358069 B1 KR 101358069B1
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- South Korea
- Prior art keywords
- led module
- led
- data
- motor
- optical data
- Prior art date
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- 238000007689 inspection Methods 0.000 title claims abstract description 30
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000009434 installation Methods 0.000 title claims abstract description 14
- 230000007547 defect Effects 0.000 title description 2
- 230000003287 optical effect Effects 0.000 claims abstract description 32
- 238000005259 measurement Methods 0.000 claims abstract description 6
- 230000005856 abnormality Effects 0.000 claims abstract description 5
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S362/00—Illumination
- Y10S362/80—Light emitting diode
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Led Devices (AREA)
Abstract
Description
Claims (1)
- 모터의 선형화된 데이터를 이용한 LED모듈 렌즈의 설치 이상 유무 검사방법에 있어서,
LED모듈에 전류를 인가하여 전압차에 의해 발광된 LED의 전기적인 특성을 측정하여 이상 유무를 판별하는 제1단계;
상기 제1단계에 의해 통과된 정상적인 LED모듈의 LED의 발광된 광원의 선형적인 광학 데이터를 측정하는 제2단계;
상기 제2단계에 의해 측정된 측정 데이터를 그래프화하는 제3단계;
검사장비의 모터 모션의 이송속도 및 거리를 선형화함에 있어서 증속, 감속구간의 측정데이터가 등속구간과 같은 측정조건이 되도록 이동 속도 및 거리를 선형화한 광학 데이터로 변환한 알고리즘 그래프로 변환하는 제4단계;
상기 제3단계 수행 후 형성된 LED모듈의 광학 데이터에 의해 작성된 그래프와 제4단계 수행 후 형성된 모터 모션의 광학 데이터를 비교 분석하는 제5단계와;
상기 5단계에 의해 선별된 LED모듈 렌즈를 제거하는 제6단계 순으로 검사하는 것을 특징으로 하는 모터의 선형화된 데이터를 이용한 LED모듈 렌즈의 설치 이상 유무 검사방법.
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KR1020130073931A KR101358069B1 (ko) | 2013-06-26 | 2013-06-26 | 모터의 선형화된 데이터를 이용한 led모듈 렌즈의 설치 이상 유무 검사방법 |
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KR1020130073931A KR101358069B1 (ko) | 2013-06-26 | 2013-06-26 | 모터의 선형화된 데이터를 이용한 led모듈 렌즈의 설치 이상 유무 검사방법 |
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KR101358069B1 true KR101358069B1 (ko) | 2014-02-05 |
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KR1020130073931A KR101358069B1 (ko) | 2013-06-26 | 2013-06-26 | 모터의 선형화된 데이터를 이용한 led모듈 렌즈의 설치 이상 유무 검사방법 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112114271A (zh) * | 2020-08-24 | 2020-12-22 | 厦门多彩光电子科技有限公司 | 一种led芯片质量的评价方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100980837B1 (ko) | 2010-03-23 | 2010-09-10 | 디아이티 주식회사 | 발광소자 특성 검사장치 |
WO2012044123A2 (ko) | 2010-10-01 | 2012-04-05 | 소닉스자펜 주식회사 | 엘이디조명등의 성능검사장치 |
WO2012077881A1 (ko) | 2010-12-09 | 2012-06-14 | 주식회사 이노비즈 | 엘이디 칩 검사장치 |
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- 2013-06-26 KR KR1020130073931A patent/KR101358069B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100980837B1 (ko) | 2010-03-23 | 2010-09-10 | 디아이티 주식회사 | 발광소자 특성 검사장치 |
WO2012044123A2 (ko) | 2010-10-01 | 2012-04-05 | 소닉스자펜 주식회사 | 엘이디조명등의 성능검사장치 |
WO2012077881A1 (ko) | 2010-12-09 | 2012-06-14 | 주식회사 이노비즈 | 엘이디 칩 검사장치 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112114271A (zh) * | 2020-08-24 | 2020-12-22 | 厦门多彩光电子科技有限公司 | 一种led芯片质量的评价方法 |
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