KR101333341B1 - 웨이퍼 가공용 필름 및 웨이퍼 가공용 필름을 사용하여 반도체 장치를 제조하는 방법 - Google Patents

웨이퍼 가공용 필름 및 웨이퍼 가공용 필름을 사용하여 반도체 장치를 제조하는 방법 Download PDF

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KR101333341B1
KR101333341B1 KR1020117023940A KR20117023940A KR101333341B1 KR 101333341 B1 KR101333341 B1 KR 101333341B1 KR 1020117023940 A KR1020117023940 A KR 1020117023940A KR 20117023940 A KR20117023940 A KR 20117023940A KR 101333341 B1 KR101333341 B1 KR 101333341B1
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South Korea
Prior art keywords
film
adhesive layer
adhesive
wafer processing
wafer
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KR1020117023940A
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English (en)
Korean (ko)
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KR20110129952A (ko
Inventor
가즈끼 다떼베
Original Assignee
후루카와 덴키 고교 가부시키가이샤
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Publication of KR20110129952A publication Critical patent/KR20110129952A/ko
Application granted granted Critical
Publication of KR101333341B1 publication Critical patent/KR101333341B1/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • H01L2221/68336Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Dicing (AREA)
  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
KR1020117023940A 2009-03-13 2010-03-09 웨이퍼 가공용 필름 및 웨이퍼 가공용 필름을 사용하여 반도체 장치를 제조하는 방법 KR101333341B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009060572A JP2010219086A (ja) 2009-03-13 2009-03-13 ウエハ加工用フィルム及びウエハ加工用フィルムを用いて半導体装置を製造する方法
JPJP-P-2009-060572 2009-03-13
PCT/JP2010/053880 WO2010104071A1 (ja) 2009-03-13 2010-03-09 ウエハ加工用フィルム及びウエハ加工用フィルムを用いて半導体装置を製造する方法

Publications (2)

Publication Number Publication Date
KR20110129952A KR20110129952A (ko) 2011-12-02
KR101333341B1 true KR101333341B1 (ko) 2013-11-28

Family

ID=42728360

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117023940A KR101333341B1 (ko) 2009-03-13 2010-03-09 웨이퍼 가공용 필름 및 웨이퍼 가공용 필름을 사용하여 반도체 장치를 제조하는 방법

Country Status (5)

Country Link
JP (1) JP2010219086A (ja)
KR (1) KR101333341B1 (ja)
CN (1) CN102349134A (ja)
TW (1) TWI519621B (ja)
WO (1) WO2010104071A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5196034B2 (ja) * 2010-06-18 2013-05-15 日立化成株式会社 接着シート
KR101397686B1 (ko) * 2010-12-06 2014-05-22 제일모직주식회사 기재필름 및 이를 이용한 반도체용 접착필름
JP5916295B2 (ja) * 2011-04-22 2016-05-11 古河電気工業株式会社 ウエハ加工用テープおよびウエハ加工用テープを用いて半導体装置を製造する方法
US10008405B2 (en) 2012-12-26 2018-06-26 Hitachi Chemical Company, Ltd Expansion method, method for manufacturing semiconductor device, and semiconductor device
JP6021687B2 (ja) * 2013-02-25 2016-11-09 株式会社ディスコ 積層ウェーハの加工方法
JP6066013B2 (ja) * 2014-02-21 2017-01-25 株式会社村田製作所 電子部品供給体及びその製造方法
KR102455987B1 (ko) * 2014-07-22 2022-10-18 아피쿠 야마다 가부시키가이샤 성형 금형, 성형 장치, 성형품의 제조 방법 및 수지 몰드 방법
CN112967992B (zh) * 2020-12-07 2022-09-23 重庆康佳光电技术研究院有限公司 外延结构的转移方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005279755A (ja) 2004-03-30 2005-10-13 Nitto Denko Corp レーザー加工品の製造方法及びレーザー加工用保護シート
KR20060106819A (ko) * 2003-12-15 2006-10-12 후루카와 덴키 고교 가부시키가이샤 웨이퍼 가공용 테이프 및 그 제조방법
WO2008047610A1 (fr) 2006-10-06 2008-04-24 Sumitomo Bakelite Company Limited Film pour semi-conducteur, procédé de production de film pour semi-conducteur et dispositif à semiconducteurs
JP2008303386A (ja) 2007-05-08 2008-12-18 Hitachi Chem Co Ltd 接着シート及びその製造方法並びに接着シートを用いた半導体装置の製造方法及び半導体装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3669196B2 (ja) * 1998-07-27 2005-07-06 日東電工株式会社 紫外線硬化型粘着シート
JP4107417B2 (ja) * 2002-10-15 2008-06-25 日東電工株式会社 チップ状ワークの固定方法
JP2005203749A (ja) * 2003-12-15 2005-07-28 Furukawa Electric Co Ltd:The ウェハ加工用テープおよびその製造方法
MY138566A (en) * 2004-03-15 2009-06-30 Hitachi Chemical Co Ltd Dicing/die bonding sheet
JP4776189B2 (ja) * 2004-08-03 2011-09-21 古河電気工業株式会社 ウエハ加工用テープ
JP4776188B2 (ja) * 2004-08-03 2011-09-21 古河電気工業株式会社 半導体装置製造方法およびウエハ加工用テープ
JP2007019151A (ja) * 2005-07-06 2007-01-25 Furukawa Electric Co Ltd:The ウエハ加工用テープおよびそれを用いたチップの製造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060106819A (ko) * 2003-12-15 2006-10-12 후루카와 덴키 고교 가부시키가이샤 웨이퍼 가공용 테이프 및 그 제조방법
JP2005279755A (ja) 2004-03-30 2005-10-13 Nitto Denko Corp レーザー加工品の製造方法及びレーザー加工用保護シート
WO2008047610A1 (fr) 2006-10-06 2008-04-24 Sumitomo Bakelite Company Limited Film pour semi-conducteur, procédé de production de film pour semi-conducteur et dispositif à semiconducteurs
JP2008303386A (ja) 2007-05-08 2008-12-18 Hitachi Chem Co Ltd 接着シート及びその製造方法並びに接着シートを用いた半導体装置の製造方法及び半導体装置

Also Published As

Publication number Publication date
CN102349134A (zh) 2012-02-08
TW201040242A (en) 2010-11-16
TWI519621B (zh) 2016-02-01
JP2010219086A (ja) 2010-09-30
WO2010104071A1 (ja) 2010-09-16
KR20110129952A (ko) 2011-12-02

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