KR101228164B1 - 적어도 2개의 갭 사이즈와 액티브 커패시터 영역 외부에배치된 트레블 스톱을 갖는 ｚ축 가속도계 - Google Patents

적어도 2개의 갭 사이즈와 액티브 커패시터 영역 외부에배치된 트레블 스톱을 갖는 ｚ축 가속도계 Download PDF

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KR101228164B1
KR101228164B1 KR1020077017507A KR20077017507A KR101228164B1 KR 101228164 B1 KR101228164 B1 KR 101228164B1 KR 1020077017507 A KR1020077017507 A KR 1020077017507A KR 20077017507 A KR20077017507 A KR 20077017507A KR 101228164 B1 KR101228164 B1 KR 101228164B1
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accelerometer
protective shield
gap
conductive
substrate
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KR20070095987A (ko
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앤드류 씨. 맥네일
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프리스케일 세미컨덕터, 인크.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
    • G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
    • G01P2015/0831—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pressure Sensors (AREA)
  • Micromachines (AREA)
KR1020077017507A 2005-01-28 2005-11-30 적어도 2개의 갭 사이즈와 액티브 커패시터 영역 외부에배치된 트레블 스톱을 갖는 ｚ축 가속도계 Expired - Fee Related KR101228164B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/046,596 2005-01-28
US11/046,596 US7121141B2 (en) 2005-01-28 2005-01-28 Z-axis accelerometer with at least two gap sizes and travel stops disposed outside an active capacitor area
PCT/US2005/043206 WO2006083376A1 (en) 2005-01-28 2005-11-30 Z-axis accelerometer with at least two gap sizes and travel stops disposed outside an active capacitor area

Publications (2)

Publication Number Publication Date
KR20070095987A KR20070095987A (ko) 2007-10-01
KR101228164B1 true KR101228164B1 (ko) 2013-01-30

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KR1020077017507A Expired - Fee Related KR101228164B1 (ko) 2005-01-28 2005-11-30 적어도 2개의 갭 사이즈와 액티브 커패시터 영역 외부에배치된 트레블 스톱을 갖는 ｚ축 가속도계

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Country Link
US (1) US7121141B2 (enExample)
JP (1) JP5356689B2 (enExample)
KR (1) KR101228164B1 (enExample)
TW (1) TWI377169B (enExample)
WO (1) WO2006083376A1 (enExample)

Families Citing this family (99)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007298405A (ja) * 2006-04-28 2007-11-15 Matsushita Electric Works Ltd 静電容量式センサ
DE102006026880B4 (de) 2006-06-09 2023-02-16 Robert Bosch Gmbh Mikromechanischer Beschleunigungssensor
DE102006057929A1 (de) * 2006-12-08 2008-06-12 Robert Bosch Gmbh Mikromechanischer Inertialsensor mit verringerter Empfindlichkeit gegenüber dem Einfluss driftender Oberflächenladungen und zu seinem Betrieb geeignetes Verfahren
DE102006058747A1 (de) * 2006-12-12 2008-06-19 Robert Bosch Gmbh Mikromechanischer z-Sensor
US7640805B2 (en) * 2006-12-18 2010-01-05 Akustica, Inc. Proof-mass with supporting structure on integrated circuit-MEMS platform
US8047075B2 (en) * 2007-06-21 2011-11-01 Invensense, Inc. Vertically integrated 3-axis MEMS accelerometer with electronics
US8508039B1 (en) 2008-05-08 2013-08-13 Invensense, Inc. Wafer scale chip scale packaging of vertically integrated MEMS sensors with electronics
US8250921B2 (en) 2007-07-06 2012-08-28 Invensense, Inc. Integrated motion processing unit (MPU) with MEMS inertial sensing and embedded digital electronics
US8462109B2 (en) 2007-01-05 2013-06-11 Invensense, Inc. Controlling and accessing content using motion processing on mobile devices
US8141424B2 (en) 2008-09-12 2012-03-27 Invensense, Inc. Low inertia frame for detecting coriolis acceleration
US8020441B2 (en) 2008-02-05 2011-09-20 Invensense, Inc. Dual mode sensing for vibratory gyroscope
US7934423B2 (en) 2007-12-10 2011-05-03 Invensense, Inc. Vertically integrated 3-axis MEMS angular accelerometer with integrated electronics
US8952832B2 (en) 2008-01-18 2015-02-10 Invensense, Inc. Interfacing application programs and motion sensors of a device
US7796872B2 (en) 2007-01-05 2010-09-14 Invensense, Inc. Method and apparatus for producing a sharp image from a handheld device containing a gyroscope
US7610809B2 (en) * 2007-01-18 2009-11-03 Freescale Semiconductor, Inc. Differential capacitive sensor and method of making same
ITTO20070033A1 (it) * 2007-01-19 2008-07-20 St Microelectronics Srl Dispositivo microelettromeccanico ad asse z con struttura di arresto perfezionata
US20080278258A1 (en) * 2007-05-08 2008-11-13 Lianjun Liu Integrated circuit having re-configurable balun circuit and method therefor
DE102007047592B4 (de) * 2007-10-05 2022-01-05 Robert Bosch Gmbh Beschleunigungssensor
DE102007050116B4 (de) * 2007-10-19 2023-08-03 Robert Bosch Gmbh Beschleunigungssensor
US8079262B2 (en) * 2007-10-26 2011-12-20 Rosemount Aerospace Inc. Pendulous accelerometer with balanced gas damping
US8294483B2 (en) * 2008-05-30 2012-10-23 Freescale Semiconductor, Inc. Testing of multiple integrated circuits
US8032030B2 (en) * 2008-05-30 2011-10-04 Freescale Semiconductor, Inc. Multiple core system
DE102008040855B4 (de) * 2008-07-30 2022-05-25 Robert Bosch Gmbh Dreiachsiger Beschleunigungssensor
DE102008041178B4 (de) 2008-08-12 2018-11-15 Robert Bosch Gmbh Herstellungsverfahren für ein mikromechanisches Bauteil
DE102008042366A1 (de) * 2008-09-25 2010-04-01 Robert Bosch Gmbh Sensor und Verfahren zur Herstellung eines Sensors
US8020443B2 (en) * 2008-10-30 2011-09-20 Freescale Semiconductor, Inc. Transducer with decoupled sensing in mutually orthogonal directions
CN102124352B (zh) * 2008-11-25 2013-04-17 松下电器产业株式会社 加速度传感器及其构造体
US8186220B2 (en) * 2009-03-09 2012-05-29 Freescale Semiconductor, Inc. Accelerometer with over-travel stop structure
US8186221B2 (en) * 2009-03-24 2012-05-29 Freescale Semiconductor, Inc. Vertically integrated MEMS acceleration transducer
DE102009002559A1 (de) * 2009-04-22 2010-10-28 Robert Bosch Gmbh Sensoranordnung
JP2011022137A (ja) * 2009-06-15 2011-02-03 Rohm Co Ltd Ｍｅｍｓ装置及びその製造方法
US7736931B1 (en) 2009-07-20 2010-06-15 Rosemount Aerospace Inc. Wafer process flow for a high performance MEMS accelerometer
DE102009029095B4 (de) * 2009-09-02 2017-05-18 Robert Bosch Gmbh Mikromechanisches Bauelement
DE102009029248B4 (de) * 2009-09-08 2022-12-15 Robert Bosch Gmbh Mikromechanisches System zum Erfassen einer Beschleunigung
US8534127B2 (en) 2009-09-11 2013-09-17 Invensense, Inc. Extension-mode angular velocity sensor
US9097524B2 (en) 2009-09-11 2015-08-04 Invensense, Inc. MEMS device with improved spring system
US8322216B2 (en) * 2009-09-22 2012-12-04 Duli Yu Micromachined accelerometer with monolithic electrodes and method of making the same
US8338207B2 (en) 2011-01-13 2012-12-25 Taiwan Semiconductor Manufacturing Company, Ltd. Bulk silicon moving member with dimple
US8927311B2 (en) 2011-02-16 2015-01-06 Freescale Semiconductor, Inc. MEMS device having variable gap width and method of manufacture
JP5790296B2 (ja) * 2011-08-17 2015-10-07 セイコーエプソン株式会社 物理量センサー及び電子機器
US20130047726A1 (en) * 2011-08-26 2013-02-28 Freescale Semiconductor, Inc. Angular rate sensor with different gap sizes
US8960003B2 (en) * 2011-09-16 2015-02-24 Taiwan Semiconductor Manufacturing Company, Ltd. Motion sensor device and methods for forming the same
US9032777B2 (en) * 2011-09-16 2015-05-19 Robert Bosch Gmbh Linearity enhancement of capacitive transducers by auto-calibration using on-chip neutralization capacitors and linear actuation
TWI452297B (zh) 2011-09-26 2014-09-11 Richwave Technology Corp 電容式加速度計
TWI476142B (zh) * 2011-12-14 2015-03-11 Pixart Imaging Inc 微機電感測元件及微機電感測元件的製作方法
DE102011057110A1 (de) * 2011-12-28 2013-07-04 Maxim Integrated Products, Inc. MEMS-Beschleunigungssensor
JP2013152111A (ja) * 2012-01-24 2013-08-08 Mitsubishi Electric Corp 加速度センサ
JP5979344B2 (ja) 2012-01-30 2016-08-24 セイコーエプソン株式会社 物理量センサーおよび電子機器
JP2013181855A (ja) 2012-03-02 2013-09-12 Seiko Epson Corp 物理量センサーおよび電子機器
JP5935986B2 (ja) 2012-04-06 2016-06-15 セイコーエプソン株式会社 物理量センサーおよび電子機器
JP5930183B2 (ja) 2012-04-09 2016-06-08 セイコーエプソン株式会社 物理量センサーおよび電子機器
JP5942554B2 (ja) * 2012-04-11 2016-06-29 セイコーエプソン株式会社 物理量センサーおよび電子機器
US8925384B2 (en) * 2012-05-29 2015-01-06 Freescale Semiconductor, Inc. MEMS sensor with stress isolation and method of fabrication
US9134337B2 (en) * 2012-12-17 2015-09-15 Maxim Integrated Products, Inc. Microelectromechanical z-axis out-of-plane stopper
US8895339B2 (en) * 2012-12-18 2014-11-25 Freescale Semiconductor, Inc. Reducing MEMS stiction by introduction of a carbon barrier
US9470709B2 (en) * 2013-01-28 2016-10-18 Analog Devices, Inc. Teeter totter accelerometer with unbalanced mass
US9297825B2 (en) 2013-03-05 2016-03-29 Analog Devices, Inc. Tilt mode accelerometer with improved offset and noise performance
ITTO20130237A1 (it) 2013-03-22 2014-09-23 St Microelectronics Srl Struttura microelettromeccanica di rilevamento ad asse z ad elevata sensibilita', in particolare per un accelerometro mems
JP6205921B2 (ja) * 2013-07-11 2017-10-04 セイコーエプソン株式会社 物理量センサー、電子機器、および移動体
JP6206650B2 (ja) * 2013-07-17 2017-10-04 セイコーエプソン株式会社 機能素子、電子機器、および移動体
US9335340B2 (en) * 2013-07-23 2016-05-10 Freescale Semiconductor, Inc. MEMS parameter identification using modulated waveforms
JP6150056B2 (ja) * 2013-07-24 2017-06-21 セイコーエプソン株式会社 機能素子、電子機器、および移動体
JP6146565B2 (ja) 2013-08-06 2017-06-14 セイコーエプソン株式会社 物理量センサー、電子機器、および移動体
DE102014202816B4 (de) * 2014-02-17 2022-06-30 Robert Bosch Gmbh Wippeneinrichtung für einen mikromechanischen Z-Sensor
JP6544058B2 (ja) * 2014-08-19 2019-07-17 セイコーエプソン株式会社 物理量センサー、電子機器および移動体
JP6655281B2 (ja) * 2014-08-19 2020-02-26 セイコーエプソン株式会社 物理量センサー、電子機器および移動体
CN105699693B (zh) 2014-12-11 2019-04-12 意法半导体股份有限公司 具有减少漂移功能的z轴微机电检测结构
US10073113B2 (en) 2014-12-22 2018-09-11 Analog Devices, Inc. Silicon-based MEMS devices including wells embedded with high density metal
US9638712B2 (en) 2015-01-22 2017-05-02 Nxp Usa, Inc. MEMS device with over-travel stop structure and method of fabrication
US10078098B2 (en) 2015-06-23 2018-09-18 Analog Devices, Inc. Z axis accelerometer design with offset compensation
US20170023606A1 (en) * 2015-07-23 2017-01-26 Freescale Semiconductor, Inc. Mems device with flexible travel stops and method of fabrication
ITUB20154017A1 (it) 2015-09-30 2017-03-30 St Microelectronics Srl Dispositivo incapsulato di materiale semiconduttore a ridotta sensibilita' nei confronti di stress termo-meccanici
ITUB20154667A1 (it) 2015-10-14 2017-04-14 St Microelectronics Srl Dispositivo sensore microelettromeccanico con ridotta sensibilita' agli stress
DE102016203153A1 (de) * 2016-02-29 2017-08-31 Robert Bosch Gmbh Verfahren zum Betreiben eines mikromechanischen z-Beschleunigungssensors
CN105823505B (zh) * 2016-03-21 2018-01-09 广东小天才科技有限公司 一种检测智能终端入水的方法及装置
DE102017208357B4 (de) * 2017-05-18 2025-01-02 Robert Bosch Gmbh Mikroelektromechanisches Bauelement mit vertikalem Anschlag
US10502759B2 (en) * 2017-10-24 2019-12-10 Nxp Usa, Inc. MEMS device with two-stage motion limit structure
JP2020024098A (ja) * 2018-08-06 2020-02-13 セイコーエプソン株式会社 物理量センサー、センサーデバイス、電子機器、および移動体
US10816569B2 (en) * 2018-09-07 2020-10-27 Analog Devices, Inc. Z axis accelerometer using variable vertical gaps
US11255873B2 (en) 2018-09-12 2022-02-22 Analog Devices, Inc. Increased sensitivity z-axis accelerometer
US11733263B2 (en) 2018-09-21 2023-08-22 Analog Devices, Inc. 3-axis accelerometer
IT201900000190A1 (it) * 2019-01-08 2020-07-08 St Microelectronics Srl Dispositivo mems con geometria ottimizzata per la riduzione dell'offset dovuto all'effetto radiometrico
JP2021004791A (ja) * 2019-06-26 2021-01-14 セイコーエプソン株式会社 慣性センサー、電子機器および移動体
JP7331498B2 (ja) * 2019-06-27 2023-08-23 セイコーエプソン株式会社 慣性センサー、電子機器および移動体
JP2021006794A (ja) 2019-06-28 2021-01-21 セイコーエプソン株式会社 慣性センサー、電子機器および移動体
US11279614B2 (en) 2019-06-28 2022-03-22 Analog Devices, Inc. Low-parasitic capacitance MEMS inertial sensors and related methods
JP2021021676A (ja) 2019-07-30 2021-02-18 セイコーエプソン株式会社 慣性センサー、電子機器および移動体
JP2021032831A (ja) * 2019-08-29 2021-03-01 セイコーエプソン株式会社 振動デバイス、電子機器および移動体
JP7383978B2 (ja) 2019-10-23 2023-11-21 セイコーエプソン株式会社 物理量センサー、電子機器および移動体
JP7537124B2 (ja) 2020-04-28 2024-08-21 セイコーエプソン株式会社 物理量センサー、電子機器および移動体
US11499987B2 (en) * 2020-06-17 2022-11-15 Nxp Usa, Inc. Z-axis inertial sensor with extended motion stops
JP2022014567A (ja) * 2020-07-07 2022-01-20 セイコーエプソン株式会社 慣性センサー及び慣性計測装置
US12139396B2 (en) 2020-08-07 2024-11-12 Stmicroelectronics S.R.L. Microelectromechanical sensor device with improved stability to stress
JP7585712B2 (ja) * 2020-10-28 2024-11-19 セイコーエプソン株式会社 物理量センサー、物理量センサーデバイス及び慣性計測装置
JP7585729B2 (ja) * 2020-11-17 2024-11-19 セイコーエプソン株式会社 物理量センサー、物理量センサーデバイス及び慣性計測装置
JP7581790B2 (ja) * 2020-11-20 2024-11-13 セイコーエプソン株式会社 物理量センサー、物理量センサーデバイス及び慣性計測装置
JP2022175616A (ja) * 2021-05-14 2022-11-25 セイコーエプソン株式会社 慣性センサー及び慣性計測装置
EP4141453B1 (en) 2021-08-25 2024-04-03 Murata Manufacturing Co., Ltd. Seesaw accelerometer
EP4187258A1 (en) 2021-11-25 2023-05-31 STMicroelectronics S.r.l. Z-axis microelectromechanical sensor device with improved stress insensitivity

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4736629A (en) * 1985-12-20 1988-04-12 Silicon Designs, Inc. Micro-miniature accelerometer
US5181156A (en) * 1992-05-14 1993-01-19 Motorola Inc. Micromachined capacitor structure and method for making
US5581035A (en) * 1994-08-29 1996-12-03 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4930043A (en) * 1989-02-28 1990-05-29 United Technologies Closed-loop capacitive accelerometer with spring constraint
JP2804196B2 (ja) * 1991-10-18 1998-09-24 株式会社日立製作所 マイクロセンサ及びそれを用いた制御システム
US5587518A (en) * 1994-12-23 1996-12-24 Ford Motor Company Accelerometer with a combined self-test and ground electrode
DE19541388A1 (de) * 1995-11-07 1997-05-15 Telefunken Microelectron Mikromechanischer Beschleunigungssensor
JPH09257617A (ja) * 1996-03-21 1997-10-03 Matsushita Electric Ind Co Ltd 圧力センサ及びこれを用いたガス異常監視装置
JPH1090300A (ja) * 1996-09-13 1998-04-10 Omron Corp 静電容量型物理量センサ
US5900550A (en) * 1997-06-16 1999-05-04 Ford Motor Company Capacitive acceleration sensor
JPH11194139A (ja) * 1997-12-27 1999-07-21 Sumitomo Precision Prod Co Ltd 静電容量型加速度センサ
JPH11218545A (ja) * 1998-02-02 1999-08-10 Omron Corp 静電容量型加速度センサ及び検出方法
JP3968877B2 (ja) * 1998-07-07 2007-08-29 株式会社デンソー 容量式物理量検出装置
AUPR228900A0 (en) * 2000-12-22 2001-01-25 Bhp Innovation Pty Ltd Method for determining sticking and flow properties of particulate solids
WO2003044539A1 (en) * 2001-11-19 2003-05-30 Mitsubishi Denki Kabushiki Kaisha Acceleration sensor
US6955086B2 (en) * 2001-11-19 2005-10-18 Mitsubishi Denki Kabushiki Kaisha Acceleration sensor
US6841992B2 (en) * 2003-02-18 2005-01-11 Honeywell International, Inc. MEMS enhanced capacitive pick-off and electrostatic rebalance electrode placement

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4736629A (en) * 1985-12-20 1988-04-12 Silicon Designs, Inc. Micro-miniature accelerometer
US5181156A (en) * 1992-05-14 1993-01-19 Motorola Inc. Micromachined capacitor structure and method for making
US5581035A (en) * 1994-08-29 1996-12-03 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode

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TWI377169B (en) 2012-11-21
US20060169043A1 (en) 2006-08-03
TW200635847A (en) 2006-10-16
JP2008529001A (ja) 2008-07-31
WO2006083376A1 (en) 2006-08-10
JP5356689B2 (ja) 2013-12-04
KR20070095987A (ko) 2007-10-01
US7121141B2 (en) 2006-10-17

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