TWI377169B - Z-axis accelerometer with at least two gap sizes and travel stops disposed outside an active capacitor area - Google Patents
Z-axis accelerometer with at least two gap sizes and travel stops disposed outside an active capacitor area Download PDFInfo
- Publication number
- TWI377169B TWI377169B TW094145880A TW94145880A TWI377169B TW I377169 B TWI377169 B TW I377169B TW 094145880 A TW094145880 A TW 094145880A TW 94145880 A TW94145880 A TW 94145880A TW I377169 B TWI377169 B TW I377169B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- accelerometer
- gap
- conductive
- plates
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title claims description 27
- 239000000758 substrate Substances 0.000 claims description 39
- 230000001133 acceleration Effects 0.000 claims description 30
- 230000037303 wrinkles Effects 0.000 claims description 12
- 230000001965 increasing effect Effects 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 52
- 230000035945 sensitivity Effects 0.000 description 10
- 230000008859 change Effects 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 239000004020 conductor Substances 0.000 description 6
- 230000033001 locomotion Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 229920005591 polysilicon Polymers 0.000 description 3
- 239000000725 suspension Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
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- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical group [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
- G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
- G01P2015/0831—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pressure Sensors (AREA)
- Micromachines (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/046,596 US7121141B2 (en) | 2005-01-28 | 2005-01-28 | Z-axis accelerometer with at least two gap sizes and travel stops disposed outside an active capacitor area |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200635847A TW200635847A (en) | 2006-10-16 |
| TWI377169B true TWI377169B (en) | 2012-11-21 |
Family
ID=36755078
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094145880A TWI377169B (en) | 2005-01-28 | 2005-12-22 | Z-axis accelerometer with at least two gap sizes and travel stops disposed outside an active capacitor area |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7121141B2 (enExample) |
| JP (1) | JP5356689B2 (enExample) |
| KR (1) | KR101228164B1 (enExample) |
| TW (1) | TWI377169B (enExample) |
| WO (1) | WO2006083376A1 (enExample) |
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| DE102006058747A1 (de) * | 2006-12-12 | 2008-06-19 | Robert Bosch Gmbh | Mikromechanischer z-Sensor |
| US7640805B2 (en) * | 2006-12-18 | 2010-01-05 | Akustica, Inc. | Proof-mass with supporting structure on integrated circuit-MEMS platform |
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| JPH11218545A (ja) * | 1998-02-02 | 1999-08-10 | Omron Corp | 静電容量型加速度センサ及び検出方法 |
| JP3968877B2 (ja) * | 1998-07-07 | 2007-08-29 | 株式会社デンソー | 容量式物理量検出装置 |
| AUPR228900A0 (en) * | 2000-12-22 | 2001-01-25 | Bhp Innovation Pty Ltd | Method for determining sticking and flow properties of particulate solids |
| WO2003044539A1 (en) * | 2001-11-19 | 2003-05-30 | Mitsubishi Denki Kabushiki Kaisha | Acceleration sensor |
| US6955086B2 (en) * | 2001-11-19 | 2005-10-18 | Mitsubishi Denki Kabushiki Kaisha | Acceleration sensor |
| US6841992B2 (en) * | 2003-02-18 | 2005-01-11 | Honeywell International, Inc. | MEMS enhanced capacitive pick-off and electrostatic rebalance electrode placement |
-
2005
- 2005-01-28 US US11/046,596 patent/US7121141B2/en not_active Expired - Fee Related
- 2005-11-30 JP JP2007553092A patent/JP5356689B2/ja not_active Expired - Fee Related
- 2005-11-30 WO PCT/US2005/043206 patent/WO2006083376A1/en not_active Ceased
- 2005-11-30 KR KR1020077017507A patent/KR101228164B1/ko not_active Expired - Fee Related
- 2005-12-22 TW TW094145880A patent/TWI377169B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US20060169043A1 (en) | 2006-08-03 |
| TW200635847A (en) | 2006-10-16 |
| JP2008529001A (ja) | 2008-07-31 |
| WO2006083376A1 (en) | 2006-08-10 |
| KR101228164B1 (ko) | 2013-01-30 |
| JP5356689B2 (ja) | 2013-12-04 |
| KR20070095987A (ko) | 2007-10-01 |
| US7121141B2 (en) | 2006-10-17 |
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| MM4A | Annulment or lapse of patent due to non-payment of fees |