KR101216765B1 - 반도체 집적 회로 장치 - Google Patents
반도체 집적 회로 장치 Download PDFInfo
- Publication number
- KR101216765B1 KR101216765B1 KR1020100001274A KR20100001274A KR101216765B1 KR 101216765 B1 KR101216765 B1 KR 101216765B1 KR 1020100001274 A KR1020100001274 A KR 1020100001274A KR 20100001274 A KR20100001274 A KR 20100001274A KR 101216765 B1 KR101216765 B1 KR 101216765B1
- Authority
- KR
- South Korea
- Prior art keywords
- type
- voltage
- mosfet
- terminal
- type mosfet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 60
- 230000005540 biological transmission Effects 0.000 claims abstract description 34
- 230000015556 catabolic process Effects 0.000 claims description 90
- 239000003990 capacitor Substances 0.000 claims description 20
- 239000000758 substrate Substances 0.000 claims description 14
- 238000000034 method Methods 0.000 claims 8
- 101000854777 Homo sapiens Pantetheinase Proteins 0.000 abstract description 14
- 101000854774 Homo sapiens Pantetheine hydrolase VNN2 Proteins 0.000 abstract description 14
- 102100020749 Pantetheinase Human genes 0.000 abstract description 14
- 102100020748 Pantetheine hydrolase VNN2 Human genes 0.000 abstract description 14
- 101000805729 Homo sapiens V-type proton ATPase 116 kDa subunit a 1 Proteins 0.000 abstract description 13
- 101000854873 Homo sapiens V-type proton ATPase 116 kDa subunit a 4 Proteins 0.000 abstract description 13
- 101000806601 Homo sapiens V-type proton ATPase catalytic subunit A Proteins 0.000 abstract description 13
- 102100037979 V-type proton ATPase 116 kDa subunit a 1 Human genes 0.000 abstract description 13
- 102100020737 V-type proton ATPase 116 kDa subunit a 4 Human genes 0.000 abstract description 13
- 238000010586 diagram Methods 0.000 description 12
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 230000003071 parasitic effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- -1 GND Proteins 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/74—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of diodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/6871—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
- H03K17/6874—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor in a symmetrical configuration
Landscapes
- Ultra Sonic Daignosis Equipment (AREA)
- Electronic Switches (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2009-037338 | 2009-02-20 | ||
| JP2009037338A JP5337523B2 (ja) | 2009-02-20 | 2009-02-20 | 半導体集積回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20100095366A KR20100095366A (ko) | 2010-08-30 |
| KR101216765B1 true KR101216765B1 (ko) | 2012-12-28 |
Family
ID=42630428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100001274A Active KR101216765B1 (ko) | 2009-02-20 | 2010-01-07 | 반도체 집적 회로 장치 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8143924B2 (enExample) |
| JP (1) | JP5337523B2 (enExample) |
| KR (1) | KR101216765B1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102823133B (zh) | 2010-04-12 | 2016-11-16 | 美敦力巴肯研究中心有限公司 | 用于控制双向开关系统的控制电路系统和方法、双向开关、开关矩阵以及医疗刺激器 |
| JP5537479B2 (ja) * | 2011-03-30 | 2014-07-02 | 株式会社日立製作所 | スイッチ回路及び半導体回路 |
| JP5804854B2 (ja) * | 2011-09-05 | 2015-11-04 | 株式会社東芝 | 超音波診断装置 |
| JP2014028027A (ja) * | 2012-07-31 | 2014-02-13 | Toshiba Corp | 超音波診断装置、スイッチング制御プログラムおよびスイッチング制御方法 |
| JP6555465B2 (ja) * | 2015-02-24 | 2019-08-07 | 横河電機株式会社 | 超音波流量計 |
| US9705518B2 (en) | 2015-12-02 | 2017-07-11 | Butterfly Network, Inc. | Asynchronous successive approximation analog-to-digital converter and related methods and apparatus |
| US10175347B2 (en) | 2015-12-02 | 2019-01-08 | Butterfly Network, Inc. | Ultrasound receiver circuitry and related apparatus and methods |
| US10187020B2 (en) | 2015-12-02 | 2019-01-22 | Butterfly Network, Inc. | Trans-impedance amplifier for ultrasound device and related apparatus and methods |
| EP3383278A4 (en) * | 2015-12-02 | 2019-07-17 | Butterfly Network, Inc. | Multi-stage impulse generator and associated apparatus and method |
| US10082488B2 (en) | 2015-12-02 | 2018-09-25 | Butterfly Network, Inc. | Time gain compensation circuit and related apparatus and methods |
| US9492144B1 (en) | 2015-12-02 | 2016-11-15 | Butterfly Network, Inc. | Multi-level pulser and related apparatus and methods |
| JP2017123893A (ja) * | 2016-01-12 | 2017-07-20 | 国立大学法人東北大学 | 超音波の送信回路 |
| EP3425799A4 (en) * | 2017-02-23 | 2019-05-08 | Shenzhen Goodix Technology Co., Ltd. | RECTANGULAR CELL GENERATION METHOD AND RECTANGULAR CELL GENERATION CIRCUIT |
| TW202034624A (zh) | 2018-11-09 | 2020-09-16 | 美商蝴蝶網路公司 | 用於超音波裝置的跨阻抗放大器(tia) |
| JP7329411B2 (ja) | 2019-10-18 | 2023-08-18 | エイブリック株式会社 | アナログスイッチ |
| JP7362474B2 (ja) * | 2019-12-27 | 2023-10-17 | キヤノンメディカルシステムズ株式会社 | 電圧出力装置、超音波診断装置、および超音波プローブ装置 |
| GB2601803A (en) * | 2020-12-11 | 2022-06-15 | Univ Leeds Innovations Ltd | Ultrasound transmitter |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5632019A (en) * | 1994-07-15 | 1997-05-20 | Seagate Technology, Inc. | Output buffer with digitally controlled power handling characteristics |
| JP3665408B2 (ja) | 1996-02-29 | 2005-06-29 | 株式会社東芝 | 駆動パルス発生装置 |
| JPH1051285A (ja) * | 1996-05-28 | 1998-02-20 | Mitsubishi Electric Corp | 電圧制御型トランジスタの駆動回路 |
| JP3139982B2 (ja) * | 1997-08-14 | 2001-03-05 | ジーイー横河メディカルシステム株式会社 | 超音波送波パルス発生回路および超音波診断装置 |
| JP4657497B2 (ja) * | 2001-06-07 | 2011-03-23 | ルネサスエレクトロニクス株式会社 | 可変インピーダンス回路 |
| JP2006261790A (ja) * | 2005-03-15 | 2006-09-28 | Matsushita Electric Ind Co Ltd | レベル生成装置 |
| JP4471967B2 (ja) | 2006-12-28 | 2010-06-02 | 株式会社ルネサステクノロジ | 双方向スイッチモジュール |
| JP4946572B2 (ja) * | 2007-03-30 | 2012-06-06 | 株式会社日立製作所 | 半導体集積回路装置 |
| JP2010042146A (ja) * | 2008-08-13 | 2010-02-25 | Ge Medical Systems Global Technology Co Llc | 超音波撮像装置 |
-
2009
- 2009-02-20 JP JP2009037338A patent/JP5337523B2/ja active Active
-
2010
- 2010-01-07 KR KR1020100001274A patent/KR101216765B1/ko active Active
- 2010-01-11 US US12/685,024 patent/US8143924B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20100214006A1 (en) | 2010-08-26 |
| KR20100095366A (ko) | 2010-08-30 |
| JP5337523B2 (ja) | 2013-11-06 |
| JP2010193329A (ja) | 2010-09-02 |
| US8143924B2 (en) | 2012-03-27 |
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